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Development of nano-CMM (Coordinate Measuring Machine with Nanometer Resolution)

Research Project

Project/Area Number 07455109
Research Category

Grant-in-Aid for Scientific Research (B)

Allocation TypeSingle-year Grants
Section一般
Research Field Intelligent mechanics/Mechanical systems
Research InstitutionThe University of Tokyo

Principal Investigator

TAKAMASU Kiyoshi  The University of Tokyo, Graduate School of Engneering, Department of Precision Engineering, Associate Professor, 大学院・工学研究科, 助教授 (70154896)

Project Period (FY) 1995 – 1997
Project Status Completed (Fiscal Year 1997)
Budget Amount *help
¥7,500,000 (Direct Cost: ¥7,500,000)
Fiscal Year 1997: ¥1,400,000 (Direct Cost: ¥1,400,000)
Fiscal Year 1996: ¥1,500,000 (Direct Cost: ¥1,500,000)
Fiscal Year 1995: ¥4,600,000 (Direct Cost: ¥4,600,000)
KeywordsCoordinate Measureing Machine / Nanometer Measurement / Thermal Force Analysis / Precision Instrument / 精密測定機 / 三次元座標測定 / ナノメール計測
Research Abstract

New X table of nano-CMM which made of iron and added newly parts for improvements was designed and made. The performances of the table was tested by the laser interferometer. Then, the thermal force properties of the bable were investigated by the series of thermal tests. A probing system for SMM was installed on Z table and three dimensional measureing tests were carried out.
From these tests, we an reach the following results,
(1) We estimate the straightness of X table is 100 nm and the repeatability is 20nm, from the testes by the laser intrferometer and measuring an optical flat.
(2) New Z table with parallel springs was designed.
(3) We estimate the straightness of Z table is 400 nm and the repeatability is 40 nm.
(4) using a probing system was installed on Z table, it is found that three dimensional measuring tests with nanometer resolution can be done in the systam.
(5) The accuracy of the system is most influenced by the probing system.
(6) From thermal analysis, the material and the thermal circumstance of the instruments are important for nanameter measurements.

Report

(4 results)
  • 1997 Annual Research Report   Final Research Report Summary
  • 1996 Annual Research Report
  • 1995 Annual Research Report
  • Research Products

    (34 results)

All Other

All Publications (34 results)

  • [Publications] 高増 潔: "nano-CMMの研究開発" 機械と工具. 39. 28-32 (1995)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1997 Final Research Report Summary
  • [Publications] 高増 潔: "形状測定におけるソフトウェアの問題点" 精密工学会誌. 61. 1049-1053 (1995)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1997 Final Research Report Summary
  • [Publications] K.Takamasu: "Data Processing Method for Geometrical Forms with Form Deviations in Coordinate Metrology" Proc.4th CIRP Seminar Computer Aided Tolerancing. 301-311 (1995)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1997 Final Research Report Summary
  • [Publications] K.Takamasu: "Basic Concepts of Nano-CMM" Proc.Japan-China Bilateral Symposium. 155-158 (1996)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1997 Final Research Report Summary
  • [Publications] S.Osawa: "Profile Measurement by Combination Projection Method" Proc.Japan-China Bilateral Symposium. 207-221 (1996)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1997 Final Research Report Summary
  • [Publications] K.Takamasu: "Development of Nano-CMM(Coordinate Measuring Machine with Nanometer Resolution)" Proc.IMEKO World Congress ΞV. 8. 34-39 (1997)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1997 Final Research Report Summary
  • [Publications] K.Takamasu: "Statistical Evaluation of Form Deviations in Coordinate Metrology" Proc.9th IPES. 255-258 (1997)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1997 Final Research Report Summary
  • [Publications] 高増 潔: "座標計測における形体パラメータの信頼性" 精密工学会誌. 63. 1594-1598 (1997)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1997 Final Research Report Summary
  • [Publications] K.Takamasu: "Development of nano-CMM" Tool Engineer. Vol.39. 28-32 (1995)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1997 Final Research Report Summary
  • [Publications] K.Takamasu: "Software for Profile Measurements" Journal of JSPE. Vol.61. 1049-1053 (1995)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1997 Final Research Report Summary
  • [Publications] K.Takamasu: "Data Processing Method for Geometrical Forms with Form Deviations in Coodinate Metrology" Proc.4th CIRP Semina Computer Aided Tolerancing. 301-311 (1995)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1997 Final Research Report Summary
  • [Publications] K.Takamasu: "Basic Concepts of Nano-CMM" Proc.Japan-China Bilateral Symposium. 155-158 (1996)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1997 Final Research Report Summary
  • [Publications] S.Osawa: "Profile Measurement by Combination Projection Method" Proc.Japan-China Bilateral Symposium. 207-221 (1996)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1997 Final Research Report Summary
  • [Publications] K.Takamasu: "Development of Nano-CMM (Coordinate Measuring Macchine with Nanometer Resolution)" Proc.IMEKO World Congress XIV. Vol.18. 34-39 (1997)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1997 Final Research Report Summary
  • [Publications] K.Takamasu: "Statistical Evaluation of Form Deviations in Coordinate Metrology" Proc.9th IPES. 255-258 (1997)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1997 Final Research Report Summary
  • [Publications] K.Takamasu: "Reliability of Parameters for Associated Features in Coordinate Metrology" Journal of JSPE. Vol.63. 1594-1598 (1997)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1997 Final Research Report Summary
  • [Publications] 高増 潔: "nano-CMMの研究開発" 機械と工具. 39. 28-32 (1995)

    • Related Report
      1997 Annual Research Report
  • [Publications] 高増 潔: "形状測定におけるソフトウェアの問題点" 精密工学会誌. 61. 1049-1053 (1995)

    • Related Report
      1997 Annual Research Report
  • [Publications] K.Takamasu: "Data Processing Method for Geometrical Forms with Form Deviations in Coordinate Metrology" Proc.4th CIRP Seminar Computer Aided Tolerancing. 301-311 (1995)

    • Related Report
      1997 Annual Research Report
  • [Publications] K.Takamasu: "Basic Concepts of Nano-CMM" Proc.Japan-China Bilateral Symposium. 155-158 (1996)

    • Related Report
      1997 Annual Research Report
  • [Publications] S.Osawa: "Profile Measurement by Combination Projection Method" Proc.Japan-China Bilateral Symposium. 207-221 (1996)

    • Related Report
      1997 Annual Research Report
  • [Publications] K.Takamasu: "Development of Nano-CMM (Coordinate Measuring Mechine with Nanometer Resolution)" Proc.IMEKO World Congress XIV. 8. 34-39 (1997)

    • Related Report
      1997 Annual Research Report
  • [Publications] K.Takamasu: "Statistical Evaluation Form Deviation in Coordinate Metrology" Proc.9th IPES. 255-258 (1997)

    • Related Report
      1997 Annual Research Report
  • [Publications] 高増 潔: "座標計測における形体パラメータの信頼性" 精密工学会誌. 63. 1594-1598 (1997)

    • Related Report
      1997 Annual Research Report
  • [Publications] 高増潔: "座標計測における幾何偏差を含んだ形体間演算" 精密工学会誌. 62. 964-968 (1996)

    • Related Report
      1996 Annual Research Report
  • [Publications] 浅野秀光: "多値パターン投影による3次元形状測定(第2報)" 精密工学会誌. 62. 830-834 (1996)

    • Related Report
      1996 Annual Research Report
  • [Publications] K.Takamasu: "Basic Concepts of Nano-CMM" Proc.Iapan-China Bilateral Symposium. 155-158 (1996)

    • Related Report
      1996 Annual Research Report
  • [Publications] S.Osawa: "Profile Measurement by Combination Projection Method" Proc.Japan-China Bilateral Symposium. 207-221 (1996)

    • Related Report
      1996 Annual Research Report
  • [Publications] F.Kimura: "Computer-Aided Tolerancing" Chapman & Hall, 352 (1996)

    • Related Report
      1996 Annual Research Report
  • [Publications] 洪 俊憙: "測定データから抽出した幾何バラメータによる加工工程の管理手法" 精密工学会誌. 61. 1710-1714 (1995)

    • Related Report
      1995 Annual Research Report
  • [Publications] 大澤尊光: "多値パターン投影による三次元形状測定" 精密工学会誌. 61. 1101-1105 (1995)

    • Related Report
      1995 Annual Research Report
  • [Publications] 高増 潔: "nano-CMMの研究開発" 機械と工具. 39. 28-32 (1995)

    • Related Report
      1995 Annual Research Report
  • [Publications] 高増 潔: "形状測定におけるソフトウェアの問題点" 精密工学会誌. 61. 1049-1053 (1995)

    • Related Report
      1995 Annual Research Report
  • [Publications] K.Takamasu: "Data Processing Method for Geometrical Forms with Form Deviations in Coordinate Metrology" Proc.4th CIRP Seminar Computer Aided Tolerancing. 301-311 (1995)

    • Related Report
      1995 Annual Research Report

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Published: 1995-04-01   Modified: 2016-04-21  

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