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SURFACE PROCCESSING OF SEMICONDUCTOR BY THE USE OF PHOTOELECTROCHEMICAL TECHNIQUE

Research Project

Project/Area Number 07650781
Research Category

Grant-in-Aid for Scientific Research (C)

Allocation TypeSingle-year Grants
Section一般
Research Field Inorganic materials/Physical properties
Research InstitutionGIFU UNIVERSITY

Principal Investigator

SUGIURA Takashi  GIFU UNIVERSITY,FACULTY OF ENGINEERING,ASSOCIATE PROFESSOR, 工学部, 助教授 (40171144)

Co-Investigator(Kenkyū-buntansha) YOSHIDA Tsukasa  GIFU UNIVERSITY,FACULTY OF ENGINEERING,ASSISTANT, 工学部, 助手 (90273127)
MINOURA Hideki  GIFU UNIVERSITY,FACULTY OF ENGINEERING,PROFESSOR, 工学部, 教授 (40021612)
Project Period (FY) 1995 – 1996
Project Status Completed (Fiscal Year 1996)
Budget Amount *help
¥2,100,000 (Direct Cost: ¥2,100,000)
Fiscal Year 1996: ¥500,000 (Direct Cost: ¥500,000)
Fiscal Year 1995: ¥1,600,000 (Direct Cost: ¥1,600,000)
KeywordsZINC OXIDE / GRAIN BOUNDARY / CADMIUM SELENIDE / ELECTRO CERAMICS / STRONTIUM TITANATE / VARISTOR / GAS SENSOR / PHOTOELECTROCHEMICAL ETCHING
Research Abstract

Photoelectrochemical etching is a useful technique for fabricating microstructures of semiconductor surface. It affects directly the photoelectrochemical active sites and leads to a unique morphologies of the semiconductor surface depending upon certain features of the grain structures such as crystallographic orientations and presence of grain boundaries, etc.. We studied the photoelectrochemical etching site selectivity of CdSe, SrTiO_3 varistor and ZnO gas sensor.
It was observed that the grain boundaries are left undissolved and both sides of the grain boundaries are deeply etched after the photoelectrochemical etching of CdSe polycrystalline electrodes under weak anodic polarization. On the contrary, the grain boundaries selectively dissolved under strong anodic polarization. We explained this etching site selectivity by energy band model of semiconductor/electrolyte interface and grain boundary potential barrier. The grain boundary potential barrier plays an important role in the semiconducting electroceramic devices such as varistors, sensors, photoeletrochemical devices etc.. The photoelectrochemical etching makes it possible to obseve visually the grain boundary potential barrier structures and affects it. We applied this etching technique to SrTiO_3 varistor and ZnO gas sensor. In the case of SrTiO_3 varistor, the onset voltage and the slope of the current varied with etching potentials. We also found that the photoelectrochemical etching treatment is effective to increase the gas sensitivity of ZnO gas sensor.

Report

(3 results)
  • 1996 Annual Research Report   Final Research Report Summary
  • 1995 Annual Research Report

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Published: 1995-04-01   Modified: 2016-04-21  

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