走査型トンネル顕微鏡による半導体表面・ヘテロ接合界面の研究

• Project/Area Number: 03750207
• Research Category: Grant-in-Aid for Encouragement of Young Scientists (A)
• Allocation Type: Single-year Grants
• Research Field: 電子材料工学
• Research Institution: University of Tsukuba
• Principal Investigator: 岡田 至崇 筑波大学, 物質工学系, 助手
• Project Period (FY): 1991
• Project Status: Completed (Fiscal Year 1991)
• Budget Amount: ¥1,000,000 (Direct Cost: ¥1,000,000); Fiscal Year 1991: ¥1,000,000 (Direct Cost: ¥1,000,000)