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IC SOFT ERROR MEASUREMENTS BY MONOCHROMIZED CF FISSION FRAGMENTS

Research Project

Project/Area Number 05650939
Research Category

Grant-in-Aid for General Scientific Research (C)

Allocation TypeSingle-year Grants
Research Field Aerospace engineering
Research InstitutionRIKKYO UNIVERSITY

Principal Investigator

TAKAMI Yasukiyo  RIKKYO UNIV., INSTITUTE FOR ATOMIC ENERGY, PROE., 原子力研究所, 教授 (40062559)

Co-Investigator(Kenkyū-buntansha) SHIRAISHI Fumio  RIKKYO UNIV., INSTITUTE FOR ATOMIC ENERGY, PROF, 原子力研究所, 教授 (20062606)
Project Period (FY) 1993 – 1995
Project Status Completed (Fiscal Year 1995)
Budget Amount *help
¥2,200,000 (Direct Cost: ¥2,200,000)
Fiscal Year 1995: ¥300,000 (Direct Cost: ¥300,000)
Fiscal Year 1994: ¥600,000 (Direct Cost: ¥600,000)
Fiscal Year 1993: ¥1,300,000 (Direct Cost: ¥1,300,000)
KeywordsCF-252 / FISSION FRAGMENTS / MONOCHROMIZED / MASS IDENTIFICATION / IC / SI DETECTOR / SOFT ERROR / SINGLE EVENT UPSET / ソフト・エラー / Cf核分裂片 / 同時測定
Research Abstract

Two fission fragments, generated simultaneously at the spontaneous fission phenomena of Cf-252, were utilized - one for SEU measurements for Devices and another for fission fagments energy detection by Si SSDs. And the mass and effective charge of the fragment got into Devices was identified. For the identification the following relations were used :
in the Cf fission
E_2/E_1=M_1/M_2 : E_1+E_2=186 MeV : M_1+M_2=248 AMU (mass difference 4 is attributed to prompt neutron emission)
Cf-252 source was mounted on 0.1mum Ni foil. So that both fission fragments can be utilized without actual energy loss passing through the supporting Ni foil.

Report

(4 results)
  • 1995 Annual Research Report   Final Research Report Summary
  • 1994 Annual Research Report
  • 1993 Annual Research Report
  • Research Products

    (14 results)

All Other

All Publications (14 results)

  • [Publications] E.R.Berger, M.House, G.mango and A.H.Taber: "Single Event Upset in Microelectronics : Third Cosmic Ray UpsetExperiment" IBM Technical Direction. vol. 11, No. 1. 33 (1985)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1995 Final Research Report Summary
  • [Publications] J.H.Stephen, T.K.Sanderson, D.Mapper and J.Farren: "A Comparison of Heavy Ion Sources Used In cosmic Ray Simulation Studies of VLSI Circuits" IEEE Trans. Nucl. Sci.Vol. NS-31, No.6. 1069 (1984)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1995 Final Research Report Summary
  • [Publications] J.S.browning: "Single-Event Correlation Between Heavy Ions and Cf-252 Fission Fragments" Nucl. Instr. and Meth.Vol. B45. 714 (1990)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1995 Final Research Report Summary
  • [Publications] J.T.Blandford and J.C.Pickel: "Use of Cf-252 To Determine Parameters For SEU Rate Calculations" IEEE Trans. Nucl. Sci.Vol. NS-32, No.6. 4282 (1985)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1995 Final Research Report Summary
  • [Publications] T.K.Sanderson, D.Mapper, J.H.Stephen, and J.Farren: "SEU Measurement Using Cf-252 Fisson Particles, On CMOS Static RAMS, Subjected To A Continuous Period of Low Dose Rate Co-60 Irradiation" IEEE Trans. Nucl. Sci.Vol. NS-34 No.6. 1287 (1987)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1995 Final Research Report Summary
  • [Publications] R.Valazco, A.Provost-Grellier, T.Chapuis, M.Labrunee, D.Falguere, R.Koga: "Comparison Between Californium and Cyclotron SEU Tests" IEEE Trans. Nucl. Sci.Vol. NS-36 Vol.6. 2388 (1989)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1995 Final Research Report Summary
  • [Publications] Y.Takami et al.: "Investigation Of Single Event Upset Subject To Protons Of Intermediate Energy Range" IEEE Trans. Nucl. Sci.Vol. 37, No.6. 1953 (1990)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1995 Final Research Report Summary
  • [Publications] Y.Takami et al.: "The Measurement And Prediction Of Proton Upset" IEEE Trans. Nucl. Sci.Vol. NS-36 No.6. 2344 (1989)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1995 Final Research Report Summary
  • [Publications] P.E.Dodd and F.W.Sexton: "Critical Charge Concepts For CMOS SRAMS" IEEE Trans. Nucl. Sci.Vol. NS-42 No.6. 1764 (1995)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1995 Final Research Report Summary
  • [Publications] R.A.Reed and P.J.McNulty: "Effects Of Geometry On The Proton SEU Dependence On The Angle Of Incidence" IEEE Trans. Nucl. Sci.Vol. NS-42 No.6. 1803 (1995)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1995 Final Research Report Summary
  • [Publications] I.Kanno and Y.Nakagome: "Responce Characteristics Of Thin Film Detectors To Fission Fragmens" Nucl. Instr. and Meth.Vol. A251. 108 (1986)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1995 Final Research Report Summary
  • [Publications] N.Bohr.: Phys. Rev.Vol.58. 654 (1940)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1995 Final Research Report Summary
  • [Publications] N.O.Lassen: Dan. Mat-fys. Medd.Vol. 25, No. 11. (1949)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1995 Final Research Report Summary
  • [Publications] C.B.Fulmer: Phys. Rev.Vol. 108. 1113 (1957)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1995 Final Research Report Summary

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Published: 1993-04-01   Modified: 2016-04-21  

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