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Phenomena of Atomic Proximity Field induced by Atomic Force Microscopy

Research Project

Project/Area Number 09440113
Research Category

Grant-in-Aid for Scientific Research (B).

Allocation TypeSingle-year Grants
Section一般
Research Field 固体物性Ⅰ(光物性・半導体・誘電体)
Research InstitutionUniversity of Tokyo

Principal Investigator

TSUKADA Masaru  University of Tokyo, Graduate School of Sci. Professor, 大学院・理学系研究科, 教授 (90011650)

Co-Investigator(Kenkyū-buntansha) TAMURA Ryo  University of Tokyo, Graduate School of Sci. Research Associate, 大学院・理学系研究科, 助手 (20282717)
Project Period (FY) 1997 – 2000
Project Status Completed (Fiscal Year 2000)
Budget Amount *help
¥13,600,000 (Direct Cost: ¥13,600,000)
Fiscal Year 2000: ¥3,300,000 (Direct Cost: ¥3,300,000)
Fiscal Year 1999: ¥3,200,000 (Direct Cost: ¥3,200,000)
Fiscal Year 1998: ¥3,300,000 (Direct Cost: ¥3,300,000)
Fiscal Year 1997: ¥3,800,000 (Direct Cost: ¥3,800,000)
Keywordsatomic force microscopy / solid surface / nano structures / scanning disspative force microscopy / graphite / 摩擦力顕微鏡
Research Abstract

Atomic resolution has been achieved by the non-contact atomic force microscopy (ncAFM) in ultra high vacuum, and several experimental groups are observing very clear atomic scale images of surfaces. Therefore we aimed in the present work, elucidation of the mechanism of ncAFM and development of the quantitative analyses method of the images from the first-principles theory. To elucidate the mechanism, it is necessary to understand how the oscillation frequency is influenced by the nonoliniear interaction between the tip and the surface, as well as the net force and its microscopic distribution and the effect of the dissipation. In this year we developed the theoretical simulation method based on the first-principles calculation of the tip-surface interaction force, which is mathematically transformed to the frequency shift forming the image with the help of the 2-dimensional Fourier expansion method. The theory is applied to Si(111)7x7, and Si(111)√3x√3-Ag surface and compared well with experiments. Furthermore theory of the noncontact dissipasive force microscopy is developed. This method is found to be suitable to detect nano-mechanical properties of the atoms/molecules and nano-structures on surfaces. Even the idetification of the atoms can be expected by this method, using the different disspation depending on the atomic mass.

Report

(5 results)
  • 2000 Annual Research Report   Final Research Report Summary
  • 1999 Annual Research Report
  • 1998 Annual Research Report
  • 1997 Annual Research Report
  • Research Products

    (41 results)

All Other

All Publications (41 results)

  • [Publications] N.Sasaki: "Theoretical simulation of noncontact AFM images of Si(111)√3×√3-Ag surface based on Fourier expansion method"Appl.Surf.Sci.. 157. 367-372 (2000)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] M.Gauthier: "Damping Mechanism in Dynamic Force Microscopy"Phys.Rev.Lett.. 85. 5348-5351 (2000)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] N.Sasaki: "Fourier Expansion Method for Noncontact Atomic Force Microscopy Image Simulations-Application to Si(111)√3×√3-Ag surface"Jpn.J.Appl.Phys.. 39. L174-L177 (2000)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] K.Tagami: "A Tight-Binding Study of Chemical Interaction of Nanotube Tip with Si(001) Surface"J.Phys.Soc.Jpn.. 69. 3937-3942 (2000)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] N.Sasaki: "Theoretical simulation of noncontact AFM images of Si(111)√3×√3-Ag surface based on Fourier expansion method"Appl.Surf.Sci.. 157. 367-372 (2000)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] M.Gauthier: "Damping Mechanism in Dynamic Force Microscopy"Phys.Rev.Lett.. 85. 5348-5351 (2000)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] N.Sasaki: "Fourier Expansion Method for Noncontact Atomic Force Microscopy Image Simulations-Application to Si(111)√3×√3-Ag surface"Jpn.J.Appl.Phys.. 39. L174-L177 (2000)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] K.Tagami: "A Tight-Binding Study of Chemical Interaction of Nanotube Tip with Si(001) Surface"J.Phys.Soc.Jpn.. Vol.69, No.12. 3937-3942 (2000)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] N.Sasaki: "Theoretical simulation of noncontact AFM images of Sin (111) √3 ×√3-Ag surface based on Fourier expansion method"Appl.Surf.Sci.. 157. 367 (2000)

    • Related Report
      2000 Annual Research Report
  • [Publications] N.Sasaki: "Effect of Microscopic Nonconservative Process on Noncontact Atomic Force Microscopy"Jpn.J.Appl.Phys.. 39. L1334 (2000)

    • Related Report
      2000 Annual Research Report
  • [Publications] M.Gauthier: "Damping Mechanism in Dynamic Force Microscopy"Phys.Rev.Lett.. 85. 5348 (2000)

    • Related Report
      2000 Annual Research Report
  • [Publications] N.Sasaki: "Fourier Expansion Method for Noncontact Atomic Force Microscopy Image Simulations-Application to Si (111) √3×√3-Ag surface"Jpn.J.Appl.Phys.. 39. L174 (2000)

    • Related Report
      2000 Annual Research Report
  • [Publications] K.Tagami: "A Tight-Binding Study of Chemical Interaction of Nanotube Tip with Si (001) Surface"J.Phys.Soc.Jpn.. 69. 3937 (2000)

    • Related Report
      2000 Annual Research Report
  • [Publications] 佐々木成朗: "原子スケールの摩擦 -摩擦力顕微鏡-"固体物理. 35. 47 (2000)

    • Related Report
      2000 Annual Research Report
  • [Publications] N. Kobayashi, N. Brabbyge and M. Tsukada: "Transmission Channels through Na and Al Atom Wire"Surface Sci.. 433-435. 854-857 (1999)

    • Related Report
      1999 Annual Research Report
  • [Publications] N. Sasaki and M. Tsukada: "New Method for Noncontact AFM Image Simulations"Jpn. J. Appl. Phys.. 38. 192-194 (1999)

    • Related Report
      1999 Annual Research Report
  • [Publications] N. Sasaki and M. Tsukada: "Theory for the effect of the tip-surface interaction potential on atomic resolution in forced vibration system of noncontact AFM"Appl. Surf. Sci.. 137/3-4. 339-343 (1999)

    • Related Report
      1999 Annual Research Report
  • [Publications] H. Aizawa, M. Tsukada, N. Sato and S. Hasegawa: "Asymmetric Structure of the Si(111)-√<3> ×√<3> -Ag Suface"Surface Sci.. 429. 509-514 (1999)

    • Related Report
      1999 Annual Research Report
  • [Publications] H. Aizawa and M. Tsukada: "First-Principles Study of Ag Adatimson the Si(111) -√<3>×√<3>- Ag Surface"Phys. Rev. B. 59. 10923-10927 (1999)

    • Related Report
      1999 Annual Research Report
  • [Publications] M. Brandbyge, N. Kobayashi and M. Tsukada: "Conduction Channels at Finite Bias in Single-Atom Gold Contacts"Phys. Rev. B. 60. 17064-17070 (1999)

    • Related Report
      1999 Annual Research Report
  • [Publications] M. Gauthier and M. Tsukada: "Theory of non-contact dissipation force microscopy"Phys. Rev. B. 60. 11716-11722 (1999)

    • Related Report
      1999 Annual Research Report
  • [Publications] M. Tsukada, N. Kobayashi, M. Brandbyge and S. Nakanishi: "Physics of Arttificial Nano-Structures on Surfaces"Progr. Sruf. Sci.. (印刷中).

    • Related Report
      1999 Annual Research Report
  • [Publications] 塚田捷,小林伸彦,佐々木成朗: "走査プローブ顕微鏡の理論-その現状と新展開"表面科学. 306-312 (1999)

    • Related Report
      1999 Annual Research Report
  • [Publications] 塚田捷: "走査トンネル顕微鏡の物理"応用物理学会誌. (印刷中).

    • Related Report
      1999 Annual Research Report
  • [Publications] N. Sasaki, H. Aizawa and M. Tsukada: "Theoretical simulation of noncontact AFM images of Si(111) -√<3>×√<3> -Ag surface based on Fourier expansion method"Appl. Suf. Sci. (印刷中).

    • Related Report
      1999 Annual Research Report
  • [Publications] N. Sasaki, H. Aizawa and M. Tsukada: "Fourier Expansion Method for Noncontact AFM Image Simulations - Application to Si(111 ) -√<3>×√<3> -Ag Surface"JJAP L.. (印刷中).

    • Related Report
      1999 Annual Research Report
  • [Publications] N.Sasaki and M.Tsukada: "Theoretical Analysis of the Load Dependence of Frictional-Force Microscopy Image Pattern of Graphite Surface" Phys.Rev.B. 57. 3785-3786 (1998)

    • Related Report
      1998 Annual Research Report
  • [Publications] N.Sasaki, M.Tsukada, S.Fujisawa, Y.Sugawara and S.Morita: "Theoretical Analyses of Atomic-Scale Friction in Frictional-Force Microscopy" Tribology Letters. 4. 125-128 (1998)

    • Related Report
      1998 Annual Research Report
  • [Publications] M.Tsukada, N.Sasaki, R.Tamura, N.Sato and K.Abe: "Features of the Cantilever Motion in Dynamical Mode AFM" Surface Sci.401. 355-363 (1998)

    • Related Report
      1998 Annual Research Report
  • [Publications] N.Sasaki and M.Tsukada: "The Relation between Resonance Curves and Tip-Surface Interaction Potential in Noncontact Atomic-Force Microscopy" Jpn.J.Appl.Phys.vol.37. L533-535 (1998)

    • Related Report
      1998 Annual Research Report
  • [Publications] N.Sasaki, M.Tsukada, R.Tamura, K.Abe, N.Sato: "Dynamics of the Cantilever in Noncontact Atomic Force Microscopy" Appl.Phys.A66. 5287 (1998)

    • Related Report
      1998 Annual Research Report
  • [Publications] Naruo Sasaki and Masaru Tsukada: "Theory for the effect of the tip-surface interaction potential on atomic resolution in forced vibration system of noncontact AFM" Appl.Surf.Sci.137/3・4 (in press). (1999)

    • Related Report
      1998 Annual Research Report
  • [Publications] 塚田 捷: "「第一原理電子状態計算によるSTM像の解析」「走査プローブ顕微鏡-STMからSPMへ」" 丸善出版, 245 (1998)

    • Related Report
      1998 Annual Research Report
  • [Publications] N.Sasaki,and M.Tsukada: "Theory of Scanning Probe Microscopy (in press)" (Springer,eds T.Sakurai),

    • Related Report
      1998 Annual Research Report
  • [Publications] T.Uchiyama and M.Tsukada: "Scanning-Tunneling-Microscopy Images of Oxygen Adsorption on the Si(001)Surtface" Phys.Rev.B55. 9356-9359 (1997)

    • Related Report
      1997 Annual Research Report
  • [Publications] N.Kobayashi, K.Hirosie and M.Ysukada: "Theoretical Study of Silicon Adatom Transfer from Silicon Surface" Jpn.Appl.Phys.36. 3791-3795 (1997)

    • Related Report
      1997 Annual Research Report
  • [Publications] N.Sasaki and M.Tsukada: "Theoretical analysis of the Load Dependence of Frictional-Force Microscopy Image Pattern of Graphite Surface" Phys.Rev.B. in press

    • Related Report
      1997 Annual Research Report
  • [Publications] N.Sasaki, M.Tsukada, S.Fujisawa, Y.Sugawara and S.Morita: "Theoretical Analyses of Atomic-Scale Friction inFridional-Force Microscopy" Tribology Letters. in press

    • Related Report
      1997 Annual Research Report
  • [Publications] M.Tsukada, N.Sasaki, R.Tamura N.Sato and K.Abe: "Features of the Cantilever Motion in dynamical Mode AFM" Surface Sci.in press

    • Related Report
      1997 Annual Research Report
  • [Publications] N.Sasaki, M.Tsukada, S.Fujisawa, Y.Sugawara, S.Morita and K.Kobayashi: "Analysis of frictional-force image patterns of a graphite surface" J.Vac.Sci.and Techn.B.1997 (154)

    • Related Report
      1997 Annual Research Report
  • [Publications] N.Sasaki, M.Tsukada, S.Fujisawa, Y.Sugawara, S.Morita and K.Kobayashi: "Analysis of frictional-force image patterns of a graphite surface" J.Vac.Sci.and Techn.B.1997 (154)1479-1482:

    • Related Report
      1997 Annual Research Report

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Published: 1997-04-01   Modified: 2020-05-15  

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