• Search Research Projects
  • Search Researchers
  • How to Use
  1. Back to previous page

Study of impurity states in II-VI semiconductor particles by local photon-emission spectroscopy

Research Project

Project/Area Number 06640449
Research Category

Grant-in-Aid for General Scientific Research (C)

Allocation TypeSingle-year Grants
Research Field 固体物性Ⅰ(光物性・半導体・誘電体)
Research InstitutionKyushu Institute of Technology

Principal Investigator

NISHITANI Ryusuke  Kyushu Institute of Technology, Department of Computer Science and Electronics.Associate Professor, 情報工学部, 助教授 (50167566)

Project Period (FY) 1994 – 1995
Project Status Completed (Fiscal Year 1995)
Budget Amount *help
¥2,100,000 (Direct Cost: ¥2,100,000)
Fiscal Year 1995: ¥300,000 (Direct Cost: ¥300,000)
Fiscal Year 1994: ¥1,800,000 (Direct Cost: ¥1,800,000)
KeywordsSTM / photon emission / scanning tunneling microscope / local electronic structure / fine particle / surface plasmon / nanoscale / digital control / 局所電子状態 / スペクトロスコピー / II-VI族半導体 / プラズマスッパタリング / STS
Research Abstract

1.For the study of the local electronic structure of the surfaces and the microclusters, we have made a digital controlled UHV-STM which is able to record 2-dimensional map of the intensity of the photon emitted from the STM tunnel junction. An image of the photon map is recorded simultaneously with the measurements of a topography image by STM and the STS measurements. The spectral resolved photon-maps can also be obtained by using an optical band pass filter with the band width of about 50 nm and the center of the wave length of 700 and 650 nm. This apparatus is emplyed to observe the STM induced photon-maps for the film of the noble metal particles (Au and Ag) on the graphite surface. We have measured the photon images for various morphology of the film to investigate the correlation between the photon maps and the morphology of the films. We have observed that the photon map is dependent on the wave length of the collected light. We have found that the photon spectra is closely related with the geometry of the STM tip and the metal particles. The change in the spectral resolved photon map is explained in terms of the effect of the curvature radius of the STM tip on the photon spectra.
2.We have studied the optical properties of the CdS microclustes. The microclustes of CdS microclusters in various sizes ranging from 1 to 2nm are prepared by precipitation technique.We have observed the size-dependnet absorption spectra for the CdS microclusters. The absorption edge for the CdS clusters increases in energy with the decrease in the cluster size. This observation is explained by the quantum size effect on the electronic levels of CdS microclustes.

Report

(3 results)
  • 1995 Annual Research Report   Final Research Report Summary
  • 1994 Annual Research Report
  • Research Products

    (12 results)

All Other

All Publications (12 results)

  • [Publications] Ryusuke Nishitani: "Measurements of Photon Intensity Map for Metal Particles by STM" Materials Science and Engineering A. (1996)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1995 Final Research Report Summary
  • [Publications] 西谷龍介: "ナノスケールトンネル発光像の測定:DSP制御STMの拡張" 固体物理. 31. 475-482 (1996)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1995 Final Research Report Summary
  • [Publications] S.Tsunekawa: "Observation of Ferroelastic Domains in LaNbO_4 by Atomic Force Microscope" Materials Transactions,JIM. 36. 1188-1191 (1995)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1995 Final Research Report Summary
  • [Publications] R.Nishitani: "Measurement of Photon Intensity Map for Metal Particles by STM" Materials Science and Engineering A. (1996)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1995 Final Research Report Summary
  • [Publications] R.Nishitani: "Measurements of Photon Intensity Map in Nanometer Scale by STM : an extended application of DSP controlled STM" Solid State Physics. Vol.31, No.5. 475-482 (1996)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1995 Final Research Report Summary
  • [Publications] S.Tsunekawa: "Observation of Ferroelastic Domains in LaNbO_4 by Atomic Force Microscope" Materials Transactions, JIM. Vol.36, No.9. 1188-1191 (1995)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1995 Final Research Report Summary
  • [Publications] Ryusuke Nishitani: "Measurements of Photon Intensity Map for Metal Particles by STM" Materials Science & Engineering A. (1996)

    • Related Report
      1995 Annual Research Report
  • [Publications] 西谷龍介: "ナノスケールトンネル発光像の測定:DSP制御STMの拡張" 固体物理. 31. (1996)

    • Related Report
      1995 Annual Research Report
  • [Publications] S.Tsunekawa: "Observation of Ferroelastic Domains in LaNbO_4 by Atomic Force Microscope" Materials Transactions,JIM. 36. 1188-1191 (1995)

    • Related Report
      1995 Annual Research Report
  • [Publications] Yong Sun: "Study of Sputtering Mechanism of Silicon with Hydrogen Plasma Controlled by Magnetic Field" Jpn. J. Appl. Phys.33. L263-L266 (1994)

    • Related Report
      1994 Annual Research Report
  • [Publications] Yong Sun: "Temperature-Dependent Reaction of rf Hydrogen Plasma with Silicon" Jpn. J. Appl. Phys.33. L1117-L1120 (1994)

    • Related Report
      1994 Annual Research Report
  • [Publications] Yong Sun: "Study of the Growth Mechanism of Narocrystalline Si:H Films Prepared by Reactive Hydrogen Plasma Sputtering of Silicon" Jpn. J. Appl. Phys.33. L1645-L1648 (1994)

    • Related Report
      1994 Annual Research Report

URL: 

Published: 1994-04-01   Modified: 2020-05-15  

Information User Guide FAQ News Terms of Use Attribution of KAKENHI

Powered by NII kakenhi