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Structure analysis of crystal surfaces by x-ray absolute refectivity.

Research Project

Project/Area Number 06452043
Research Category

Grant-in-Aid for General Scientific Research (B)

Allocation TypeSingle-year Grants
Research Field 固体物性Ⅰ(光物性・半導体・誘電体)
Research InstitutionUniversity of Tokyo

Principal Investigator

TAKAHASHI Toshio  University of Tokyo, Institute for Solid State Physics, Associate Professor., 物性研究所, 助教授 (20107395)

Co-Investigator(Kenkyū-buntansha) NAKATANI Shinichiro  University of Tokyo, Institute for Solid State Physics, Research Assistant, 物性研究所, 助手 (40198122)
Project Period (FY) 1994 – 1995
Project Status Completed (Fiscal Year 1995)
Budget Amount *help
¥2,200,000 (Direct Cost: ¥2,200,000)
Fiscal Year 1995: ¥2,200,000 (Direct Cost: ¥2,200,000)
KeywordsX-ray diffracton / reflectivity / surface structure / silicon / coverage / シリコン / CTR散乱 / 吸着層
Research Abstract

1.Absolute reflectivity of X-rays diffracted from the Si (111) ROO<3>*ROO<3>-metal surfaces was measured and analyszed in the framework of absolute reflectivity.
It was shown that the use of absolute reflectivity is very effective for estimation of the coverage of adsorbed atoms. For the Si (111) ROO<3>*ROO<3>-Bi surfaces, the Bi coverages of the two different phases were exactly determined as 1 ML and 1/3 ML.The 1-ML phase is compatible with the so-called milk-stool structure. For the 1/3-ML phase the adsorbed Bi atom is registered on the T_4 site and the distance between the Bi layr and the first Si layr is estimated at 1.60@90.
2.The structure of the Si (111) ROO<3>*ROO<3>-Sb surface was investigated by the surface X-ray diffraction method. The result of data analysis in the framework of absolute reflectivity confirmed that the Si (111) ROO<3>*ROO<3>-Sb system forms the so-called T_4-centered milk-stool structure with the coverage of 1ML.
3.The three-dimensional atomic structure of the Si (001) 2*1 clean surface was investigated by surface X-ray diffraction technique. The least squares fitting gave the asymmetric dimers whose bond length is 2.37<plus-minus>0.06@90 and buckling angle is 20<plus-minus>3゚ with the strain of the substrate over six layrs. This structure is similar to that of the Ge (001) 2*1 surf

Report

(3 results)
  • 1995 Annual Research Report   Final Research Report Summary
  • 1994 Annual Research Report
  • Research Products

    (16 results)

All Other

All Publications (16 results)

  • [Publications] S. Nakatani, T. Takahashi, Y. Kuwahara and M. Aono: "Use of x-ray reflectivity for determining the Si(111)√<3>X√<3>- Bi surface structures" Physical Review B. 52. R8711-R8714 (1995)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1995 Final Research Report Summary
  • [Publications] M. Takahasi, S. Nakatani, Y. Ito, T. Takahashi, X. W. Zhang and M. Ando: "Surface x-ray diffraction study on the Si(001)2×1 structure" Surface Science. 338. L846-L850 (1995)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1995 Final Research Report Summary
  • [Publications] T.Takahashi and S. Nakatani: "x-ray reflectivity for the complete determination of surface structures" Surface Science. (印刷中).

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1995 Final Research Report Summary
  • [Publications] S. Nakatani, Y. Kuwahara, T. Takahashi and M. Aono: "Structure determination of the Si(111)√<3>X√<3>-Sb surface by x-ray diffraction" Surface Science. (印刷中).

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1995 Final Research Report Summary
  • [Publications] M. Takahasi, S. Nakatani, Y. Ito, T. Takahashi, X. W. Zhang and M. Aodo: "Study of the Si(001)clean surface using a six-circle surface x-ray diffractometer" Surface Science. (印刷中).

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1995 Final Research Report Summary
  • [Publications] S.Nakatani, T.Takahashi, Y.Kuwahara and M.Aono: "Use of x-ray reflectivity for-determining the Si (111) ROO<3>*ROO<3>-Bi surface structure" Phys.Rev.B. 52. R8711-R8714 (1995)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1995 Final Research Report Summary
  • [Publications] M.Takahasi, S.Nakatani, Y.Ito, T.Takahashi, X.W.Zhang and M.Ando: "Surface x-ray diffraction study on the Si (001) 2*1 structure" Surf.Sci.338. L846-L850 (1995)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1995 Final Research Report Summary
  • [Publications] T.Takahashi and S.Nakatani: "X-ray reflectivity for the complete determination of surface structures" Surface Science.(to be published).

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1995 Final Research Report Summary
  • [Publications] S.Nakatani, Y.Kuwahara, T.Takahashi, and M.Aono: "Structure determination of the Si (111) ROO<3>*ROO<3>-Sb surface by x-ray diffraction" Surface Science.(to be published).

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1995 Final Research Report Summary
  • [Publications] M.Takahasi, S.Nakatani, Y.Ito, T.Takahashi, X.W.Zhang and M.Ando: "Study of the Si (001) clean surface using a six-circle surface x-ray diffractometer" Surface Science.(to be published).

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1995 Final Research Report Summary
  • [Publications] T.Takahashi and S.Nakatani: "Dynamical theory of X-ray diffraction for the study of crystal surfaces" Surface Science. 326. 347-360 (1995)

    • Related Report
      1995 Annual Research Report
  • [Publications] S.Nakatani, T.Takahashi, Y.Kuwahara and M.Aono: "Use of X-ray reflectivity for determining the Si (111) √<3>×√<3>-Bi surface structures" Phys.Rev.B. 52. R8711-R8714 (1995)

    • Related Report
      1995 Annual Research Report
  • [Publications] M.Takahashi, S.Nakatani, Y.Ito, T.Takahashi, X.W.Zhang, M.Ando: "Surface X-ray diffraction study on the Si (001) 2×1 structure" Surface Science. 338. L846-L850 (1995)

    • Related Report
      1995 Annual Research Report
  • [Publications] T.Takahashi and S.Nakatani: "X-ray reflectivity for the complete determination of surface structures" Surface Science. (印刷中).

    • Related Report
      1995 Annual Research Report
  • [Publications] S.Nakatani, Y.Kuwahara, T.Takahashi and M.Aono: "Structure determination of the Si (111) √<3>×√<3>-Sb surface by X-ray diffraction" Surface Science. (印刷中).

    • Related Report
      1995 Annual Research Report
  • [Publications] T.Takahashi and S.Nakatani: "Dynamicul theory of X-ray diffraction for the study of crystal surfaces" Surface Science. (印刷中).

    • Related Report
      1994 Annual Research Report

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Published: 1995-04-01   Modified: 2020-05-15  

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