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Development of in-situ measurement method of sub-nm size particles in processing plasmas

Research Project

Project/Area Number 08555019
Research Category

Grant-in-Aid for Scientific Research (A)

Allocation TypeSingle-year Grants
Section展開研究
Research Field Applied physics, general
Research InstitutionKYUSHU UNIVERSITY

Principal Investigator

WATANABE Yukio  KYUSHU UNIVERSITY,FACULTY OF ENGINEERING,PROFESSOR, 大学院・システム情報科学研究科, 教授 (80037902)

Co-Investigator(Kenkyū-buntansha) FUKUZAWA Tsuyoshi  KYUSHU UNIVERSITY,FACULTY OF ENGINEERING,RESEARCH ASSOCIATE, 大学院・システム情報科学研究科, 助手 (70243904)
Project Period (FY) 1996 – 1998
Project Status Completed (Fiscal Year 1998)
Budget Amount *help
¥11,900,000 (Direct Cost: ¥11,900,000)
Fiscal Year 1998: ¥1,400,000 (Direct Cost: ¥1,400,000)
Fiscal Year 1997: ¥4,500,000 (Direct Cost: ¥4,500,000)
Fiscal Year 1996: ¥6,000,000 (Direct Cost: ¥6,000,000)
Keywordscluster / particle / dust / photoemission / photo-ionization / photo-detachment / amorphous silicon / silane plasma / アモルファスシリコン / 光脱離 / シリコン / サブナノ微粒子
Research Abstract

It is important to understand growth kinetics of particles in processing plasmas, because they are harmful for fabrication of electronic devices and also promising as new materials. However, information on growth of particles below 10 nm in size is very limited because of lack of detection methods of such particles. In this study, we have developed a photon-counting laser-light-scattering (PCLLS) method detectable particles in 1-10 nm size and above 10^6cm^<-3> in density and a method (TPE-MI method), which is combined a threshold photoemission method with the microwave interferometry, detectable particles below a few rim in size and above 10^9cm^<-3> in density. By using these methods, we have revealed the following results regarding growth of particles in silane rf plasmas under so-called device-quality conditions : 1) density of sub-nm particles is by more than one order higher than the plasma positive ion density and most of the particles are neutral, 2) particles nucleate and grow around the plasma/sheath boundary where radicals are produced actively, 3) in the initial growth phase of particles, they grow due to deposition of polymerized species, which are originated from short lifetime SiH_2 radicals.

Report

(4 results)
  • 1998 Annual Research Report   Final Research Report Summary
  • 1997 Annual Research Report
  • 1996 Annual Research Report
  • Research Products

    (20 results)

All Other

All Publications (20 results)

  • [Publications] Masaharu Shiratani: "Development of photon-counting laser-light-scattering method for detection of nano-particles formed in CVD plasmas" Rev.Laser Eng. 26・6. 449-452 (1998)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1998 Final Research Report Summary
  • [Publications] Tshuyoshi Fukuzawa: "Growth mechanism of particles in cluster-size range SiH_4 rf discharges using threshold photoemission method" Proc.4th.Int.Conf.Reactive Plasma/16th Symp.Plasma Processes. 67-68 (1998)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1998 Final Research Report Summary
  • [Publications] Sinichi Maeda: "Development of photon-counting laser-light-scattering method for size and density measurements of nano-particles in processing plasmas" Proc.4th Int.Conf.Reactive Plasma/16th Symp.Plasma Processes. 69-70 (1998)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1998 Final Research Report Summary
  • [Publications] 白谷 正治: "フォトンカウンティングレーザ散乱法によるプラズマ中の微粒子計測" 応用物理. 68・5:印刷中. (1998)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1998 Final Research Report Summary
  • [Publications] M.Shiratani and Y.Watanabe: "Development of photon-counting laser-light-scattering method for detection of nano-particles formed in CVD plasmas" Rev.Laser Eng.Vol.26. 449-452 (1998)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1998 Final Research Report Summary
  • [Publications] T.Fukuzawa, S.Kushima, Y.Matsuoka, M.Shiratani and Y.Watanabe: "Growth mechanism of particles in cluster-size range in SiH_4 rf discharges using threshold photoemission method" Proc.4th Int.Conf.Reactive Plasma/16th Symp.Plasma Processes. 67-68 (1998)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1998 Final Research Report Summary
  • [Publications] S.Maeda, K.Sakamoto, T.Fukuzawa, M.Shiratani and Y.Watanabe: "Development of photon-counting laser-light-scattering method for size and density measurements of nano-particles in processing plasmas" Proc.4th Int.Conf.Reactive Plasma/16th Symp.Plasma Processes. 69-70 (1998)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1998 Final Research Report Summary
  • [Publications] M.Shiratani and Y.Watanabe: "Detection of particles in plasmas by photon-counting laser-light-scattering method" OYO BUTURI. Vol.68 (in press). (1998)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1998 Final Research Report Summary
  • [Publications] Masaharu Shiratani: "Development of photon-counting laser-light-scattering method for detection if nano-paticles formed in CVD plasmas" Rev.Laser Eng.26・6. 449-452 (1998)

    • Related Report
      1998 Annual Research Report
  • [Publications] Tsuyoshi Fukuzawa: "Growth mechanism of particles in SiH_4rf discharges using threshold photoemission method" Proc.4th Int.Conf.Reactive Plasma/16th Symp.Plasm a Processes. 67-68 (1998)

    • Related Report
      1998 Annual Research Report
  • [Publications] Sinichi Maeda: "Development of photon-counting laser-light-scattering method for size and density measurements of nano-particles in processing plasmas" Proc.4th Int.Conf.Reactive Plasma/16th Symp.Plasma Processes. 69-70 (1998)

    • Related Report
      1998 Annual Research Report
  • [Publications] 白谷正治: "フォトンカウンティングレーザ散乱法によるプラズマ中の微粒子計測" 応用物理. 68・5(印刷中). (1998)

    • Related Report
      1998 Annual Research Report
  • [Publications] 福澤 剛: "シラン高周波放電中の微小微粒子のサイズと密度その場測定法の開発" 九州大学大学院システム情報科学研究科研究科報告. (印刷中). (1998)

    • Related Report
      1997 Annual Research Report
  • [Publications] Yukio Watanabe: "Particle phenomena in processing plasmas" J.Plasma and Fusion Research. 73,11. 1240-1245 (1997)

    • Related Report
      1997 Annual Research Report
  • [Publications] Yukio Watanabe: "Roles of SiH_3 and SiH_2 radicals in particle growth in rf silane plasmas" Jpn.J.Appl.Phys.36,7B. 4985-4988 (1997)

    • Related Report
      1997 Annual Research Report
  • [Publications] Tsuyoshi Fukuzawa: "Growth and behavior of particles below of particles below nanometer in size in silane plasma using threshold photoemmision method" Proc.3rd Int.Conf.Reactive Plasma/14th Symp.Plasma Processes. 3. 349-350 (1997)

    • Related Report
      1997 Annual Research Report
  • [Publications] Yukio Watanabe: "Contribution of short lifetime radicals to growth of particles in SiH_4 HF discharges and effects of particles on deposited films" J.Vac.Sci.Technol.A. 14,3. 995-1001 (1996)

    • Related Report
      1996 Annual Research Report
  • [Publications] Tsuyoshi Fukuzawa: "Detection of partticles in rf silane plasmas using photoemission method" J.Appl.Phys.80,6. 3202-3207 (1996)

    • Related Report
      1996 Annual Research Report
  • [Publications] Yukio Watanabe: "Particle Formation in High Frequency CVD Plasmas" Proc.3rd Int.Conf.Reactive Plasma/14th Symp.Plasma Processes. 3. 225-226 (1997)

    • Related Report
      1996 Annual Research Report
  • [Publications] Tsuyoshi Fukuzawa: "Growth and behavior of particles below ofparticles below nanometer in size in silane plasmausing threshold photoemmision Method" Proc.3rd Int.Conf.Reactive Plasma/14th Symp.Plasma Processes. 3. 349-350 (1997)

    • Related Report
      1996 Annual Research Report

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Published: 1996-04-01   Modified: 2016-04-21  

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