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Fundamental Study on magnetic-granular films with fine structures

Research Project

Project/Area Number 08455142
Research Category

Grant-in-Aid for Scientific Research (B)

Allocation TypeSingle-year Grants
Section一般
Research Field Electronic materials/Electric materials
Research InstitutionNagoya University

Principal Investigator

TANJI Takayoshi  Nagoya university, Center for Integrated Research in Science and Engineering Associate Professor, 理工科学総合研究センター, 助教授 (90125609)

Co-Investigator(Kenkyū-buntansha) MUROOKA Yoshie  Nagoya university, School of Engineering Research Associate, 工学研究科, 助手 (40273263)
TANAKA Sigeyasu  Nagoya university, School of Engineering Research Associate, 工学研究科, 助手 (70217032)
KIMURA Keiko  Nagoya university, Center for Integrated Research in Science and Engineering Res, 理工科学総合研究センター, 助手 (60262862)
Project Period (FY) 1996 – 1997
Project Status Completed (Fiscal Year 1997)
Budget Amount *help
¥7,400,000 (Direct Cost: ¥7,400,000)
Fiscal Year 1997: ¥1,300,000 (Direct Cost: ¥1,300,000)
Fiscal Year 1996: ¥6,100,000 (Direct Cost: ¥6,100,000)
Keywordsfine magnetic structure / granular film / Lorentz microscopy / electron beam annealing / ローレンツ電顕法 / 電子線ホログラフィ
Research Abstract

The theme of this research is to make fine structures of magnetic granular thin films. Magnetic granular films have been remarked as one of new magnetic substances. Specifically, it has been aimed to produce fine magnetic-granular areas less than a few tens nanometers in an amorphous thin film. No method to investigate the magnetic state in such small region bad been confirmed, so far. Therefore, first of all, we had to realized the observation of the magnetism of fine particles less than 10 nm. In order to make a pattern of granular area, the original matrix is required to be amorphous or a poly-crystal of ultra fine grains less than 1 nm in diameter.
Following results have been obtained in this project ;
i) We have found the condition to make an amorphous film of Fe_8Mo_2 using a DC magnetron sputtering method.
ii) By Lorentz electron microscopy using a transmission electron microscope instrument equipped with a field emission electron gun and a magnetically shielded electron lens, we observed successfully the magnetic states of fine particles less than 10 nm which have single magnetic domains in the case of Fe particles embedded in a MgO single crystal and Fe particles precipitated in a Fe_8Mo_2 amorphous film.
iii) We have realized to precipitate partially fine particles in the Fe_8Mo_2 amorphous film by 200 keV electron irradiation with an assist of a heating stage for transmission electron microscopy. A character "N" of granular area wi th the width less than 100 nm was drown in the amorphous film. Some particles in such area was found to have self magnetization by Lorentz microscopy, and small area x-ray analysis confirmed that the atomic concentration of Fe in such particles is la rger than 80% on the matrix.

Report

(3 results)
  • 1997 Annual Research Report   Final Research Report Summary
  • 1996 Annual Research Report
  • Research Products

    (32 results)

All Other

All Publications (32 results)

  • [Publications] T.Tanji: "Differential microscopy by conventional electron off-axis holography" Applied Physics Letters. 69・18. 2623-2625 (1996)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1997 Final Research Report Summary
  • [Publications] S.Tanaka: "Transmission electron microscopy study of InGaAs/InGaP thin layer structure grown by liquid phase epitaxy" Journal of Crystal Growth. 166・2. 334-338 (1996)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1997 Final Research Report Summary
  • [Publications] S.Tanaka: "XTEM sample preparation technique for n-type compound semiconductors using photochemical etching" Microscopy Research and Technique. 35・2. 363-364 (1996)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1997 Final Research Report Summary
  • [Publications] M.Hibino: "High resolution and high collection efficiency YAG screen for lens coupling TV and CCD camera" Proc.6th Asia-Pacific Conf.on Electron Microscopy. 45-46 (1996)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1997 Final Research Report Summary
  • [Publications] 小粥(木村) 啓子: "STEM-パラレルEELS元素マッピング" 生産と技術. 48・3. 11-13 (1996)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1997 Final Research Report Summary
  • [Publications] T.Hirayama: "Interference of three electron waves by two biprisms and its application to direct visualization of electromagnetic fields in small regions" Journal of Applied Physics. 82・2. 522-527 (1997)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1997 Final Research Report Summary
  • [Publications] T.Tanji: "Differential microscopy by electron holography with an electron trapezoidal prism" Microscopy and Microanalysis. 3・suppl.2. 512-516 (1997)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1997 Final Research Report Summary
  • [Publications] S.Tanaka: "Photochemical etching techique for preparing high-quality TEM samples of n-type compound semiconductors" Journal of Electron Microscopy. 46・2. 129-133 (1997)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1997 Final Research Report Summary
  • [Publications] Y.Murooka: "A.study of individual carbon nanotubes by angular-resolved EELS" Inst.Phys.Conf.Ser.153・8. 285-288 (1997)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1997 Final Research Report Summary
  • [Publications] T.Tanji: "Differential microscopy in off-axis transmission electron microscpy holography" Scanning Microscopy. suppl.11(印刷中). (1998)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1997 Final Research Report Summary
  • [Publications] M.Hibino: "High Resolution and high Collection Efficiency YAG Screen for Lens Coupling TV and CCD Camera" Proc.Sixth Asia-Pacific Conference on Electron Microscopy (eds.D.Barber et al.). Vol.1. 45-46 (1996)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1997 Final Research Report Summary
  • [Publications] T.Tanji: "Differential Microscopy by Conventional Electron Off-Axis Holography" Applied Physics Letters. Vol.69-18. 2623-2625 (1996)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1997 Final Research Report Summary
  • [Publications] S.Tanaka: "Transmission Electron Microscopy Study of InGaAsP/InGaP Thin Layr Structure Grown by Liquid Phase Epitaxy" Journal of Crystal Growth. Vol.166. 334-338 (1996)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1997 Final Research Report Summary
  • [Publications] S.Tanaka: "XTEM Sample Preparation Technique for n-Type Compound Semiconductors using Photochemical Etching" Microscopy Research and Technique. Vol.35-4. 363-364 (1996)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1997 Final Research Report Summary
  • [Publications] K.Kimura: "STEM Parallel-EELS Elemental Mapping (in Japanese)" Seisan to Gijutsu. Vol.48-3. 11-13 (1996)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1997 Final Research Report Summary
  • [Publications] T.Hirayama: "Interference of Three Electron Waves by Two Biprisms and its Application to Direct Visualization of Electromagnetic Fields in Small Regions" Journal of Applied Physics. Vol.82-2. 522-527 (1997)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1997 Final Research Report Summary
  • [Publications] T.Tanji: "Differential Microscopy by electron Holography with an Electron Trapezoidal Prism" Microscopy and Microanalysis. Vol.3-suppl.2. 515-516 (1997)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1997 Final Research Report Summary
  • [Publications] S.Tanaka: "Photochemical etching Technique for Preparing High-Quality TEM Samples of n-Type Compound Semiconductors" Journal of electron Microscopy. Vol.46-2. 129-133 (1997)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1997 Final Research Report Summary
  • [Publications] Y.Murooka: "A Study of Individual Carbon Nanotubes by Angular-Resolved EELS" Institute Physics Conference Series. No.153-8. 285-288 (1997)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1997 Final Research Report Summary
  • [Publications] T.Tanji: "Differential Microscopy in Off-Axis TEM Holography" Scanning Microscopy. Suppl.11 (in print).

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1997 Final Research Report Summary
  • [Publications] T.Tanji: "Differential microscopy by conventional electron off-axis holography" Applied Physics Letters. 69・18. 2623-2625 (1996)

    • Related Report
      1997 Annual Research Report
  • [Publications] S.Tanaka: "Transmission electron microscopy study of InGaAs/InGaP thin layer structrure grown by liquid phase epitaxy" Journal of Crystal Growth. 166・2. 334-338 (1996)

    • Related Report
      1997 Annual Research Report
  • [Publications] S.Tanaka: "XTEM sample preparation technique for n-type compound semiconductors using photochemical etching" Microscopy Research and Technique. 35・2. 363-364 (1996)

    • Related Report
      1997 Annual Research Report
  • [Publications] M.Hibino: "High resolution and high collection efficiency YAG screen for lens coupling TV and CCD camera" Proc. 6th Asia-Pacific Conf.on Electron Microscopy. 45-46 (1996)

    • Related Report
      1997 Annual Research Report
  • [Publications] 小粥(木村)啓子: "STEM-パラレルEELS元素マッピング" 生産と技術. 43・3. 11-13 (1996)

    • Related Report
      1997 Annual Research Report
  • [Publications] T.Hirayama: "Interference of three electron waves by two biprisms and its application to direct visualization of electromagnetic fields in small regions" Journal of Applied Physics. 82・2. 522-527 (1997)

    • Related Report
      1997 Annual Research Report
  • [Publications] T.Tanji: "Differential microscopy by electron holography with an electron trapezoidal prism" Microscopy and Microanalysis. 3・supl.2. 512-516 (1997)

    • Related Report
      1997 Annual Research Report
  • [Publications] S.Tanaka: "Phtochemical etching technique for preparing high-quality TEM samples of n-type compound semiconducgors" Jounal of Electron Microscopy. 46・2. 129-133 (1997)

    • Related Report
      1997 Annual Research Report
  • [Publications] Y.Murooka: "A Study of individual Carbon Nanotubes by Angular-Resolved EELS" Inst.Phys.Conf.Ser.153・8. 285-288 (1997)

    • Related Report
      1997 Annual Research Report
  • [Publications] T.Tanji: "Differential microscopy in off-axis transmission electron microscpy holography" Scanning Microscopy. supl.11(発売予定). (1998)

    • Related Report
      1997 Annual Research Report
  • [Publications] 丹司敬義: "Differential microscopy by conventional electron off-axis holography" Applied Physics Letters. 69・18. 2623-2625 (1996)

    • Related Report
      1996 Annual Research Report
  • [Publications] 丹司敬義: "Differential Microscopy in Off-Axis TEM Holography" Scannning Microscopy. (掲載予定).

    • Related Report
      1996 Annual Research Report

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Published: 1996-04-01   Modified: 2016-04-21  

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