Development of Random Loading Test by Parallel Micro-Processor
| Project/Area Number |
08555244
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| Research Category |
Grant-in-Aid for Scientific Research (B)
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| Allocation Type | Single-year Grants |
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| Section | 展開研究 |
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| Research Field |
船舶工学
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| Research Institution | Yokohama National University |
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Principal Investigator |
ISHIZUKA Tetsuo Yokohama National University, Faculty of Education and Human Sciences, Associate Professor, 教育人間科学部, 助教授 (50017927)
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| Project Period (FY) |
1996 – 1997
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| Project Status |
Completed (Fiscal Year 1997)
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| Budget Amount *help |
¥3,100,000 (Direct Cost: ¥3,100,000)
Fiscal Year 1997: ¥600,000 (Direct Cost: ¥600,000)
Fiscal Year 1996: ¥2,500,000 (Direct Cost: ¥2,500,000)
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| Keywords | Random Fatigue / Gaussian Random Load / Stress Indtensity Factor / K Cotrol / ランダム荷重 / 荷重制御 / 疲労試験法 |
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| Research Abstract |
Structures of large size as ships, airplanes and with ocmplicated system as nuclear power plant have been built recently, it has been frequent that they cause a terrible accidents by metal fatigue. Load they have been given is generally random load, to prevent accidents, random fatigue test takes on importance.
When a load profile can be approximated by a narrow band stationary Gaussian random process, it has been pointed out that random fatigue tests are easiliy done with a personal computer. In this study, we wrote random fatigue test program by simulating the the envelope of the narrow band random process by FFT for personal computer.
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Report
(3 results)
Research Products
(1 results)
