X-Ray Measurement of Stress in a Localized Area of Ceramics by Use of Imaging Plate
| Project/Area Number |
03650066
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| Research Category |
Grant-in-Aid for General Scientific Research (C)
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| Allocation Type | Single-year Grants |
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| Research Field |
機械材料工学
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| Research Institution | MUSASHI INSTITUTE OF TECHNOLOGY |
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Principal Investigator |
YOSHIOKA Yasuo Musashi Institute of Technology, Faculty of Engineering, Professor, 工学部, 教授 (40061501)
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| Co-Investigator(Kenkyū-buntansha) |
HASEGAWA Ken-ichi Hosei University Faculty of Engineering, Professor, 工学部, 教授 (40010798)
OHYA Shin-ichi Musashi Institute of Technology, Faculty of Engineering, Lecturer, 工学部, 講師 (80120864)
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| Project Period (FY) |
1991 – 1992
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| Project Status |
Completed (Fiscal Year 1992)
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| Budget Amount *help |
¥2,000,000 (Direct Cost: ¥2,000,000)
Fiscal Year 1992: ¥800,000 (Direct Cost: ¥800,000)
Fiscal Year 1991: ¥1,200,000 (Direct Cost: ¥1,200,000)
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| Keywords | X-ray stress analysis / Imaging Plate / Residual stress / Cosalpha method / Localized area / Image processing / Cosd法 / イメ-ジングプレ-ト / 単一入射法 / Cosα法 |
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| Research Abstract |
We combined a modified single exposure technique and the imaging plate, which is an x-ray digital area detector, for determination of stress in a localized area. Stress value by the single exposure method is obtained from lattice strains in only two directions with a single incident x-ray beam directed at an oblique angle. However, diffraction data around a whole Debye-Scerrer ring was used in this study, and then a stress value can be accurately determined in comparison with the single exposure method. We measured the DS ring by use of the imaging plate with requiring only a short exposure time. Lattice strains in many directions on a DS ring were measured by the assistance of an image processing analyzer connected to a personal computer.
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Report
(3 results)
Research Products
(6 results)
