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Ultra-Fine Surface Analysis by a Combined Instrument of an STM and A-P

Research Project

Project/Area Number 01460211
Research Category

Grant-in-Aid for General Scientific Research (B)

Allocation TypeSingle-year Grants
Research Field Physical properties of metals
Research InstitutionTokyo Institute of Technology

Principal Investigator

NISHIKAWA Osamu  Tokyo Inst. Technol., Mat. Sci. Eng., Professor, 大学院・総合理工学研究科, 教授 (10108235)

Co-Investigator(Kenkyū-buntansha) TOMITORI Masahiko  Tokyo Inst. Technol., Mat. Sci. Eng., Research Asso., 総合理工学研究科, 助手 (10188790)
Project Period (FY) 1989 – 1990
Project Status Completed (Fiscal Year 1990)
Budget Amount *help
¥7,200,000 (Direct Cost: ¥7,200,000)
Fiscal Year 1990: ¥4,300,000 (Direct Cost: ¥4,300,000)
Fiscal Year 1989: ¥2,900,000 (Direct Cost: ¥2,900,000)
KeywordsScanning Tunneling Microscope (STM) / Atom-Probe (A-P) / Si cluster / Scanning Tunneling Spectroscopy (STS) / Tip Apex / Surface / Field Emission Electron Spectrometer (FEES) / STM・A-P複合器 / 電子の状態密度 / 二極走査型トンネル映像法(DPTI) / 走査探針先端 / 電流映像型トンネル電子分光法(CITS)
Research Abstract

The surface study utilizing the unique capability of a scanning tunneling microscope (STM) with atomically high resolution has made us realize that the tunneling characteristics of the STM strongly depend on the structure and composition of the apex of a scanning tip and that the promotion of the surface study with the STM requires the clarification of the tip profile. Then we have realized that an atom-probe (A-P) would be the most suitable instrument for clarifying the apex profile because it can directly image the atomic arrangement and mass analyze individual apex atoms. Accordingly, the outcomes of this research are :
(1) Development of a combined instrument of an ultra-high vacuum STM and an A-P.
(2) Development of scanning tunneling spectroscopy (STS) to investigate the electronic states of individual surface atoms of surfaces.
(3) Installation of a field emission electron spectrometer (FEES) to energy analyze the field emitted electrons from the tip apex. The FEES study successfully demonstrated the variation of the electronic states of metal tip apexes by hydrogen adsorption and a Si cluster of a few atoms.
(4) Systematic analysis of the correlation between STM images, STS spectra and the profile of tip apexes. The study clarified that plural apex atoms participating in the electron tunneling generates anomalous ordered STM images and STS spectra varies with the cone angle of the tip apex.
The present study suggests that the clarification of the apex profiles is the fundamental requirement for obtaining the reproducible, reliable data with STM and STS. The study is extending over various materials from metals, semiconductors, ceramics to conductive polymers.

Report

(3 results)
  • 1990 Annual Research Report   Final Research Report Summary
  • 1989 Annual Research Report
  • Research Products

    (27 results)

All Other

All Publications (27 results)

  • [Publications] O.Nishikawa,M.Tomitori,F.Iwawaki and N.Hirano: "Correlation Between Scanning Tunneling Microscopy/Spectroscopy Images Apex Profiles of Scanning Tips" J.Vac.Sci.Technol.A. 8. 421-424 (1990)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1990 Final Research Report Summary
  • [Publications] M.Tomitori,N.Hirano,F.Iwatani,Y.Watanabe,T.Takayanagi and O.Nishikawa: "Eleboration and Evaluation of Tip Manupulation of Scanning Tunneling Microscopy" J.Vac.Sci.Technol.A. 8. 425-428 (1990)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1990 Final Research Report Summary
  • [Publications] O.Nishikawa,H.Koyama and M.Tomitori: "Work Function, Field Emitted Electron Energy Spectrum and Surface Composition of Silicon Covered Molybdenum" Surf.Sci.

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1990 Final Research Report Summary
  • [Publications] O.Nishikawa,H.Koyama,M.Tomitori and F.Iwawaki: "Tunneling Characteristics of Silicon Covered Molybdenum Tip Apex" J.Vac.Sci.Technol.A.

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1990 Final Research Report Summary
  • [Publications] F.Iwawaki,M.Tomitori and O.Nishikawa: "STM/STS Observation of Step Structures of Si(001) and (111) Surfaces" J.Vac.Sci.Technol.A.

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1990 Final Research Report Summary
  • [Publications] O.Nishikawa,M.Tomitori and F.Iwawaki: "Atomic Configurations of Tip Apexes and Scanning Tunneling Microscopy/Spectroscopy" Materials Sci.Engineering.

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1990 Final Research Report Summary
  • [Publications] O. Nishikawa, M. Tomitori, F. Iwawaki and F. Katsuki: "Image Quality of STM and Apex Profile of a Scanning Tip" Colloque de Physique. Vol. 50,. C8-217 (1989)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1990 Final Research Report Summary
  • [Publications] O. Nishikawa, H. Koyama, N. Kodama and M. Tomitori: "The Atom-Probe with a Field Emission Electron Spectrometer" Colloque de Physique. Vol. 50,. C8-507 (1989)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1990 Final Research Report Summary
  • [Publications] O. Tomitori, F. Iwawaki, N. Hirano, F. Katsuki and o Nishikawa :"Corrugation of Si Surfaces and Profiles of Tip Apexes" J. Vac. Sci. Technol. A. Vol. 8,. 222 (1990)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1990 Final Research Report Summary
  • [Publications] O. Nishikawa, M. Tomitori, F. Iwawaki and N. Hirano: "Correlation Between Scanning Tunneling Microscopy/Spectroscopy Images and Apex Profiles of Scanning Tips" J. Vac. Sci. Technol. A. Vol. 8,. 421 (1990)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1990 Final Research Report Summary
  • [Publications] M. Tomitori, N. Hirano, F. Iwawaki, Y. Watanabe, T. Takayanagi and O. Nishikawa :"Eleboration and Evaluation of Tip Manipulation of Scanning Tunneling Microscopy" J. Vac. Sci. Technol. A. Vol. 8,. 425 (1990)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1990 Final Research Report Summary
  • [Publications] O. Nishikawa, H. Koyama and M. Tomitori : Work Function: "Field Emitted Electron Energy Spectrum and Surface Composition of Silicon Covered Molybdenum," Surf. Sci.(1991)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1990 Final Research Report Summary
  • [Publications] O. Nishikawa, H. Koyama, M. Tomitori and F. Iwawaki: "Tunneling Characteristics of Silicon Covered Molybdenum Tip Apex" J. Vac. Sci. Technol. A. (1991)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1990 Final Research Report Summary
  • [Publications] F. Iwawaki, M. Tomitori and O. Nishikawa :"STM/STS Observation of Step Structures of Si (001) and (111) Surfaces" J. Vac. Sci. Technol. A. (1991)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1990 Final Research Report Summary
  • [Publications] O. Nishikawa, M. Tomitori and F. Iwawaki :"Atomic Con-figurations of Tip Apexes and Scanning Tunneling Microscopy/Spectroscopy" Materials Sci. Engineering. (1991)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1990 Final Research Report Summary
  • [Publications] F. Iwawaki, M. Tomitori and O. Nishikawa :"STM Study of Epitaxial Growth of Ge on Si (001)"

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1990 Final Research Report Summary
  • [Publications] O.Nishikawa,M.Tomitori,F.Iwawaki and N.Hirano: "Correlation Between Scanning Tunneling Microscopy/Spectroscopy Images and Apex Profiles of Scanning Tips" J.Vac.Sci.Technol.A. 8. 421-424 (1990)

    • Related Report
      1990 Annual Research Report
  • [Publications] M.Tomitori,N.Hirano,F.Iwawaki,Y.Watanabe,T.Takayanagi and O.Nishikawa: "Eleboration and Evaluation of Tip Manupulation of Scanning Tunneling Microscopy" J.Vac.Sci.Technol.A. 8. 425-428 (1990)

    • Related Report
      1990 Annual Research Report
  • [Publications] O.Nishikawa,H.Koyama and M.Tomitori: "Work Function,Field Emitted Electron Energy Spectrum and Surface Composition of Silicon Covered Molybdenum" Surf.Sci.

    • Related Report
      1990 Annual Research Report
  • [Publications] O.Nishikawa,H.Koyama,M.Tomitori and F.Iwawaki: "Tunneling Characteristics of Silicon Covered Molybdenum Tip Apex" J.Vac.Sci.Technol.A.

    • Related Report
      1990 Annual Research Report
  • [Publications] F.Iwawaki,M.Tomitori and O.Nishikawa: "STM/STS Observation of Step Structres of Si(001) and (111) Surfaces" J.Vac.Sci.Technol.A.

    • Related Report
      1990 Annual Research Report
  • [Publications] O.Nishikawa,M.Tomitori and F.Iwawaki: "Atomic Configurations of Tip Apexes and Scanning Tunneling Microscopy/Spectroscopy" Materials Sci.Engineering.

    • Related Report
      1990 Annual Research Report
  • [Publications] O.Nishikawa,M.Tomitori,F.Iwawaki and F.Katsuki: "Image Quality of STM and Apex Profile of a Scanning Tip" Colloque de Physique. 50-C8. 217-222 (1989)

    • Related Report
      1989 Annual Research Report
  • [Publications] O.Nishikawa,H.Koyama,N.Kodama and M.Tomitori: "The Atom-PROBE with a Field Emission Electron Spectrometer" Colloque de Physique. 50-C8. 507-512 (1989)

    • Related Report
      1989 Annual Research Report
  • [Publications] M.Tomitori,F.Iwawaki,N.Hirono,F.Katsuki and O.Nishikawa: "Corrugation of Si Surfaces and Profiles of Tip Apexes" J.Vacuum Science and Technology. A8. 222-225 (1990)

    • Related Report
      1989 Annual Research Report
  • [Publications] O.Nishikawa,M.Tomitori,F.Iwawaki,and N.Hirano: "Correlation beteween STM/STS Images and Apex Profiles of Scanning Tips" J.Vacuum Science and Technology. A8. 421-424 (1990)

    • Related Report
      1989 Annual Research Report
  • [Publications] M.Tomitori,N.Hirono,F.Iwawaki,Y.Watanabe,T.Takayanagi and O.Nishikawa: "Elaboration and Evaluation of Tip Manupulation of STM" J.Vacuum Science and Technology. A8. 425-428 (1990)

    • Related Report
      1989 Annual Research Report

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Published: 1989-04-01   Modified: 2016-04-21  

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