| Project/Area Number |
07044166
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| Research Category |
Grant-in-Aid for international Scientific Research
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| Allocation Type | Single-year Grants |
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| Section | Joint Research |
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| Research Institution | Nihon University |
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Principal Investigator |
MIYAMOTO Tetsu College of Science and Technology, Nihon University, Professor, 理工学部, 教授 (10059256)
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| Co-Investigator(Kenkyū-buntansha) |
SCHYLAPTSEVA Alla Scientific Research Institute of Technical Glass, 主任研究員
KANTSYREV Victor Scientific Research Institute of Technical Glass, 研究室長
TAKASUGI Keiichi College of Science and Technology, Nihon University, 理工学部, 講師 (50187952)
SCHYLAPTSEVA シュラプツエバー ガラス技術研究所, 主任研究員
SCHLAPTSEVA アラー 工業ガラス研究所, 主任研究員
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| Project Period (FY) |
1995 – 1996
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| Project Status |
Completed (Fiscal Year 1996)
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| Budget Amount *help |
¥3,500,000 (Direct Cost: ¥3,500,000)
Fiscal Year 1996: ¥1,200,000 (Direct Cost: ¥1,200,000)
Fiscal Year 1995: ¥2,300,000 (Direct Cost: ¥2,300,000)
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| Keywords | Z-pinch / Soft Z-ray / Capillary Converter / X-ray spectroscopy / Z-pinch / Gas-puff Z-pinch / Soft X ray / Spectral analysis / Capillary convertor |
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| Research Abstract |
The X-ray radiation emitted from the gas-puff Z-pinch device in Nihon University was observed by the X-ray technologies developed in the Scientific Institute of Technical Glass. The gas-puff Z-pinch emits intensive X-rays with a wide wave length. The observation was carried out by glass capillary converters and X-ray spectrometers.
The glass capillary converter propagated selectedly the soft X-ray with longer wave length than 1 nm and converged it in a spot within 1 mm. It plays a role of filter for the hard X-ray with shorter wave length. Making use of this feature the thermal plasma profile was observed removing the effect of hard X-rays emitted by high energy electrons accelerated by the applied electric field.
In the spectroscopy both crystal and multi-layr membrane were used for diffraction. The fabricated spectroscopy is small and simple, and it is easy to change the measuring length by replacing a crystal. In the crystal interferometer two wave length regions, 3.4-4.6 nm and less than 1 nm, were measured. Both regions of radiation were emitted from specially different place. The previous measurement showed that the X-ray radiation was emitted in different instance and from different place. The present result was consistent of it. The latter radiation was emitted from the hot spot relating with instabilities except the surface of the electrodes. In the spectroscopy with the multi-layr membrane, both spectral lines and one-dimensional, special distribution was observed. As our spectroscopic pictures were obtained by integrating 50-100 times shots, the profile of special distribution was quite ambiguous. However, both spectral lines and special profile will be obtained simultaneously for more bright X-ray source.
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