| Budget Amount *help |
¥94,400,000 (Direct Cost: ¥94,400,000)
Fiscal Year 2011: ¥10,000,000 (Direct Cost: ¥10,000,000)
Fiscal Year 2010: ¥18,600,000 (Direct Cost: ¥18,600,000)
Fiscal Year 2009: ¥25,900,000 (Direct Cost: ¥25,900,000)
Fiscal Year 2008: ¥18,600,000 (Direct Cost: ¥18,600,000)
Fiscal Year 2007: ¥21,300,000 (Direct Cost: ¥21,300,000)
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| Research Abstract |
In this study a novel WDX and cathodoluminescence detectors dedicated to S/TEM were developed, which were integrated into a single S/TEM instruments as a 'Integrated electron spectroscopic S/TEM'. A method where the datasets obtained was statistically processed and the underlying information was thereby extracted was developed, which is called as 'Diagnostic visualization of physical properties'. Furthermore, atomic site selective electronic structure measurement using electron channeling phenomena was established. We analyzed by utilizing those methods above the spatial and electronic structures of optical, magnetic, hydrogen storage, and photo-catalytic materials as well as lithium ion secondary battery cathodes in nanometer scale.
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