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DEVELOPMENT OF A COMPACT HIGH-RESOLUTION RBS SYSTEM

Research Project

Project/Area Number 09355003
Research Category

Grant-in-Aid for Scientific Research (A)

Allocation TypeSingle-year Grants
Section展開研究
Research Field 表面界面物性
Research InstitutionKYOTO UNIVERSITY

Principal Investigator

KIMURA Kenji (1998-1999)  Kyoto Univ., Dept. of Engn. Phys. & Mech, Professor, 工学研究科, 教授 (50127073)

万波 通彦 (1997)  京都大学, 工学研究科, 教授 (60025294)

Co-Investigator(Kenkyū-buntansha) NAKAJIMA Kaoru  Kyoto Univ., Dept. of Engn. Phys. & Mech, Research Associate, 工学研究科, 助手 (80293885)
木村 健二  京都大学, 工学研究科, 助教授 (50127073)
Project Period (FY) 1997 – 1999
Project Status Completed (Fiscal Year 1999)
Budget Amount *help
¥32,400,000 (Direct Cost: ¥32,400,000)
Fiscal Year 1999: ¥1,200,000 (Direct Cost: ¥1,200,000)
Fiscal Year 1998: ¥7,000,000 (Direct Cost: ¥7,000,000)
Fiscal Year 1997: ¥24,200,000 (Direct Cost: ¥24,200,000)
Keywordshigh-resolution / Ratherford backscattering / monolayer resolution / growth of Ge / Si(001) / initial oxidation process on Si(001) / analysis of light elements / silicon oxynitride / hydrogen analysis / 酸窒化膜 / Si(001) / 酸化初期過程 / 超小型 / 組成分析 / 結晶性評価 / RBS / エピタキシャルシャル成長 / 熱振動 / 反跳粒子検出法
Research Abstract

We have developed a compact high-resolution RBS system including a small accelerator and a high-resolution magnetic spectrometer. The energy resolution was measured to be 0.33keV for 292keV HeィイD1+ィエD1 ions at an acceptance angle of 0.3msr. Monolayer resolution was demonstrated with this system.
Because the acceptance angle is rather wide, a so-called "kinematic broadening" reduces the apparent energy resolution especially for light elements. We designed an electrostatic quadrupole lens (Q-lens) for correction of the kinematic broadening. Using the Q-lens, depth profiles of nitrogen atoms in a ultrathin films of silicon oxynitride could be measured with depth resolution of atomic level. Initial oxidation process of Si(001) surfaces was also investigated with the HRBS system. It was found that the oxidation proceeds in the layer-by-layer mode and that the first atomic layer is not completely oxidized at room temperature. The initial stage of Ge/Si(001) epitaxial growth was also studied by HRBS. The intermixing of Ge and Si was observed at growth temperature of 500℃ even in the sub-monolayer coverage region.
It was demonstrated that high-resolution elastic recoil can be performed using the developed HRBS system. A depth resolution of 0.28nm was obtained in a depth profile of hydrogen in silicon crystals.
A more compact high-resolution RBS system was developed in collaboration with Kobe Steel Ltd. The dimensions of the full system, including an accelerator, are 3.8m(L)×2.8(W)×2.35m(H). This system, called HRBS-500, is now commercially available.

Report

(4 results)
  • 1999 Annual Research Report   Final Research Report Summary
  • 1998 Annual Research Report
  • 1997 Annual Research Report
  • Research Products

    (27 results)

All Other

All Publications (27 results)

  • [Publications] K.Nakajima: "The(III) surface of PbTe observed by high-resolution RBS"Nucl. Instr.and Meth. in Phys. Res.. B135. 350-354 (1998)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1999 Final Research Report Summary
  • [Publications] K.Kimura: "Some applications of high resolution RBS and ERD using a magnetic spectrometer"Nucl. Instr.and Meth. in Phys. Res.. B136-138. 1196-1202 (1998)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1999 Final Research Report Summary
  • [Publications] K.Kimura: "Hydrogen depth profiling with sub-nm resolution in high-resolution ERD"Nucl. Instr.and Meth. in Phys. Res.. B140. 397-401 (1998)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1999 Final Research Report Summary
  • [Publications] K.Nakajima: "Direct Observation of Intermixing at Ge/Si(001) interfaces by High-resolution RBS"Phys. Rev. Lett.. 83. 1802-1805 (1999)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1999 Final Research Report Summary
  • [Publications] K.Kimura: "Amocphization of Si(001) by ultra low energy(0.5 to 5keV) ionimplantation observed with highresolution RBS"Nucl. Instr.and Meth. in Phys. Res.. B148. 284-288 (1999)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1999 Final Research Report Summary
  • [Publications] K.Nakajima: "Intermixing at Ge/Si(001) Interfaces Studied by High-resolution RBS"Nucl. Instr.and Meth. in Phys. Res.. (印刷中).

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1999 Final Research Report Summary
  • [Publications] K. Nakajima et al: "The (111) surface of PbTe observed by high-resolution RBS"Nucl. Instr. and Meth. in Phys. Res. B135. 350-354 (1998)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1999 Final Research Report Summary
  • [Publications] K. Kimura et al: "Some applications of high-resolution RBS and ERD using a magnetic spectrometer"Nucl. Instr. and Meth. in Phys. Res.. B136-138. 1196-1202 (1998)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1999 Final Research Report Summary
  • [Publications] K. Kimura et al: "Hydrogen depth profiling with sub-nm resolution in high-resolution ERD"Nucl. Instr. and Meth. in Phys. Res.. B140. 397-401 (1998)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1999 Final Research Report Summary
  • [Publications] K. Nakajima et al: "Direct Observation of Intermixing at Ge/Si (001) interfaces by High-resolution RBS"Phys. Rev. Lett.. 83. 1802-1805 (1999)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1999 Final Research Report Summary
  • [Publications] K. Kimura et al: "Amorphization of Si (001) by ultra low energy (0.5 to 5 keV) ion implantation observed with high-resolution RBS"Nucl. Instr. and Meth. in Phys. Res.. B148. 284-288 (1999)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1999 Final Research Report Summary
  • [Publications] K. Nakajima et al: "Intermixing at Ge/Si (001) Interfaces Studied by High-resolution RBS"Nucl. Instr. and Meth. in Phys. Res.. (in press).

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1999 Final Research Report Summary
  • [Publications] K.Nakajima: "Direct Observation of Intermixing at Ge/Si (001) interfaces by High resolution RBS"Phys. Rev. Lett.. 83. 1802-1805 (1999)

    • Related Report
      1999 Annual Research Report
  • [Publications] K.Kimura: "Amorphization of Si (001) by ultra low energy (0.5 to 5keV) ion implantation cbserved with high resolution RBS"Nucl. Instr and Meth in Phys. Res.. B148. 284-288 (1999)

    • Related Report
      1999 Annual Research Report
  • [Publications] 木村健二: "Si 中の Sb の異常表面偏析"表面科学. 20. 38-43 (1999)

    • Related Report
      1999 Annual Research Report
  • [Publications] K.Nakajima: "Intermixing at Ge/Si (001) Interfaces Studied by High-resolution RBS"Nucl. Inst and Meth in Phys. Res.. (in press). (2000)

    • Related Report
      1999 Annual Research Report
  • [Publications] K.Nakajima,K.Kimura,M.Mannami: "The(III)surface of PbTe observed by high-resolution RBS" Nuclear Instruments and Methods in Physics Research B. 135. 350-354 (1998)

    • Related Report
      1998 Annual Research Report
  • [Publications] K.Kimura,K.Nakajima,M.Mannami: "Some applocations of high-resolution RBS and ERD using a magnetic spectrometer" Nuclear Instruments and Methods in Physics Research B. 136/138. 1196-1202 (1998)

    • Related Report
      1998 Annual Research Report
  • [Publications] Y.Hattori,K.Kobayashi,S.Kawasaki,et al: "Direct thermal fluorination of DLC surfaces" Carbon. 36. 1399-1401 (1998)

    • Related Report
      1998 Annual Research Report
  • [Publications] K.Kimura,K.Nakajima,H.Imura: "Hydrogen depth profiling with sub-nmresolution in high-resolution ERD" Nuclear Instruments and Methods in Physics Research B. 140. 397-401 (1998)

    • Related Report
      1998 Annual Research Report
  • [Publications] K.Kimura,A.Agarwal,H.Toyofuku,K.Nakajima,et al: "Amorphization of Si(001) by ultra low energy(0.5 to 5 keV) ion implantation observed with high-" Nuclear Instruments and Methods in Physics Research B. 148. 284-288 (1999)

    • Related Report
      1998 Annual Research Report
  • [Publications] K.Kimura: "Growth mode and defect generation in ZnSe heteroepitaxy on Te-terminated GaAs(001) surfeces" J.Vac.Sci.Technol.B. 15. 1254-1259 (1997)

    • Related Report
      1997 Annual Research Report
  • [Publications] K.Kimura: "Heterovalent ZnSe/GaAs Interfaces" phys.stat.sol.202. 657-668 (1997)

    • Related Report
      1997 Annual Research Report
  • [Publications] K.Nakajima: "The (111)surface of PbTe observed by high-resolution RBS" Nucl.Instr.and Methods in Phys.Res.B. (in press). (1998)

    • Related Report
      1997 Annual Research Report
  • [Publications] K.Kimura: "Some applications of high-resolution RBS and ERD using a magnetic spectrometer" Nucl.Instr.and Methods.in phys.Res.B. (in press). (1998)

    • Related Report
      1997 Annual Research Report
  • [Publications] K.Kimura: "Hydrogen depth profiling with sub-nm resolution in high-resolution ERD" Nucl.Instr.and Methods in Phys.Res.B. (in press). (1998)

    • Related Report
      1997 Annual Research Report
  • [Publications] K.Kimura: "Defect generation in layer-by-layer-grown ZnSe films on Te-terminated GaAs(001) surfaces" Phys.Rev.B. 57,3. 1410-1413 (1998)

    • Related Report
      1997 Annual Research Report

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Published: 1997-04-01   Modified: 2016-04-21  

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