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DEVELOPMENT OF FABRICATION SYSTEM FOR NEW QUANTUM FUNCTIONAL MATERIALS OF SEMICONDUCTOR/INSULATOR/METAL HYBRID STRUCTURES

Research Project

Project/Area Number 07555100
Research Category

Grant-in-Aid for Scientific Research (A)

Allocation TypeSingle-year Grants
Section展開研究
Research Field Electronic materials/Electric materials
Research InstitutionNAGOYA UNIVERSITY

Principal Investigator

TAKEDA Yoshikazu  NAGOYA UNIVERSITY,DEPARTMENT OF MATERIALS SCIENCE AND ENGINEERING,PROFESSOR, 工学研究科, 教授 (20111932)

Co-Investigator(Kenkyū-buntansha) 澤井 巳喜夫  サムコ, インターナショナル研究所・技術開発部, 研究員
TATSUTA Toshiaki  SAMCO INTERNATIONAL LABORATORY,DEVELOPMENT DIVISION,DIVISION HEAD, インターナショナル研究所・技術開発部, 研究員
NONOGAKI Yoichiro  OKAZAKI NATIONAL RESERACH INSTITUTES,INSTITUTE FOR MOLECULAR SCIENCE,RESEARCH AS, 分子科学研究所, 助手 (40300719)
TABUCHI Masao  NAGOYA UNIVERSITY,DEPARTMENT OF MATERIALS SCIENCE AND ENGINEERING,ASSISTANT PROF, 工学部, 講師 (90222124)
FUJIWARA Yasufumi  NAGOYA UNIVERSITY,DEPARTMENT OF MATERIALS SCIENCE AND ENGINEERING,ASSOCIATE PROF, 工学研究科, 助教授 (10181421)
OYANAGI Hiroyuki  ELECTROTECHNICAL LABORATORY,EXOTIC MATERIALS RESEARCH LABORATORY,LABORATORY HEAD
大柳 宏之  電子技術総合研究所, 電子基礎部, 研究員
Project Period (FY) 1995 – 1997
Project Status Completed (Fiscal Year 1997)
Budget Amount *help
¥23,100,000 (Direct Cost: ¥23,100,000)
Fiscal Year 1997: ¥1,700,000 (Direct Cost: ¥1,700,000)
Fiscal Year 1996: ¥7,800,000 (Direct Cost: ¥7,800,000)
Fiscal Year 1995: ¥13,600,000 (Direct Cost: ¥13,600,000)
KeywordsSEMICONDUCTORS / INSULATORS / METALS / HYBRID STRUCTURES / QUANTUM FUNCTIONS / GROWTH SYSTEM
Research Abstract

To realize such a hybrid structure as smiconductor/insulator/metal for a new quantum functional materials, conventional growth techniques are of no use. The hetero-interface must be controlled to one monolayr accuracy. We designed and fabricated a new reactor structure in OMVPE system with very quick switching of source gases and correpondong pressure balance in the low-pressure vertical reactor.
To test the basic capability of the new growth system, InP/InGaAs/InP with monolayr level InGaAs and with different switching modes of source gases were grown and the heterointerface structures were investigated mainly by the X-ray CTR scattering and interference using synchrotron radiation.
delta-doped ErP structures in InP were also fabricated and the layr structure and even the crystal structure of the ErP were elucidated by fluorescence-detected EXAFS and X-ray CTR scattering. The ErP layr was found to be the rocksalt structure by both techniques and the Er distribution (as-grown and after anealing) was determined to one monolayr level. From the growth temperature dependence of the local structures around Er atoms it was very clearly concluded that the strong dependence of the photo-luminescecce intensity on the growth temperature is determined by the local structure around the Er atoms, i.e., zincblende strucrtre gives a high intensity and the rocksalt structure almost diminshes the luminescene.
The versatile switching modes of the new growth system enabled the droplet hetero-epitaxy by which InAs quantum dots on InP (001)-just surface were successfully fabricated and showed emission in the 1.5mum-region which is important for the optical fiber communication.

Report

(4 results)
  • 1997 Annual Research Report   Final Research Report Summary
  • 1996 Annual Research Report
  • 1995 Annual Research Report
  • Research Products

    (38 results)

All Other

All Publications (38 results)

  • [Publications] 田渕, 竹田 他: "Croup-V Atoms Exchange Due to Exposure of InP Surface to AsH_3(+PH_3) Revealed by X-Ray CTR Scattering" Journal of Electronic Materials. 25. 671-675 (1996)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1997 Final Research Report Summary
  • [Publications] 田渕, 竹田 他: "Distribution of As atoms in InP/InPAs/InP and InP/InGaAs/InP hetero-structures measured by X-ray CTR scattering" Institute of Physics Conference Series. 145. 227-232 (1996)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1997 Final Research Report Summary
  • [Publications] 田渕, 竹田 他: "Exafs and X-Ray CTR Scattering Characterization of Er Doped in InP by OMVPE" Materials Research Society Symposium Proceedings. 422. 155-160 (1996)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1997 Final Research Report Summary
  • [Publications] 田渕, 竹田 他: "Atom configuration study of δ-doped Er in InP by fluorescence" Applied Surface Science. 117/118. 781-784 (1997)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1997 Final Research Report Summary
  • [Publications] 藤田, 竹田 他: "Occupation site and distribution of δ-doped Er in InP measured by X-ray CTR scattering" Applied Surface Science. 117/118. 785-789 (1997)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1997 Final Research Report Summary
  • [Publications] 竹田, 藤原 他: "Layer structure analysis of Er δ-doped InP by x-ray crystal truncation rod scattering" Jouenal of Applied Physics. 82. 635-638 (1997)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1997 Final Research Report Summary
  • [Publications] M.Tabuchi, Y.Takda et al.: "Group-V atoms exchange due to exposure of InP surface to AsH_3 (+PH_3) revealed by X-ray CTR scattering" J.Electron.Mat.Vol.25. 671-675 (1996)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1997 Final Research Report Summary
  • [Publications] M.Tabuchi, Y.Takeda et al.: "Distribution of As atoms in InP/InPAs/InP and InP/InGaAs/InP heterostructures measured by X-ray CTR scattering" Inst.Phys.Conf.Ser.No.145. 227-232 (1996)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1997 Final Research Report Summary
  • [Publications] M.Tabuchi, Y.Fujiwara, Y.Takeda et al.: "EXAFS and X-ray CTR scattering characterization of Er doped in InP by OMVPE" Materials Research Society Symposium Proceedings, Vol.422, Rare-Earth Doped Semiconductors II. 150-160 (1996)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1997 Final Research Report Summary
  • [Publications] M.Tabuchi, Y.Takeda et al.: "Distribution of As atoms in InP/InPAs (1 monolayr) /InP heterostructures measured by x-ray crystal truncation rod scattering" J.Appl.Phys.Vol.81. 112-115 (1997)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1997 Final Research Report Summary
  • [Publications] M.Tabuchi, Y.Fujiwara, Y.Takeda et al.: "Atom configuration study of delta-doped Er in InP by fluorescence EXAFS" Appl.Sur.Sci.Vols.117/118. 781-784 (1997)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1997 Final Research Report Summary
  • [Publications] Y.Takeda, Y.Fujiwara, M.Tabuchi et al.: "Layr structure analysis of Er delta-doped InP by X-ray crystal truncation rod scattering" Appl.Sur.Sci.Vols.117/118. 785-789 (1997)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1997 Final Research Report Summary
  • [Publications] M.Tabuchi, T., Fujiwara, Y.Takeda et al.: "Local structures around Er atoms doped in InP revealed by fluorescence EXAFS scattering" Microelectrom.Engr.J.(accepted for publication).

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1997 Final Research Report Summary
  • [Publications] Y.Nonogaki, Y.Fujiwara, Y.Takeda et al.: "InAs dots grown on InP (001) by droplet hetero-epitaxy using OMVPE" Mat.Sci.& Engr.B. (accepted for publication).

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1997 Final Research Report Summary
  • [Publications] M.Tabuchi, Y.Takeda et al.: "Determination of composition in InP/InGaAs/InP qunatum-well structures by X-ray CTR scattering and quantum levels" J.Cryst.Growth. (accepted for publication).

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1997 Final Research Report Summary
  • [Publications] M.Tabuchi, Y.takeda et al.: "EXAFS measurement on local structure around erbium atoms doped in GaAs with oxygen co-doping" Defects in Semiconductors. (accepted for publication).

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1997 Final Research Report Summary
  • [Publications] M.Tabuchi, Y.Takeda et al.: "Observation of composition in surface monolayr by X-ray scattering spectra caused by crystal truncation rod and interference" J.Synch.Radiat.(accepted for publication).

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1997 Final Research Report Summary
  • [Publications] M.Tabuchi, Y.Fujiwara, Y.Takeda et al.: "Local structure study on dilute Er in III-V semi-conductors by fluorescence EXAFS" J.Synch.Radiat.(accepted for publication).

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1997 Final Research Report Summary
  • [Publications] M.Tabuchi, Y.Takeda et al.: "Monolayr scale analysis of ZnSe/GaAs hetero-interfaces structures by X-ray CTR scattering and interference" Inst.Phys.Conf.Ser.(accepted for publication).

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1997 Final Research Report Summary
  • [Publications] M.Tabuchi, Y.Fujiwara, Y.Takeda et al.: "Thermal diffusion of Er atoms delta-doped in InP" Appl.Sur.Sci.(accepted for publication).

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1997 Final Research Report Summary
  • [Publications] M.Tabuchi, Y.Fujiwara, Y.Takeda et al.: "Local structures around Fe atoms and magnetic properties of Fe/Cu multilayrs" Appl.Sur.Sci.(accepted for publication).

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1997 Final Research Report Summary
  • [Publications] 田渕,竹田 他: "Group-V Atoms Exchange Due to Exposure of InP Surface to A_sH_3(+PH_3) Revealed by X-Ray CTR Scattering" Journal of Electronic Materials. 25. 671-675 (1996)

    • Related Report
      1997 Annual Research Report
  • [Publications] 田渕,竹田 他: "Distribution of As Atoms in InP/InPAs/InP and InP/InGaAs/InP hetero-structures measured by X-ray CTR Scattering" Institute of Physics Conference Series. 145. 227-232 (1996)

    • Related Report
      1997 Annual Research Report
  • [Publications] 田渕,竹田 他: "Exafs and X-Ray CTR Scattering Characterization of Er Doped in InP by OMVPE" Materials Research Society Symposium Proceedings. 422. 155-160 (1996)

    • Related Report
      1997 Annual Research Report
  • [Publications] 大渕,竹田 他: "Atom configuration study of δ-doped Er in InP by fluorescence" Applied Surface Science. 117/118. 781-784 (1997)

    • Related Report
      1997 Annual Research Report
  • [Publications] 藤田,竹田 他: "Occupation site and distribution of δ-doped Er in InP measured by X-Ray CTR Scattering" Applied Surface Science. 117/118. 785-789 (1997)

    • Related Report
      1997 Annual Research Report
  • [Publications] 竹田,藤原 他: "Layer Structure analysis of Er δ-doped InP by X-ray Crystal truncation rod scattering" Journal of Applied Physics. 82. 635-638 (1997)

    • Related Report
      1997 Annual Research Report
  • [Publications] 竹田,田渕 他: "Group-V atoms exchange due to exposure of surface to A_2HH_3 (+PH_3) revealed by X-Ray CTR scattering" J.Electron.Mat.25. 671-675 (1996)

    • Related Report
      1996 Annual Research Report
  • [Publications] 竹田,田渕 他: "Distributio of As atoms in InP/InPAs/InP and InP/In GaAs/InP hetero-structures measured by X-ray CTR scatering." Inst.Phys.Conf.Ser.145. 227-232 (1976)

    • Related Report
      1996 Annual Research Report
  • [Publications] 竹田,田渕 他: "EXAFs and X-ray CTR scattering characterization of Er doped in InP by OMVPE" Rare Earth Doped Semiconductors II. 422. 155-160 (1996)

    • Related Report
      1996 Annual Research Report
  • [Publications] 田渕,竹田 他: "実験室系のX線回折装置を使用したX線CTR測定による半導体のヘテロ構造界面評価" 電子情報通信学会技報. ED96-40. 69-74 (1996)

    • Related Report
      1996 Annual Research Report
  • [Publications] 竹田,田渕 他: "BL12Cによる不純物レベルのEXAFS測定" Photon Factory News. 13. 19-24 (1996)

    • Related Report
      1996 Annual Research Report
  • [Publications] 田渕,竹田 他: "Distribution of As atoms in InP/InP As (1 monolayer)/InP heterostructures measured by X-ray crystal truncation rod scattering" J.Appl.Phys.81. 112-115 (1997)

    • Related Report
      1996 Annual Research Report
  • [Publications] 竹田,田渕 他: "蛍光EXAFS法によるInP中に均一ドープしたEr原子周囲の局所構造解析" 電子情報通信学会技報. ED95-117. 7-12 (1995)

    • Related Report
      1995 Annual Research Report
  • [Publications] 竹田,藤原 他: "Erをδド-ピングしたInPのX線CTR散乱法による界面構造解析" 電子情報通信学会技報. ED95-118. 13-18 (1995)

    • Related Report
      1995 Annual Research Report
  • [Publications] 田渕,竹田 他: "Group-V atoms.exchange due to exposure of InP surface to AsH_3(+PH_3) revealed by X-ray CTR scattering" J.Electron Mat.(印刷中). (1996)

    • Related Report
      1995 Annual Research Report
  • [Publications] 田渕,竹田 他: "Distribution of As atoms in InP/InPAs/InP and InP/InGaAs/InP heterostructures measured by X-ray CTR scattering" Institute of Physics Conference Series. (印刷中). (1996)

    • Related Report
      1995 Annual Research Report
  • [Publications] 田渕,竹田 他: "As desonption from InGaAs morolayer during PH_3-purge in OMVPE growth of InP/InGaAs(IML)/InP heterostructures measured by X-ray CTR" Indium Phosphide and Related Materials. (印刷中). (1996)

    • Related Report
      1995 Annual Research Report

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Published: 1995-04-01   Modified: 2016-04-21  

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