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Structural Properties and Size-control of Visible Photoluminescent Porous Silicon

Research Project

Project/Area Number 05452273
Research Category

Grant-in-Aid for General Scientific Research (B)

Allocation TypeSingle-year Grants
Research Field Physical properties of metals
Research InstitutionTokyo Institute of Technology

Principal Investigator

NITTONO Osamu  Tokyo Institute of Technology, Professor Faculty of Engineering, 工学部, 教授 (40016564)

Project Period (FY) 1993 – 1994
Project Status Completed (Fiscal Year 1994)
Budget Amount *help
¥7,100,000 (Direct Cost: ¥7,100,000)
Fiscal Year 1994: ¥2,000,000 (Direct Cost: ¥2,000,000)
Fiscal Year 1993: ¥5,100,000 (Direct Cost: ¥5,100,000)
Keywordssilicon / visible light emission / photoluminescence / porous structure / optical properties / crystallinity / anodization / X-ray diffraction / X線回析 / 多孔質シリコン
Research Abstract

The purposes of this study are to find suitable preparation conditions for porous silicon (PS) layrs having a constant size-distribution of residual Si parts, and to discuss common structural features including emitting parts and their morphology and crystallinity for the p+PS and n+ PS layrs with reference to photoluminescent natures. The PS layrs, formed on heavily doped p-type and n-type silicon wafers of low resistivi less than 0.02OMEGAcm, have been investigated by mainly X-ray multi-crystal diffractometry, supplemented with electron diffraction and scanning electron microscopy and transmission electron microscopy. Main experimental results are as follow : The p+ PS layr presents a wirelike or branched structure of more than 10nm in diameter from the top surface to the bottom part of the PS layr. It was easy to get p+ PS layrs with a constant size-distribution by controlling preparation conditions. The PS layr exibits a slightly larger lattice spacing than the si substate along th … More e direction normal to the surface. The p+ PS layr shows a sharp peak on X-ray diffraction profile measured by X-ray double-crystal diffractometer, indicating that the p+ PS exhibits the same crystallinity as that of the Si substrate. It was also shown that PS layrs which exhibit intensive photoluminescence under He-Cd laser illumination at room temperature are not amorphous, but crystalline, and that the visible photoluminescence is strongly related to the microstructure of PS layr near the surface that shows a spongelike structure consisting of a large number of silicon crystallites of few nm's in size. On the contrary, the n+ PS layr always shows broad diffuse scattering under severl coherent peaks for the n+ PS layr in a large angular range, indicating that the crystallinity of the n+ PS layrs is inferior to that of the p+ PS layrs, probably due to some modifications of the nanostructure of PS layr. It was also found that the n+ PS layrs are composed of several layred pore-structures which are associated with anodization processes, and that halogen-lamp illumination was very effective in forming such a spongelike structure which can emit visible photoluminescence near the top surfaces of the PS layrs.
In conclusion, we would like to say that visible light emission comes from only the PS layr that has a spongelike structure consisting of a large number of silicon parts of few nm's in size, and that photoluminescence is probably due to charge carrier confinement in such three dimensional structure. Detailed studies on the correlation between microcrystallite size and photoluminescence peak position or blueshift are now in grogress. Less

Report

(3 results)
  • 1994 Annual Research Report   Final Research Report Summary
  • 1993 Annual Research Report
  • Research Products

    (19 results)

All Other

All Publications (19 results)

  • [Publications] 入戸野修、竹本邦子: "可視発光多孔質シリコンの微細構造と結晶性" 日本結晶学会誌. 35. 340-346 (1993)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1994 Final Research Report Summary
  • [Publications] 入戸野修: "X-ray Intensity Sistribution around the Reciprocal Lattice points for Porous Silicon Producod by Electroch emical Anodizarion" Photon factory Activity Report. 10. 333 (1993)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1994 Final Research Report Summary
  • [Publications] 竹本邦子、入戸野修: "Microtexture and Lottice Distortion of P-type porous silicon produced by Electrochemical Anodization" Trans.Mat.Res.soc.Japan. 13. 6-17 (1993)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1994 Final Research Report Summary
  • [Publications] 竹本邦子、入戸野修: "Microstructure and Crystollnity of N-type porou Silicon" Jpn.J.Appl.phys.33. 6432-6436 (1994)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1994 Final Research Report Summary
  • [Publications] 入戸野修、竹本邦子: "Crystallinity of porous silicon layer formed on Silicon substrate characterized by x-ray Multiple Diffractomotry" Proc.PRICM-2. (1995)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1994 Final Research Report Summary
  • [Publications] Osamu NITTONO and Kiniko Takemoto: "Microstructure and Crystallinity of Porous Siliocn with Visible Light Photoemission" J.Crystal.Soc.Jpn :. 35. 340-346 (1993)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1994 Final Research Report Summary
  • [Publications] Osamu NITTONO et al.: "X-ray Intensity Distribution around the Reciprocal Lattice Points for Porous Silicon Produced by Electrochemical Anodization" Photon Factory Activity Report :. 10. 333 (1993)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1994 Final Research Report Summary
  • [Publications] Kuniko TAKEMOTO, Osamu NITTONO et al.: "Microstructure and Lattice Distortion of P-type Porous Silicon Produced by Electrochemical Anodization" Trans.Mat.Res.Soc.Jpn.13. 6-17 (1993)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1994 Final Research Report Summary
  • [Publications] E.ARAI,A.ZOUNECK,M.SEKINO,K.TAKEMOTO and O.NITTONO: "Depth Profiling of Porous Silicon Surface by Means of Heavy-ion TOF ERDA" Nucl.Inst. & Meth.B85. 226-229 (1994)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1994 Final Research Report Summary
  • [Publications] T.MITSUI,N.YAMAMOTO.K.TAKEMOTO and O.NITTONO: "Cathodoluminescence and Electron Beam Irradiation Effect of Porous Silicon Studied by Transmission Electon Microscopy" Jpn.J.Appl.Phys.33. L342-344 (1994)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1994 Final Research Report Summary
  • [Publications] Kuniko TAKEMOTO,Osamu NITTONO: "Microstructure and Crysallinity of N-type Porous Silicon" Jpn.J.Appl.Phys.33. 6432-6436 (1994)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1994 Final Research Report Summary
  • [Publications] Osamu NITTONO,K.TAKEMOTO.H.YAMANASHI and Y.NAKAMURA: "Crystallinity of Porous Silicon Layr Formed on silicon Substrate Characterized by X-ray Multiple Diifractometry" Proc. of PRICM-2. (1995)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1994 Final Research Report Summary
  • [Publications] 入戸野修,竹本邦子: "可視発光多孔質シリコンの微細構造と結晶性" 日本結晶学会誌. 35. 340-346 (1993)

    • Related Report
      1994 Annual Research Report
  • [Publications] 入戸野修: "X-ray Intensity Distribution oround the Reciprocal Lattice Points for Porous Silicon Producod by Electrochemical Anodizarion" Photon Factory Activity Report. 10. 333- (1993)

    • Related Report
      1994 Annual Research Report
  • [Publications] 竹本邦子,入戸野修: "Microtexture and Lottice Distortion of P-type Porous Silicon Produced by Electrochemical Anodization" Trans.Mat.Res.Soc.Japan. 13. 6-17 (1993)

    • Related Report
      1994 Annual Research Report
  • [Publications] 竹本邦子,入戸野修: "Microstructure and Crystallnity of N-type Porous Silicon" Jpn.J.Appl.Phys.33. 6432-6436 (1994)

    • Related Report
      1994 Annual Research Report
  • [Publications] 入戸野修,竹本邦子: "Crystallinity of Porous Silicon Layer Formed on Silicon Substcate Chacactericed by x-ray Multiple Dittractomotry" Proc.PRICM-2. (1995)

    • Related Report
      1994 Annual Research Report
  • [Publications] 入戸野修,竹本邦子: "可視発光多孔質シリコンの微細構造と結晶性" 日本結晶学会誌. 35. 340-346 (1993)

    • Related Report
      1993 Annual Research Report
  • [Publications] 入戸野修,竹本邦子: "X-ray Intensity Distribution around the Reciprocal Lattice Points for Porous Silicon Produced by Electrochemical Anodization" PPHOTON FACTORY ACTIVITY REPORT. 10. 333 (1993)

    • Related Report
      1993 Annual Research Report

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Published: 1993-04-01   Modified: 2016-04-21  

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