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The Role of defects which play in the process of functional degradation in environmental resisting properties of ceramic coatings

Research Project

Project/Area Number 09450053
Research Category

Grant-in-Aid for Scientific Research (B)

Allocation TypeSingle-year Grants
Section一般
Research Field Materials/Mechanics of materials
Research InstitutionKogakuin UNIVERSITY

Principal Investigator

KIMURA Yuji  Kogakuin Univ., Faculty of Engineering, Professor, 工学部, 教授 (90107160)

Co-Investigator(Kenkyū-buntansha) FUJIWARA Yukio  Kogakuin Univ., Faculty of Engineering, Associate professor, 工学部, 助教授 (80100361)
TAKANO Ichiro  Kogakuin Univ., Faculty of Engineering, Associate professor, 工学部, 助教授 (70226801)
Project Period (FY) 1997 – 1998
Project Status Completed (Fiscal Year 1998)
Budget Amount *help
¥9,200,000 (Direct Cost: ¥9,200,000)
Fiscal Year 1998: ¥2,700,000 (Direct Cost: ¥2,700,000)
Fiscal Year 1997: ¥6,500,000 (Direct Cost: ¥6,500,000)
Keywordscoated TiN thin film / Plasma CVD and DIM method / initial stages of localized corrosion / E-AFM in-situ observation / defect ratio / type of defects / mixing layer / electrohemical measurement / CVD,IMコーティング / AFM観察
Research Abstract

Thin film coatings toward various types of materials have been used for protecting substrate surface from corrosion damages or adding a lot of functions to them. Till now the studies have been mainly conducted concerning mechanical and chemical properties of TiN thin film coating. Therefore in this study, basic properties such as corrosion-resisting characteristics of CVD and PVD coatings were investigated from the viewpoint of defect in coated layer and adhesion properties between coating and substrate. The roles of defects, which play in the process of functional degradation in environment resistant characteristics of coatings, were examined. And then, improvement in these characteristics of coatings by making better the adhesion state between coating and substrate is investigated.
Results obtained are summarized as follows ;
(1) Extremely initial stages of localized corrosion process in coated TiN thin film in 3%NaCl aqueous solution was investigated by detailed mum or urn orders observations using Atomic Force Microscope (AFM). As a result, it was observed that correlation between localized corrosion morphologies and type of defects. Moreover, crevice corrosion characteristics were controlled by the adhesion properties between thin film and substrate was recognized.
(2) TiN thin film coatings used in this study were made by two different types of coating methods, that is, Plasma CVD and Dynamic Ion Mixing (DIM) method. Then, defect morphology and the initial stage of localized corrosion morphology of urn or mum orders in 3% NaCl aqueous solution was investigated by Atomic Force Microscope (AEM). As a result, difference in the types of defects and localized corrosion morphologies were dearly observed depending upon the coating methods.
(3) Electrochemical AFM in-situ observation of the types of defects and initial localized corrosion process on TiN thin film made by different coating methods can be conducted under various electrochemically controlled conditions.

Report

(3 results)
  • 1998 Annual Research Report   Final Research Report Summary
  • 1997 Annual Research Report
  • Research Products

    (10 results)

All Other

All Publications (10 results)

  • [Publications] M.OHATA and Y.KIMURA: "Observation of Nanometric Corrosion Process on Coated TiN Thin Film by AFM" Proc.of Int.Conf.on Advanced Technology in Experimental Mechanics. 379-384 (1997)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1998 Final Research Report Summary
  • [Publications] S.Nitta and Y.Kimura: "Evaluation of Defects in TiN Thin Film by Various Electrochemical Techniques" Advance in Surface Engineering Vol II : Process Technology. 39-47 (1997)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1998 Final Research Report Summary
  • [Publications] 大畑, 木村, 鷹野: "AFMによるTiNセラミック薄膜の初期局部腐食過程の欠陥形態依存性の検討" 材料試験技術. 43・2. 103-109 (1998)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1998 Final Research Report Summary
  • [Publications] 木村雄二: "白金対極とのカップリング条件下における電気化学測定によるCVDコーティング膜の欠陥評価" 工学院大学総合研究所年報. 第5号. 129-136 (1998)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1998 Final Research Report Summary
  • [Publications] Michio OHATA and Yuji KIMURA: "Observation of Nanometric Corrosion Process on Coated TiN Thin Film by AFM" Proc.of Int.Conf.on Advanced Technology in Experimental Mechanics. 379-384 (1997)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1998 Final Research Report Summary
  • [Publications] Seiji Nitta and Yuji Kimura: "Evaluation of Defects in TiN Thin Film by Various Electrochemical Techniques" Advance in Surface Engineering, Vol II : Process Technology. 39-47 (1997)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1998 Final Research Report Summary
  • [Publications] Michio OHATA,Yuji KIMURA and Ichiro TAKANO: "AFM Studies on the Dependency of Extremely Initial Localized Corrosion Morphologies in Coated TiN Thin Film upon the Types of Defects" Journal of Material Testing Research Association of Japan. Vol.44, No.2. 103-109 (1998)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1998 Final Research Report Summary
  • [Publications] Yuji KIMURA: "Evaluation of Defects in Plasma CVD Coating Film by Electrochemical Measurements under Coupling Condition with Pt Counter Electrode" Annual Report of Research Institute for Science and Technology Kogakuin University. No.5. 129-136 (1998)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1998 Final Research Report Summary
  • [Publications] 大畑,木村,鷹野: "AFMによるTiNセラミック薄膜の初期局部腐食過程の欠陥形態依存性の検討" 材料試験技術. 43・2. 103-109 (1998)

    • Related Report
      1998 Annual Research Report
  • [Publications] M.OHATA and Y.KIMURA: "Observation of Nanometric Corrosion Process on Coated TiN Thin Film by AFM" Proc.of Int.Conf.on Advanced Technology in Experimental Mechanics. 379-384 (1997)

    • Related Report
      1997 Annual Research Report

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Published: 1997-04-01   Modified: 2016-04-21  

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