Novel Nanoprobe Method for Investigating of Electrical and Mechanical Properties of Carbon Nanotubes
| Project Area | Carbon nanotube nanoelectronics |
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| Project/Area Number |
19054010
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| Research Category |
Grant-in-Aid for Scientific Research on Priority Areas
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| Allocation Type | Single-year Grants |
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| Review Section |
Science and Engineering
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| Research Institution | Kyoto University |
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Principal Investigator |
YAMADA Hirofumi 京都大学, 大学院・工学研究科, 准教授 (40283626)
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| Co-Investigator(Kenkyū-buntansha) |
KOBAYASHI Kei 京都大学, 産官学連携本部, 助教 (40335211)
NODA Kei 京都大学, 工学研究科, 助教 (30372569)
MIYATO Yuji 大阪大学, 基礎工学研究科, 助教 (80512780)
佐藤 宣夫 京都大学, 工学研究科, 助教 (70397602)
石田 謙司 神戸大学, 工学研究科, 准教授 (20303860)
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| Project Period (FY) |
2007 – 2011
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| Project Status |
Completed (Fiscal Year 2011)
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| Budget Amount *help |
¥77,400,000 (Direct Cost: ¥77,400,000)
Fiscal Year 2011: ¥11,500,000 (Direct Cost: ¥11,500,000)
Fiscal Year 2010: ¥17,700,000 (Direct Cost: ¥17,700,000)
Fiscal Year 2009: ¥17,800,000 (Direct Cost: ¥17,800,000)
Fiscal Year 2008: ¥16,200,000 (Direct Cost: ¥16,200,000)
Fiscal Year 2007: ¥14,200,000 (Direct Cost: ¥14,200,000)
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| Keywords | カーボンナノチューブ / 原子間力顕微鏡(AFM) / ケルビンプローブAFM / 周波数変調(FM)検出法 / 高分解能マルチプローブAFM / 密度勾配遠心分離 / 誘電泳動 / 3次元フォースマップ / 表面電位計測 / AFMポテンショメトリー / 走査ゲート顕微鏡 / 高分解能マルチプローブ技術 / AFMポテンショメトー / 高分解能マルチプローブ計測 / 表面電位 / 点接触AFM |
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| Research Abstract |
Nanometer-scale investigations of the electrical characteristics of carbon nanotube (CNT) devices in operation are essentially important for understanding of electrical conduction mechanisms in the devices. We have developed novel high-resolution nanoprobe techniques based on atomic force microscopy such as point-by-point stroboscopic scanning gate microscopy capable of visualizing potential barriers including channel defects and high-frequency electric force microscopy which allows us to measure precise local surface potentials without local charge effects.
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Report
(7 results)
Research Products
(76 results)
