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Electronic States of Negative Electron Affinity GaAs Photocathode Surface Studied with Scanning Tunneling Microscopy

Research Project

Project/Area Number 04650014
Research Category

Grant-in-Aid for General Scientific Research (C)

Allocation TypeSingle-year Grants
Research Field Applied materials
Research InstitutionResearch Institute of Electronics, Shizuoka University

Principal Investigator

HAGINO Minoru  Research Institute of Electronics, Shizuoka University, Professor, 電子工学研究所, 教授 (90022128)

Co-Investigator(Kenkyū-buntansha) NOMURA Takashi  Research Institute of Electronics, Shizuoka University, Research Associate, 電子工学研究所, 助手 (90172816)
ISHIKAWA Kenji  Research Institute of Electronics, Shizuoka University, Associate Professor, 電子工学研究所, 助教授 (50022140)
Project Period (FY) 1992 – 1993
Project Status Completed (Fiscal Year 1993)
Budget Amount *help
¥2,300,000 (Direct Cost: ¥2,300,000)
Fiscal Year 1993: ¥500,000 (Direct Cost: ¥500,000)
Fiscal Year 1992: ¥1,800,000 (Direct Cost: ¥1,800,000)
KeywordsPhotocathode / Negative Electron Affinity / Scanning Tunneling Microscopy / GaAs / Sulfide Treastment / Residual Gas Adsorption / Molecular Beam Epitaxy / Hetero-epitaxy / 走査トンネル顕微鏡 / egative ectron ffinity / scanning tunneling microscope / molecular beam epitaxy / GaAs / CS / photo cathode / surface / sulfur treatment
Research Abstract

The purpose of this research is to clarify the mechanism of negative electron affinity (NEA). A well defined, clean GaAs(001) surface has to be prepared to study the activation process of NEA.Therefore, we have constructed the scanning tunneling microscope (STM) which operates in ultra-high vacuum environment and mounts the same sample holder used during the MBE growth. The growth process of GaAs thin film onto an optically transparent substrate, which is essential to apply the NEA photocathode to the image intensifier, is studied by the STM.The degradation process of the NEA photocathode due to the adsorption of residual gases is studied by the temperature programd desorption spectrum (TDS). We showed the degradation is caused by the variation of Cesium/Oxide ratio in the activation layr. The sulfide treatment is also applied to the preparation of GaAs surface to achieve reproducible NEA activation. The desorption process of sulfides from GaAs surface is studied by TDS.

Report

(3 results)
  • 1993 Annual Research Report   Final Research Report Summary
  • 1992 Annual Research Report
  • Research Products

    (21 results)

All Other

All Publications (21 results)

  • [Publications] 矢後栄郎: "制御電子回路の雑音除去による走査トンネル顕微鏡の画質改善" 静岡大学電子工学電子工学研究所研究報告. 26. 125-132 (1992)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1993 Final Research Report Summary
  • [Publications] 藁科英永: "(NH_4)_2S_x処理したGaAs表面の昇温脱離法による評価" 静岡大学電子工学電子工学研究所研究報告. 27. 33-40 (1992)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1993 Final Research Report Summary
  • [Publications] Takashi Nomura: "Anisotropic Relaxation of Misfit Strain in GaAs Films Grown on GaP(001)" J.Cryst.Growth. 127. 584-588 (1993)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1993 Final Research Report Summary
  • [Publications] Takashi Nomura: "Temperature Programmed Desorption Study of (NH_4)_2S_x Treated GaAs Surfaces" Appl.Surface Sci.65/66. 638-642 (1993)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1993 Final Research Report Summary
  • [Publications] Tatsuaki Wada: "A Thermal Desorption Analysis for the Adsorption of CO_2 on GaAs Photocathodes" Surface Sci.285. 186-196 (1993)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1993 Final Research Report Summary
  • [Publications] 矢後栄郎: "分子線エピタキシャル成長した半導体表面観察用STM装置" 静岡大学大学院電子科学研究科研究報告. 15(印刷中). (1994)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1993 Final Research Report Summary
  • [Publications] Haruo Yago, Takashi Nomura, Kenji Murakami, Kenji Ishikawa and Minoru Hagino: "Noise Reduction of Electric Circuits for Scanning Tunneling Microscope" Bulletin of the Research Instiktute of Electronics, Shizuoka University. 26. 125-132 (1992)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1993 Final Research Report Summary
  • [Publications] Hidenaga Warashina, Taku Yamagata, Takashi Nomura, Kenji Ishikawa and Minoru Hagino: "Study of (NH_4)_2S_x Treated GaAs Surface Using Thermal Desorption." Bulletin of the Research Institute of Electronics, Shizuoka University. 27. 33-40 (1992)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1993 Final Research Report Summary
  • [Publications] Takashi Nomura, Kenji Ishikawa, Kenji Murakami and Minoru Hagino: "Anisotropic Relaxation of Misfit Strain in GaAs Films Grown on GaP(001)" Journal of Crystal Growth. 127. 584-588 (1993)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1993 Final Research Report Summary
  • [Publications] Takashi Nomura, Taku Yamagata, Hidenaga Warashina, Kenji Ishikawa and Minoru Hagino: "Temperature Programd Desorption Study of (NH_4)_2S_x Treated GaAs Surfaces" Applied Surface Science. 65/66. 638-642 (1993)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1993 Final Research Report Summary
  • [Publications] Tatsuaki Wada, Takashi Nomura, Masahiro Miyao and Minoru Hagino: "A Thermal Desorption Analysis for the Adsorption of CO_2 on GaAs Photocathodes" Surface Science. 285. 186-196 (1993)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1993 Final Research Report Summary
  • [Publications] Haruo Yago, Takashi Nomura, Kenji Ishikawa and Minoru Hagino: "Scanning Tunneling Microscope for the Observation of Semiconductor Surfaces Grown by Molecular Beam Epitaxy" Reports of the Graduate School of Electronic Science and Technology, Shizuoka University. 15 in press. (1994)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1993 Final Research Report Summary
  • [Publications] 矢後栄郎: "制御電子回路の雑音除去による走査トンネル顕微鏡の画質改善" 静岡大学電子工学電子工学研究所研究報告. 26. 125-132 (1992)

    • Related Report
      1993 Annual Research Report
  • [Publications] 藁科英永: "(NH_4)_2S_x処理したGaAS表面の昇温脱離法による評価" 静岡大学電子工学電子工学研究所研究報告. 27. 33-40 (1992)

    • Related Report
      1993 Annual Research Report
  • [Publications] Takashi Nomura: "Anisotropic Relaxation of Misfit Strain in GaAs Films Grown on GaP(001)" J.Cryst.Growth. 127. 584-588 (1993)

    • Related Report
      1993 Annual Research Report
  • [Publications] Takashi Nomura: "Temperature Programmed Desorption Study of (NH_4)_2S_x Treated GaAs Surfaces" Appl.Surface Sci.65/66. 638-642 (1993)

    • Related Report
      1993 Annual Research Report
  • [Publications] Tatsuaki Wada: "A Thermal Desorption Analysis for the Adsorption of CO_2 on GaAs Photocathodes" Surface Sci.285. 186-196 (1993)

    • Related Report
      1993 Annual Research Report
  • [Publications] 矢後栄郎: "分子線エピタキシャル成長した半導体表面観察用STM装置" 静岡大学大学院電子科学研究科研究報告. 15 (印刷中). (1994)

    • Related Report
      1993 Annual Research Report
  • [Publications] 佐々木,山田,深谷,岩田,加藤,青山,宮尾,村上,石川,野村,山口,萩野: "レーザビーム偏向による走査型トンネル顕微鏡圧電素子の変位特性" 光学. 21. 95-101 (1992)

    • Related Report
      1992 Annual Research Report
  • [Publications] T.Nomura,T.Yamagata,H.Warashina,K.Ishikawa,M;Hagino: "Temperature programaed Desorption Study of (NH_4)_2Sx Treated GaAs Sunface" Applied Surface Science. (1993)

    • Related Report
      1992 Annual Research Report
  • [Publications] 藁科,山縣,野村,石川,萩野: "(NH_4)_2Sx処理したGaAsの昇温脱離法による評価" 静岡大学電子工学研究所研究報告. 27. 33-40 (1992)

    • Related Report
      1992 Annual Research Report

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Published: 1992-04-01   Modified: 2016-04-21  

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