| Project/Area Number |
04650047
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| Research Category |
Grant-in-Aid for General Scientific Research (C)
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| Allocation Type | Single-year Grants |
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| Research Field |
応用物理学一般(含航海学)
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| Research Institution | MIE UNIVERSITY |
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Principal Investigator |
SAITO Yahachi Mie University, Faculty of Engineering, Associate Professor, 工学部, 助教授 (90144203)
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| Co-Investigator(Kenkyū-buntansha) |
HATA Koichi Mie University, Faculty of Engineering, Assistant, 工学部, 助手 (30228465)
SHINOHARA Hisanori Nagoya University, Department of Chemistry, Professor, 理学部, 教授 (50132725)
OHSHITA Akinori Mie University, Faculty of Engineering, Professor, 工学部, 教授 (80023240)
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| Project Period (FY) |
1992 – 1993
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| Project Status |
Completed (Fiscal Year 1993)
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| Budget Amount *help |
¥2,100,000 (Direct Cost: ¥2,100,000)
Fiscal Year 1993: ¥500,000 (Direct Cost: ¥500,000)
Fiscal Year 1992: ¥1,600,000 (Direct Cost: ¥1,600,000)
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| Keywords | Carbon Cluster / Fullerene / Thin Films / Crystal Structrue / Epitaxial / Electronic Structure / Optical Property |
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| Research Abstract |
C_<60>, C_<70>, C_<76> and C_<84> purified by liquid chromatography were evaporated in vacuum from a molybdenum boat (evaporation source) and deposite on solid surfaces such as NaCl, mica and quartz.
1. Electron microscopy of fullerene thin films
On mica substrate, all the fullerenes studied formed epitaxitally grown single-crystalline films with the fcc structure. The lattice constants of the fcc-fullerites change linearly with the square root of the number of carbon atoms constituting a fullerene. On the other hand, fullerene films grown on NaCl were polycrystalline. The structures were the fcc when the substrate was held at elevated temperature, otherwise a hcp structure was dominant.
2. Electronic structures and optical properties of fullerene films
Electron energy loss spectroscopy revealed that the band gaps of C_<60>, C_<70>, C#76 and C_<84> were 1.7, 1.8, 1.3 and 1.2 eV, respectively. Optical absorption and emission studies showed optical properties inherent in fullerenes such as large third-order nolinear response.
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