Novel Nanoprobe Method for Investigating of Electrical and Mechanical Properties of Carbon Nanotubes

• Project Area: Carbon nanotube nanoelectronics
• Project/Area Number: 19054010
• Research Category: Grant-in-Aid for Scientific Research on Priority Areas
• Allocation Type: Single-year Grants
• Review Section: Science and Engineering
• Research Institution: Kyoto University
• Principal Investigator: YAMADA Hirofumi 京都大学, 大学院・工学研究科, 准教授 (40283626)
• Co-Investigator(Kenkyū-buntansha): KOBAYASHI Kei 京都大学, 産官学連携本部, 助教 (40335211) ; NODA Kei 京都大学, 工学研究科, 助教 (30372569) ; MIYATO Yuji 大阪大学, 基礎工学研究科, 助教 (80512780) ; 佐藤 宣夫 京都大学, 工学研究科, 助教 (70397602) ; 石田 謙司 神戸大学, 工学研究科, 准教授 (20303860)
• Project Period (FY): 2007 – 2011
• Project Status: Completed (Fiscal Year 2011)
• Budget Amount: ¥77,400,000 (Direct Cost: ¥77,400,000); Fiscal Year 2011: ¥11,500,000 (Direct Cost: ¥11,500,000); Fiscal Year 2010: ¥17,700,000 (Direct Cost: ¥17,700,000); Fiscal Year 2009: ¥17,800,000 (Direct Cost: ¥17,800,000); Fiscal Year 2008: ¥16,200,000 (Direct Cost: ¥16,200,000); Fiscal Year 2007: ¥14,200,000 (Direct Cost: ¥14,200,000)
• Keywords: カーボンナノチューブ / 原子間力顕微鏡(AFM) / ケルビンプローブAFM / 周波数変調(FM)検出法 / 高分解能マルチプローブAFM / 密度勾配遠心分離 / 誘電泳動 / 3次元フォースマップ / 表面電位計測 / AFMポテンショメトリー / 走査ゲート顕微鏡 / 高分解能マルチプローブ技術 / AFMポテンショメトー / 高分解能マルチプローブ計測 / 表面電位 / 点接触AFM

Research Abstract

Nanometer-scale investigations of the electrical characteristics of carbon nanotube (CNT) devices in operation are essentially important for understanding of electrical conduction mechanisms in the devices. We have developed novel high-resolution nanoprobe techniques based on atomic force microscopy such as point-by-point stroboscopic scanning gate microscopy capable of visualizing potential barriers including channel defects and high-frequency electric force microscopy which allows us to measure precise local surface potentials without local charge effects.

Research Products

• [Journal Article] Effect of Trapped Charges on Local Potential Measurement of Carbon Nanotubes Using Frequency-Modulation Kelvin-Probe Force Microscopy (2011)
  • Author(s): M. Ito, Y. Hosokawa, R. Nishi, and Y. Miyato, K. Kobayashi, K. Matsushige and H. Yamada
  • Journal Title: e-Journal of Surface Science and Nanotechnology Volume: 9 Pages: 210-214
  • DOI: 10.1380/ejssnt.2011.210
  • NAID: 130004439278
  • ISSN: 1348-0391
  • Peer Reviewed
• [Journal Article] Development of dual-probe atomic force microscopy system using optical beam deflection sensors with obliquely incident laser beams (2011)
  • Author(s): E. Tsunemi, K. Kobayashi, K. Matsushige, and H. Yamada
  • Journal Title: Rev. Sci. Instrum. Volume: 82 Issue: 3 Pages: 33708-33708
  • DOI: 10.1063/1.3534830
  • NAID: 120004920379
  • Peer Reviewed
• [Journal Article] Atomic-Resolution Imaging of Graphite-Water Interface by Frequency Modulation Atomic Force Microscopy (2011)
  • Author(s): K.Suzuki, N.Oyabu, K.Kobayashi, K.Matsushige, H.Yamada
  • Journal Title: Applied Physics Express Volume: 4 Issue: 12 Pages: 125102-125102
  • DOI: 10.1143/apex.4.125102
  • NAID: 10030154221
  • Peer Reviewed
• [Journal Article] Effect of Trapped Charges on Local Potential Measurement of Carbon Nanotubes Using Frequency-Modulation Kelvin-Probe Force Microscopy (2011)
  • Author(s): M.Ito, Y.Hosokawa, R.Nishi, Y.Miyato, K.Kobayashi, K.Matsushige, H.Yamada
  • Journal Title: e-Journal of Surface Science and Nanotechnology Volume: Vol.9 Pages: 210-214
  • NAID: 130004439278
  • Peer Reviewed
• [Journal Article] Development of dual-probe atomic force microscopy system using optical beam deflection sensors with obliquely incident laser beams (2011)
  • Author(s): E.Tsunemi, K.Kobayashi, K.Matsushige, H.Yamada
  • Journal Title: Rev.Sci.Instrum. Volume: 82 Pages: 33708-33708
  • NAID: 120004920379
  • Peer Reviewed
• [Journal Article] Position Control and Electrical Characterization of Single-Walled Carbon Nanotubes Debundled by Density Gradient Ultracentrifugation (2010)
  • Author(s): K. Kaneko, Y. Miyato, K. Kobayashi, K. Matsushige, and H. Yamada
  • Journal Title: Jpn. J. Appl. Phys. Volume: 49 Issue: 2S Pages: 02BD04-02BD04
  • DOI: 10.1143/jjap.49.02bd04
  • NAID: 210000067975
  • Peer Reviewed
• [Journal Article] Surface Potential Investigation of Carbon Nanotube Field-Effect Transistor by Point-by-Point Atomic Force Microscope Potentiometry (2010)
  • Author(s): Y. Miyato, K. Kobayashi, K. Matsushige, and H. Yamada
  • Journal Title: Jpn. J. Appl. Phys. Volume: 49 Issue: 2S Pages: 02BD03-02BD03
  • DOI: 10.1143/jjap.49.02bd03
  • NAID: 210000067974
  • Peer Reviewed
• [Journal Article] Visualization of anisotropic conductance in polydiacetylene crystal by dual-probe frequency-modulation atomic force microscopy/Kelvin-probe force microscopy (2010)
  • Author(s): E.Tsunemi, K.Kobayashi, K.Matsushige, H.Yamada
  • Journal Title: J.Vac.Sci.Technol.B Volume: 28
  • Peer Reviewed
• [Journal Article] Position Control and Electrical Characterization of Single-Walled Carbon Nanotubes Debundled by Density Gradient Ultracentrifugation (2010)
  • Author(s): K. Kaneko, Y. Miyato, K. Kobayashi, K. Matsushige, H. Yamada
  • Journal Title: Jpn. J. Appl. Phys. 49
  • NAID: 210000067975
  • Peer Reviewed
• [Journal Article] Surface Potential Investigation of Carbon Nanotube Field-Effect Transistor by Point-by-Point Atomic Force Microscope Potentiometry (2010)
  • Author(s): Y. Miyato, K. Kobayashi, K. Matsushige, H. Yamada
  • Journal Title: Jpn. J. Appl. Phys. 49
  • NAID: 210000067974
  • Peer Reviewed
• [Journal Article] Surface Potential Investigation of Carbon Nanotube Field-Effect Transistor by Point-by-Point Atomic Force Microscope Potentiometry (2010)
  • Author(s): Y.Miyato, K.Kobayashi, K.Matsushige, H.Yamada
  • Journal Title: Japanese Journal of Applied Physics Vol.49
  • NAID: 210000067974
  • Peer Reviewed
• [Journal Article] Position Control and Electrical Characterization of Single-Walled Carbon Nanotubes Debundled by Density Gradient Ultracentrifueation (2010)
  • Author(s): K.Kaneko, Y.Miyato, K.Kobayashi, K.Matsushige, H.Yamada
  • Journal Title: Japanese Journal of Applied Physics Vol.49
  • Peer Reviewed
• [Journal Article] True Atomic-Resolution Imaging of (10(1)over-bar4) Calcite in Aqueous Solution by Frequency Modulation Atomic Force Microscopy (2009)
  • Author(s): S. Rode , N. Oyabu, K. Kobayashi, H. Yamada, A. Kuhnle
  • Journal Title: Langmuir Vol.25,5 Pages: 2850-2853
  • Peer Reviewed
• [Journal Article] The effect of local polarized domains of ferroelectric P(VDF/TrFE) copolymer thin film on a carbon nanotube field-effect transistor (2008)
  • Author(s): T. Nishio, Y. Miyato, K. Kobayashi, K. Matsushige and H. Yamada
  • Journal Title: Nanotechnology Volume: 19 Pages: 35202-35202
  • Peer Reviewed
• [Journal Article] Piezoresistive properties of carbon nanotubes under radial force investigated by atomic force microscopy (2008)
  • Author(s): T. Nishio, Y. Miyato, K. Kobayashi, K. Matsushige and H. Yamada
  • Journal Title: Appl. Phys. Lett. Volume: 92 Issue: 6 Pages: 63117-63117
  • DOI: 10.1063/1.2857480
  • NAID: 120001462527
  • Peer Reviewed
• [Journal Article] Piezoresistive properties of carbon nanotubes under radial force investigated by atomic force microscopy (2008)
  • Author(s): T. Nishio, Y. Miyato, K. Kobayashi, K. Matsushige, H. Yamada
  • Journal Title: Applied Physics Letters 92 Pages: 63117-63117
  • NAID: 120001462527
  • Peer Reviewed
• [Journal Article] The effect of local polarized domains of ferroelectric P(VDF/TrFE) copolymer thin film on a carbon nanotube field-effect transistor (2008)
  • Author(s): T. Nishio, Y. Miyato, K. Kobayashi, K. Matsushige, H. Yamada
  • Journal Title: Nanotechnology 19 Pages: 35202-35202
  • Peer Reviewed
• [Journal Article] Small amplitude frequency modulation atomic force microscopy of lead phthalocyanine molecules using cantilever with very high spring constant (2008)
  • Author(s): Y. Hosokawa, T. Ichii, K. Kobayashi, K. Matsushige, H. Yamada
  • Journal Title: Jpn. J. Appl. Phys Vol.47, No.7 Pages: 6125-6127
  • Peer Reviewed
• [Journal Article] The effect oflocal polarized domains of ferroelectric P(VDF/TrFE) copolymer thin film on acarbon nanotube field-effect transistor (2008)
  • Author(s): T. Nishio, Y. Miyato, K. Kobayashi, K. Matsushige and H. Yamada
  • Journal Title: Nanotechnology 19 Pages: 35202-35202
  • Peer Reviewed
• [Journal Article] Piezoresistive properties of carbon nanotubes under radial force investigated by atomic force microscopy (2008)
  • Author(s): T. Nishio, Y. Miyato, K. Kobayashi, K. Matsushige and H. Yamada
  • Journal Title: Appl. Phys. Lett. 92 Pages: 63117-63117
  • NAID: 120001462527
  • Peer Reviewed
• [Journal Article] Submolecular resolution viscoelastic imaging of a poly(p-toluene-sulfonate) single caystal using force modulation microscopy (2008)
  • Author(s): K. Kimura, K. Kobayashi, H. Yamada, K.Matsushige
  • Journal Title: Nanotechnology 19 Pages: 65701-65701
  • Peer Reviewed
• [Presentation] 周波数変調検出方式高周波静電気力顕微鏡法(FM-HF-EFM)によるカーボンナノチューブ上における電位分布計測(2) (2012)
  • Author(s): 伊藤正尚, 池田尚弘, 小林圭, 野田啓, 山田啓文, 松重和美
  • Organizer: 第59回応用物理学関係連合講演会
  • Place of Presentation: 早稲田大学(東京都)
  • Year and Date: 2012-03-16
• [Presentation] 多角的評価に向けたカーボンナノチューブ宙空架橋構造の作製(3) (2012)
  • Author(s): 池田尚弘, 伊藤正尚, 小林圭, 宮戸祐治, 松重和美, 山田啓文
  • Organizer: 第59回応用物理学関係連合講演会
  • Place of Presentation: 早稲田大学(東京都)
  • Year and Date: 2012-03-15
• [Presentation] High-Resolution Surface Potential Imaging of Single-Walled Carbon Nanotubes Using Frequency-Modulation High-Frequency Electrostatic Force Microscopy (2011)
  • Author(s): M.Ito, K.Kobayashi, Y.Miyato, K.Matsushige, H.Yamada
  • Organizer: 2011 Materials Research Society Fall Meeting
  • Place of Presentation: ボストン(アメリカ合衆国)
  • Year and Date: 2011-11-29
• [Presentation] Surface Potential Distribution on Single-walled Carbon Nanotubes Studied by Frequency-Modulation High-Frequency Electrostatic Force Microscopy (2011)
  • Author(s): M.Ito, K.Kobayashi, Y.Miyato, K.Matsushige, H.Yamada
  • Organizer: 5th International Conference on Thin Films (ICTF-15)
  • Place of Presentation: 京都テルサ(京都市)
  • Year and Date: 2011-11-08
• [Presentation] High-resolution surface potential mapping on single-walled carbon nanotubes using frequencymodulation high-frequency electrostatic force microscopy (2011)
  • Author(s): M. Ito, K. Kobayashi, Y. Miyato, K. Matsushige, H. Yamada
  • Organizer: The 14th International Conference on Non-Contact Atomic Force Microscopy (NC-AFM 2011)
  • Place of Presentation: リンダウ, ドイツ
  • Year and Date: 2011-09-20
• [Presentation] High-resolution surface potential mapping on single-walled carbon nanotubes using frequency-modulation high-frequency electrostatic force microscopy (2011)
  • Author(s): M.Ito, K.Kobayashi, Y.Miyato, K.Matsushige, H.Yamada
  • Organizer: The 14th International Conference on Non-Contact Atomic Force Microscopy
  • Place of Presentation: リンダウ(ドイツ)
  • Year and Date: 2011-09-20
• [Presentation] 多角的評価に向けたカーボンナノチューブ宙空架橋構造の作製(2) (2011)
  • Author(s): 池田尚弘, 伊藤正尚, 小林圭, 宮戸祐治, 松重和美, 山田啓文
  • Organizer: 第72回応用物理学関係連合講演会
  • Place of Presentation: 山形大学(山形市)
  • Year and Date: 2011-09-02
• [Presentation] 周波数変調検出方式高周波静電気力顕微鏡法(FM-HF-EFM)によるカーボンナノチューブ上における電位分布計測 (2011)
  • Author(s): 伊藤正尚, 小林圭, 野田啓, 山田啓文, 松重和美
  • Organizer: 第72回応用物理学関係連合講演会
  • Place of Presentation: 山形大学(山形市)
  • Year and Date: 2011-09-02
• [Presentation] カーボンナノチューブの表面電位の定量解析法 (2011)
  • Author(s): 西立司, 伊藤正尚, 宮戸祐治, 大藪範昭, 小林圭, 山田啓文
  • Organizer: 第58回応用物理学関係連合講演会
  • Place of Presentation: 神奈川工科大学(神奈川県)
  • Year and Date: 2011-03-27
• [Presentation] 多角的評価に向けたカーボンナノチューブ宙空架橋構造の作製 (2011)
  • Author(s): 宮戸祐治, 池田尚弘, 小林圭, 松重和美, 山田啓文
  • Organizer: 第58回応用物理学関係連合講演会
  • Place of Presentation: 神奈川工科大学(神奈川県)
  • Year and Date: 2011-03-27
• [Presentation] 3-D potential mapping on CN-FETs by atomic force microscopy (2010)
  • Author(s): R. Nishi, Y. Miyato, N. Oyabu, K. Kobayashi, K. Matsushige, H. Yamada
  • Organizer: Pacifi Chem 2010
  • Place of Presentation: ハワイ, アメリカ合衆国
  • Year and Date: 2010-12-17
• [Presentation] Characterization of defects and potential barriers in carbon nanotube field effect transistors using AFM (2010)
  • Author(s): Y.Miyato, K.Kobayashi, K.Matsushige, H.Yamada
  • Organizer: PacifiChem 2010
  • Place of Presentation: ハワイ(アメリカ合衆国)
  • Year and Date: 2010-12-17
• [Presentation] 3-D potential mapping on CN-FETs by atomic force microscopy (2010)
  • Author(s): R.Nishi, Y.Miyato, N.Oyabu, K.Kobayashi, K.Matsushige, H.Yamada
  • Organizer: PacifiChem 2010
  • Place of Presentation: ハワイ(アメリカ合衆国)
  • Year and Date: 2010-12-17
• [Presentation] ケルビンプローブ原子間力顕微鏡を用いたカーボンナノチューブ上の表面/空間電位分布測定 (2010)
  • Author(s): 伊藤正尚, 西立司, 細川義浩, 宮戸祐治, 小林圭, 山田啓文, 松重和美
  • Organizer: 第71回応用物理学関係連合講演会
  • Place of Presentation: 長崎大学(長崎県)
  • Year and Date: 2010-09-17
• [Presentation] 簡易真空下における探針-試料間相互作用力・トンネル電流同時検出 (2010)
  • Author(s): 宮戸祐治, 小林圭, 松重和美, 山田啓文
  • Organizer: 第71回応用物理学関係連合講演会
  • Place of Presentation: 長崎大学(長崎県)
  • Year and Date: 2010-09-16
• [Presentation] バイアス-フォースカーブ法によるナノワイヤー試料上における3次元静電気力計測 (2010)
  • Author(s): 西立司, 宮戸祐治, 大藪範昭, 小林圭, 松重和美, 山田啓文
  • Organizer: 第71回応用物理学関係連合講演会
  • Place of Presentation: 長崎大学(長崎県)
  • Year and Date: 2010-09-16
• [Presentation] Development of multi-environment dual-probe AFM with optical beam deflection sensors (2010)
  • Author(s): E.Tsunemi, N.oyabu, K.Kobayashi, K.matsushige, H.yamada
  • Organizer: International Conference on Nanoscience and Technology
  • Place of Presentation: 北京(中華人民共和国)
  • Year and Date: 2010-08-07
• [Presentation] Local potential mapping on carbon nanotube transistors using frequency-modulation Kelvin-probe force microscopy (2010)
  • Author(s): M.Ito, Y.Hosokawa, R.Nishi, Y.Miyato, K.Kobayashi, K.Matsushige, H.Yamada
  • Organizer: 13th International Conference on Non-Contact Atomic Force Microscopy
  • Place of Presentation: 金沢(石川県)
  • Year and Date: 2010-08-02
• [Presentation] Potential Barriers of Carbon Nanotube FETs Investigated by Scanning Gate Microscopy and AFM Potentiometry (2010)
  • Author(s): Y.Miyato, K.Kobayashi, K.Matsushige, H.Yamada
  • Organizer: 11th International Conference of the Science and Application of Nanotubes
  • Place of Presentation: モントリオール(カナダ)
  • Year and Date: 2010-06-28
• [Presentation] ストロボ走査型ゲート顕繍によるかボンナイチープの欠陥評価 (2010)
  • Author(s): 宮戸祐治, 小林圭, 松重和美, 山田啓文
  • Organizer: 第57回応用物理学関係連合講演会
  • Place of Presentation: 東海大学
  • Year and Date: 2010-03-20
• [Presentation] バイアス-フォースカーブ法によるCN-FETデバイス上における3次元静電気カマッピング (2010)
  • Author(s): 西立司, 宮戸祐治, 大藪範昭, 小林圭, 松重和美, 山田啓文
  • Organizer: 第57回応用物理学関係連合講演会
  • Place of Presentation: 東海大学
  • Year and Date: 2010-03-19
• [Presentation] 密度勾配超遠心分離法による(6,5)SWNTの単離とその配向制御および電気特性評 (2010)
  • Author(s): 金子勝弘, 宮戸祐治, 小林圭, 松重和美, 山田啓文
  • Organizer: 第57回応用物理学関係連合講演会
  • Place of Presentation: 東海大学
  • Year and Date: 2010-03-18
• [Presentation] AFM Characterization of Carbon Nanotube FETs Fabricated by Dielectrophoresis Method Using Density Gradient Ultracentrifugation Process (2009)
  • Author(s): Y. Miyato, K. Kobayashi, K. Matsushige, H. Yamada
  • Organizer: 2009 Materials Research Society Fall Meeting
  • Place of Presentation: ボストン, アメリカ合衆国
  • Year and Date: 2009-12-01
• [Presentation] AFM Characterization of Carbon Nanotube FETs Fabricated by Dielectrophoresis Method Using Density Gradient Ultracentrifugation Process (2009)
  • Author(s): Y.Miyato, K.Kobayashi, K.Matsushige, H.Yamada
  • Organizer: 2009 Materials Research Society Fall Meeting
  • Place of Presentation: Boston, USA
  • Year and Date: 2009-12-01
• [Presentation] P-SGMによるSWNTにおける時分解局所ゲート応答測定 (2009)
  • Author(s): 宮戸祐治, 西立司, 金子勝弘, 小林圭, 松重和美, 山田啓文
  • Organizer: 第70回応用物理学関係連合講演会
  • Place of Presentation: 富山大学
  • Year and Date: 2009-09-10
• [Presentation] 密度勾配遠心分離法により孤立・分離処理したSWNTの配向制御と電気特性評価(2) (2009)
  • Author(s): 金子勝弘, 宮戸祐治, 小林圭, 松重和美, 山田啓文
  • Organizer: 第70回応用物理学関係連合講演会
  • Place of Presentation: 富山大学
  • Year and Date: 2009-09-10
• [Presentation] カーボンナノチューブ上における3次元バイアス-フォースカーブ・マッピング (2009)
  • Author(s): 西立司, 金子勝弘, 宮戸祐治, 大藪範昭, 小林圭, 松重和美, 山田啓文
  • Organizer: 第70回応用物理学関係連合講演会
  • Place of Presentation: 富山大学
  • Year and Date: 2009-09-09
• [Presentation] Local Defects of SWNTs Investigated by Scanning Gate Microscopy and AFM Potentiometory (2009)
  • Author(s): Y.Miyato, K.Kobayashi, K.Matsushige, H.Yamada
  • Organizer: International Symposium on Carbon Nanotube Nanoelectronics (CNTNE 2009)
  • Place of Presentation: Matsushima, Miyagi
  • Year and Date: 2009-06-11
• [Presentation] Position control and electrical characterization of isolated SWNTs separated by density eradient centrifugation (2009)
  • Author(s): K.Kaneko, K.Kobayashi, K.Matsushige, H.Yamada
  • Organizer: International Symposium on Carbon Nanotube Nanoelectronics (CNTNE 2009)
  • Place of Presentation: Matsushima, Miyagi
  • Year and Date: 2009-06-10
• [Presentation] Carrier Injection from Schottky Barrier of CN-FETs Investigated by AFM Potentiometory (2008)
  • Author(s): Y. Miyato, K. Kobayashi, K. Matushige, H. Yamada
  • Organizer: International Symposium on Surface Science and Nanotechnology
  • Place of Presentation: Tokyo
  • Year and Date: 2008-11-12
• [Presentation] Carrier Injection from Schottky Barrier of CN-FETs Investigated by AFM Potentiometory (2008)
  • Author(s): Y. Miyato, K. Kobayashi, K. Matushige, H. Yamada
  • Organizer: International Symposium on Surface Science and Nanotechnology (ISSS-5)
  • Place of Presentation: Tokyo
  • Year and Date: 2008-11-12
• [Presentation] Local Electrical Measurement of Organic Thin Films with Two-probe AFM/ICFM (2008)
  • Author(s): E. Tsunemi, N. Satoh, K. Kobayashi, K. Matsushige, H. Yamada
  • Organizer: International Symposium on Surface Science and Nanotechnology (ISSS-5)
  • Place of Presentation: Tokyo
  • Year and Date: 2008-11-10
• [Presentation] Frequency Modulation Atomic Force Microscopy as a Nano-measurement Tool (2008)
  • Author(s): H. Yamada
  • Organizer: 21st International Microprocesses and Nanotechnology Conference
  • Place of Presentation: Fukuoka
  • Year and Date: 2008-10-29
• [Presentation] 界面活性剤SDSにより孤立化したSWNTの配向制御とその電気特性評価 (2008)
  • Author(s): 金子勝弘, 宮戸祐治, 小林圭, 松重和美, 山田啓文
  • Organizer: 第69回応用物理学関係連合講演会
  • Place of Presentation: 中部大学
  • Year and Date: 2008-09-05
• [Presentation] 電気伝導時のSWNT-電極接触界面における局所的電位評価 (2008)
  • Author(s): 宮戸祐治, 小林圭, 松重和美, 山田啓文
  • Organizer: 第69回応用物理学関係連合講演会
  • Place of Presentation: 中部大学
  • Year and Date: 2008-09-05
• [Presentation] Surface Potential Measurements of CN-FETs by AFM Potentiometory (2008)
  • Author(s): Y. Miyato, K. Kobayashi, K. Matsushige, H. Yamada
  • Organizer: International Conference of the Science and Application of Nanotubes
  • Place of Presentation: モンペリエ, フランス
  • Year and Date: 2008-07-01
• [Presentation] Surface Potential Measurements of CN-FETs by AFM Potentiometory (2008)
  • Author(s): Y. Miyato, K. Kobayashi, K. Matsushige, H. Yamada
  • Organizer: 9th International Conference of the Science and Application of Nanotubes
  • Place of Presentation: Montpellier, France
  • Year and Date: 2008-07-01
• [Presentation] 金属電極に架橋したオリゴチオフェン分子薄膜のFM-KFM表面電位測定 (2008)
  • Author(s): 小野山有亮, 小林 圭, 佐藤宣夫, 松重和美, 山田啓文
  • Organizer: 2008年春季 第55回応用物理学関係連合講演会
  • Place of Presentation: 日本大学
  • Year and Date: 2008-03-28
• [Presentation] Point-by-point AFMPによるCN-FETの表面電位測定 (2008)
  • Author(s): 宮戸祐治, 小林圭, 松重和美, 山田啓文
  • Organizer: 2008年春季 第55回応用物理学関係連合講演会
  • Place of Presentation: 日本大学
  • Year and Date: 2008-03-27
• [Presentation] 誘電泳動により配向制御した孤立単層カーボンナノチューブの電子物性評価 (2008)
  • Author(s): 金子 勝弘, 宮戸 祐治, 小林 圭, 松重 和美、山田 啓文
  • Organizer: 2008年春季 第55回応用物理学関係連合講演会
  • Place of Presentation: 日本大学
  • Year and Date: 2008-03-27
• [Presentation] 原子間力顕微鏡によるバリスティック伝導時のSWNT表面電位評価 (2008)
  • Author(s): 宮戸 祐治, 小林 圭, 松重 和美, 山田 啓文
  • Organizer: 第34回フラーレン・ナノチューブ総合シンポジウム
  • Place of Presentation: 名城大学
  • Year and Date: 2008-03-05
• [Presentation] Surface Potential Investigations of Single-Wall Carbon Nanotubes Connecting Nanogap Electrodes by Atomic Force Microscopy (2008)
  • Author(s): Y. Miyato, K. Kobayashi, H. Yamada
  • Organizer: International Carbon Nanotube Conference in NU
  • Place of Presentation: 名古屋大学
  • Year and Date: 2008-02-14
• [Presentation] Surface Potential Investigations of Single-Wall Carbon Nanotubes Connecting Nanogap Electrodes by Point-by-point AFM Potentiometry (2007)
  • Author(s): Y. Miyato, K. Kobayashi, K. Matsushige and H. Yamada
  • Organizer: The 15th International Colloquium on Scanning Probe Microscopy
  • Place of Presentation: 熱川ハイツ
  • Year and Date: 2007-12-08
• [Presentation] Surface Potential Mapping of Carbon Nanotube Field Effect Transistor by Kelvin Probe Force Microscopy and AFM Potentiometry (2007)
  • Author(s): Y. Miyato, K. Kobayashi, K. Matsushige and H. Yamada
  • Organizer: 2007 Materials Research Society Fall Meeting
  • Place of Presentation: ボストン, アメリカ合衆国
  • Year and Date: 2007-11-30
• [Presentation] Surface Potential Mapping of Carbon Nanotube Field Effect Transistor by Kelvin Probe Force Microscopy and AFM Potentiometry (2007)
  • Author(s): Y. Miyato, K. Kobayashi, K. Matsushige and H. Yamada
  • Organizer: Materials Research Society 2007 Fall Meeting
  • Place of Presentation: Boston, USA
  • Year and Date: 2007-11-30
• [Presentation] Surface Potential Mapping of Single-Wall Carbon Nanotubes bridging Nanogap Electrodes by Kelvin Probe Force Microscopy and AFM Potentiometry (2007)
  • Author(s): Y. Miyato, K. Kobayashi, K. Matsushige and H. Yamada
  • Organizer: JST Joint International Symposium, CREST Workshop on Molecular Nano-Electronic Devices
  • Place of Presentation: 京大会館
  • Year and Date: 2007-11-20
• [Presentation] Surface Potential Mapping of Single Wall Carbon Nanotubes Connected to Nanogap electrodes by Kelvin probe Force Microscopy and AFM Potentiometry (2007)
  • Author(s): Y. Miyato, K. Kobayashi, K. Matsushige and H. Yamada
  • Organizer: 9th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures
  • Place of Presentation: 東京大学
  • Year and Date: 2007-11-12
• [Presentation] Investigation of local surface potential on highly ordered organic semiconductor film (2007)
  • Author(s): Y. Onoyama, K. Kobayashi, N. Satoh, K. Matsushige, H. Yamada
  • Organizer: Korea-Japan Joint Forum 2007 (KJF 2007)
  • Place of Presentation: Seoul, Korea
  • Year and Date: 2007-09-27
• [Presentation] Point-contact AFMを用いたSWNTの電流に対する局所応力依存性マッピング (2007)
  • Author(s): 宮戸 祐治, 西尾 太一, 小林 圭, 松重 和美, 山田 啓文
  • Organizer: 2007年秋季 第68回応用物理学会学術講演会
  • Place of Presentation: 北海道工業大学
  • Year and Date: 2007-09-08
• [Presentation] ナノギャップ電極に架橋したSWNTの表面電位評価 (2007)
  • Author(s): 宮戸 祐治, 小林 圭, 松重 和美, 山田 啓文
  • Organizer: 2007年秋季 第68回応用物理学会学術講演会
  • Place of Presentation: 北海道工業大学
  • Year and Date: 2007-09-07
• [Book] 第1章走査プローブ技術-分子エレクトロニクスを縁の下から支える走査プローブ顕微鏡-, 「分子エレクトロニクスの基盤技術と将来展望」(松重和美・田中一義・和田恭雄 監修) (2009)
  • Author(s): 宮戸祐治、山田啓文、松重和美
  • Publisher: シーエムシー出版
• [Remarks]
  • URL: http://piezo.kuee.kyoto-u.ac.jp/jp/research/cnt
• [Remarks]
  • URL: http://piezo.kuee.kyoto-u.ac.jp/jp/research/cnt
• [Remarks]
  • URL: http://piezo.kuee.kyoto-u.ac.jp/jp/research/cnt
• [Patent(Industrial Property Rights)] 分子デバイス及びその製造方法 (2011)
  • Inventor(s): 宮戸祐治, 小林圭, 山田啓文, 松重和美
  • Industrial Property Rights Holder: 国立大学法人京都大学
  • Acquisition Date: 2011-08-11