| Project/Area Number |
08650099
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| Research Category |
Grant-in-Aid for Scientific Research (C)
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| Allocation Type | Single-year Grants |
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| Section | 一般 |
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| Research Field |
Materials/Mechanics of materials
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| Research Institution | Kanazawa University |
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Principal Investigator |
HIROSE Yukio Kanazawa University, Faculty of Science Professor, 理学部, 教授 (20019425)
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| Project Period (FY) |
1996 – 1997
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| Project Status |
Completed (Fiscal Year 1997)
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| Budget Amount *help |
¥2,300,000 (Direct Cost: ¥2,300,000)
Fiscal Year 1997: ¥400,000 (Direct Cost: ¥400,000)
Fiscal Year 1996: ¥1,900,000 (Direct Cost: ¥1,900,000)
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| Keywords | X-ray stress measurement / Residual stress / non-destructive inspection / Experimental Mechanics / Stress / Imaging plate / Elastic constants / X-ray diffraction / IP(イメージングプレート) / 迅速残留応力測定 / 2次元X線検出器 / α角基準法 / ミクロ・マクロ応力 / 三軸応力解析 / 複合材料 |
|---|
| Research Abstract |
This study was performed to examine the possibility of the X-ray stress measurement by analyzing whole Debye-Scherrer ring. An imaging plate (IP) was used for the detection of X-ray in order to obtain a high degree of accuracy and efficiency. Through the investigation on the Tanaka's method, we proposed new equations for sigma_y and tau_<xy>. We also found that the Tanaka's method involved an assumption that the angle eta was constant. So we proposed a new method for the determination of stresses from Debye-Scherrer ring without the above approximation on angle eta. For the experiment, a new system of processing image data, calculating stresses and back-reflection Laue camera for IP with a four-point-bending-device was manufactured. The stress applied mechanically with this device was compared to that from the present method. The result showed that it was possible to obtain the stress with the same accuracy as that by the sin^2psi method. The advantage of this method is that one can obtain all three components of the stress in plane stress state from one diffraction ring with single incidence of X-ray beam.
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