Atomic Modification and Structure Analysis of Surface Nanodopant

• Project Area: Nano Materials Science for Atomic Scale Modification
• Project/Area Number: 19053006
• Research Category: Grant-in-Aid for Scientific Research on Priority Areas
• Allocation Type: Single-year Grants
• Review Section: Science and Engineering
• Research Institution: Osaka University
• Principal Investigator: MORITA Seizo 大阪大学, 大学院・工学研究科, 教授 (50091757)
• Co-Investigator(Kenkyū-buntansha): ABE Masayuki 大阪大学, 大学院・工学研究科, 准教授 (00362666) ; NISHI Ryuji 大阪大学, 超高圧電子顕微鏡センター, 准教授 (40243183)
• Co-Investigator(Renkei-kenkyūsha): SUGIMOTO Yoshiaki 大阪大学, 大学院・工学研究科, 准教授 (00432518)
• Project Period (FY): 2007 – 2011
• Project Status: Completed (Fiscal Year 2011)
• Budget Amount: ¥103,500,000 (Direct Cost: ¥103,500,000); Fiscal Year 2011: ¥11,300,000 (Direct Cost: ¥11,300,000); Fiscal Year 2010: ¥23,200,000 (Direct Cost: ¥23,200,000); Fiscal Year 2009: ¥24,500,000 (Direct Cost: ¥24,500,000); Fiscal Year 2008: ¥21,300,000 (Direct Cost: ¥21,300,000); Fiscal Year 2007: ¥23,200,000 (Direct Cost: ¥23,200,000)
• Keywords: 原子間力顕微鏡 / 表面機能元素 / 元素識別 / 原子構造解析 / 原子制御 / 化学配位効果 / K/TiO_2(110) / Au/TiO_2(110) / ナノ空間の開閉 / 原子クラスタ組立 / H_2O/CeO_2(111) / 複合物性評価 / 国際研究者交流 / スペイン:チェコ:ドイツ / フォース・スペクトロスコピー / 原子操作 / AFM / STM同時測定 / 局所的接触電位差(LCPD) / フォースカーブ / カリウム(K)原子 / Pb-Pbダイマー分子 / へき開機能 / スペイン : チェコ / フオース・スペクトロスコピー / フオース・マッピング

Research Abstract

Invention of single atom pen that can vertically interchange heterogeneous atoms at room temperature, and the drastic decrease of construction time for embedded atom letters compared with the former (lateral atom interchange manipulation) method. Invention of in-situ elemental mapping method based on nondestructive force mapping at room temperature, and the drastic decrease of chemical identification time compared with the former (force curve) method. Development of simultaneous force/tunnel current measurements to investigate the correlation between increase of covalent bonding force and gap opening of surface states.

Research Products

• [Journal Article] Understanding image contrast formation in TiO_2 with force spectroscopy (2012)
  • Author(s): Ayhan Yurtsever, Delia Fernandez-Torre, Cesar Gonzalez, Pavel Jelinek, Pablo Pou, Yoshiaki Sugimoto, Masayuki Abe, Ruben Perez and Seizo Morita
  • Journal Title: Physical Review B Volume: Vol.85(Issue 12) Issue: 12
  • DOI: 10.1103/physrevb.85.125416
  • Peer Reviewed
• [Journal Article] Manipulation of individual water molecules on CeO_2(111) (2012)
  • Author(s): S. Torbrugge, O. Custance, S. Morita and M. Reichling
  • Journal Title: J. Phys.: Condens. Matter Volume: Vol.24, No.8 Issue: 8 Pages: 084010-084010
  • DOI: 10.1088/0953-8984/24/8/084010
  • Peer Reviewed
• [Journal Article] Three-dimensional scanning force / tunneling spectroscopy at room temperature (2012)
  • Author(s): Yoshiaki Sugimoto, Keiichi Ueda, Masayuki Abe and Seizo Morita
  • Journal Title: J. Phys.: Condens. Matter Volume: Vol.24, No.8 Issue: 8 Pages: 084008-084008
  • DOI: 10.1088/0953-8984/24/8/084008
  • Peer Reviewed
• [Journal Article] Non-contact AFM (PREFACE) (2012)
  • Author(s): Franz J Giessibl
  • Journal Title: J.Phys. : Condens.Matter [SPECIAL SECTION ON NON-CONTACT AFM] Volume: Vol.24 Issue: 8 Pages: 080301-080301
  • DOI: 10.1088/0953-8984/24/8/080301
• [Journal Article] 原子間力顕微鏡を用いた室温元素識別・原子操作 (2012)
  • Author(s): 森田清三
  • Journal Title: News Letter(応用物理学会薄膜・表面物理分科会) Volume: No.144,March Pages: 29-37
  • Peer Reviewed
• [Journal Article] 原子の室温元素識別・操作・組立 (2012)
  • Author(s): 森田清三
  • Journal Title: 顕微鏡 Volume: Vol.47 Pages: 1-1
  • NAID: 10030552122
  • Peer Reviewed
• [Journal Article] Kelvin probe force microscopy characterization of TiO_2 (110)-supported Au clusters (2011)
  • Author(s): Hong Jing Chung, Ayhan Yurtsever, Yoshiaki Sugimoto, Masayuki Abe, and Seizo Morita
  • Journal Title: Applied Physics Letters Volume: Vol.99(Issue 12)
  • URL: http://dx.doi.org/10.1063/1.3641418
  • Peer Reviewed
• [Journal Article] Alkali-metal adsorption and manipulation on hydroxylated TiO_2(110) surface using atomic force microscopy (2011)
  • Author(s): A.Yurtsever, Y.Sugimoto, M.Abe, K.Matsunaga, I.Tanaka, S.Morita
  • Journal Title: PHYS.REV.B Volume: 84 Issue: 8
  • DOI: 10.1103/physrevb.84.085413
  • Peer Reviewed
• [Journal Article] Atom world based on nano-forces : 25 years of atomic force microscopy (2011)
  • Author(s): Seizo Morita
  • Journal Title: Journal of Electron Microscopy Volume: Vol.60, Suppl. 1(60th Anniversary Issue: Physical) Issue: suppl 1 Pages: S199-S211
  • DOI: 10.1093/jmicro/dfr047
  • Peer Reviewed
• [Journal Article] Simultaneous scanning force/tunneling microscopy using a quartz cantilever with a tungsten tip (2011)
  • Author(s): K.Morita
  • Journal Title: Appl.Phys.Exp. Volume: Vol.4 Issue: 11 Pages: 115201-115201
  • DOI: 10.1143/apex.4.115201
  • NAID: 10030153803
  • Peer Reviewed
• [Journal Article] Kelvin probe force microscopy Characterization of TiO_2(110)-supported Au clusters (2011)
  • Author(s): Hong Jing Chung
  • Journal Title: APPLIED PHYSICS LETTERS Volume: Vol.99 Issue: 12
  • DOI: 10.1063/1.3641418
  • Peer Reviewed
• [Journal Article] Fabrication of Quartz Cantilevers for Small-Amplitude Dynamic Force Microscopy Using an Optical Deflection Sensor (2011)
  • Author(s): Ken-ichi Morita
  • Journal Title: Japanese Journal of Applied Physics Volume: Vol.50 Issue: 8S3 Pages: 08LB12-08LB12
  • DOI: 10.1143/jjap.50.08lb12
  • NAID: 210000071141
  • Peer Reviewed
• [Journal Article] ナノスケール計測におけるロバストネス-走査型プローブ顕微鏡の新技術 (2011)
  • Author(s): 阿部真之
  • Journal Title: システム/制御/情報(システム制御情報学会誌) Volume: Vol.55 Pages: 141-146
  • Peer Reviewed
• [Journal Article] 原子を見る,測る,動かす新たな万能ツール (2011)
  • Author(s): 森田清三
  • Journal Title: 別冊化学化学のブレークスルー Volume: (機器分析編) Pages: 71-76
  • Peer Reviewed
• [Journal Article] Lateral Manipulation of Single Defect on Insulating Surface Using Noncontact Atomic Force Microscope (2011)
  • Author(s): Insook Yi
  • Journal Title: Japanese Journal of Applied Physics Volume: Vol.50
  • Peer Reviewed
• [Journal Article] Simultaneous AFM and STM measurements on the Si(111)-(7×7) surface (2010)
  • Author(s): Y. Sugimoto, Y. Nakajima, D. Sawada, K. Morita, M. Abe and S. Morita
  • Journal Title: Physical Review B Volume: Vol.81(Issue 24) Issue: 24
  • DOI: 10.1103/physrevb.81.245322
  • Peer Reviewed
• [Journal Article] NC-AFM imaging of the TiO_2(110)-(1×1) surface at low temperature (2010)
  • Author(s): A. Yurtsever , Y. Sugimoto , M. Abe and S. Morita
  • Journal Title: Nanotechnology Volume: Vol.21, No.16 Issue: 16 Pages: 165702-165702
  • DOI: 10.1088/0957-4484/21/16/165702
  • Peer Reviewed
• [Journal Article] 原子分解能を持つ非接触原子間力顕微鏡の開発研究、表面科学 (2010)
  • Author(s): 森田清三、杉本宜昭、阿部真之
  • Journal Title: (社)日本表面科学会創立30周年記念特集号、分野別記念解説 Volume: Vol.31, No.1 Pages: 19-24
  • URL: http://www.sssj.org/jsssj/Vol31/31-01/index.htm
  • Peer Reviewed
• [Journal Article] Observation of Subsurface Atoms of the Si(111)-(7×7) Surface by Atomic Force Microscopy (2010)
  • Author(s): Daisuke Sawada
  • Journal Title: Appl.Phys.Express Volume: Vol.3
  • Peer Reviewed
• [Journal Article] Small-amplitude dynamic force microscopy using a quartz cantilever with an optical interferometer (2010)
  • Author(s): Kenichi Morita
  • Journal Title: Nanotechnology Volume: Vol.21
  • NAID: 130005038268
  • Peer Reviewed
• [Journal Article] Simultaneous force and current mapping of the Si(111)-(7x7) surface by dynamic force microscopy (2010)
  • Author(s): Yoshiaki Sugimoto
  • Journal Title: Applied Physics Letters Volume: Vol.96
  • Peer Reviewed
• [Journal Article] Simultaneous AFM and STM measurements on the Si(111)-(7x7) surface (2010)
  • Author(s): Yoshiaki Sugimoto
  • Journal Title: Physical Review B Volume: Vol.81
  • Peer Reviewed
• [Journal Article] Molecular resolution investigation of tetragonal lysozyme(110) face in liquid by FM-AFM (2010)
  • Author(s): Ken Nagashima
  • Journal Title: Journal of Vacuum Science & Technology B Volume: Vol.28
  • Peer Reviewed
• [Journal Article] Simultaneous atomic force and scanning tunneling microscopy study of the Ge(111)-c(2×8) surface (2010)
  • Author(s): Daisuke Sawada
  • Journal Title: Journal of Vacuum Science & Technology B Volume: Vol.28
  • Peer Reviewed
• [Journal Article] NC-AFM imaging of the TiO_2(110)-(1×1) surface at low temperature (2010)
  • Author(s): Ayhan Yurtsever
  • Journal Title: Nanotechnology Volume: Vol.21
  • Peer Reviewed
• [Journal Article] 単原子ペンによるナノパターンニング (2010)
  • Author(s): 森田清三
  • Journal Title: 顕微鏡 Volume: Vol.45 Pages: 51-54
  • NAID: 130007788915
  • Peer Reviewed
• [Journal Article] 原子分解能を持つ非接触原子間力顕微鏡の開発研究 (2010)
  • Author(s): 森田清三
  • Journal Title: 表面科学 Vol.31 Pages: 19-24
  • NAID: 130004673271
  • Peer Reviewed
• [Journal Article] New insights on atomic-resolution frequency-modulated Kelvin-probe force-microscopy imaging of semiconductors (2009)
  • Author(s): Sascha Sadewasser, Pavel Jelinek, Chung-Kai Fang, Oscar Custance, Yusaku Yamada, Yoshiaki Sugimoto, Masayuki Abe and Seizo Morit
  • Journal Title: Physical Review Letters Volume: Vol.103(Issue 26)
  • Peer Reviewed
• [Journal Article] Atomic force microscopy as a tool for atom manipulation (2009)
  • Author(s): Oscar Custance, Ruben Perez and Seizo Morita
  • Journal Title: Nature Nanotechnology Volume: Vol. 4 , No 12 Issue: 12 Pages: 803-810
  • DOI: 10.1038/nnano.2009.347
  • Peer Reviewed
• [Journal Article] Simultaneous measurement of force and tunneling current at room temperature (2009)
  • Author(s): Daisuke Sawada, Yoshiaki Sugimoto, Ken-ichi Morita, Masayuki Abe and Seizo Morita
  • Journal Title: Applied Physics Letters Volume: Vol.94(Issue 17)
  • URL: http://dx.doi.org/10.1063/1.3127503
  • Peer Reviewed
• [Journal Article] Mapping and imaging for rapid atom discrimination : A study of frequency modulation atomic force microscopy (2009)
  • Author(s): Yoshiaki Sugimoto, Takashi Namikawa, Masayuki Abe and Seizo Morita
  • Journal Title: Applied Physics Letters Volume: Vol. 94(Issue 2)
  • URL: http://dx.doi.org/10.1063/1.3046736
  • Peer Reviewed
• [Journal Article] New insights on atomic-resolution frequency-modulated Kelvin用robe force洋icroscopy imaging of semiconductors (2009)
  • Author(s): S. Sadewasser, P. Jelinek, C.-K. Fang, O. Custance, Y. Yamada, Y. Sugimoto, M. Abe, S. Morita
  • Journal Title: Phys. Rev. Lett. Vol.103 Pages: 266103-4
  • Peer Reviewed
• [Journal Article] Atomic force microscopy as a tool for atom manipulation (2009)
  • Author(s): O. Custance, R. Perez, S. Morita
  • Journal Title: Nature Nanotechnology Vol.4 Pages: 803-810
  • Peer Reviewed
• [Journal Article] New insights on atomic-resolution frequency-modulated Kelvin-probe force-microscopy imaging of semiconductors (2009)
  • Author(s): Sascha Sadewasser
  • Journal Title: Physical Review Letters Vol.103
  • Peer Reviewed
• [Journal Article] Atomic force microscopy as a tool for atom manipulation (2009)
  • Author(s): Oscar Custance
  • Journal Title: Nature Nanotechnology Vol.4 Pages: 803-810
  • Peer Reviewed
• [Journal Article] Simultaneous measurement of force and tunneling current at room temperature (2009)
  • Author(s): Daisuke Sawada
  • Journal Title: Applied Physics Letters Vol.94
  • Peer Reviewed
• [Journal Article] Simultaneous Atomic Imaging of Atomic Force Microscopy and Scanning Tunneling Microscopy Using Metal Coated Cantilevers (2009)
  • Author(s): Daisuke Sawada
  • Journal Title: Materials Transactions Vol.50 Pages: 940-942
  • Peer Reviewed
• [Journal Article] 交換型垂直原子操作を用いたアトムペン方式の原子埋め込み文字の研究 (2009)
  • Author(s): 森田清三
  • Journal Title: 表面科学 Vol.30 Pages: 454-459
  • NAID: 10025201261
  • Peer Reviewed
• [Journal Article] 表面機能元素の直接観察 (2009)
  • Author(s): 阿部真之
  • Journal Title: はてりあ 第48巻 Pages: 294-298
  • NAID: 10024817438
  • Peer Reviewed
• [Journal Article] 力学的原子操作による原子埋め込み文字の室温組立 (2009)
  • Author(s): 森田清三
  • Journal Title: 機能材料 Vol.29 Pages: 28-33
  • Peer Reviewed
• [Journal Article] Mapping and imaging for rapid atom discrimination : A study of frequency modulation atomic force micioscopy (2009)
  • Author(s): Yoshiaki Sugimoto
  • Journal Title: Applied Physics Letters Vol.94
  • Peer Reviewed
• [Journal Article] "原子ペン",室温で (2009)
  • Author(s): 阿部真之
  • Journal Title: CERAMICS JAPAN Vol.44 Pages: 126-126
  • Peer Reviewed
• [Journal Article] Statistics of lateral atom manipulation by atomic force microscopy at room temperature (2008)
  • Author(s): Y. Sugimoto, K. Miki, M. Abe and S. Morita
  • Journal Title: Physical Review B Volume: Vol.78, No.20 Issue: 20
  • DOI: 10.1103/physrevb.78.205305
  • Peer Reviewed
• [Journal Article] Complex Patterning by Vertical Interchange Atom Manipulation Using Atomic Force Microscopy (2008)
  • Author(s): Yoshiaki Sugimoto, Pablo Pou, Oscar Custance, Pavel Jelinek, Masayuki Abe, Ruben Perez and Seizo Morita
  • Journal Title: Science Volume: Vol.322(Issue 5900) Issue: 5900 Pages: 413-417
  • DOI: 10.1126/science.1160601
  • Peer Reviewed
• [Journal Article] Vertical and lateral force mapping on the Si(111)-(7x7) surface by dynamic force microscopy (2008)
  • Author(s): Yoshiaki Sugimoto, Takashi Namikawa, Koutaro Miki, Masayuki Abe and Seizo Morita
  • Journal Title: Physical Review B Volume: Vol. 77, No. 19 Issue: 19
  • DOI: 10.1103/physrevb.77.195424
  • Peer Reviewed
• [Journal Article] How to Move an Atom (2008)
  • Author(s): Oscar Custance and Seizo Morita
  • Journal Title: Science Volume: Vol.319(Issue 5866) Issue: 5866 Pages: 1051-1052
  • DOI: 10.1126/science.1154853
  • Peer Reviewed
• [Journal Article] 走査プローブ顕微鏡-見果てぬ夢のツール- (2008)
  • Author(s): 森田清三
  • Journal Title: 応用物理(世界物理年記念レビュー) Volume: Vol.77, No.9 Pages: 1049-1058
  • NAID: 10024192126
  • URL: http://www.jsap.or.jp/ap/2008/ob7709/cont7709.html
  • Peer Reviewed
• [Journal Article] Complex Patterning by Vertical Interchange Atom Manipulation Using Atomic Force Microscopy (2008)
  • Author(s): Y. Sugimoto, P. Pou, O. Custance, P. Jelinek, M. Abe, R. Perez, S. Morita
  • Journal Title: Science Vol.322 Pages: 413-417
  • Peer Reviewed
• [Journal Article] How to Move an Atom (2008)
  • Author(s): O. Custance, S. Morita
  • Journal Title: Science Vol.319 Pages: 1051-1052
  • Peer Reviewed
• [Journal Article] Complex Patterning by Vertical Interchange Atom Manipulation Using Atomic Force Microscopy (2008)
  • Author(s): Yoshiaki Sugimoto
  • Journal Title: Science Vol.322 Pages: 413-417
  • Peer Reviewed
• [Journal Article] Statistics of lateral atom manipulation by atomic force microscopy at room temperature (2008)
  • Author(s): Yoshiaki Sugimoto
  • Journal Title: Physical Review B Vol.78
  • Peer Reviewed
• [Journal Article] Vertical and lateral force mapping on the Si(111)-(7x7)surface by dynamic force microscopy (2008)
  • Author(s): Yoshiaki Sugimoto
  • Journal Title: Physical Review B Vol.77
  • Peer Reviewed
• [Journal Article] High Spatial Resolution Topographic Imaging and Dimer Distance Analysis of Si(100)-(2x1)Using Non-contact Atomic Force Microscopy (2008)
  • Author(s): Daisuke Sawada
  • Journal Title: Japanese Journal ofApplied Physics Vol.47 Pages: 6085-6087
  • Peer Reviewed
• [Journal Article] Solution Growth of Rubrene Single Crystals Using Various Organic Solvents (2008)
  • Author(s): Takeshi Matsukawa
  • Journal Title: Japanese Journal of Applied Physics Vol.47 Pages: 8950-8954
  • Peer Reviewed
• [Journal Article] 走査型プローブ顕微鏡 (2008)
  • Author(s): 森田清三
  • Journal Title: 真空 Vol.51 Pages: 769-770
  • NAID: 10024858252
  • Peer Reviewed
• [Journal Article] 走査プローブ顕微鏡一見果てぬ夢のツールー (2008)
  • Author(s): 森田清三
  • Journal Title: 応用物理 Vol.77 Pages: 1049-1058
  • Peer Reviewed
• [Journal Article] 原子操作で多元素系ナノ材料・ナノデバイスを創る夢 (2008)
  • Author(s): 森田清三
  • Journal Title: ATINews 第7号 Pages: 2-5
  • Peer Reviewed
• [Journal Article] フォースカーブによる元素識別とフォース・マッピング (2008)
  • Author(s): 森田清三
  • Journal Title: 表面科学 Vol.29 Pages: 214-220
  • NAID: 10021165816
  • Peer Reviewed
• [Journal Article] Chemical Coordination Effect Observed in Non-Contact AFM Topography of Pb/Si(111)-(□3×□3)Mosaic Phase (2008)
  • Author(s): Akihiro, Ohiso
  • Journal Title: e-Journal of Surface Science and Nanotechnology Vol.6 Pages: 79-83
  • Peer Reviewed
• [Journal Article] How to Move an Atom (2008)
  • Author(s): Oscar, Custance
  • Journal Title: Science Vol.319 Pages: 1051-1052
  • Peer Reviewed
• [Journal Article] 原子間力顕微鏡-超高分解能イメージングから原子操作,原子識別のツール- (2008)
  • Author(s): 阿部真之
  • Journal Title: 未来材料 Vol.8 No.2 Pages: 6-9
  • Peer Reviewed
• [Journal Article] ナノ計測・加工・評価技術と原子間力顕微鏡 (2008)
  • Author(s): 森田清三
  • Journal Title: 東レリサーチセンターThe TRC NEWS No.102 Pages: 1-13
  • Peer Reviewed
• [Journal Article] Dynamic force spectroscopy using cantilever higher flexural modes (2007)
  • Author(s): Yoshiaki Sugimoto, Seiji Innami, Masayuki Abe, Oscar Custance and Seizo Morita
  • Journal Title: Applied Physics Letters Volume: Vol.91(Issue 9)
  • NAID: 130004673809
  • URL: http://dx.doi.org/10.1063/1.2775806
  • Peer Reviewed
• [Journal Article] Evidence of subsurface oxygen vacancy ordering on reduced CeO_2(111) (2007)
  • Author(s): Stefan Torbrugge, Michael Reichling, Atsushi Ishiyama, Seizo Morita and Oscar Custance
  • Journal Title: Physical Review Letters Volume: Vol.99, No.5 Issue: 5
  • DOI: 10.1103/physrevlett.99.056101
  • Peer Reviewed
• [Journal Article] Drift-compensated data acquisition performed at room temperature with frequency modulation atomic force microscopy (2007)
  • Author(s): Masayuki Abe, Yoshiaki Sugimoto, Takashi Namikawa, Kenichi Morita, Noriaki Oyabu, and Seizo Morita
  • Journal Title: Applied Physics Letters Volume: Vol.90(Issue 20)
  • URL: http://dx.doi.org/10.1063/1.2739410
  • Peer Reviewed
• [Journal Article] Evidence of subsurface oxygen vacancy ordering on reduced CeO2(111) (2007)
  • Author(s): S. Torbrugge, M. Reichling, A. Ishiyama, S. Morita, O. Custance
  • Journal Title: Phys. Rev. Lett. Vol.99 Pages: 056101-4
  • Peer Reviewed
• [Journal Article] Growth dynamics of insulating SrF_2 films on Si(111) (2007)
  • Author(s): Yoshihide, Seino
  • Journal Title: J. Phys.: Condensed Matter Vol.19
  • Peer Reviewed
• [Journal Article] Tip-induced Local Reconstruction on the Pb/Ge(111) Surface Using Frequency Modulation Atomic Force Microscopy (2007)
  • Author(s): Akihiro, Ohiso
  • Journal Title: Japanese Journal of Applied Physics Vol.46 Pages: 5582-5585
  • Peer Reviewed
• [Journal Article] Dynamic force spectroscopy using cantilever higher flexural modes (2007)
  • Author(s): Yoshiaki, Sugimoto
  • Journal Title: Applied Physics Letters Vol.91
  • NAID: 130004673809
  • Peer Reviewed
• [Journal Article] Evidence of subsurface oxygen vacancy ordering on reduced CeO_2(111) (2007)
  • Author(s): Stefan, Torbrugge
  • Journal Title: Physical Review Letters Vol.99
  • Peer Reviewed
• [Journal Article] Drift-compensated data acquisition performed at room temperature with frequency modulation atomic force microscopy (2007)
  • Author(s): Masayuki, Abe
  • Journal Title: Applied Physics Letters Vol.90
  • Peer Reviewed
• [Journal Article] AFMによる個々の原子の元素同定 (2007)
  • Author(s): 杉本宜昭
  • Journal Title: 固体物理 第42巻 Pages: 775-783
  • Peer Reviewed
• [Journal Article] 原子分解能を有する原子間力顕微鏡法の新展開-原子種識別や原子操作を行うための新技術- (2007)
  • Author(s): 阿部真之
  • Journal Title: 日本物理学会誌 Vol.62 Pages: 829-837
  • NAID: 110006440249
  • Peer Reviewed
• [Journal Article] 原子の指紋-原子間力顕微鏡による元素識別- (2007)
  • Author(s): 阿部真之
  • Journal Title: 現代化学 No.440 Pages: 22-26
  • NAID: 40015674117
  • Peer Reviewed
• [Journal Article] AFMによる原子操作と複素ナノ構造体組立 (2007)
  • Author(s): 森田清三
  • Journal Title: 顕微鏡 第42巻 Pages: 100-105
  • NAID: 10019750941
  • Peer Reviewed
• [Presentation] 原子間力顕微鏡による元素識別と原子操作・組立 (2012)
  • Author(s): 森田清三
  • Organizer: 公益社団法人日本表面科学会東北・北海道支部講演会
  • Place of Presentation: 東北大学多元物質科学研究所科学計測研究棟S棟セミナー室,仙台市,宮城県(招待講演)
  • Year and Date: 2012-03-08
• [Presentation] 超高性能原子間力顕微鏡の夢を求めて25年 (2012)
  • Author(s): 森田清三
  • Organizer: 平成23年度公益社団法人日本表面科学会関西支部セミナー&支部20周年若手ポスター発表会
  • Place of Presentation: 京都大学宇治キャンパス宇治おうばくプラザきはだホール,宇治市,京都府
  • Year and Date: 2012-03-07
• [Presentation] Simultaneous scanning force/tunneling microscopy using a quartz cantilever with a tungsten tip (2011)
  • Author(s): K.Morita
  • Organizer: 19th International Colloquium on Scanning Probe Microscopy (ICSPM19)
  • Place of Presentation: Hokkaido, Japan
  • Year and Date: 2011-12-20
• [Presentation] Measurement of atom hopping probability and interaction force for atom manipulation on the Si(111)-(7x7) surface (2011)
  • Author(s): Y.Sugimoto
  • Organizer: 19th International Colloquium on Scanning Probe Microscopy (ICSPM19)
  • Place of Presentation: Hokkaido, Japan
  • Year and Date: 2011-12-20
• [Presentation] Three dimensional force mapping and KPFM measurements on the CaF_2/Si(111) surface (2011)
  • Author(s): M.Fukumoto
  • Organizer: 19th International Colloquium on Scanning Probe Microscopy (ICSPM19)
  • Place of Presentation: Hokkaido, Japan
  • Year and Date: 2011-12-19
• [Presentation] Alkali-metal adsorption and manipulation on a hydroxylated TiO2 (110) surface using atomic force microscopy (2011)
  • Author(s): A.Yurtsever
  • Organizer: 19th International Colloquium on Scanning Probe Microscopy (ICSPM19)
  • Place of Presentation: Hokkaido, Japan
  • Year and Date: 2011-12-19
• [Presentation] Simultaneous scanning force/tunneling microscopy using a quartz cantilever with a tungsten tip (2011)
  • Author(s): K.Morita
  • Organizer: 3rd Global COE International Symposium Electronic Devices Innovation (EDIS2011)
  • Place of Presentation: Osaka, Japan
  • Year and Date: 2011-12-16
• [Presentation] Role of the tip reactivity for atom manipulation by atomic force microscopy (2011)
  • Author(s): Y. Sugimoto, A. Yurtsever, M. Abe, and S. Morita
  • Organizer: International Symposium on Surface Science (ISSS-6)
  • Place of Presentation: Tokyo, Japan. 14aC2-1(I), p230 (Invited)
  • Year and Date: 2011-12-14
• [Presentation] Role of the tip reactivity for atom manipulation by atomic force microscopy (2011)
  • Author(s): Y.Sugimoto
  • Organizer: International Symposium on Surface Science (ISSS-6)
  • Place of Presentation: Tokyo, Japan(招待講演)
  • Year and Date: 2011-12-14
• [Presentation] Simultaneous scanning force/tunneling microscopy using a quartz cantilever with a tungsten tip (2011)
  • Author(s): K.Morita
  • Organizer: International Symposium on Surface Science (ISSS-6)
  • Place of Presentation: Tokyo, Japan
  • Year and Date: 2011-12-14
• [Presentation] Fabrication of Quartz Cantilevers for Small-Amplitude Dynamic Force Microscopy Using an Optical Deflection Sensor (2011)
  • Author(s): Y.Miyata
  • Organizer: International Symposium on Surface Science (ISSS-6)
  • Place of Presentation: Tokyo, Japan
  • Year and Date: 2011-12-14
• [Presentation] 原子間力顕微鏡の歴史と最先端計測技術 (2011)
  • Author(s): 森田清三
  • Organizer: 社団法人日本顕微鏡学会SPM分科会主催研究会、テーマ:走査型プローブ顕微鏡における最先端技術～イノベーションのキーテクノロジー～
  • Place of Presentation: 物質・材料研究機構S千現地区研究本館,つくば市,茨城県(招待講演)
  • Year and Date: 2011-12-02
• [Presentation] 原子間力顕微鏡AFMの現状と将来展望 (2011)
  • Author(s): 森田清三
  • Organizer: 第6回新世代研究所(ATI)合同研究会及びATI25周年記念会
  • Place of Presentation: 紫紺館,御茶ノ水,東京(招待講演)
  • Year and Date: 2011-11-29
• [Presentation] 室温元素識別と原子操作組立 (2011)
  • Author(s): 森田清三
  • Organizer: 大阪大学名誉教授会
  • Place of Presentation: リーガロイヤルホテル光琳の間,大阪市,大阪府(招待講演)(特別講演)
  • Year and Date: 2011-11-28
• [Presentation] 表面機能元素の制御と原子構造解析 (2011)
  • Author(s): 森田清三
  • Organizer: 社団法人日本金属学会秋期大会
  • Place of Presentation: カルチャーリゾートフェストーネ,宜野湾市,沖縄県(招待講演)(基調講演)
  • Year and Date: 2011-11-28
• [Presentation] 室温原子操作によるAgナノクラスターの作製 (2011)
  • Author(s): 平山直樹
  • Organizer: 社団法人日本金属学会秋期大会
  • Place of Presentation: カルチャーリゾートフェストーネ,宜野湾市,沖縄県
  • Year and Date: 2011-11-07
• [Presentation] Si(111)-7×7表面上におけるAFM/STMを用いた3D force mappingによる同時測定 (2011)
  • Author(s): 上田啓市
  • Organizer: 社団法人日本金属学会秋期大会
  • Place of Presentation: カルチャーリゾートフェストーネ,宜野湾市,沖縄県
  • Year and Date: 2011-11-07
• [Presentation] 非接触原子間力顕微鏡を用いたH/Si(111)-7×7表面の測定 (2011)
  • Author(s): 福本将輝
  • Organizer: 社団法人日本金属学会秋期大会
  • Place of Presentation: カルチャーリゾートフェストーネ,宜野湾市,沖縄県
  • Year and Date: 2011-11-07
• [Presentation] 原子間力顕微鏡を用いた室温元素識別・原子操作 (2011)
  • Author(s): 森田清三
  • Organizer: 応用物理学会薄膜・表面物理分科会第39回薄膜・表面物理セミナー
  • Place of Presentation: 産業技術総合研究所臨海副都心センター別館11階,お台場,東京(招待講演)
  • Year and Date: 2011-10-28
• [Presentation] 原子を見て動かして組み立てる (2011)
  • Author(s): 森田清三
  • Organizer: 最先端の物理を高校生にSaturday Afternoon Physics 2011
  • Place of Presentation: 大阪大学豊中キャンパス,理学部D501大講義室,豊中市,大阪府(招待講演)
  • Year and Date: 2011-10-22
• [Presentation] Atom-by-atom Creation and Evaluation of Engineered Nanostructures at Room Temperature Based on Atomic Force Microscopy (2011)
  • Author(s): Seizo Morita
  • Organizer: 13th International Conference on the Formation of Semiconductor Interfaces (ICFSI-13)
  • Place of Presentation: Czech Technical University in Prague, Czech Republic(招待講演)(基調講演)
  • Year and Date: 2011-07-07
• [Presentation] Atom-by-atom Creation of Engineered Nanostructures at Room Temperature Based on Noncontact Atomic Force Microscopy (2011)
  • Author(s): Seizo Morita
  • Organizer: 8th International workshop on interfaces at the boundary between natural and synthetic materials
  • Place of Presentation: University of Santiago, Santiago de Compostela, Spain(招待講演)
  • Year and Date: 2011-06-29
• [Presentation] 多元素ナノ構造体の室温原子操作・組立 (2011)
  • Author(s): 森田清三
  • Organizer: 平成23年度澪電会講演会
  • Place of Presentation: リーガロイヤルホテル,大阪市,大阪府(招待講演)
  • Year and Date: 2011-06-03
• [Presentation] 熱揺らぎの有る室温での交換型原子操作 (2011)
  • Author(s): 森田清三
  • Organizer: 日本材料学会分子動力学部門マルチスケールモデリングシンポジウム
  • Place of Presentation: 大阪大学コンベンションセンター,吹田市,大阪府(招待講演)(基調講演)
  • Year and Date: 2011-05-23
• [Presentation] 原子間力顕微鏡による半導体中の不純物の直接観察 (2011)
  • Author(s): 阿部真之
  • Organizer: 第29回(2010年春期)応用物理学会
  • Place of Presentation: 神奈川県(厚木市)(招待講演)(26p-KL-3)
  • Year and Date: 2011-03-26
• [Presentation] Atom-by-atom Creation and Evaluation of Engineered Nanostructures at Room Temperature Based on Atomic Force Microscopy (2011)
  • Author(s): Seizo Morita
  • Organizer: 13th International Conference on the Formation of Semiconductor Interfaces (ICFSI-13)
  • Place of Presentation: Prague, Czech Republic, Faculty of Civil Engineering, CZECH TECHNICAL UNIVERSITY IN PRAGUE, HALL 1, July 7th, 09:00～10:00 (Plenary lecture)
• [Presentation] Atom-by-atom Creation of Engineered Nanostructures at Room Temperature Based on Noncontact Atomic Force Microscopy (2011)
  • Author(s): Seizo Morita
  • Organizer: 8th International workshop on interfaces at the boundary between natural and synthetic materials
  • Place of Presentation: University of Santiago, Santiago de Compostela, Spain, June 29, 2011, 9:00～9:45 (Invited)
• [Presentation] Toward Atom-by-Atom Creation and Evaluation of Composite Nanostructures at Room Temperature based on AFM (2010)
  • Author(s): Seizo Morita
  • Organizer: IMRE (Institute of Materials Research and Engineering) Seminar on Symposium on Singapore Scanning Probe Microscopy 2010 (SingSPM 2010)
  • Place of Presentation: Singapore, 14:20～15:00, Abstracts of SingSPM 2010 p.13(Keynote Lecture)
  • Year and Date: 2010-12-15
• [Presentation] Toward Atom-by-Atom Creation and Evaluation of Composite Nanostructures at Room Temperature based on AFM (2010)
  • Author(s): Seizo Morita
  • Organizer: Symposium on Singapore Scanning Probe Microscopy 2010 (SingSPM 2010)
  • Place of Presentation: Institute of Materials Research and Engineering (Singapore)(招待講演)(Invited ; p.13)
  • Year and Date: 2010-12-15
• [Presentation] Simultaneous AFM and STM measurements at room temperature (2010)
  • Author(s): Yoshiaki Sugimoto
  • Organizer: The 18th International Colloquium on Scanning Probe Microscopy
  • Place of Presentation: Atagawa Haitsu, Sizuoka, Japan (Higashi-Izu-Cho)(Oral ; S5-3, p.11)
  • Year and Date: 2010-12-10
• [Presentation] Simultaneous force and current mapping of the Si(111)-(7x7) surface bv dynamic force microscopy (2010)
  • Author(s): Keiichi Ueda
  • Organizer: The 18th International Colloquium on Scanning Probe Microscopy
  • Place of Presentation: Atagawa Haitsu, Sizuoka, Japan (Higashi-Izu-Cho)(Poster ; S4-2, p.39)
  • Year and Date: 2010-12-10
• [Presentation] Force spectroscopy on hydrogen adsorbed Si(111)-(7x7) surface using dynamic force microscopy (2010)
  • Author(s): Masaki Fukumoto
  • Organizer: The 18th International Colloquium on Scanning Probe Microscopy
  • Place of Presentation: Atagawa Haitsu, Sizuoka, Japan (Higashi-Izu-Cho)(Poster ; S4-3, p.40)
  • Year and Date: 2010-12-10
• [Presentation] High spring constant cantilever for small amplitude dynamic force microscopy using an optical interferometer (2010)
  • Author(s): Kenichi Morita
  • Organizer: The 18th International Colloquium on Scanning Probe Microscopy
  • Place of Presentation: Atagawa Haitsu, Sizuoka, Japan (Higashi-Izu-Cho)(Oral ; S5-2, p.10)
  • Year and Date: 2010-12-10
• [Presentation] 原子間力顕微鏡を用いた水平原子操作に関わる相互作用力測定 (2010)
  • Author(s): 杉本宜昭
  • Organizer: 第30回表面科学学術講演会
  • Place of Presentation: 大阪府(吹田市)(口頭発表;6Ap-11、p.366)
  • Year and Date: 2010-11-06
• [Presentation] AFM/STM同時測定における化学結合とトンネル電流の相関 (2010)
  • Author(s): 深田大輔
  • Organizer: 真空・表面科学合同講演会(第30回表面科学学術講演会・第51回真空に関する連合講演会)
  • Place of Presentation: 大阪府(吹田市)(Poster ; 5P-064Y、p.303)
  • Year and Date: 2010-11-05
• [Presentation] 周波数変調方式AFMによる液中での可溶性結晶の格子像観察 (2010)
  • Author(s): 長嶋剣
  • Organizer: 第30回表面科学学術講演会
  • Place of Presentation: 大阪府(吹田市)(口頭発表:4Da-02、p.59)
  • Year and Date: 2010-11-04
• [Presentation] 水晶カンチレバーと光干渉計を用いた小振幅原子間力顕微鏡測定 (2010)
  • Author(s): 森田健一
  • Organizer: 第30回表面科学学術講演会
  • Place of Presentation: 大阪府(吹田市)(口頭発表;4Da-01S、p.58)
  • Year and Date: 2010-11-04
• [Presentation] 走査型プローブ顕微鏡-原理から最先端まで- (2010)
  • Author(s): 森田清三
  • Organizer: 平成22年度第1回NPPPスクール「走査型プローブ顕微鏡」セミナー
  • Place of Presentation: つくば産総研NPF,茨城県(つくば市)(招待講演)(特別講演)
  • Year and Date: 2010-09-28
• [Presentation] 水晶カンチレバーと光干渉計を用いた小振幅原子間力顕微鏡 (2010)
  • Author(s): 森田健一
  • Organizer: 第71回応用物理学会学術講演会
  • Place of Presentation: 長崎大学,長崎県(長崎市)(ポスター;P9-19)
  • Year and Date: 2010-09-16
• [Presentation] 熱揺らぎの有る室温での力学的原子操作・組立 (2010)
  • Author(s): 森田清三
  • Organizer: 第4回分子科学討論会
  • Place of Presentation: 大阪府(豊中市)(招待講演)(特別講演;3S01)
  • Year and Date: 2010-09-16
• [Presentation] Atomic force microscopy as a tool for room temperature atom identification and manipulation (2010)
  • Author(s): Seizo Morita
  • Organizer: 18^<th> International Vacuum Congress (IVC-18)
  • Place of Presentation: the Beijing International Convention Center, China (Beijing)(招待講演)(Plenary Lecture, CPL3-2)
  • Year and Date: 2010-08-25
• [Presentation] Atomic resolution observation of soluble crystals in liquid by Frequency-Modulation AFM (2010)
  • Author(s): Ken Nagashima
  • Organizer: 167 Committee satellite workshop on SPM
  • Place of Presentation: Ishikawa, Japan (Kanazawa)(招待講演)(Invited ; p.6-7)
  • Year and Date: 2010-08-04
• [Presentation] AFM/STM Simultaneous Imaging of the Si_4 Tetramer (2010)
  • Author(s): Daisuke Sawada
  • Organizer: 13th International Conference on Non-Contact Atomic Force Microscopy (NC-AFM2010)
  • Place of Presentation: Ishikawa, Japan (Kanazawa)(Poster ; P2-1-10, p.112)
  • Year and Date: 2010-08-02
• [Presentation] Impact of asymmetry tip structure on NC-AFM force mapping (2010)
  • Author(s): Hong Jing Chung
  • Organizer: 13th International Conference on Non-Contact Atomic Force Microscopy (NC-AFM2010)
  • Place of Presentation: Ishikawa, Japan (Kanazawa)(Poster ; P2-2-16, p.136)
  • Year and Date: 2010-08-02
• [Presentation] Atom manipulation and force measurement by atomic force microscopy (2010)
  • Author(s): Hideki Tanaka
  • Organizer: 13th International Conference on Non-Contact Atomic Force Microscopy (NC-AFM2010)
  • Place of Presentation: Ishikawa, Japan (Kanazawa)(Poster ; P2-1-14, p.116)
  • Year and Date: 2010-08-02
• [Presentation] Measurement of atom hopping probability and interaction force during atom manipulation on the Si(111)-(7x7) surface (2010)
  • Author(s): Yoshiaki Sugimoto
  • Organizer: 13th International Conference on Non-Contact Atomic Force Microscopy (NC-AFM2010)
  • Place of Presentation: Ishikawa, Japan (Kanazawa)(Oral ; Su-1440, p.9)
  • Year and Date: 2010-08-01
• [Presentation] Small-amplitude dynamic force microscopy using a quartz cantilever combined with an optical interferometer (2010)
  • Author(s): Kenichi Morita
  • Organizer: 13th International Conference on Non-Contact Atomic Force Microscopy (NC-AFM2010)
  • Place of Presentation: Ishikawa, Japan (Kanazawa)(Oral ; Su-1200, p.7)
  • Year and Date: 2010-08-01
• [Presentation] Small-amplitude dynamic force microscopy using a quartz cantilever and an optical interferometer (2010)
  • Author(s): Kenichi Morita
  • Organizer: 2nd Global COE Student Conference on Innovative Electronic Topics SCIENT2010
  • Place of Presentation: Osaka, Japan (Suita)(Poster ; Po-01, p.50)
  • Year and Date: 2010-07-28
• [Presentation] Toward Atom-by-Atom Creation and Evaluation of Composite Nanostructures at RT based on AFM (2010)
  • Author(s): Seizo Morita
  • Organizer: SSSJ-A3 Foresight Joint Symposium on Nanomaterials and Nanostructures
  • Place of Presentation: University of Tokyo, Japan (Tokyo)(Oral ; p.19)
  • Year and Date: 2010-07-06
• [Presentation] NC-AFM/STM Measurements on the Semiconductor Surface (2010)
  • Author(s): Daisuke Sawada
  • Organizer: 13th International Conference on Intergranular and Interphase Boundaries in Materials
  • Place of Presentation: Mie, Japan (Shima)(Poster ; P-C37, p.205)
  • Year and Date: 2010-07-01
• [Presentation] Toward atom-by-atom creation and evaluation of composite nanostructures at room temperature (2010)
  • Author(s): Seizo Morita
  • Organizer: 13th International Conference on Intergranular and Interphase Boundaries in Materials
  • Place of Presentation: Mie, Japan (Shima)(招待講演)(Invited ; S10-34, p.64)
  • Year and Date: 2010-06-30
• [Presentation] Toward Atom-by-Atom Nanostructuring of Composite Nanomaterials Based on Atomic Force Microscopy (2010)
  • Author(s): Seizo Morita
  • Organizer: 6th Nanoscience and Nanotechnology Conference (Nano-TRVI)
  • Place of Presentation: Cesme, Turkey (Izmir)(招待講演)(Plenary Talk ; p.145)
  • Year and Date: 2010-06-17
• [Presentation] High spring constant cantilever with metal tip for small amplitude NC-AFM operation (2010)
  • Author(s): Kenichi Morita
  • Organizer: International Conference on Core Research and Engineering Science of Advanced Materials
  • Place of Presentation: Osaka, Japan (Suita)(Poster ; PSI-45)
  • Year and Date: 2010-06-01
• [Presentation] 半導体表面におけるAFM/STM同時測定 (2010)
  • Author(s): 杉本宜昭
  • Organizer: 社団法人日本顕微鏡学会第66回学術講演会
  • Place of Presentation: 名古屋国際会議場,愛知県(名古屋市)(招待講演)(26aC04-S)
  • Year and Date: 2010-05-26
• [Presentation] 周波数変調方式AFMによる液中での無機・有機結晶の格子像観察 (2010)
  • Author(s): 長嶋剣
  • Organizer: 日地球惑星科学連合2010年大会
  • Place of Presentation: 幕張メッセ国際会議場,千葉県(千葉市)(口頭発表;MIS012-09)
  • Year and Date: 2010-05-23
• [Presentation] Site-specific force spectroscopy on TiO_2 (110) surface at low-temperature (2010)
  • Author(s): Abdi Pratama
  • Organizer: 2nd Global COE International Symposium-Electronic Devices Innovation-, Workshop on Applications of Atomic Force Microscopy
  • Place of Presentation: Osaka, Japan (Hotel Hankyu Expo-park, Suita)
  • Year and Date: 2010-01-14
• [Presentation] Force and Tunneling Current Measurements on the Semiconductor Surface (2010)
  • Author(s): Daisuke Sawada
  • Organizer: 2nd Global COE International Symposium-Electronic Devices Innovation-, Workshop on Applications of Atomic Force Microscopy
  • Place of Presentation: Osaka, Japan (Hotel Hankyu Expo-park, Suita)
  • Year and Date: 2010-01-14
• [Presentation] Atomic force microscopy as a tool for room temperature atom identification and manipulation (2010)
  • Author(s): Seizo Morita
  • Organizer: 18^<th> International Vacuum Congress (IVC-18)
  • Place of Presentation: Beijing International Convention Center, Beijing, China, August 25, Rm. 201ABC 17:15-18:00 CPL3-2(Plenary Lecture)
• [Presentation] Toward Atom-by-Atom Nanostructuring of Composite Nanomaterials Based on Atomic Force Microscopy (2010)
  • Author(s): S. Morita, Y. Sugimoto, M. Abe
  • Organizer: 6th Nanoscience and Nanotechnology Conference (Nano-TRVI)
  • Place of Presentation: Golden Dolphin Hotel, Izmir Cesme, Turkey, June 17, 8:30-9:20, YUNUS HALL, p.145 (Plenary Talk)
• [Presentation] Molecular resolution investigation of tetragonal lysozyme(110) face in liquid by frequency-modulation AFM (2009)
  • Author(s): Ken Nagashima
  • Organizer: Watching Biomolecules in Action Symposium & 2nd Kanazawa Bio-AFM Workshop
  • Place of Presentation: Osaka, Japan (Suita)
  • Year and Date: 2009-12-15
• [Presentation] NC-AFM/STM measurements on the Si(111)-(7×7) surface and the Ge(111)-c(2×8) surface (2009)
  • Author(s): Ryousuke Takimoto
  • Organizer: 17th International Colloquium on Scanning Probe Microscopy (ICSPM17)
  • Place of Presentation: Shizuoka, Japan (Atagawa)
  • Year and Date: 2009-12-10
• [Presentation] Studying different type of image contrast on TiO2 (110) surface by using nc-AFM measurement (2009)
  • Author(s): Hideki Tanaka
  • Organizer: 17th International Colloquium on Scanning Probe Microscopy (ICSPM17)
  • Place of Presentation: Shizuoka, Japan (Atagawa)
  • Year and Date: 2009-12-10
• [Presentation] Atomic Resolution Imaging of alkali halide crystal in liquid by Frequency-Modulation AFM (2009)
  • Author(s): Sho Yamane
  • Organizer: 17th International Colloquium on Scanning Probe Microscopy (ICSPM17)
  • Place of Presentation: Shizuoka, Japan (Atagawa)
  • Year and Date: 2009-12-10
• [Presentation] Molecular resolution investigation of tetragonal lysozyme(110) face in liquid by frequency-modulation AFM (2009)
  • Author(s): Ken Nagashima
  • Organizer: 17th International Colloquium on Scanning Probe Microscopy (ICSPM17)
  • Place of Presentation: Shizuoka, Japan (Atagawa)
  • Year and Date: 2009-12-10
• [Presentation] Toward Atom-by-Atom Assembly of Composite Nanostructures Based on AFM (2009)
  • Author(s): Seizo Morita
  • Organizer: 7th International Symposium on Atomic Level Characterizations for New Materials and Devices
  • Place of Presentation: Hawaii, USA (Maui)
  • Year and Date: 2009-12-09
• [Presentation] Understanding the Mechanism of Different Contrast Modes on TiO_2 (110) - (1×1) Surface using nc-AFM at Low Temperature - a Force Spectroscopic Measurement (2009)
  • Author(s): Abdi Pratama
  • Organizer: 2009 MRS FALL MEETING
  • Place of Presentation: Boston, USA (The Hynes Convention Center)
  • Year and Date: 2009-12-02
• [Presentation] AFM/STM Simultaneous Measurement on TiO_2 (110) Surface (2009)
  • Author(s): Hideki Tanaka
  • Organizer: 2009 MRS FALL MEETING
  • Place of Presentation: Boston, USA (The Hynes Convention Center)
  • Year and Date: 2009-12-01
• [Presentation] Force and Tunneling Current Measurements on the Semiconductor Surface (2009)
  • Author(s): Ken-ichi Morita
  • Organizer: 2009 MRS FALL MEETING
  • Place of Presentation: Boston, USA (The Hynes Convention Center)
  • Year and Date: 2009-12-01
• [Presentation] Simultaneous Measurement of Force and Tunneling Current with Atomic Force Microscopy (2009)
  • Author(s): Masayuki Abe
  • Organizer: 2009 MRS FALL MEETING
  • Place of Presentation: Boston, USA (The Hynes Convention Center)
  • Year and Date: 2009-11-30
• [Presentation] Atomic Resolution Imaging of KBr(100) cleaved surface in saturated solution by Frequency-Modulation AFM (2009)
  • Author(s): Sho Yamane
  • Organizer: The 4th International Symposium on Atomic Technologies (ISAT-4)
  • Place of Presentation: Hyogo, Japan (Kobe)
  • Year and Date: 2009-11-19
• [Presentation] NC-AFM/STM measurements on the Si(111)-(7×7) surface and the Ge(111)-c(2×8) surface (2009)
  • Author(s): Ryousuke Takimoto
  • Organizer: The 4th International Symposium on Atomic Technologies (ISAT-4)
  • Place of Presentation: Hyogo, Japan (Kobe)
  • Year and Date: 2009-11-19
• [Presentation] Atom-by-Atom Nanostructuring of Composite Nanomaterials Based on AFM (2009)
  • Author(s): Seizo Morita
  • Organizer: The 4th International Symposium on Atomic Technologies (ISAT-4)
  • Place of Presentation: Hyogo, Japan (Kobe)
  • Year and Date: 2009-11-18
• [Presentation] AFMを用いた化学結合力測定に基づいた原子識別 (2009)
  • Author(s): 杉本宜昭
  • Organizer: 平成21年度ナノ分光部会第1回シンポジウム理化学研究所
  • Place of Presentation: 埼玉県(和光市)
  • Year and Date: 2009-11-06
• [Presentation] 超高真空非接触原子間力顕微鏡による原子レベル物性評価 (2009)
  • Author(s): 阿部真之
  • Organizer: (社)日本表面科学会 第29回表面科学学術講演会「急速に進歩する非接触原子間力顕微鏡」
  • Place of Presentation: タワーホール船堀(東京都江戸川区)
  • Year and Date: 2009-10-29
• [Presentation] 超高真空原子間力顕微鏡を用いた原子分子技術 (2009)
  • Author(s): 杉本宜昭
  • Organizer: 平成21年度第2回関西電気化学研究会
  • Place of Presentation: 大阪大学(吹田市)
  • Year and Date: 2009-09-26
• [Presentation] FM-AFMによる正方晶リゾチーム(110)面の液中分子分解能観察 (2009)
  • Author(s): 長嶋剣
  • Organizer: 第70回応用物理学会学術講演会
  • Place of Presentation: 富山県(富山市)
  • Year and Date: 2009-09-08
• [Presentation] Probing the interaction of potassium (K) atoms on TiO_2(110) surface by using non-contact atomic force microscopy (nc-AFM) at low temperature (2009)
  • Author(s): Abdi Pratama
  • Organizer: 5th Handai Nanoscience and Nanotechnology International Symposium
  • Place of Presentation: Osaka University, Osaka, Japan (Suita)
  • Year and Date: 2009-09-02
• [Presentation] Constant height AFM/STM imaging on TiO_2(110) surface (2009)
  • Author(s): Hideki Tanaka
  • Organizer: 5th Handai Nanoscience and Nanotechnology International Symposium
  • Place of Presentation: Osaka University, Osaka, Japan (Suita)
  • Year and Date: 2009-09-02
• [Presentation] NC-AFM/STM Measurements on the Si(111)-(7×7) Surface (2009)
  • Author(s): Daisuke Sawada
  • Organizer: 5th Handai Nanoscience and Nanotechnology International Symposium
  • Place of Presentation: Osaka University, Osaka, Japan (Suita)
  • Year and Date: 2009-09-02
• [Presentation] Atomic Resolution Observation of KBr(100) cleaved surface in liquid by FM-AFM (2009)
  • Author(s): Sho Yamane
  • Organizer: 5th Handai Nanoscience and Nanotechnology International Symposium
  • Place of Presentation: Osaka University, Osaka, Japan (Suita)
  • Year and Date: 2009-09-02
• [Presentation] Atom Manipulation by Atomic Force Microscopy (2009)
  • Author(s): Yoshiaki Sugimoto
  • Organizer: 5th Handai Nanoscience and Nanotechnology International Symposium
  • Place of Presentation: Osaka University, Osaka, Japan (Suita)
  • Year and Date: 2009-09-01
• [Presentation] 周波数変調方式AFMによる液中での分子分解能測定 (2009)
  • Author(s): 長嶋剣
  • Organizer: 第34回結晶成長討論会
  • Place of Presentation: 宮城県(仙台市)
  • Year and Date: 2009-09-01
• [Presentation] 水晶振動子を用いたAFM/STMのフォースセンサーの開発 (2009)
  • Author(s): 笹川裕紀
  • Organizer: 第4回三大学(東京理科大・筑波大・大阪大)連携学生研究会「アトミック/ポリスケールテクノロジー連携研究会」
  • Place of Presentation: 北海道山越郡(長万部町)
  • Year and Date: 2009-08-27
• [Presentation] Fabry-Perot干渉計を用いたAFMの検出感度向上に関する研究 (2009)
  • Author(s): 佐藤或思
  • Organizer: 第4回三大学(東京理科大・筑波大・大阪大)連携学生研究会「アトミック/ポリスケールテクノロジー連携研究会」
  • Place of Presentation: 北海道山越郡(長万部町)
  • Year and Date: 2009-08-27
• [Presentation] GaAs(110)劈開表面のAFM/STM同時測定 (2009)
  • Author(s): 竹田真琴
  • Organizer: 第4回三大学(東京理科大・筑波大・大阪大)連携学生研究会「アトミック/ポリスケールテクノロジー連携研究会」
  • Place of Presentation: 北海道山越郡(長万部町)
  • Year and Date: 2009-08-27
• [Presentation] AFM/STM同時測定によるTiO2(110)表面の観察 (2009)
  • Author(s): 田中秀樹
  • Organizer: 第4回三大学(東京理科大・筑波大・大阪大)連携学生研究会「アトミック/ポリスケールテクノロジー連携研究会」
  • Place of Presentation: 北海道山越郡(長万部町)
  • Year and Date: 2009-08-27
• [Presentation] 非接触原子間力顕微鏡と走査型トンネル顕微鏡の同時測定 (2009)
  • Author(s): 瀧本遼介
  • Organizer: 第4回三大学(東京理科大・筑波大・大阪大)連携学生研究会「アトミック/ポリスケールテクノロジー連携研究会」
  • Place of Presentation: 北海道山越郡(長万部町)
  • Year and Date: 2009-08-27
• [Presentation] STMによる交換型原子操作 (2009)
  • Author(s): 北野晋平
  • Organizer: 第4回三大学(東京理科大・筑波大・大阪大)連携学生研究会「アトミック/ポリスケールテクノロジー連携研究会」
  • Place of Presentation: 北海道山越郡(長万部町)
  • Year and Date: 2009-08-27
• [Presentation] FM-AFMを用いた溶液中でのKBr(100)劈開面の原子分解能観察 (2009)
  • Author(s): 山根翔
  • Organizer: 第4回三大学(東京理科大・筑波大・大阪大)連携学生研究会「アトミック/ポリスケールテクノロジー連携研究会」
  • Place of Presentation: 北海道山越郡(長万部町)
  • Year and Date: 2009-08-27
• [Presentation] Site-specific force spectroscopy on TiO_2(110) surface at low-temperature (2009)
  • Author(s): Ayhan Yurtsever
  • Organizer: 12th International Conference on Noncontact Atomic Force Microscopy
  • Place of Presentation: CT, USA (New Haven)
  • Year and Date: 2009-08-12
• [Presentation] Molecular Resolution Investigation of Lysozyme Crystal in Liquid by Frequency-Modulation AFM (2009)
  • Author(s): Ken Nagashima
  • Organizer: 12th International Conference on Noncontact Atomic Force Microscopy
  • Place of Presentation: CT, USA(New Haven)
  • Year and Date: 2009-08-12
• [Presentation] Simultaneous measurement of force and tunneling current (2009)
  • Author(s): Daisuke Sawada
  • Organizer: 12th International Conference on Noncontact Atomic Force Microscopy
  • Place of Presentation: CT, USA (New Haven)
  • Year and Date: 2009-08-11
• [Presentation] Force and Tunneling Current Measurements on the Semiconductor Surface (2009)
  • Author(s): Daisuke Sawada
  • Organizer: 12th International Conference on Noncontact Atomic Force Microscopy
  • Place of Presentation: CT, USA (New Haven)
  • Year and Date: 2009-08-11
• [Presentation] Toward Atom-by-Atom Assembly of Complex Nanostructures Based on Atomic Force Microscopy (2009)
  • Author(s): Seizo Morita
  • Organizer: Local meeting of Czech nanosociety (Institute of Physics, Academy of Sciences of the Czech Republic)
  • Place of Presentation: Czech Republic (Prague)
  • Year and Date: 2009-07-16
• [Presentation] Toward Atom-by-Atom Assembly of Complex Nanostructures Based on Atomic Force Microscopy (2009)
  • Author(s): Seizo Morita
  • Organizer: Physikalisches Kolloquium - Weekly colloquia SS09, Physik, Universitat Regensburg, Germany
  • Place of Presentation: Germany (Regensburg)
  • Year and Date: 2009-07-13
• [Presentation] 超高真空SPMの半導体への応用 (2009)
  • Author(s): 杉本宜昭
  • Organizer: 第47回表面科学基礎講座
  • Place of Presentation: 東京大学(文京区)
  • Year and Date: 2009-07-08
• [Presentation] 周波数変調方式AFMによる液中での分子分解能測定 (2009)
  • Author(s): 長嶋剣
  • Organizer: 日本地球惑星科学連合2009年大会
  • Place of Presentation: 千葉県(幕張メッセ、千葉市)
  • Year and Date: 2009-05-16
• [Presentation] 原子操作による多元素ナノ構造体の室温組立 (2009)
  • Author(s): 森田清三
  • Organizer: 第10回大阪大学理学部同窓会講演会
  • Place of Presentation: 大阪大学(豊中市)
  • Year and Date: 2009-05-02
• [Presentation] 複素ナノ構造体を室温で組み立てる研究 (2009)
  • Author(s): 森田清三
  • Organizer: 北海道大学情報科学研究科グローバルCOEプログラム『知の創出を支える次世代IT基盤拠点』『第1回若手研究者による知の創出のための異分野共同セミナー』
  • Place of Presentation: 北海道(札幌市南区定山渓温泉)
  • Year and Date: 2009-04-25
• [Presentation] Development of Atomic Force Microscopy Using Quartz Tuning Fork Operated in Ultra High Vacuum (2009)
  • Author(s): Takashi TERADQ
  • Organizer: 3rdinternational Symposium on Atomic Technology(ISAT-3)3rd Polyscale Technology Workshop(PTW-3)
  • Place of Presentation: Tokyo Internatiorial Exchange Center, Tokyo, Japan
  • Year and Date: 2009-03-05
• [Presentation] Optical Interferometer for Detection and Excitation of Cantilever Motion : A Study of Atomic Force Microscopy (2009)
  • Author(s): Arushi SATO
  • Organizer: 3rd International Symposium on Atomic Technology(ISAT-3)3rd Polyscale Technology Worlcshop(PTW-3)
  • Place of Presentation: Tokyo International Exchange Center, Tokyo, Japan
  • Year and Date: 2009-03-05
• [Presentation] Sensitivity improvement of interferometer for NC-AFM (2009)
  • Author(s): Kenichi INA
  • Organizer: 3rd International Symposium on Atomic Technology(ISAT-3)3rd Polyscale Technology Workshop(PTW-3)
  • Place of Presentation: Tokyo International Exchange Center, Tokyo, Japan
  • Year and Date: 2009-03-05
• [Presentation] Investigation of excitation method for quartz tuning fork atomic force microscopy (2009)
  • Author(s): Yuki SASAGAWA
  • Organizer: 3rd International Symposium on Atomic Technology(ISAT-3)3rd Polyscale Technology Workshop(PTW-3)
  • Place of Presentation: Tokyo International Exchange Center, Tokyo, Japan
  • Year and Date: 2009-03-05
• [Presentation] Observation of the metal oxide surface by scanning probe microscopy (2009)
  • Author(s): Hideki TANAKA
  • Organizer: 3rd International Symposium on Atomic Technology(ISAT-3)3rd Polyscale Technology Workshop(PTW-3)
  • Place of Presentation: Tokyo International Exchange Center, Tokyo, Japan
  • Year and Date: 2009-03-05
• [Presentation] High Resolution Imaging of TiO_2(110)-(1x1)Using Non-Contact AFM at Low Temperature (2009)
  • Author(s): Abdi PRATAMA
  • Organizer: 3rd International Symposium on Atomic Technology(ISAT-3)3rd Polyscale Technology Workshop(PTW-3)
  • Place of Presentation: Tokyo International Exchange, Center, Tokyo, Japan
  • Year and Date: 2009-03-05
• [Presentation] High-resolution imaging of CaF_2/Si(111)surface using atomic resolution NC-AFM (2009)
  • Author(s): Makoto TAKEDA
  • Organizer: 3rd International Symposium on Atomic Technology(ISAT-3)3rd Polyscale Technology Workshop(PTW-3)
  • Place of Presentation: Tokyo International Exchange Center, Tokyo, Japan
  • Year and Date: 2009-03-05
• [Presentation] Statistics of lateral atom manipulation by atomic force microscopy at room temperature (2009)
  • Author(s): Yuki NAKAJIMA
  • Organizer: 3rd International Symposium on Atomic Technology(ISAT-3)3rd Polyscale Technology Workshop(PTW-3)
  • Place of Presentation: Tokyd International Exchange Center, Tokyo, Japan
  • Year and Date: 2009-03-05
• [Presentation] Investigation into small diameter metal tip for force sensor (2009)
  • Author(s): Hitomi HASEGAWA
  • Organizer: 3rd International Symposium on Atomic Technology(ISAT-3)3rd Polyscale Technology Workshop(PTW-3)
  • Place of Presentation: Tokyo International Excha nge Center, Tokyo, Japan
  • Year and Date: 2009-03-05
• [Presentation] Deflection amplifier for tuning fork operated in ultra-high vacuum (2009)
  • Author(s): Saeidifar SOMAYEH
  • Organizer: 3rd International Symposium on Atomic Technology(ISAT-3)3rd Polyscale Technology Workshop(PTW-3)
  • Place of Presentation: Tokyo International Exchange Center, Tokyo, Japan
  • Year and Date: 2009-03-05
• [Presentation] Toward Atom-by-Atom Assembly of Composite Nanostructures Based on AFM (2009)
  • Author(s): S. Morita, Y. Sugimoto, P. Pou, P. Jelinek, R. Perez, O. Custance and M. Abe
  • Organizer: 7th International Symposium on Atomic Level Characterizations for New Materials and Devices '09 (ALC'09)
  • Place of Presentation: The Westin Maui Resort & Spa, Maui, Hawaii, USA, 11:50-12:20, Dec.9, "SSSJ Special Session on SPM", Proc. Of ALC’09, pp.385-387 (Invited)
• [Presentation] Statistics of Lateral Atom Manipulation by Atomic Force Microscopy at Room Temperature (2008)
  • Author(s): Yoshiaki Sugimoto
  • Organizer: The 16th International Colloquium on Scanning Probe Microscopy
  • Place of Presentation: Atagawa, Japan
  • Year and Date: 2008-12-13
• [Presentation] 走査型プローブ顕微鏡の現状と原子間力顕微鏡の開発 (2008)
  • Author(s): 森田清三
  • Organizer: (財)国際高等研究所ワークショップ、2008年度研究プロジェクト「高度計測技術の発展と埋没」
  • Place of Presentation: 財団法人国際高等研究所
  • Year and Date: 2008-11-15
• [Presentation] 非接触原子間力顕微鏡を用いたフォース・マッピング (2008)
  • Author(s): 杉本宜昭
  • Organizer: 社団法人日本表面科学会主催第28回表面科学学術講演会
  • Place of Presentation: 早稲田大学総合学術情報センター(国際会議場)
  • Year and Date: 2008-11-15
• [Presentation] NC-AFM/STM Study on the Semiconductor Surface (2008)
  • Author(s): Daisuke Sawada
  • Organizer: The 16th International Colloquium on Scanning Probe Microscopy
  • Place of Presentation: Atagawa, Janin
  • Year and Date: 2008-11-10
• [Presentation] Vertical and lateral force mapping by non-contact atomic force microscopy (2008)
  • Author(s): Yoshiaki Sugimoto
  • Organizer: International Symposium on Surface Science and Nanotechnology(ISSS-5)
  • Place of Presentation: Waseda University, Tokyo, Japan
  • Year and Date: 2008-11-10
• [Presentation] Toward Atom-by-Atom Assembly of Composite Nanostructures Based on Atomic Force Microscopy (2008)
  • Author(s): Seizo Morita
  • Organizer: 21st International Microproceses and Nanotechnology Conference(MNC 2008)
  • Place of Presentation: Fukuoka, Japan
  • Year and Date: 2008-10-29
• [Presentation] Atomic Tool for Nanofabrication Based on Atomic Force Microscopy (2008)
  • Author(s): Seizo Morita, Yoshiaki Sugimoto, Oscar Custance, Masayuki Abe, Pablo Pou, Pavel Jelinek and Ruben Perez
  • Organizer: 55th AVS International Symposium in Boston
  • Place of Presentation: MA, USA, Nanometer-scale Science and Technology, Room: 311 - Session NS+NC-TuM, The Frontiers of Nanoscience, NS+NC-TuM11, 11:20-12:00 AM October 21, 2008 (Invited; Albert Nerken Award Lecture)
  • Year and Date: 2008-10-21
• [Presentation] Atomic. Tool for Nanofabrication Based on Atomic Force Microscopy (2008)
  • Author(s): Seizo Morita
  • Organizer: 55th AVS International Symposium
  • Place of Presentation: Boston, MA, USA
  • Year and Date: 2008-10-21
• [Presentation] 走査プローブ顕微鏡の基礎と表面原子操作の最先端 (2008)
  • Author(s): 森田清三
  • Organizer: 社団法人日本表面科学会主催(2008年秋季)第46回表面科学基礎講座"表面・界面分析の基礎と応用"
  • Place of Presentation: 神戸大学瀧川記念学術交流会館
  • Year and Date: 2008-10-02
• [Presentation] Observation of the metal oxide surfabe by scanning probe microscopy (2008)
  • Author(s): Akira Hirai
  • Organizer: 4th Handai Nanoscience and technology International Symposium
  • Place of Presentation: Suita, Japan
  • Year and Date: 2008-09-30
• [Presentation] NC-AFM/STM measurements on the Ge(111)-c(2x8)Surface (2008)
  • Author(s): Daisuke Sawada
  • Organizer: 4th Handai Nanoscience and technology International Symposium
  • Place of Presentation: Suita, Japan
  • Year and Date: 2008-09-30
• [Presentation] Distinction of intermixed ionic atoms on insulating surface of(Ca,Sr)F_2 (2008)
  • Author(s): Masanori Nagayasu
  • Organizer: 4th Handal Nanoscience and technology International Symposium
  • Place of Presentation: Suita, Japan
  • Year and Date: 2008-09-30
• [Presentation] Single atom manipulaiton at room temperature (2008)
  • Author(s): Yoshiaki Sugimoto
  • Organizer: 4th Handai Nanoscience and technology International Symposium
  • Place of Presentation: Suita, Japan
  • Year and Date: 2008-09-29
• [Presentation] 非接触原子間力顕微鏡を用いたSnを蒸着したSi(111)-(7×7)表面での原子操作 (2008)
  • Author(s): 三木浩太郎
  • Organizer: 旦本金属学会2008年秋季(第143回)大会
  • Place of Presentation: 熊本大学黒髪キャンパス
  • Year and Date: 2008-09-25
• [Presentation] 非接触原子間力顕微鏡を用いた金属酸化物表面の観察 (2008)
  • Author(s): 平井明
  • Organizer: 日本金属学会2008年秋季(第143回)大会
  • Place of Presentation: 熊本大学黒髪キャンパス
  • Year and Date: 2008-09-25
• [Presentation] Force spectroscopy using cantilever higher flexural modes (2008)
  • Author(s): Oscar Custance
  • Organizer: 11th International Conference on Non-contact Atomic Force Microscopy
  • Place of Presentation: Madrid, Spain
  • Year and Date: 2008-09-19
• [Presentation] Imaging and Mapping for discriminating atom species using Non-contact Atomic Force Microscopy (2008)
  • Author(s): Masayuki Abe
  • Organizer: 11th International Conference,on Non-contact Atomic Force Microscopy
  • Place of Presentation: Madrid, Spain
  • Year and Date: 2008-09-19
• [Presentation] Characterizing reactivity of water molecules on CeO_2(111)using atomic fcirce microscopy (2008)
  • Author(s): Stefan Torbrtigge
  • Organizer: 11th International Conference on Non-contact Atomic Force Microscopy
  • Place of Presentation: Madrid, Spain
  • Year and Date: 2008-09-17
• [Presentation] Vertical and lateral force mapping on the Si(111)-(7x7)surface by dynamic force microscopy (2008)
  • Author(s): Yoshiaki Sugimoto
  • Organizer: 11th International Conference on Non-contact Atomic Force Microscopy
  • Place of Presentation: Madrid, Spain
  • Year and Date: 2008-09-16
• [Presentation] Distinct short-range electrostatic interaction on Si and substitutional Pb atoms at the Si(111)-(7x7)surface (2008)
  • Author(s): Sascha Sadewasser
  • Organizer: 11 th International Conference on Non-contact Atomic Force Microscopy
  • Place of Presentation: Madrid, Spain
  • Year and Date: 2008-09-16
• [Presentation] Unveiling the atomic processes during the manipulation of single atoms at semiconductor surfaces using the FM-AFM in the repulsive regime (2008)
  • Author(s): Pablo Pou
  • Organizer: 11th International Conference on Non-contact Atomic Force Microscopy
  • Place of Presentation: Madrid, Spain
  • Year and Date: 2008-09-16
• [Presentation] State-of-the-Art and Future Prospects of Atomic Force Microscopy with Atomic Resolution (2008)
  • Author(s): Seizo Morita
  • Organizer: the 2008 International Conference on Nanoscience+Technology(ICN+T2008)
  • Place of Presentation: Colorado, USA
  • Year and Date: 2008-07-23
• [Presentation] Atom-by-Atom Bottom-up Nanostructuring System Based on Atomic Force Microscopy (2008)
  • Author(s): Seizo Morita
  • Organizer: Osaka University GCOE Summer Seminar Program for Electronic Devices, Academic Melting-Pot 2008(AMP2008)
  • Place of Presentation: Suita Campus, Osaka University Japan
  • Year and Date: 2008-07-10
• [Presentation] Atom-by-Atom Chemical Identification and Following Manipulation on Semiconductor Surfaces Toward Nanostructuring at Room Temperature (2008)
  • Author(s): Seizo Morita
  • Organizer: the 14th International Conference on Solid Films and Surfaces(ICSFS-14)
  • Place of Presentation: Trinity College Dublin, Ireland
  • Year and Date: 2008-07-01
• [Presentation] Imaging of the Si clusters on the Si(111)-(7x7)surfac by using NC-AFM (2008)
  • Author(s): SitOrulWasaki
  • Organizer: The 1st International Symposium on Advanced Microscopy and Theoretical Calculations(AMTC)
  • Place of Presentation: Nagoya, Japan
  • Year and Date: 2008-06-30
• [Presentation] NC-AFM study of phosphorous/Si(001)2x1 surface (2008)
  • Author(s): Daisuke Sawada
  • Organizer: The 1st International Symposium on Advanced Microscopy and Theoretical Calculations(AMTC)
  • Place of Presentation: Nagoya, Japan
  • Year and Date: 2008-06-29
• [Presentation] 多元系ナノ構造構築を目指した原子識別操作技術開発 (2008)
  • Author(s): 森田清三
  • Organizer: QE (QuantumEngineering)デザイン研究イニシアティブ研究会
  • Place of Presentation: 銀杏会館,大阪大学
  • Year and Date: 2008-01-28
• [Presentation] Toward Atom-by-Atom Assembly of Composite Nanostructures Based on Atomic Force Microscopy (2008)
  • Author(s): Seizo Morita, Yoshiaki Sugimoto, Oscar Custance, Masayuki Abe, Pablo Pou, Pavel Jelinek and Ruben Perez
  • Organizer: 21st International Microprocesses and Nanotechnology Conference (MNC 2008)
  • Place of Presentation: JAL Resort Sea Hawk Hotel Fukuoka, Japan, Session Title.: Nano Fabrication I, Session Number : 29C-7-1, Session Time: 13:30-14:00, Room: Navis C (1F), Author’s Interview 15:20-15:35, Digest of Papers: pp.110-111 (Invited)
• [Presentation] State-of-the-Art and Future Prospects of Atomic Force Microscopy with Atomic Resolution (2008)
  • Author(s): Seizo Morita
  • Organizer: The 2008 International Conference on Nanoscience+Technology (ICN+T 2008)
  • Place of Presentation: Keystone Resort and Conference Center, Colorado, USA, PS-WeM1 (July 23, 8:00 AM-8:50AM), Technical Program & Abstracts of ICN+T 2008 p.133 (PLENARY LECTURE)
• [Presentation] Atom-by-Atom Chemical Identification and Following Manipulation on Semiconductor Surfaces Toward Nanostructuring at Room Temperature (2008)
  • Author(s): Seizo Morita, Yoshiaki Sugimoto, Oscar Custance and Masayuki Abe
  • Organizer: The 14th International Conference on Solid Films and Surfaces (ICSFS-14)
  • Place of Presentation: Trinity College Dublin, Tue-PL-2 13:45-14:25, Tuesday 1 July 2008, Programme of ICSFS-14 p.91 (PLENARY LECTURE)
• [Presentation] Room Temperature Atomic Manipulation Using Dynamic Force Microscopy (2007)
  • Author(s): Yoshiaki, Sugimoto
  • Organizer: The 15th International Colloquium on Scanning Probe Microscopy
  • Place of Presentation: Atagawa, Japan
  • Year and Date: 2007-12-07
• [Presentation] Atom Manipulation on the Sn Deposited Si(111)-(7×7) Surface Using Atomic Force Microscopy (2007)
  • Author(s): Koutarou, Miki
  • Organizer: The 15th International Colloquium on Scanning Probe Microscopy
  • Place of Presentation: Atagawa, Japan
  • Year and Date: 2007-12-06
• [Presentation] Atom Identification by Dynamic Force Mapping (2007)
  • Author(s): Takashi, Narnikawa
  • Organizer: The 15th International Colloquium on Scanning Probe Microscopy
  • Place of Presentation: Atagawa, Japan
  • Year and Date: 2007-12-06
• [Presentation] NC-AFM Investigation of the Si Cluster on the Si(111)-(7×7) Surface (2007)
  • Author(s): Satoru, Iwasaki
  • Organizer: The 15th International Colloquium on Scanning Probe Microscopy
  • Place of Presentation: Atagawa, Japan
  • Year and Date: 2007-12-06
• [Presentation] AFM Observation of P/Si(001)-(2×1) Surface (2007)
  • Author(s): Daisuke, Sawada
  • Organizer: The 15th International Colloquium on Scanning Probe Microscopy
  • Place of Presentation: Atagawa, Japan
  • Year and Date: 2007-12-06
• [Presentation] Atom-by-Atom Chernical Identification and Following Atom Manipulation (2007)
  • Author(s): Seizo, Morita
  • Organizer: 2nd International Workshop on Materials Science and Nano-Engineering
  • Place of Presentation: Awaji Yumebutai, Japan
  • Year and Date: 2007-12-05
• [Presentation] 原子・分子の識別・操作の最新動向と未来 (2007)
  • Author(s): 森田清三
  • Organizer: (独)目本学術振興会、ナノプローブテクノロシー第167委員会、第48回研究会
  • Place of Presentation: ウェルシティ金沢(石川厚生年金会館),石川県
  • Year and Date: 2007-11-19
• [Presentation] 原子・分子の識別・操作の今後の課題 (2007)
  • Author(s): 杉本宜昭
  • Organizer: (独)目本学術振興会、ナノプローブテクノロシー第167委員会、第48回研究会
  • Place of Presentation: ウェルシティ金沢(石川厚生年金会館),石川県
  • Year and Date: 2007-11-19
• [Presentation] Atom-by-Atom Chernical Identification and Following Atom Manipulation Toward Cound Nanostructuring (2007)
  • Author(s): Seizo, Morita
  • Organizer: The 9th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures (ACSIN-9)
  • Place of Presentation: Komaba Research Campus of The University of Tokyo, Tokyo, Japan
  • Year and Date: 2007-11-12
• [Presentation] (Ca,Sr)F_2/Si(II1)表面における個々のイオン原子識 (2007)
  • Author(s): 清野宜秀
  • Organizer: 第27回表面科学講演大会
  • Place of Presentation: 東京大学生産技術研究所(駒場),東京
  • Year and Date: 2007-11-01
• [Presentation] 高次共振モード原子間力顕微鏡によるフォーススペクトロスコピー (2007)
  • Author(s): 杉本宜昭
  • Organizer: 第27回表面科学講演大会
  • Place of Presentation: 東京大学生産技術研究所(駒場),東京
  • Year and Date: 2007-11-01
• [Presentation] Principles and Sate of the Art of Atomic Force Microscopy (2007)
  • Author(s): Seizo, Morita
  • Organizer: 6th Int.Symp.Atomic Level Characterizations for New Materials and Devices'07(ALC07)
  • Place of Presentation: Kanazawa Art Hall, Ishikawa, Japan
  • Year and Date: 2007-10-28
• [Presentation] 原子間力顕微鏡の高分解能化と原子の識別・操作・組み立てへの応用 (2007)
  • Author(s): 森田清三
  • Organizer: 日本顕微鏡学会第51回シンポジウム
  • Place of Presentation: 徳島大学蔵本キャンパス,徳島
  • Year and Date: 2007-10-19
• [Presentation] Mechanism for room-temperature single-atom lateral manipulations on semiconductors using dynamic force microscopy (2007)
  • Author(s): Yoshiaki, Sugimoto
  • Organizer: Second International Symposium on Atomic Technologies (ISAT-2)
  • Place of Presentation: Awaji Yumebutai, Hyogo, Japan
  • Year and Date: 2007-10-01
• [Presentation] Tip-surface interaction potential mapping at room-temperature using non-contact atomic force microscopy (2007)
  • Author(s): Takashi, Narnikawa
  • Organizer: Second International Symposium on Atomic Technologies (ISAT-2)
  • Place of Presentation: Awaji Yumebutai, Hyogo, Japan
  • Year and Date: 2007-10-01
• [Presentation] Characterization of the electrostatic interaction on substitutional Pb at oms at the Si(111)-(7×7) surface using low temperature dynamic force microscopy (2007)
  • Author(s): Yusaku, Yamada
  • Organizer: Second International Symposium on Atomic Technologies (ISAT-2)
  • Place of Presentation: Awaji Yumebutai, Hyogo, Japan
  • Year and Date: 2007-10-01
• [Presentation] Non-contact atomic force microscopy investigation of the Pb/Si(111)-(〓3×〓3) mosaic phase (2007)
  • Author(s): Akihiro, Ohiso
  • Organizer: Second International Symposium on Atomic Technologies (ISAT-2)
  • Place of Presentation: Awaji Yumebutai, Hyogo, Japan
  • Year and Date: 2007-10-01
• [Presentation] Distribution of individual ionic atom species on (Ca,Sr)F_2/Si(111) surface (2007)
  • Author(s): Yoshihide Seino
  • Organizer: Second International Symposium on Atomic Technologies (ISAT-2)
  • Place of Presentation: Awaji Yumebutai, Hyogo, Japan
  • Year and Date: 2007-10-01
• [Presentation] Atomic force microscopy using quartz tuning fork in air (2007)
  • Author(s): Yusuke, Murai
  • Organizer: Second International Symposium on Atomic Technologies (ISAT-2)
  • Place of Presentation: Awaji Yumebutai, Hyogo, Japan
  • Year and Date: 2007-10-01
• [Presentation] Room temperature lateral atom manipulations on semiconductors using dynamic force microscopy (2007)
  • Author(s): Yoshiaki, Sugimoto
  • Organizer: Handai Nanoscience and Nanotechnology International Symposium 2007
  • Place of Presentation: Sigma Hall, Osaka University, Japan
  • Year and Date: 2007-09-27
• [Presentation] Characterization of the electrostatic interaction on substitutional Pb at oms at the Si(111)-(7×7) surface using low temperature dynamic force microscopy (2007)
  • Author(s): Yusaku, Yamada
  • Organizer: Handai Nanoscience and Nanotechnology International Symposium 2007
  • Place of Presentation: Sigma Hall, Osaka University, Japan
  • Year and Date: 2007-09-27
• [Presentation] Distribution of individual ionic atom species on (Ca,Sr)F_2/Si(111) (2007)
  • Author(s): Yoshihide Seino
  • Organizer: Handai Nanoscience and Nanotechnology International Symposium 2007
  • Place of Presentation: Sigma Hall, Osaka University, Japan
  • Year and Date: 2007-09-27
• [Presentation] Potential mapping at room-temperature using dynamic force microscopy (2007)
  • Author(s): Takashi, Narnikawa
  • Organizer: Handai Nanoscience and Nanotechnology International Symposium 2007
  • Place of Presentation: Sigma Hall, Osaka University, Japan
  • Year and Date: 2007-09-27
• [Presentation] Surrounding atoms effects on the Pb/Si(111)-(〓3×〓3) mosaic phase (2007)
  • Author(s): Akihiro, Ohiso
  • Organizer: Handai Nanoscience and Nanotechnology International Symposium 2007
  • Place of Presentation: Sigma Hall, Osaka University, Japan
  • Year and Date: 2007-09-27
• [Presentation] Atomic force microscopy using quartz tuning fork in air (2007)
  • Author(s): Yusuke, Murai
  • Organizer: Handai Nanoscience and Nanotechnology International Symposium 2007
  • Place of Presentation: Sigma Hall, Osaka University, Japan
  • Year and Date: 2007-09-27
• [Presentation] AFMによる原子のidentification (2007)
  • Author(s): 杉本宜昭
  • Organizer: 日本物理学会第62回年次大会
  • Place of Presentation: 北海道大学,北海道
  • Year and Date: 2007-09-23
• [Presentation] Evidence of Subsurface Oxygen Vacancy Ordering on Reduced CeO_2(111) (2007)
  • Author(s): Stefan, Torbrugge
  • Organizer: The 10th Internatinal Conference on Non-Contact Atomic Force Microscopy
  • Place of Presentation: Antalya, Turkey
  • Year and Date: 2007-09-18
• [Presentation] Characterization of the electrostatic interaction on substitutional Pb at oms at the Si(111)-(7×7) surface using low temperature dynamic force microscopy (2007)
  • Author(s): Yusaku, Yamada
  • Organizer: The 10th Internatinal Conference on Non-Contact Atomic Force Microscopy
  • Place of Presentation: Antalya, Turkey
  • Year and Date: 2007-09-18
• [Presentation] Investgations of Organic Molecules by Frequency Modulation Atomic Force Microscopy in Air or Liquid (2007)
  • Author(s): Masahiro, Ohta
  • Organizer: The 10th Internatinal Conference on Non-Contact Atomic Force Microscopy
  • Place of Presentation: Antalya, Turkey
  • Year and Date: 2007-09-18
• [Presentation] Development of Low-thermal Drift FM-AFM Working in Air/Liquid Environments (2007)
  • Author(s): Noriaki Oyabu
  • Organizer: The 10th International Conference on Non-Contact Atomic Force Microscopy
  • Place of Presentation: Antalya, Turkey
  • Year and Date: 2007-09-18
• [Presentation] Chemical identifivation of individual surface atoms using dynamic force microscopy (2007)
  • Author(s): Oscar Custance
  • Organizer: Thends in Nanotechnology(TNT2007)International Conference
  • Place of Presentation: San Sebastian, Spain
  • Year and Date: 2007-09-04
• [Presentation] Toward atom-by-atom assembly of complex nanostructures at room temperature based on AFM (2007)
  • Author(s): Seizo, Morita
  • Organizer: The 10th Asia Pacific Physics Conference(APPC10)
  • Place of Presentation: POSTECH, Pohang, Korea
  • Year and Date: 2007-08-23
• [Presentation] 原子間力顕微鏡による個々の原子の識別・操作・組立 (2007)
  • Author(s): 森田清三
  • Organizer: 「汎用走査プローブ顕微鏡シミュレータ」研究会
  • Place of Presentation: みずほ情報総研,東京
  • Year and Date: 2007-08-06
• [Presentation] Forc3e spectrascopy and single atom chemical identification (2007)
  • Author(s): Oscar Custance
  • Organizer: Workshop on atomic/molecular manipulation and spectroscopy using scanning probe techniques
  • Place of Presentation: Suita Campus, Osaka University, Japan
  • Year and Date: 2007-08-02
• [Presentation] Atomic manipulation using dynamic force microscopy (2007)
  • Author(s): Yoshiaki, Sugimoto
  • Organizer: Workshop on atomic/molecular manipulation and spectroscopy using scanning probe techniques
  • Place of Presentation: Suita Campus, Osaka University, Japan
  • Year and Date: 2007-08-01
• [Presentation] Mechanical Atom Identification and Following Atom Manipulation for Assembling Compound Nanostructure (2007)
  • Author(s): Seizo, Morita
  • Organizer: ICYS-ICMR Summer School on Nanomaterials 2007
  • Place of Presentation: NIMS Sengen-site, Tsukuba, Japan
  • Year and Date: 2007-06-28
• [Presentation] Drift-compensated data acquisition performed at room temperature with ferquency modulation atomic force microscopy (2007)
  • Author(s): Masayuki, Abe
  • Organizer: 17th International Vacuum Conference
  • Place of Presentation: Stockholm, Sweden
  • Year and Date: 2007-06-02
• [Presentation] Mechanical Atom Identification and Following Atom Manipulation for Assembling Compound Nanostructure (2007)
  • Author(s): Seizo, Morita
  • Organizer: International Confernce on Materials for Advanced Technologies (ICMAT)
  • Place of Presentation: Singapore
  • Year and Date: 2007-06-02
• [Presentation] 原子間力顕微鏡を用いた原子識・粛乍による複素ナノ構造体の組立 (2007)
  • Author(s): 森田清三
  • Organizer: (社)応用物理学会・日本光学会微小光学研究グループ第104回微小光学研究会
  • Place of Presentation: 慶応義塾大学日吉キャンパス来往舎
  • Year and Date: 2007-05-29
• [Presentation] 高分解能・高機能原子間力顕微鏡の進展と今後の展望 (2007)
  • Author(s): 森田清三
  • Organizer: 表面科学会関西支部15周年記念
  • Place of Presentation: 神戸大学百年記念会館兵庫県
  • Year and Date: 2007-05-28
• [Presentation] AFMを用いた力学的元素識別 (2007)
  • Author(s): 杉本宜昭
  • Organizer: 日本顕微鏡学会第63回学術講演会
  • Place of Presentation: 朱鷺メッセ(新潟コンベンションセンター),新潟
  • Year and Date: 2007-05-20
• [Presentation] 原子間力顕微鏡を用いた「交換型垂直原子操作」 (2007)
  • Author(s): 杉本宜昭
  • Organizer: 日本顕微鏡学会第63回学術講演会
  • Place of Presentation: 朱鷺メッセ(新潟コンベンションセンター),新潟
  • Year and Date: 2007-05-20
• [Presentation] 非接触原子間力顕微鏡によるKCI(100)へき開面上での単欠陥水平原子操作 (2007)
  • Author(s): 西竜治
  • Organizer: 日本顕微鏡学会第63回学術講演会
  • Place of Presentation: 朱鷺メッセ(新潟コンベンションセンター),新潟
  • Year and Date: 2007-05-20
• [Presentation] 絶縁体薄膜(Ca,Sr)F_2/Si(ll1)表面上の異種イオン原子識別 (2007)
  • Author(s): 清野宜秀
  • Organizer: 日本真空協会関西支部、平成19年度講演会(第2回)・研究会(第1回)
  • Place of Presentation: 大阪大学吹田キャンパス内、材料開発物性記念館
  • Year and Date: 2007-05-20
• [Presentation] AFMを用いた個々の原子の元素同定 (2007)
  • Author(s): 杉本宜昭
  • Organizer: 日本真空協会関西支部、平成19年度講演会(第2回)・研究会(第1回)
  • Place of Presentation: 大阪大学吹田キャンパス内、材料開発物性記念館
  • Year and Date: 2007-05-20
• [Presentation] Chemical identification of single atoms and following atom manipulati on for assembling compound nanostructures (2007)
  • Author(s): Seizo, Morita
  • Organizer: the International Nanoscience Symposium
  • Place of Presentation: Universitaet Hamburg, Hamburg, Germany
  • Year and Date: 2007-03-31
• [Presentation] Room Temperature Atomic Manipulation Using Dynamic Force Microscopy (2007)
  • Author(s): Y. Sugimoto, M. Abe, O. Custance, S. Morita, P. Pou, P. Jelinek and R. Perez
  • Organizer: The 15th International Colloquium on Scanning Probe Microscopy
  • Place of Presentation: Atagawa, S7-1, Dec.7, 13:15-13:50, Abstract (JSAP Catalog Number:072251) p.16 (Invited)
• [Presentation] Atom-by-Atom Chemical Identification and Following Atom Manipulation Toward Cound Nanostructuring (2007)
  • Author(s): Y. Sugimoto, P. Pou, M. Abe, P. Jelinek, O. Custance, R. Perez and S. Morita
  • Organizer: The 9th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures (ACSIN-9)
  • Place of Presentation: Komaba Research Campus of The University of Tokyo, Tokyo, Japan, Nov.12, Room A 16:00-16:30 12Ap2-1, 2, Program and Abstracts p.64 (Invited)
• [Presentation] Principles and State of the Art of Atomic Force Microscopy (2007)
  • Author(s): Seizo Morita
  • Organizer: 6th International Symposium on Atomic Level Characterizations for New Materials and Devices ’07 (ALC’07)
  • Place of Presentation: Kanazawa Art Hall, Ishikawa, Japan, Tutorial, 16:30～17:30 SuA-4, Oct.28, 2007, Program&Abstract p.4 (Invited)
• [Presentation] Toward atom-by-atom assembly of complex nanostructures at room temperature based on AFM (2007)
  • Author(s): Seizo Morita, Yoshiaki Sugimoto, Oscar Custance, and Masayuki Abe
  • Organizer: The 10^<th> Asia Pacific Physics Conference (APPC10)
  • Place of Presentation: POSCO International Center, POSTECH, Pohang, Korea, , Ac5 16:00-17:45 August 23, 2007, Condensed Matter Physics 5 (Atomic-scale phenomena on surface), 16:00-16:30, Handbook & Abstracts p.74 (Invited)
• [Presentation] Mechanical Atom Identification and Following Atom Manipulation for Assembling Compound Nanostructure (2007)
  • Author(s): Y. Sugimoto, P. Jelinek, P. Pou, O. Custance, M. Abe, R. Perez, S. Morita
  • Organizer: International Conference on Materials for Advanced Technologies (ICMAT) 2007
  • Place of Presentation: Singapore, Symposium G - SPM in materials research, 2 July 2007, 14:30 - 15:15, Abstract Booklet of Symposium G, pp.7-8 (keynote speaker)
• [Presentation] Distinction of individual ionic atom species on (Ca,Sr)F_2/Si)(111) surface (2007)
  • Author(s): Yoshihide Seino
  • Organizer: 2nd International Workshop on Materials Science and Nano-Engineering
  • Place of Presentation: Awaji Yumebutai, Japan
• [Presentation] Force spectroscopy using human interface (2007)
  • Author(s): Masuhiro, Hiragak
  • Organizer: 2nd International Workshop on Materials Science and Nano-Engineering
  • Place of Presentation: Awaji Yumebutai, Japan
• [Presentation] Non-Contact AFM observation of the "Chemical Coordination Effect" of Pb/Si(111)-(〓3×〓3) Mosaic Phase (2007)
  • Author(s): Akihiro, Ohiso
  • Organizer: 2nd International Workshop on Materials Science and Nano-Engineering
  • Place of Presentation: Awaji Yumebutai, Japan
• [Presentation] Potential mapping using non-contact atomic force microscopy (2007)
  • Author(s): Takashi, Narnikawa
  • Organizer: 2nd International Workshop on Materials Science and Nano-Engineering
  • Place of Presentation: Awaji Yumebutai, Japan
• [Presentation] Atomic force microscopy using quartz tuning fork in air (2007)
  • Author(s): Yusuke, Murai
  • Organizer: 2nd International Workshop on Materials Science and Nano-Engineering
  • Place of Presentation: Awaji Yumebutai, Japan
• [Presentation] Characterization of the electrostatic interaction on substitutional Pb at oms at the Si(111)-(7×7) surface using low temperature dynamic force microscopy (2007)
  • Author(s): Yusaku, Yamada
  • Organizer: 2nd International Workshop on Materials Science and Nano-Engineering
  • Place of Presentation: Awaji Yumebutai, Japan
• [Presentation] Atomic force microscopy study of P/Si(001)-(2×1) surface (2007)
  • Author(s): Daisuke, Sawada
  • Organizer: 2nd International Workshop on Materials Science and Nano-Engineering
  • Place of Presentation: Awaji Yumebutai, Japan
• [Book] 原子を見る、測る、動かす 新たな万能ツール、化学のブレークスルー(304ページ)(科学同人編集部編)、PART III「機器分析のブレークスルー」、ISBN 978-4-7598-1466-8 (2011)
  • Author(s): 森田清三
• [Book] 「化学のブレークスルー」(PART III「機器分析のブレークスルー」革新論文と解説「原子を見る、測る、動かす新たな万能ツール」) (2011)
  • Author(s): 森田清三
  • Publisher: 科学同人
• [Book] Noncontact Atomic Force Microscopy Volume 2”, Series: NanoScience and Technology, ISBN:978-3-642-01494-9 (2009)
  • Author(s): Seizo Morita, Franz J. Giessibl, Roland Wiesendanger (Eds.)
  • Publisher: Springer-Verlag
• [Book] Noncontact Atomic Force Microscopy Volume 2 (2009)
  • Author(s): S. Morita, F.J. Giessibl, R. Wiesendanger
  • Total Pages: 401
  • Publisher: Springer-Verlag
• [Book] Noncontact Atomic Force Microscopy Volume 2 (Series : NanoScience and Technology) (2009)
  • Author(s): Seizo Morita
  • Total Pages: 401
  • Publisher: Springer-Verlag
• [Book] 先端計測技術分野科学技術・研究開発の国際比較2008年版「2.国際技術比較、2.1近接場プローブ顕微鏡、2.12中綱目ごとの比較(5)原子間力(AFM)」 (2008)
  • Author(s): 森田清三(分担執筆)
  • Total Pages: 3
  • Publisher: 独立行政法人科学技術振興機構研究開発戦略センター
• [Remarks] 森田研究室 ホームページ
  • URL: http://www.afm.eei.eng.osaka-u.ac.jp/jp/
• [Remarks] 特定領域「機能元素のナノ材料科学」 ホームページ
  • URL: http://www.nanodopant.com/
• [Remarks] 森田清三 : 平成23年春の紫綬褒章(応用物理学の分野)、平成23年6月15日(水)受章発表［発令は4月29日に遡る］、伝達式と皇居(豊明殿)での拝謁は6月29日(水)、東京都 受賞
• [Remarks] 森田清三 : The 2010 IUVSTA Prize for Technology, August 23, 2010, “For outstanding contributions to the development of room temperature atom identification and manipulation using atomic force microscopy”, International Union for Vacuum Science, Technique and Applications (IUVSTA), Award Ceremony was held in the Opening Ceremony at the 18th International Vacuum Congress (IVC-18) in Beijing, China 受賞
• [Remarks] 杉本宜昭、阿部真之、Oscar Custance : the 2009 Feynman Prize for Experimental work、in recognition of their pioneering experimental demonstrations of mechanosynthesis, specifically the use of atomic resolution dynamic force microscopy - also known as non-contact atomic force microscopy (NC-AFM) - for vertical and lateral manipulation of single atoms on semiconductor surfaces, The Feynman Prizes were awarded at Foresight 2010: the Synergy of Molecular Manufacturing and AGI, January 16-17, 2010, Palo Alto, California, USA 受賞
• [Remarks] 森田清三 : 日本学術振興会マイクロビームアナリシス第141委員会第15回2009年度榊特別賞、「ノンコンタクトAFMの開発と原子オーダーでの表面物性の解明」(平成21年9月29日)、賞の授与は第137回研究会［名城大学 名駅サテライトキャンパス(MSAT)］愛知県名古屋市 受賞
• [Remarks] 森田清三(筆頭者)、杉本宜昭、阿部真之、Oscar Custance、平成21年度科学技術分野の文部科学大臣表彰、科学技術賞、研究部門「室温原子間力顕微鏡による多元素系ナノ構造体操作組立の研究」、平成21年4月14日(火)12:00～14:00【表彰式】虎ノ門パストラル新館１階「鳳凰の間」東京都 受賞
• [Remarks] 森田清三 : American Vacuum Society (AVS) , the AVS Albert Nerken Award for 2008, “For the development of room-temperature, non-contact atomic force microscopy technologies and applications”, Awarded at the AVS Awards Assembly during the Symposium in Boston, USA, October 22, 2008 受賞
• [Remarks] 森田清三 : (社)日本顕微鏡学会2007年度学会賞(瀬藤賞)【A：顕微鏡基礎部門(A-1)】「原子間力顕微鏡の高分解能化と原子の識別・操作・組み立てへの応用」(2007年5月21日受賞：平成19年)第63回日本顕微鏡学会、新潟 受賞
• [Remarks]
  • URL: http://www.afm.eei.eng.osaka-u.ac.jp/jp/index.html
• [Remarks]
  • URL: http://www.afm.eei.eng.osaka-u.ac.jp/
• [Remarks]
  • URL: http://www.afm.eei.eng.osaka-u.ac.jp/
• [Remarks]
  • URL: http://www.afm.eei.eng.osaka-u.ac.jp/
• [Remarks]
  • URL: http://www.afm.eei.eng.osaka-u.acjp/jp/index.html
• [Remarks]
  • URL: http://www.afm.eei.eng.osaka-u.ac.jp/jp/index.html
• [Patent(Industrial Property Rights)] 原子間力顕微鏡及びそれを用いた相互作用力測定法 (2008)
  • Inventor(s): 大田昌弘, 大藪範昭, 阿部真之, オスカル・クスタンセ, 杉本宜昭, 森田清三
  • Industrial Property Rights Holder: 株式会社島津製作所および国立大学法人大阪大学
  • Filing Date: 2008-01-07
• [Patent(Industrial Property Rights)] 原子間力顕微鏡及びそれを用した相互作用測定法 (2008)
  • Inventor(s): 大田昌弘, 大藪範昭和, 阿部真之, オスカル・クスタンセ, 杉本宜昭, 森田清三
  • Industrial Property Rights Holder: 株式会社島津製作所および国立大学法人大阪大学
  • Filing Date: 2008-01-07
• [Patent(Industrial Property Rights)] PROBE POSITION CONTROL SYSTEM AND METHOD (2007)
  • Inventor(s): Masayuki Abe, Masahiro Ota, Yoshiaki Sugimoto, Kenichi Morita, Noriaki, Oyabu, Seizo Morita, Oscar Custance
  • Industrial Property Rights Holder: SHIMADZU CORPORATION and OSAKA UNIVERSITY
  • Filing Date: 2007-05-25
  • Overseas
• [Patent(Industrial Property Rights)] PROBE POSITION CONTROL SYSTEM AND METHOD (2007)
  • Inventor(s): Masayuki Abe, Masahiro Ota, Yoshiaki Sugimoto, Kenichi Morita, Noriaki, Oyabu, Seizo Morita, Oscar Custance
  • Industrial Property Rights Holder: SHIMADZU CORPORATION and OSAKA UNIVERSITY
  • Filing Date: 2007-05-24
  • Overseas
• [Patent(Industrial Property Rights)] 探針位置控制系統和方法 (2007)
  • Inventor(s): Masayuki Abe, Masahiro Ota, Yoshiaki Sugimoto, Kenichi Morita, Noriaki, Oyabu, Seizo Morita, Oscar Custance
  • Industrial Property Rights Holder: SHIMADZU CORPORATION and OSAKA UNIVERSITY
  • Filing Date: 2007-05-24
  • Overseas
• [Patent(Industrial Property Rights)] Probe position control system and method (2007)
  • Inventor(s): Masayuki Abe, Masahiro Ohta, Yoshiaki Sugimoto, Kenichi Morita, Noriaki Oyabu, Morita Seizo, Oscar Custace
  • Industrial Property Rights Holder: SHIMADAU, CORPORATION, OSAKA, UNIVERSITY
  • Filing Date: 2007-05-24
  • Overseas
• [Patent(Industrial Property Rights)] 探針位置制御装置及び方法 (2007)
  • Inventor(s): Masayuki Abe, Masahiro Ohta, Yoshiaki Sugimoto, Kenichi Morita, Noriaki Oyabu, Oscar Custace, Seizo Morita
  • Industrial Property Rights Holder: 株式会社島津製作所および国立大学法人大阪大学
  • Filing Date: 2007-05-25
  • Overseas
• [Patent(Industrial Property Rights)] Probe position control system and method (2007)
  • Inventor(s): Masayuki Abe, Masahiro Ohta, Yoshiaki Sugimoto, Kenichi Morita, Noriaki Oyabu, Oscar Custace, Seizo Morita
  • Industrial Property Rights Holder: Shimazu, Corporation, Osaka, University
  • Filing Date: 2007-05-24
  • Overseas