Development of Ultraviolet Photoelectron Spectrometer Working in Air Atmosphere
| Project/Area Number |
01840025
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| Research Category |
Grant-in-Aid for Developmental Scientific Research
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| Allocation Type | Single-year Grants |
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| Research Field |
分析・地球化学
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| Research Institution | Osaka University |
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Principal Investigator |
YOKOYAMA Yu Dept. Chemistry. Fac. Science Osaka Univ., Prof., 理学部, 教授 (10028095)
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| Co-Investigator(Kenkyū-buntansha) |
FUKUMOTO Takao Dept. Chemistry, Fac. Science Osaka Univ., Tech. Official, 理学部, 教務員 (10199268)
MONJUSHIRO Hideki Dept. Chemistry, Fac. Science Osaka Univ., Assistant, 理学部, 助手 (80191071)
HINOUE Teruo Dept. Chemistry, Fac. Science Osaka Univ., Assistant, 理学部, 助手 (50143821)
WATANABE Iwao Dept. Chemistry, Fac. Science Osaka Univ., Associate Prof., 理学部, 助教授 (50028239)
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| Project Period (FY) |
1989 – 1991
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| Project Status |
Completed (Fiscal Year 1991)
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| Budget Amount *help |
¥9,000,000 (Direct Cost: ¥9,000,000)
Fiscal Year 1991: ¥600,000 (Direct Cost: ¥600,000)
Fiscal Year 1990: ¥2,200,000 (Direct Cost: ¥2,200,000)
Fiscal Year 1989: ¥6,200,000 (Direct Cost: ¥6,200,000)
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| Keywords | Photoelectron Emission Spectroscopy / Work Function / Surface Analysis / Semiconductors / Thin Films / 薄膜 |
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| Research Abstract |
A new technique for measuring the ultraviolet photoelectron yield (UPY) spectra from the solid samples under air atmosphere has been developed. The experimental conditions for the UPY spectrometer operation has been examined in detail.
UPY spectra of various samples including metals, semiconductors, and thin evaporated metal films were measured and the photoelectron emission threshold energy, Et was determined for each sample. It is elucidated that the Et is characteristic of the sample and is quite sensitive to the surface conditions such as formation of oxide and adsorptions of water or hydrocarbons and also to the radius of the sample particle.
The escape depth of very low energy electrons in silicon oxide, aluminium oxide, and hydrocarbons have been estimated from the photoelectron yield to be 15, 11, and 6A respectively. These results indicate that the analytical depth of this technique is comparable or smaller than those of other electron spectroscopies in vacuum such as XPS or UPS.
The analytical method for the determination of electronic band structure of the sample from the UPY spectrum has been proposed.
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Report
(4 results)
Research Products
(7 results)
