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Study on Physico-mathematical Model of Dc Flashover Phenomena of Contaminated Insulators

Research Project

Project/Area Number 04650235
Research Category

Grant-in-Aid for General Scientific Research (C)

Allocation TypeSingle-year Grants
Research Field 電力工学
Research InstitutionNagoya Institute of Technology

Principal Investigator

NAITO Katsuhiko  Nagoya institute of Technology, Department of Electrical and Computer Engineering Professor, 工学部, 教授 (90240811)

Project Period (FY) 1992 – 1993
Project Status Completed (Fiscal Year 1993)
Budget Amount *help
¥2,100,000 (Direct Cost: ¥2,100,000)
Fiscal Year 1993: ¥1,100,000 (Direct Cost: ¥1,100,000)
Fiscal Year 1992: ¥1,000,000 (Direct Cost: ¥1,000,000)
KeywordsDc Insulator / Physico-mathematical Model / Flashover / Contaminated Condition / Insoluble Material / Ambient Temperature / Pressure / Surface Wetting / 漏れ電流 / 避雷器 / 汚損フラッシオーバ現象 / 導電性物質 / 人工汚損試験 / 大気圧
Research Abstract

The purpose of this study is to construct a physico-mathematical model of de fiashover phenomena of contaminated insulators as well as to evaluate factors experimentally which affect flashover phenomena. The main results obtained during this study are as follows :
1. The results of worldwide round-robin artificial contamination test on dc high voltage insulators were analyzed. Improvement information which will serve for the revision of the existing international standard of dc contamination test.
2. Dc flashover phenomena are affected by the kinds of insoluble materials in the contaminant.
3. Ambient temperature and pressure have significant influence on dc flashover voltage.
4. Wetting condition on the insulator surface has to be considereded.
5. Analysis of leakage current waveforms obtained in dc contamination tests proved that waveforms depend on the shape and size of specimen and that relatively large current flows for about one second in some casess.
6. A model considering electrostatic capacitance was constructed in the case of ac voltage application. The calculated leakage current waveform based on the model is almost the same with the experimental one, suggesting the validity of the model.
7. Time variation of ac voltage distribution along series arrestors during the drying process of insulator surface was calculated by using a newly constructed model. It was shown that unusual voltage distribution 1.8 times as large as the normal may was obtained in a typical case.
Construction of a physico-mathematical model in the case of dc voltage application is now in progress.

Report

(3 results)
  • 1993 Annual Research Report   Final Research Report Summary
  • 1992 Annual Research Report
  • Research Products

    (20 results)

All Other

All Publications (20 results)

  • [Publications] K.Naito,S.Hayashi,Y.Ibi: "Insulation Coordination against Insulator Contamination" IEEE Mexico Section,RVP-93-TRA-002. 329-335 (1993)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1993 Final Research Report Summary
  • [Publications] K.Naito: "Round-robin Artificial Contamination Test on HVDC Insulators" CIGRE SC33.93(Coll),IWD2.7. (1993)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1993 Final Research Report Summary
  • [Publications] K.Naito,H.M.Schneider: "Round-robin Artificial Contamination Test on High Voltage Dc Insulators" IEEE Power Engineering Society 1994 Summer Meeting. (1994)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1993 Final Research Report Summary
  • [Publications] K.Naito,Y.Mizuno,S.Hayashi: "Voltage Distribution along Arrestors under Contaminated Condition" IEEE Mexico Section.RVP-94. (1994)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1993 Final Research Report Summary
  • [Publications] K.Naito, S.Hayashi & Y.Ibi: "Insulation Coordination against Insulator Contamination" IEEE Mexico Section RVP-93-TRA-002. 329-335 (1993)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1993 Final Research Report Summary
  • [Publications] K.Naito: "Round-robin Artificial Contamination Test on HVDC Insulators" CIGRE SC33.93(Coll) IWD2.7. (1993)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1993 Final Research Report Summary
  • [Publications] K.Naito & H.M.Schneider: "Round-robin Artificial Contamination Test on High Voltage Dc Insulators" IEEE Power Engineering Society 1994 Summer Meeting. (to be presented). (1994)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1993 Final Research Report Summary
  • [Publications] K.Naito, Y.Mizuno & S.Hayashi: "Voltage Distribution along Arrestors under Contaminated Condition" IEEE Mexico Section RVP-94. (to be presented). (1994)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1993 Final Research Report Summary
  • [Publications] K.Naito,S.Hayashi,Y.Ibi: "Insulation Coordination against Insulator Contamination" IEEE Mexico Section,RVP-93-TRA-002. 329-335 (1993)

    • Related Report
      1993 Annual Research Report
  • [Publications] K.Naito: "Round-robin Artificial Contamination Test on HVDC Insulators" CIGRE SC33.93(Coll)IWD2.7. (1993)

    • Related Report
      1993 Annual Research Report
  • [Publications] 林樹弘,内藤克彦: "汚損がいしの物理数学モデルによる数値解析" 平成5年度電気関係学会東海支部連合大会論文集. No.110 (1993)

    • Related Report
      1993 Annual Research Report
  • [Publications] 林樹弘,内藤克彦: "避雷器の汚損時の挙動の数値解析" 平成5年度電気関係学会東海支部連合大会論文集. No.111 (1993)

    • Related Report
      1993 Annual Research Report
  • [Publications] 西山秀樹,水野幸男,内藤克彦,坂西健治,伊藤進,松岡良輔: "直流汚損がいしの漏れ電流波形の解析" 平成6年電気学会全国大会論文集. No.1339 (1994)

    • Related Report
      1993 Annual Research Report
  • [Publications] 林樹弘,水野幸男,内藤克彦: "2段積汚損避雷器の電圧分担に関する数値解析" 平成6年電気学会全国大会論文集. No.1447 (1994)

    • Related Report
      1993 Annual Research Report
  • [Publications] 武井 心彩,内藤 克彦 他: "全世界持ち回り直流汚損がいし試験結果概要" 平成5年電気学会全国大会論文集. 10. 82-83 (1993)

    • Related Report
      1992 Annual Research Report
  • [Publications] 近藤 邦明,内藤 克彦 他: "がいしの人工汚損耐電圧に及ぼす不溶性物質の影響に関する実験" 平成5年電気学会全国大会論文集. 10. 72-73 (1993)

    • Related Report
      1992 Annual Research Report
  • [Publications] 長屋 行則,内藤 克彦: "周囲温度が汚損フラッシオーバ電圧に及ぼす影響" 平成4年度電気関係学会 東海支部連合大会論文集. 55 (1993)

    • Related Report
      1992 Annual Research Report
  • [Publications] 長屋 行則,内藤 克彦: "大気条件が汚損フラッシオーバ電圧に及ぼす影響" 平成5年電気学会全国大会論文集. 10. 75 (1993)

    • Related Report
      1992 Annual Research Report
  • [Publications] 林 樹弘,内藤 克彦: "汚損がいしの物理数学モデルに関する一考察" 平成4年度電気関係学会 東海支部連合大会論文集. 53 (1993)

    • Related Report
      1992 Annual Research Report
  • [Publications] 林 樹弘,内藤 克彦: "汚損による交流絶縁低下の物理数学モデルに関する一考察" 平成5年電気学会全国大会論文集. 10. 74 (1993)

    • Related Report
      1992 Annual Research Report

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Published: 1992-04-01   Modified: 2016-04-21  

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