| Co-Investigator(Kenkyū-buntansha) |
藤平 哲也 大阪大学, 基礎工学研究科, 准教授 (00463878)
石川 亮 東京大学, 大学院工学系研究科(工学部), 助教 (20734156)
栃木 栄太 東京大学, 大学院工学系研究科(工学部), 助教 (50709483)
溝口 照康 東京大学, 生産技術研究所, 准教授 (70422334)
佐藤 幸生 九州大学, 工学(系)研究科(研究院), 准教授 (80581991)
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| Budget Amount *help |
¥162,890,000 (Direct Cost: ¥125,300,000、Indirect Cost: ¥37,590,000)
Fiscal Year 2017: ¥18,460,000 (Direct Cost: ¥14,200,000、Indirect Cost: ¥4,260,000)
Fiscal Year 2016: ¥30,030,000 (Direct Cost: ¥23,100,000、Indirect Cost: ¥6,930,000)
Fiscal Year 2015: ¥35,620,000 (Direct Cost: ¥27,400,000、Indirect Cost: ¥8,220,000)
Fiscal Year 2014: ¥37,960,000 (Direct Cost: ¥29,200,000、Indirect Cost: ¥8,760,000)
Fiscal Year 2013: ¥40,820,000 (Direct Cost: ¥31,400,000、Indirect Cost: ¥9,420,000)
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| Outline of Final Research Achievements |
In this project, we explored new frontiers of nano-dopant analysis using atomic-resolution scanning transmission electron microscopy (STEM). By developing new STEM techniques and applying them to the characterization of nano-dopant structures on surfaces, grain boundaries, dislocations and point defects of oxides and nitrides, we have succeeded in obtaining new structural information of nano-dopants at atomic dimensions. These results are shared with other groups and used for understanding structure-property relationships of nano-dopants inside materials. In addition, we developed a new technique called “grain boundary informatics,” which can predict stable grain boundary structures very efficiently using machine learning techniques.
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