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Micro-machining of metal surfaces by scanning probe microscope

Research Project

Project/Area Number 06650821
Research Category

Grant-in-Aid for General Scientific Research (C)

Allocation TypeSingle-year Grants
Research Field Material processing/treatments
Research InstitutionHiroshima-Denki Institute of Technology

Principal Investigator

SUMOMOGI Tsunetaka  Hiroshima-Denki Institute of Technology, Faculty of Engineering, Associate Professor, 工学部, 助教授 (10136129)

Co-Investigator(Kenkyū-buntansha) ENDO Toshiro  Hiroshima-Denki Institute of Technology, Faclty of Engineering, Professor, 工学部, 教授 (60069200)
HIDAKA Yasuharu  Hiroshima-Denki Institue of Technology, Faculty of Engineering, Professor, 工学部, 教授 (20228737)
Project Period (FY) 1994 – 1995
Project Status Completed (Fiscal Year 1995)
Budget Amount *help
¥1,800,000 (Direct Cost: ¥1,800,000)
Fiscal Year 1995: ¥300,000 (Direct Cost: ¥300,000)
Fiscal Year 1994: ¥1,500,000 (Direct Cost: ¥1,500,000)
Keywordsscanning probe microscope / atomic force microscope / scanning tunneling microscope / micro-machining / nano-scale machining / metal surface / マイクロトライボロジ / 金属材料
Research Abstract

First, we constructed a scanning probe microscope (SPM) system for micromachining studies. The SPM system consists of a SPM unit, an atmosphere control apparatus and a measuring/controlling system. The SPM unit has a mechanism which can measure the lateral force images as well as the normal force images.
Secondly, we studied micro-machining of pure metal surfaces in air by the SPM that has a very sharp diamond tip mounted on the end of a cantilever beam. Samples of pure metals, such as Ni, Cu and Au, were prepared by vapor deposition or mechanical polishing of bulk metals. Sample surfaces were scratched with x-y-scanning of 0.5-3 mu m x-direction width and 0.5-20 mu N loading force, and topographies of the scratched area were observed by the same SPM with a loading force of less than 0.1 muN.Flat square hollows of 5-50 nm depth were obtained on Ni, although the ridge caused by the adhesion of removed materials were observed on Cu and Au. In the case of Ni, moreover, the scratched depth is increased with increasing loading force and repetition numbers of scratching. The scratched depth is also strongly dependent on numbers of x direction scan line, but scarcely on x direction scan rate and x-y direction scan width. Results obtained indicate that the nano-scale thickness material removal can be controlled. The mechanism of micro-machining should be determined by several factors such as plasticity, adhesive property and oxide surface of metals. The method presented here will be powerful for micro-machining of various materials.

Report

(3 results)
  • 1995 Annual Research Report   Final Research Report Summary
  • 1994 Annual Research Report
  • Research Products

    (23 results)

All Other

All Publications (23 results)

  • [Publications] T.Sumomogi et al: "Influence of atmosphere on tribological properties of scanning probe microscope observation" 4th Int'l Conf.on Nanometer-scale Sci.& Technol.September 8-12,1996,Bejing,China. (発表予定). (1996)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1995 Final Research Report Summary
  • [Publications] T.Sumomogi et al: "Nanoscale layer removal of metal surfaces by scannig probe microscope scratching" J.Vac.Sci.Technol.B13. 1257-1260 (1995)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1995 Final Research Report Summary
  • [Publications] T.Sumomogi et al: "Micromachining of metal surface by scanning probe microscope" J.Vac.Sci.Technol.B12. 1876-1880 (1994)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1995 Final Research Report Summary
  • [Publications] T.Endo et al: "Observation of lattice defects using scanning tunneling microscopy/sectroscopy at low temperturs" J.Vac.Sci.Technol.B12. 1652-1654 (1994)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1995 Final Research Report Summary
  • [Publications] H.Yamada et al: "A new method to measure dI/dV and d^2I/dV^2 of tunneling current-voltage characteristics" J.Vac.Sci.Technol.B12. 1655-1657 (1994)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1995 Final Research Report Summary
  • [Publications] T.Endo et al: "Constraction of scanning tunneling microscope for the investigation of electronic structures of lattice defects in high purity metals" Int'l Conf.on Ultra High Purity Base Metals May 24-27,1994,Kitakyushu-city,Japan. 467-471 (1994)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1995 Final Research Report Summary
  • [Publications] Micromachining of metal surfaces by scanning probe microscope: "T.Sumomogi, T.Endo, K.Kuwahara, R.Kaneko and T.Miyamoto" J.Vac.Sci.Technol.B.Vol.12. 1876-1880 (1994)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1995 Final Research Report Summary
  • [Publications] T.Endo, H.Yamada, T.Sumomogi, T.Kino, N.Kusunoki and S.Morita: "Observation of lattice defect using a scanning tunneling microscope/spectroscope at low temperatueres" J.Vac.Sci.Technol.B,Vol.12. 1652-1654 (1994)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1995 Final Research Report Summary
  • [Publications] "Construction of a scanning tunneling microscope for the investigation of electronic structures of lattice defects in high purity metals" Ultra High Purity Base Metals. UHPM-94. 467-471 (1994)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1995 Final Research Report Summary
  • [Publications] T.Sumomogi, T.Endo, K.Kuwahara and R.Kaneko: "Micromachining of metal surfaces by scanning probe microscope" New Letter (Jap.Soc.Appl.Phys. ; Thin Films and Surf.Phys.Div). No.90. 123 (1994)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1995 Final Research Report Summary
  • [Publications] T.Sumomogi, T.Endo, K.Kuwahaea and R.Kaneko: "Nanoscale layr removal of metal surfaces by scanning probe microscope scratching" J.Vac.Sci.Technol.B.Vol.13. 1257-1260 (1995)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1995 Final Research Report Summary
  • [Publications] T.Sumomogi, K.Hieda, T.Endo and K.Kuwahara: "Influence of atmosphere on tribological properties of scanning probe microscope observation" Fourth Intl.Conf.on Nanometer-Scale Science and Technology, Beijing, China, Sep.8-12. (submitted). (1996)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1995 Final Research Report Summary
  • [Publications] K.Hieda, Y.Hayashi and T.Sumomogi: "Construction of scanning probe microscope system for nano-tribology study" Mem.Hiroshima-Denki Inst.& Hiroshima Jun.Col.Auto.Engi.(submitted).

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1995 Final Research Report Summary
  • [Publications] T. Sumomogi et al: "Influence of atmoshere on tribological properties of scanning probe microscope observation" 4th Int'l Conf. on Nanometer-scale Sci. & Technol. September 8-12, 1996, Beijing, China. (発表予定). (1996)

    • Related Report
      1995 Annual Research Report
  • [Publications] T. Sumomogi et al: "Nanoscale layer removal of metal surfaces by scanning probe microscope scratching" J. Vac. Sci. Technol.B13. 1257-1260 (1995)

    • Related Report
      1995 Annual Research Report
  • [Publications] T. Sumomogi et al: "Micromachining of metal surfaces by scanning probe microscope" J. Vac. Sci. Technol.B12. 1876-1880 (1994)

    • Related Report
      1995 Annual Research Report
  • [Publications] T. Endo et al: "Obsercation of lattice defects using scanning tunneling microscopy/sertroscopy at low tempertures" J. Vac. Sci. Technol.B12. 1652-1654 (1994)

    • Related Report
      1995 Annual Research Report
  • [Publications] H. Yamada et al: "A new method to measure dI/dV and d^2I/dV^2 of tunneling current-voltage charactersitics" J. Vac. Sci. Technol.B12. 1655-1657 (1994)

    • Related Report
      1995 Annual Research Report
  • [Publications] T. Endo et al: "Constraction of scanning tunneling microscope for the investigation of electronic structures of lattice defects in high purity metals" Int'l Conf. on Ultra High Purity Base Metals May 24-27, 1994, Kitakyushu-city, Japan. 467-471 (1994)

    • Related Report
      1995 Annual Research Report
  • [Publications] T.Sumomogi: "Nanocale layer removal of metal surfaces by scanning probe microscope scratching" J.Vac.Sci.Technol.B13(in press). (1995)

    • Related Report
      1994 Annual Research Report
  • [Publications] T.Sumomogi: " Micromachining of metal surfaces by scanning probe microscope" J.Vac.Sci.Technol.B12. 1876-1880 (1994)

    • Related Report
      1994 Annual Research Report
  • [Publications] T.Endo: "Observation of lattice defects using scanning tunneling microscopy/sectroscopy low tempertures" J.Vac.Sci.Technol.B12. 1652-1654 (1994)

    • Related Report
      1994 Annual Research Report
  • [Publications] H.Yamada: "A new method to measure dI/dV and d^2I/dV^2 of tunneling current-voltage characteristics" J.Vac.Sci.Technol.B12. 1655-1657 (1994)

    • Related Report
      1994 Annual Research Report

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Published: 1994-04-01   Modified: 2016-04-21  

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