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Studies on parallel processing of test generation for VLSI circuits

Research Project

Project/Area Number 06680322
Research Category

Grant-in-Aid for General Scientific Research (C)

Allocation TypeSingle-year Grants
Research Field 計算機科学
Research InstitutionNara Institute of Science and Technology

Principal Investigator

FUJIWARA Hideo  NAIST Grad.Sch.of Info.& Syst.Professor, 情報科学研究科, 教授 (70029346)

Co-Investigator(Kenkyū-buntansha) INOUE Tomoo  NAIST Grad.Sch.of Info.& Syst.Research Assosiate, 情報科学研究科, 助手 (40252829)
Project Period (FY) 1994 – 1995
Project Status Completed (Fiscal Year 1995)
Budget Amount *help
¥1,500,000 (Direct Cost: ¥1,500,000)
Fiscal Year 1995: ¥800,000 (Direct Cost: ¥800,000)
Fiscal Year 1994: ¥700,000 (Direct Cost: ¥700,000)
KeywordsVLSI circuit / test generation / parallel processing / multi-processor system / fault parallelizm / performance analysis
Research Abstract

The problem of test generation for VLSI circuits computationally requires prohibitive costs. Parallel processing on a multiprocessor system is one of available methods in order to speedup the process for such time-consuming problem. In this paper, we analyyze the performance of parallel test generation for combinational circuits. We present two types of parallel test generation systems in which the communication methods are different ; vector broadcasting (VB) and fault broadcasting (FB) systems. We analyze the number of generated test vectors, the costs of test vector generation, fault simulation and communication, and the speedup of these parallel test generation systems, where the two types of communication factors ; communication cut-off factor and the communication period, are applied. We also present experimental results on the VB and FB systems implemented on a network of workstations using ISCAS'85 and ISCAS'89 benchmark circuits. The analytical and experimental results show that the total number of test vectors generated in the VB system is the same as that in the FB system, the speedup of the FB system is larger than that of the VB, and it is effective in reducing the communication cost to switch broadcasted data from vectors to faults.

Report

(3 results)
  • 1995 Annual Research Report   Final Research Report Summary
  • 1994 Annual Research Report
  • Research Products

    (17 results)

All Other

All Publications (17 results)

  • [Publications] 井上智生: "Optimal granularity of parallel test generation on the Client-Agent-Senermodel" 情報処理学会論文誌. Vol.35No.8. 1614-1623 (1994)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1995 Final Research Report Summary
  • [Publications] 井上智生: "On the performance aralysis of parallel processing for test generation" Proceedings of the Third IEEE Asian Test Symposium. 69-74 (1994)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1995 Final Research Report Summary
  • [Publications] 井上智生: "A scheduling problem in test generation" Proceedings of the 13th IEEE VLSI Test Symposium. 344-349 (1995)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1995 Final Research Report Summary
  • [Publications] 藤原秀雄: "Optimal granularity ardscheme of parallel test generation in a distributed System" Vol.6 No.7. (1995)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1995 Final Research Report Summary
  • [Publications] 藤原秀雄: "Optimal granularity ardscheme of parallel test generation in a distributed System" Vol.6 No.7. (1995)344-349

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1995 Final Research Report Summary
  • [Publications] Tomoo Inoue, Tomonori Yonezawa and Hideo Fujiwara: ""Optimal granularity of parallel test generation on the Client-Agent-Server model."" Transactions of Information Processing Society of Japan. Vol.35, No.8. 1614-1623 (1994)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1995 Final Research Report Summary
  • [Publications] Tomoo Inoue, Takaharu Fujii and Hideo Fujiwara: ""On the performance analysis parallel processing for test generation."" Proceedings of the Third IEEE Asian Test Symposium. 69-74 (1994)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1995 Final Research Report Summary
  • [Publications] Tomoo Inoue, Hironori Maeda and Hideo Fujiwara: ""A scheduling problem in test generation."" Proceedings of the 13th IEEE VLSI Test Symposium. 344-349 (1995)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1995 Final Research Report Summary
  • [Publications] Hideo Fujiwara and Tomoo Inoue: ""Optimal granularity and scheme of parallel test generation in a distributed system."" IEEE Transactions on Parallel and Distributed Systems. Vol.6, No.7. 677-686 (1995)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1995 Final Research Report Summary
  • [Publications] 井上智生,米澤友紀,藤原秀雄: "Optimal granularity of parallel test generation of the Client-Agent-Server model" 情報処理学会論文誌. ud.35,No,8. 1614-1623 (1994)

    • Related Report
      1995 Annual Research Report
  • [Publications] 井上智生,藤井高晴,藤原秀雄: "On the performance analysis of parallel processing for test generation" Proceedings of theThird IEEE Asian Test Symposium. 69-74 (1994)

    • Related Report
      1995 Annual Research Report
  • [Publications] 藤原秀雄,井上智生: "Optimal granularity and scheme of parallel test generation in a distributed system" IEEE Trans.on Parallel and DistributedSystems. Vol.6. 667-686 (1995)

    • Related Report
      1995 Annual Research Report
  • [Publications] 井上智生,前田裕紀,藤原秀雄: "A scheduling problem on test generation" Proceedings of the 13th IEEE VLSI Test Symposium. 344-349 (1995)

    • Related Report
      1995 Annual Research Report
  • [Publications] 井上智生,米澤友紀,藤原秀雄: "Optimal granularity of parallel test generation on hte Client-Agent-Server model" 情報処理学会論文誌. Vol.35 No.8. 1614-1623 (1994)

    • Related Report
      1994 Annual Research Report
  • [Publications] 井上智生,藤井高晴,藤原秀雄: "On the performance analysis of parallel processing for test generation" Proceedings of the Third IEEE Asian Test Symposium. 69-74 (1994)

    • Related Report
      1994 Annual Research Report
  • [Publications] 井上智生,藤原秀雄: "Optimal granularity and scheme of parallel test generation in a distributed system" IEEE Transacitions on Parallel and Distributed Systems. (掲載決定).

    • Related Report
      1994 Annual Research Report
  • [Publications] 井上智生,前田裕紀,藤原秀雄: "A scheduling problem in test generation" Proceedings of the IEEE VLSI Test Symposium. (発表予定). (1995)

    • Related Report
      1994 Annual Research Report

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Published: 1994-04-01   Modified: 2016-04-21  

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