| Budget Amount *help |
¥124,280,000 (Direct Cost: ¥95,600,000、Indirect Cost: ¥28,680,000)
Fiscal Year 2017: ¥28,470,000 (Direct Cost: ¥21,900,000、Indirect Cost: ¥6,570,000)
Fiscal Year 2016: ¥23,530,000 (Direct Cost: ¥18,100,000、Indirect Cost: ¥5,430,000)
Fiscal Year 2015: ¥25,350,000 (Direct Cost: ¥19,500,000、Indirect Cost: ¥5,850,000)
Fiscal Year 2014: ¥23,530,000 (Direct Cost: ¥18,100,000、Indirect Cost: ¥5,430,000)
Fiscal Year 2013: ¥23,400,000 (Direct Cost: ¥18,000,000、Indirect Cost: ¥5,400,000)
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| Outline of Final Research Achievements |
We developed some tips of test element groups(TEGs) for X-ray counting-type pixel sensor, based on the SOI（Silicon On Insulator）technology. We evaluated the TEGs using synchrotron X-rays, and the charge comparing circuit and the thin structure for detecting soft X-rays were successfully confirmed by the experiments. We also used the SOPHIAS detector that was developed by the C01 group, for synchrotron X-ray experiments of the X-ray small scattering and of the X-ray diffraction. A new phase of a polymer material was surely determined by using a fine pixel size of 30 μm of the SOPHIAS detector.
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