| Project/Area Number |
05452215
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| Research Category |
Grant-in-Aid for General Scientific Research (B)
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| Allocation Type | Single-year Grants |
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| Research Field |
計測・制御工学
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| Research Institution | UNIVERSITY OF TOKYO,INSTITUTE OF INDUSTRIAL SCIENCE |
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Principal Investigator |
KAWAKATSU Hideki UNIV.of TOKYO,Inst.of Ind.Sci., Associate Professor, 生産技術研究所, 助教授 (30224728)
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| Co-Investigator(Kenkyū-buntansha) |
MASUZAWA Takahisa UNIV.of Tokyo, Inst.of Ind.Sci., Professor, 生産技術研究所, 教授 (60013215)
ブロイレル ハネス 東京大学, 生産技術研究所, 助教授
ハネス ブロイレル 東京大学, 生産技術研究所, 客員助教授
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| Project Period (FY) |
1993 – 1995
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| Project Status |
Completed (Fiscal Year 1995)
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| Budget Amount *help |
¥7,300,000 (Direct Cost: ¥7,300,000)
Fiscal Year 1995: ¥900,000 (Direct Cost: ¥900,000)
Fiscal Year 1994: ¥1,300,000 (Direct Cost: ¥1,300,000)
Fiscal Year 1993: ¥5,100,000 (Direct Cost: ¥5,100,000)
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| Keywords | AFM / STM / Condensed matter / 原子間力顕微鏡 / 走査型力顕微鏡 / 表面物性 / ナノテクノロジー / 制御 / 顕微鏡 |
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| Research Abstract |
An atomic force microscope with two optical levers was developed to access the possibility of detecting the deflection and torsion of the cantilever. Experiments showed that the sytem is capable of detecting the difference of tip end point displacement along the axis of the cantilever and in the direction normal to the sample surface. When scanning mica, it was shown that the tip end point meanders along discrete stick points. The potential of the microscope was demonstrated.
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