Development of an In-Process Technique for Measuring Temperatures and Micro-Geometry of High Temperature Surfaces by Using the Broad Range Spectroscopy
Project/Area Number |
01850049
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Research Category |
Grant-in-Aid for Developmental Scientific Research (B).
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Allocation Type | Single-year Grants |
Research Field |
Thermal engineering
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Research Institution | Kyoto University |
Principal Investigator |
MAKINO Toshiro Kyoto University Dept. Engineering Science, Associate Professor, 工学部, 助教授 (30111941)
|
Co-Investigator(Kenkyū-buntansha) |
YOSHIDA Atsumasa Okayama University Dept. mechanical Engineering, Associate Professor, 工学部, 助教授 (60174918)
小坂 武 ミノルタカメラ(株), 計測機器部門, 次長
|
Project Period (FY) |
1989 – 1990
|
Project Status |
Completed (Fiscal Year 1990)
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Budget Amount *help |
¥5,600,000 (Direct Cost: ¥5,600,000)
Fiscal Year 1990: ¥1,600,000 (Direct Cost: ¥1,600,000)
Fiscal Year 1989: ¥4,000,000 (Direct Cost: ¥4,000,000)
|
Keywords | Thermal Radiation / Thermophysica Property / Measurement / Spectrum / Surface Film / Surface Roughness / Fractal Geometry / High Temperature |
Research Abstract |
A series of works were performed for the development of an in-process technique for measuring temperatures and micro-geometry of high temperature surfaces by using the broad range spectroscopy : 1. The high-speed spectrophotometer system was modified to extend the spectral region to 0.35-14.5mum. A wavelength continuous variable filter was used for it . 2. Transient behavior in reflection characteristics was investigated on several kinds of stainless steels and super-alloys in an air-oxidation process at high temperatures. The spectra were found to be characterized by a few simple rules of interference and diffraction of radiation at the roughened oxidized surfaces. 3. An interesting phenomenon of temperature hysteresis was found in the near -infrared spectra of emission and reflection at a paradium surface in air and at around 1000K. It was attributed to the combined oxidation and desociation reactions at the surface. 4. An ellipsoidal mirror-type reflectometer system was developed to measure the normal-incident hemispherical reflectance spectra of real surfaces. The system was applied to the measurement of the angular and wavelength characteristics of rough metallic surfaces. 5. A theoretical model was proposed to describe the reflection characteristics of rough metallic surfaces. The surface was modelled as a fractal-like three-dimensional structure which consists of discrete and statistically controlled surface elements. The diffraction/ scattering characteristics were calculated to demonstrated the reality of the model. 6. Another idea was proposed to deal with the transient behavior in reflection characteristics of real surfaces in actual industrial environments. The above surface model was combined with a three-dimensional non-parallel film element model. The experimentally found behavior of the spectrum transition was readily reproduced theoretically on a basis of a computer.
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Report
(3 results)
Research Products
(24 results)