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Study of Charge States of Fast Ions in Solids

Research Project

Project/Area Number 03452051
Research Category

Grant-in-Aid for General Scientific Research (B)

Allocation TypeSingle-year Grants
Research Field 物理学一般
Research InstitutionUniversity of Tsukuba

Principal Investigator

KUDO Hiroshi  Univ. of Tsukuba, Inst. of Appl. Phys, Associate Professor, 物理工学系, 助教授 (40111364)

Co-Investigator(Kenkyū-buntansha) ISHIHARA Toyoyuki  Univ. of Tsukuba, Tandem Accelerator Center, Associate Professor, 物理学系(加速器センター), 助教授 (10013385)
SHIMA Kunihiro  Univ. of Tsukuba, Tandem Accelerator Center, Lecturer, 物理工学系(加速器センター), 講師 (70087964)
Project Period (FY) 1991 – 1992
Project Status Completed (Fiscal Year 1992)
Budget Amount *help
¥2,900,000 (Direct Cost: ¥2,900,000)
Fiscal Year 1992: ¥600,000 (Direct Cost: ¥600,000)
Fiscal Year 1991: ¥2,300,000 (Direct Cost: ¥2,300,000)
KeywordsCharge states of ions / Channeling / Ion-beam shadowing / Secondary electrons / Ion beam analysis
Research Abstract

When fast ions are incident in an axial direction of target crystal, the ions are deflected away from the aligned atoms as a result of ion-atom repulsive potential. Such shadowing processes can be well observed by using high-energy (keV) secondary electrons induced by MeV/u ions. If the ion has electrons in the inner-shell, the deflection angle from the aligned atoms should be smaller than for the fully-stripped case since the repulsive interaction potential is reduced. This causes a reduced shadowing effect i.e., an increase in the ratio of channeling to random electron yield, compared with that for fully stripped light ions of equal velocity. By using this effect, we have determined effective nuclear charges of fast heavy ions running in the crystal.
The experiments have been carried out using tandem accelerators at the University of Tsukuba, and at Japan Atomic Energy Research Institute (Takasaki). For Si crystals, we have collected data for 2.5-MeV/u ions of H, B, C, O, Si, S, and Cl, and for 3.5-MeV/u ions of H, B, C, and Si. We have also measured GaAs and MgO crystals for several ions of equal velocity.
We have found that even at a depth of about 100 A^^゚ most of MeV/u light ions maintain their initial charge states, while heavier ions quickly capture target electrons very close to the surface. For example, the charge states of 2.5-MeV/u B^<5+>, C^<4+>, C^<6+>, O^<5+>, and O^<8+> incident in the Si <110> or <100> directions remained almost unchanged at a depth of about 100 A^^゚. However, heavier Si^<5+>, Si^<13+>, S^<5+>, S^<13+>, Cl^<8+>, or Cl^<15+> exhibit a screening effect equivalent to an electron capture of several electrons at the same depth.
Such knowledge on the charge states of fast ions in solid have been obtained for the first time by the Tsukuba-Takasaki joint research. Further experiments covering wide ranges of ion energy and ion species are still under way.

Report

(3 results)
  • 1992 Annual Research Report   Final Research Report Summary
  • 1991 Annual Research Report
  • Research Products

    (18 results)

All Other

All Publications (18 results)

  • [Publications] Hiroshi Kudo et al.: "Secondary electrons induced by fast ions under channeling conditions.I.Production and emission of secondary electrons." Physical Review. B43. 12729-12735 (1191)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1992 Final Research Report Summary
  • [Publications] Hiroshi Kudo et al.: "Secondary electrons induced by fast ions under channeling conditions.II.Screening of fast heavy ions in solids." Physical Review. B43. 12736-12743 (1991)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1992 Final Research Report Summary
  • [Publications] Hiroshi Kudo et al.: "Binary encounter electron spectroscopy under channeling incidence conditions." Radiation Effect and Defects in Solids. 117. 85-89 (1991)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1992 Final Research Report Summary
  • [Publications] Hiroshi Kudo et al.: "Shadowing pattern imaging with High-Energy Secondary Electrons Induced by fast Ions." Japanese Journal of Applied Physics. 31. L1284-L1286 (1992)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1992 Final Research Report Summary
  • [Publications] Hiroshi Kudo et al.: "Secondary electrons induced by fast ions under channeling conditions.III.Unshadowed electrons in target crystals." Physical Review. B47. 27-34 (1993)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1992 Final Research Report Summary
  • [Publications] Hiroshi Kudo et al.: "Surface Layer Analysis of Sputter-Etched Si Using Secondary Electrons Induced by Fast Ions." Japanese Journal of Applied Physics. 32. (1993)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1992 Final Research Report Summary
  • [Publications] 工藤 博(共著): "分析化学ハンドブック(pp.486-490「イオンビーム分析法」)" 朝倉書店, (1992)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1992 Final Research Report Summary
  • [Publications] Hiroshi Kudo et al.: "Secondary electrons induced by fast ions under channeling conditions. I. Production and emission of secondary electrons." Phys. Rev.B43. 12729-12735 (1991)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1992 Final Research Report Summary
  • [Publications] Hiroshi Kudo et al.: "Secondary electrons induced by fast ions under channeling conditions. II. Screening of fast heavy ions in solids." Phys. Rev.B43. 12736-12743 (1991)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1992 Final Research Report Summary
  • [Publications] Hiroshi Kudo et al.: "Binary encounter electron spectroscopy under channeling incidence conditions." Radiati. Eff. & Defects in Solids. 117. 85-89 (1991)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1992 Final Research Report Summary
  • [Publications] Hiroshi Kudo et al.: "Shadowing Pattern Imaging with High-Energy Secondary Electrons Induced by fast Ions." Jpn.J.Appl.Phys.31. L1284-L1286 (1992)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1992 Final Research Report Summary
  • [Publications] Hiroshi Kudo et al.: "Secondary electrons induced by fast ions under channeling conditions. III. Unshadowed electrons in target crystals." Phys. Rev.B47. 27-34 (1993)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1992 Final Research Report Summary
  • [Publications] Hiroshi Kudo et al.: "Surface Layer Analysis of Sputter-Etched Si Using Secondary Electrons Induced by Fast Ions." Jpn.J.Appl.Phys.32,5A. (1993)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1992 Final Research Report Summary
  • [Publications] Hiroshi KUDO et al: "Shadowing Pattern Imaging with High-Energy Secondary Electrons Induced by fast Ions" Japanese Journal of Applied Physics. 31. L1284-L1286 (1992)

    • Related Report
      1992 Annual Research Report
  • [Publications] Hiroshi KUDO et al: "Secondary Electrons Induced by Fast Ions under Channeling Conditions III.Unshadowed Electrons in Target Crystals" Physical Review. B47. 27-34 (1993)

    • Related Report
      1992 Annual Research Report
  • [Publications] H.Kudo: "Binary Encounter Electron Spectroscopy under Channeling Incidence Conditions." Radiat.Eff.Defects in Solids. 117. 85-89 (1991)

    • Related Report
      1991 Annual Research Report
  • [Publications] H.Kudo: "Secondary electrons induced by fast ions under channeling conditions.I.Production and emission of secondary electrons" Phys.Rev.B43. 12729-12735 (1991)

    • Related Report
      1991 Annual Research Report
  • [Publications] H.Kudo: "Secondary electrons induced by fast ions under channeling conditions.II.Screening of fast heavy ions in solids" Phys.Rev.B43. 12736-12743 (1991)

    • Related Report
      1991 Annual Research Report

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Published: 1991-04-01   Modified: 2016-04-21  

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