| Project/Area Number |
07650015
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| Research Category |
Grant-in-Aid for Scientific Research (C)
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| Allocation Type | Single-year Grants |
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| Section | 一般 |
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| Research Field |
Applied materials science/Crystal engineering
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| Research Institution | Kobe University |
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Principal Investigator |
FUJII Yoshikazu Kobe University, Faculty of Engineering, Associate Professor, 工学部, 助教授 (80238534)
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| Co-Investigator(Kenkyū-buntansha) |
YOSHIDA Kentaroh Kobe University, Faculty of Engineering, Professor, 工学部, 教授 (60031085)
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| Project Period (FY) |
1995 – 1996
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| Project Status |
Completed (Fiscal Year 1996)
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| Budget Amount *help |
¥2,000,000 (Direct Cost: ¥2,000,000)
Fiscal Year 1996: ¥500,000 (Direct Cost: ¥500,000)
Fiscal Year 1995: ¥1,500,000 (Direct Cost: ¥1,500,000)
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| Keywords | ultrahigh vacuum / surface / X-ray / crystal / crystal growth / X-ray scattering at small glancing angle incidence / surface step / surface roughness |
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| Research Abstract |
A compact ultrahigh-vacuum X-ray diffractometer was designed and constructed using a small rotating-anode X-ray source of 18kW.Its UHV specimen chamber is 200mm high and 140mm in diameter and can be evacuated up to 3*10^<-8> Pa. The X-ray is incident into the chamber through a thin Be window, 0.2mm thick and 30mm in diameter. Diffracted and scattered X-rays are taken out through another Be window, 0.4mm thick and 60mm in diameter. All the equipments, a rotating-anode X-ray source, an incident monochromator, and a two-circle diffractometer onto which a UHV specimen chamber and a conventional scintillation counter are mounted, are arranged on only one optical table, 70cm wide and 90cm in length. Configuration of the specimen holder in the chamber, which is designed for the surface glancing angle scatterings at present, can be controlled from outside of the vacuum. The UHV chamber has two evaporation cells for specimen preparation and a heater to anneal the specimen. This arrangement allows us to perform in situ observations of the growing crystal surfaces during the deposition by means of glancing angle X-ray scattering method.
A preliminary experiment of the glancing angle scattering of mechanically polished silver polycrystal surfaces gave an order of 10^3 count・sec^<-1> of scattered X-rays intensity at its specular reflection angle, which is enough to derive a significant interpretation of the surface structure.
The next experiment was estimation of the growing surface of PbSe (111) by means of glancing angle X-ray scattering method. We success to perform in situ observation of layr-by-layr growth of PbSe (111) by surface X-ray scattering with the use of X-ray from the small rotating-anode X-ray source of 18kW.
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