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DEVELOPMENT OF HIGH TEMPERATURE ULTRA-MICROINDENTOR USING LASER-PHASE-MODULATION-INTERFEROMETER

Research Project

Project/Area Number 07555497
Research Category

Grant-in-Aid for Scientific Research (A)

Allocation TypeSingle-year Grants
Section試験
Research Field Structural/Functional materials
Research InstitutionTHE UNIVERSITY OF TOKYO

Principal Investigator

SUZUKI Takayoshi  THE UNIVERSITY OF TOKYO,INSTITUTE OF INDUSTRIAL SCIENCE,PROFESSOR, 生産技術研究所, 教授 (70013208)

Project Period (FY) 1995 – 1996
Project Status Completed (Fiscal Year 1996)
Budget Amount *help
¥3,500,000 (Direct Cost: ¥3,500,000)
Fiscal Year 1996: ¥3,500,000 (Direct Cost: ¥3,500,000)
KeywordsUltra-microindentor / High Temperature / Laser phase modulation
Research Abstract

Ultra-micro-indentor is the only one method for the direct-measurement of hardnesses and mechanical properties in micro area, and is expected to be applied to material-development and products-management. It is, however, the present situation that the generalization of this measurement-technique is behind because of the technical difficulties at relatively high temperature. In the existing technique, the micro displacement of indentor is indirectly measured by a electric capacitance, therefore the influence of thermal expansion causes errors. The purpose of the present study is the establishment of the fine measurement technique at high temperature, solving the problem of thermal expansion with the direct measurement of the relative displacement between the indentor and sample surface, using a up-to-date laser measurement technique. In the first fiscal year (1995), we developed a laser-phase-modulation-interferometer for the measurement of vertical displacement, and made a design and a trial manufacture of an indentor which introduce the laser beam to the sample surface. The indentor have a hole with 1mm diameter at 1mm distance from the central axis, and have a half-mirror within the hole. The relative displacemet between the indentor and the sample surface is directly measured by interfering the two beams reflected by the mirror and the sample surface. In the fiscal year of 1996, we installed the indentor to an existing micro indentation testing machine and estimated the efficiency from various points of view. The maximum resolution is 1nm. We also found the necessity of fine adjustment of the slope of the sample stage, because the incident angle of the reflected beam to the optical fiber strongly influence the resolution. It is pointed that, if such conditions are satisfied, the ultra micro indentation test at high temperature is available with the same procedure and accuracy as at room temperature avoiding the temperature influence.

Report

(3 results)
  • 1996 Annual Research Report   Final Research Report Summary
  • 1995 Annual Research Report
  • Research Products

    (3 results)

All Other

All Publications (3 results)

  • [Publications] T.Suzuki and T.Ohmura: "Ultra-microindentation of silicon at elevated temperatures" Philosophical Magazine A. 74(5). 1073-1084 (1996)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1996 Final Research Report Summary
  • [Publications] T.Suzuki and T.Ohmura: "Ultra-microindentation of silicon at elevated temperatures" Philosophical Magazine A. 74(5). 1073-1084 (1996)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1996 Final Research Report Summary
  • [Publications] T.Suzuki and T.Ohmura: "Ultra-microindentation of silicon at elevated temperatures" Philosophical Magazine A. 74(5). 1073-1084 (1996)

    • Related Report
      1996 Annual Research Report

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Published: 1996-04-01   Modified: 2016-04-21  

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