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Development of Photo-conductive Device with Electric Field Modulation Type using New Material of Layr Semiconductor

Research Project

Project/Area Number 07555114
Research Category

Grant-in-Aid for Scientific Research (A)

Allocation TypeSingle-year Grants
Section試験
Research Field 電子デバイス・機器工学
Research InstitutionTokyo National College of Technology

Principal Investigator

OHYAMA Masanori  Department of Electrical Engineering Tokyo National College of Technology, Professor, 電気工学科, 教授 (50042685)

Co-Investigator(Kenkyū-buntansha) KATO Makio  Department of Electrical Tokyo National College of Technology Professor, 電気工学科, 教授 (00042672)
TAMADA Koji  Department of Electrical Engineering Tokyo Natinal College of Technology Assista, 電気工学科, 助手 (40236740)
YUGA Masamitsu  Department of Electronics Tokyo National College of Technology Associate Profess, 電子工学科, 助教授 (40123997)
Project Period (FY) 1995 – 1996
Project Status Completed (Fiscal Year 1996)
Budget Amount *help
¥5,600,000 (Direct Cost: ¥5,600,000)
Fiscal Year 1996: ¥900,000 (Direct Cost: ¥900,000)
Fiscal Year 1995: ¥4,700,000 (Direct Cost: ¥4,700,000)
Keywordscompound semiconductor / layr type structure / photo conduction material / electron beam deposition / RF sputtering / photo sensor / modulated photo device / 光センサー
Research Abstract

The photoconductor device using new material laminar type compound semiconductor has been researched for fundamental development. The photoconductor device using new material for optical application to dynamic system is expected to be in the development of optelectronics. In this research and project, the new materials suitable for the photoconductor is GaS and GaSe of III-VI compound semiconductor. Fundamental properties of GaS and GaSe thin films prepared by RF spattering have been investigated first. These films have been deposited onto fused silica and glass substrates. It is found that crystalline GaSe films with good crystallinity with the appropriate sputtering conditiion at 500゚C of substrate temperature and crystalline GaS films with substrate temperature at 500゚C of reactive sputtering a mixture of Ar and H_2 as the sputtering gas. Furthermore, we have investigate of fundamental properties of GaS and GaSe thin films, prepared by electron beam deposition for those films, the crystalline GaSe films good layr type are obtained by electron beam deposition with substrate temperature at 300゚C.those the growth processes technigues of semiconductors are will lead to new technology in opt electronics.
In specially, we obtain the photoconductivity sigma_p for the GaS thin films of the impurity doping prepared by electron beam Co-deposition (Tb_2Cl_3, Sn 1wt%) with substrate temperature at 300゚C.It should be noted here in experiment that the radio photoconductivity sigma_p/dark conductivity sigma_d takes about 10^3 around room temperature, because this value is expected for the possibility of photoconductor preparations in the practical application.

Report

(3 results)
  • 1996 Annual Research Report   Final Research Report Summary
  • 1995 Annual Research Report
  • Research Products

    (13 results)

All Other

All Publications (13 results)

  • [Publications] 大山 昌憲、玉田 耕治、他: "RFスパッタリングによるSiC薄膜の電気的性質" 東京高等研究報告書. 27. 41-42 (1995)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1996 Final Research Report Summary
  • [Publications] 玉田 耕治、大山 昌憲、: "RFスパッタリングによるGa2S3_<-x>薄膜の基礎物性" 東京高等研究報告書. 27. 43-44 (1995)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1996 Final Research Report Summary
  • [Publications] 大山 昌憲、玉田 耕治、他: "RFスパッタリングによるGaSe薄膜の基礎物性" 東京高専科学技術研究センター「科学技術研究」. 5. 16-17 (1996)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1996 Final Research Report Summary
  • [Publications] M. OHYAMA, K. TAMADA: "Electrical Properties of GaSe Thin Film Prepared by RF Magnetron Sputtering Method" Trans. of The Materials Society of Japan. Vol.16. (1997)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1996 Final Research Report Summary
  • [Publications] Masanori OHYAMA: "Electrical and Optical Properties on GaSe Thin Films of III-VI compound Semiconductor" Trans. Material Science and Physics. 8. (1997)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1996 Final Research Report Summary
  • [Publications] 大山 昌憲、玉田 耕治、他: "RFスパッタリングによるSiC薄膜の電気的性質" 東京高専研究報告書. 27. 41-42 (1995)

    • Related Report
      1996 Annual Research Report
  • [Publications] 玉田 耕治、大山 昌憲: "RFスパッタリングによるGa_2S_<3-x>薄膜の基礎物性" 東京高専研究報告書. 27. 43-44 (1995)

    • Related Report
      1996 Annual Research Report
  • [Publications] 大山 昌憲、玉田 耕治、他: "RFスパッタリングによるGaSe薄膜の基礎物性" 東京高専科学技術研究センター「科学技術研究」. 5. 16-17 (1996)

    • Related Report
      1996 Annual Research Report
  • [Publications] M.OHYAMA,K.TAMADA: "Electrical Properties of GaSe Thin Film Prepared by RF Magnetron Sputtering Method" Trans.of The Materials Society of Japan. Vol.16. (1997)

    • Related Report
      1996 Annual Research Report
  • [Publications] Masanori OHYAMA: "Electrical and Optical Properties on GaSe Thin Films of III-VI compound Semiconductor" Trans.of Material Science and Physics. 8. (1997)

    • Related Report
      1996 Annual Research Report
  • [Publications] 大山昌憲・他: "RFスパッタリングによるSiC薄膜の電気的性質" 東京高専研究報告書. 27. 41-42 (1995)

    • Related Report
      1995 Annual Research Report
  • [Publications] 玉田耕治・他: "RFスパッタリングによるGa_2S_<3-x>薄膜の基礎物性" 東京高専研究報告書. 27. 43-44 (1995)

    • Related Report
      1995 Annual Research Report
  • [Publications] 大山昌憲・他: "RFスパッタリンクによるGaSe薄膜の基礎物性" 科学技術研究(東京高専). 5. 16-17 (1996)

    • Related Report
      1995 Annual Research Report

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Published: 1995-04-01   Modified: 2016-04-21  

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