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NUMERICAL EVALUATION FOR EROSION OF ELECTRICAL CONTACTS MOUNTED ON CONTROL RELAYS.

Research Project

Project/Area Number 09450111
Research Category

Grant-in-Aid for Scientific Research (B).

Allocation TypeSingle-year Grants
Section一般
Research Field 電力工学・電気機器工学
Research InstitutionSHIZUOKA UNIVERSITY

Principal Investigator

KUBONO Takayoshi  SHIZUOKA UNIVERSITY, FACULTY OF ENGINEERING, DEPARTMENT OF ELECTRICAL AND ELECTRONICS ENGINEERING, PROFESSOR, 工学部, 教授 (80005470)

Project Period (FY) 1997 – 2000
Project Status Completed (Fiscal Year 2000)
Budget Amount *help
¥9,700,000 (Direct Cost: ¥9,700,000)
Fiscal Year 2000: ¥1,300,000 (Direct Cost: ¥1,300,000)
Fiscal Year 1999: ¥1,400,000 (Direct Cost: ¥1,400,000)
Fiscal Year 1998: ¥2,700,000 (Direct Cost: ¥2,700,000)
Fiscal Year 1997: ¥4,300,000 (Direct Cost: ¥4,300,000)
Keywordselectromagnetic relay / contacts / contact erosion / transferred pip / contact sticking / contact life / make-only operation / break-only-operation / 継電器 / リレー / 電気接点 / コンタクト / 損傷面 / スチッキング / 開離不良 / 電磁継電器 / ロッキング / 接触面損傷面 / 開離不能
Research Abstract

The sample contact was made from silver oxidation cadmium (Ag/CdO), silver oxidation tin (Ag/SnO2), which had been spotlighted as a material without cadmium, silver tin (Ag/Sn), silver (Ag), and palladium (Pd). These contacts were mounted on the test relays, which had the contact force 0.45N and opening force 0.15N.
By repeating the make-only-operation and break-only-operation in the resistance circuit of direct current 30v-10A, the shape change of pip on the contact surfaces and sticking occurrence condition were examined.
On the Ag/CdO12wt% contacts, the break-only-contacts had no large pip ; the make-only contacts had a large pip on the negative electrode. Between the height H and the root diameter Dr of a pip, and the initial contact gap G, it was discovered that the contact sticking rose, when it reaches the relationship between "H/G>0.5 and H/Dr>0.5". These numerical values are useful for the judgment for the replacement of the relay, when the electric system equipment is checked.
Though the Ag/SnO_212wt% contacts had a comparatively large pip on the negative electrode, the contact sticking did not arise because a large pip suddenly collapsed. The Ag/Sn9.5% contacts had the welding in the contact period carrying current. The Ag contacts showed that the root diameter of pip was thick, and the height was low. The Pd contacts showed that the large pip appeared on the anode, and suddenly collapsed.
By measuring the intensity of spectral components from switching arc, which induced the transferred pip, temperature and atomic density in the arc column were measured, and the contact erosion was examined.

Report

(5 results)
  • 2000 Annual Research Report   Final Research Report Summary
  • 1999 Annual Research Report
  • 1998 Annual Research Report
  • 1997 Annual Research Report
  • Research Products

    (43 results)

All Other

All Publications (43 results)

  • [Publications] 窪野隆能,守永和史: "閉成責務動作Ag/SnO_212wt%電気接点で陰極面にできる転移突起の変容に関する一観察"電子情報通信学会論文誌C 平成13年4月号(校正済). Vol.J84-C,No.4、. 278-285 (2001)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] Mitsuru TAKEUCHI,Takayoshi KUBONO: "Spectroscopic Determination of Temperature and Metal-Vapor for Copper Breaking Arc by Using a CCD Color Camera and an Additional Filter"IEICE Trans.Electronics. Vol.E83-C,No.9,. 1377-1384 (2000)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] 窪野隆能: "閉成責務Ag/CdO電気接点における分離不良発生時の転移突起形状に関する一研究"電子情報通信学会論文誌C. Vol.J83ーC,No.4. 300-307 (2000)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] Mitsuru TAKEUCHI,Takayoshi KUBONO: "An observation of the breaking arc between silver contacts using a high speed color video"IEICE Trans.Electronics. Vol.E82-C,No.1. 33-40 (1999)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] 窪野隆能: "制御継電器の電気接点損傷に関する数値評価研究(その23)閉成責務動作Ag接点対における転移突起"2001年電子情報通信学会総合大会C-5-4、講演論文集エレクトロニクス2. 4 (2001)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] 渡邊隆志,別宮達二,窪野隆能: "制御継電器の電気接点損傷に関する数値評価研究(その21)電気接点材料の突起形状と電気的特性に及ぼす影響"電子情報通信学会 信学技報(機構デバイス研究会資料). EMD2000-90. 13-18 (2001)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] R.Miyano,H.Suzuki,T.Kubono: "Spectroscopic temperature measurements of breaking arc at palladium contacts mounted on a miniature relay."Proc.Inter.Conf.on Electrical Contacts, Electromechanical Components and Their Applications Nagoya, Japan.. 19-24 (1999)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] 窪野隆能: "制御継電器の電気接点損傷に関する数値評価研究(その1)調査・研究方針"1997年度電気関係学会東海支部連合大会 講演論文集. 161 (2000)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] T.KUBONO, And K.MORINAGA: "An observation about transfigurations of a transferred pip on a cathode surface of make-only-contacts made of Ag/SnO_212wt%"The Transactions of the Institute of Electronics, Information and Communication Engineers in Japan. Vol.J84-C, No.4. 278-285 (2001)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] M.TAKEUCHI and T.KUBONO: "Spectroscopic determination of temperature and metal-vapor for copper breaking arc by using a CCD color camera and an additional Filter."The Institute of Electronics, Information and Communication Engineers Transaction on Electronics. Vol.E83-C, No.9. 1377-1384 (2000)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] T.KUBONO: "A study about shapes of transferred pip leading to opening failure on make-only-contacts made of Ag/CdO"The Transactions of the Institute of Electronics, Information and Communication Engineers in Japan. Vol.J83-C, No.4. 300-307 (2000)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] R,MIYANO, H.Suzuki and T.KUBONO: "Spectroscopic temperature measurements of breaking arc at Palladium contacts mounted on a miniature relay"Proceedings of the International Conference on Electrical Contacts, Electromechanical Components and Their Applications, Nagoya, Japan. 165-171 (1999)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] M.TAKEUCHI and T.KUBONO: "Influence of the shape of silver contacts on the spatial distribution of spectral intensity of a breaking arc"The Institute of Electronics, Information and Communication Engineers, Transactions on Electronics. Vol.E82-C, No.1. 41-48 (1999)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] M.TAKEUCHI and T.KUBONO: "An observation of the breaking arc between silver contacts using a high speed color video"The Institute of Electronics, Information and Communication Engineers, Transactions on Electronics. Vol.E82-C, No.1. 33-40 (1999)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] T.KUBONO, T.WATANABE, and T.BEKKU: "A Study of Numerical Evaluation for the Erosion of Electrical Contacts Mounted on Relays. Part 23 Transferred Pip on Make-only-contacts Made of Silver"Proceedings of the 2001 general conference of IEICE, Electronics 2. C-5-4. (2001)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] T.WATANABE, T.BECK and T.KUBONO: "A study of Numerical Evaluation for the Erosion of Electrical Contacts Mounted on Relays. Part 21. The influence of contact material on the shape of pip and some electrical characteristics."IEICE Technical Report, EMD2000-90. Vol.100, no.624. 13-18 (2001)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] 窪野隆能: "閉成責務Ag/CdO電気接点における分離不良発生時の転移突起形状に関する一研究"電子情報通信学会論文誌C. Vol.J83-C,No.4. 300-307 (2000)

    • Related Report
      2000 Annual Research Report
  • [Publications] 窪野隆能,大田原茂: "制御継電器の電気接点損傷に関する数値評価研究(その17)開閉責務動作Pd接点対における転移突起"2000年電子情報通信学会ソサイエティ大会 講演論文集2. C-5-1. 1 (2000)

    • Related Report
      2000 Annual Research Report
  • [Publications] 渡邊隆志,守永和史,窪野隆能: "制御継電器の電気接点損傷に関する数値評価研究,(その18),Ag/SnO_2電気接点とAg/CdO電気接点の閉成責務動作動作時の比較演"平成12年度電気関係学会東海支部連合大会論文集. 144. 72 (2000)

    • Related Report
      2000 Annual Research Report
  • [Publications] 窪野隆能,大田原茂: "制御継電器の電気接点損傷に関する数値評価研究,(その19)Pd電気接点対での開離及び閉成責務動作時のバウンス回数比較"平成12年度電気関係学会東海支部連合大会 講演論文集. 145. 73 (2000)

    • Related Report
      2000 Annual Research Report
  • [Publications] Mitsuru TAKEUCHI,Takayoshi KUBONO: "Spectroscopic Determination of Temperature and Metal-Vapor for Copper Breaking Arc by Using a CCD Color Camera and an Additional Filter"IEICE Trans.Electronics. Vol.E83-C,No.9. 1377-1384 (2000)

    • Related Report
      2000 Annual Research Report
  • [Publications] 窪野隆能,別宮達二,大田原茂: "制御継電器の電気接点損傷に関する数値評価研究(その20)直流30V-10Aの抵抗性回路内のPd電気接点対での転移突起"電子情報通信学会機構デバイス研究会. EMD2000-70. 13-18 (2000)

    • Related Report
      2000 Annual Research Report
  • [Publications] 渡邊隆志,守永和史,別宮達二,窪野隆能: "制御継電器の電気接点損傷に関する数値評価研究(その21)電気接点材料の突起形状と電気的特性に及ぼす影響"電子情報通信学会機構デバイス研究会. EMD2000-91. 13-18 (2001)

    • Related Report
      2000 Annual Research Report
  • [Publications] 窪野隆能,別宮達二: "制御継電器の電気接点損傷に関する数値評価研究(その22)閉成責務及び開離責務Ag接点の損傷程度"平成13年電気学会全国大会 講演論文集,. (2001)

    • Related Report
      2000 Annual Research Report
  • [Publications] 窪野隆能,渡邊隆志,別宮達二: "制御継電器の電気接点損傷に関する数値評価研究(その23)閉成責務動作Ag接点対における転移突起"2001年電子情報通信学会総合大会 講演論文集. (2001)

    • Related Report
      2000 Annual Research Report
  • [Publications] 窪野隆能: "閉成責務動作Ag/SnO_212wt%電気接点で陰極面にできる転移突起の変容に関する一観察"電子情報通信学会論文誌C. Vol.J84-C,No.4.(2000年12月に掲載決定(4月号予告)). (2001)

    • Related Report
      2000 Annual Research Report
  • [Publications] 窪野隆能、守永和史: "制御継電器の電気接点損傷に関する数値評価研究、(その9)Ag/SnO_212wt%電気接点対での転移突起の高さ"電子情報通信学会1998年総合大会講演論文集エレクトロニクス2. C-5-5. 5 (1999)

    • Related Report
      1999 Annual Research Report
  • [Publications] 秋山健司、窪野隆能: "制御継電器の電気接点損傷に関する数値評価研究、(その10)直流回路での閉成責務動作Ag/Sn9.5wt%接点対での損傷観察"電気学会開閉保護・高電圧合同研究会. SP-99-60. 43-48 (1999)

    • Related Report
      1999 Annual Research Report
  • [Publications] 窪野隆能、大村知宏、小林智: "さい断電流値の理論的予測-安定真空アークの最小電流値-"電気学会開閉保護・高電圧合同研究会. SP-99-61. 49-54 (1999)

    • Related Report
      1999 Annual Research Report
  • [Publications] M.Takeuchi,T.Kubono: "A spectroscopic detecting system for measureing the temperature distribution of silver breaking arc using a CCD color camera"IEEE Trans.Instrumentation and Measurement. vol.48,no.3. 678-683 (1999)

    • Related Report
      1999 Annual Research Report
  • [Publications] M.Takeuchi,T.Kubono: "Spectroscopic determination of temperature and metal-vopor for copper breaking arc by using a CCD color camera and an additional filter"Proceerings the International Conference on Electrical Contacts,Electromechanical Components and Their Applications Nagoya,Japan,July 19-24,1999. 147-156 (1999)

    • Related Report
      1999 Annual Research Report
  • [Publications] R.Miyano,H.Suzuki,T.Kubono: "Spectroscopic temperature measurements of breaking arc at palladium contacts mounted on a miniature relay"Proceerings the International Conference on Electrical Contacts,Electromechanical Components and Their Applications Nagoya,Japan,July 19-24,1999. 19-24 (1999)

    • Related Report
      1999 Annual Research Report
  • [Publications] 窪野隆能、向井大輔: "制御継電器の電気接点損傷に関する数値評価研究、(その14)AC3級試験とAC4級試験での開閉時電気的特性"電子情報通信学会 信学技報、機構デバイス研究会. EMD99-74. 25-28 (1999)

    • Related Report
      1999 Annual Research Report
  • [Publications] 窪野隆能、徳永伸一: "Cu電気接点におけるDC50V-10A回路遮断時のアーク温度分光測定" 電気情報通信学会技術研究報告[機構デバイス研究会]EMD98-6. Vol.98,No.52. 1-7 (1998)

    • Related Report
      1998 Annual Research Report
  • [Publications] 窪野隆能、徳永伸一: "制御継電器の電気接点損傷に関する数値評価研究 その4" 電気情報通信学会技術研究報告[機構デバイス研究会]EMD98-7. Vol.98,No.52. 7-12 (1998)

    • Related Report
      1998 Annual Research Report
  • [Publications] 窪野隆能、秋山健司: "制御継電器の電気接点損傷に関する数値評価研究 その6" 199年度電気関係学会東海支部連合大会講演論文集(9月21日発表). 162 (1998)

    • Related Report
      1998 Annual Research Report
  • [Publications] 窪野隆能、宮野竜一: "制御継電器の電気接点損傷に関する数値評価研究 その7" 199年度電気関係学会東海支部連合大会講演論文集(9月21日発表). 163 (1998)

    • Related Report
      1998 Annual Research Report
  • [Publications] M.TAKEUCHI and T.KUBONO: "An observation of the breaking arc between silver contacts using a high speed color video" The Institute of Electronics,Information and Communication Engineers,Transactions on Electronics. E82-C,No.1. 33-40 (1999)

    • Related Report
      1998 Annual Research Report
  • [Publications] M.TAKEUCHI and T.KUBONO: "Influence of the shape of silver contacts on the spartial distribution of spectral intensity of a breaking arc" The Institute of Electronics,Information and Communication Engineers,Transactions on Electronics. E82-C,No.1. 41-48 (1999)

    • Related Report
      1998 Annual Research Report
  • [Publications] 窪野隆能: "制御継電器の電気接点損傷に関する数値評価研究 その1" 平成9年度電気関係学会東海支部連合大会講演論文集(9月30日発表). 323 (1997)

    • Related Report
      1997 Annual Research Report
  • [Publications] 窪野隆能、 冷水健吾: "制御継電器の電気接点損傷に関する数値評価研究 その2" 電気情報通信学会技術研究報告[機構デバイス]EMD97-81. Vol.97,No469. 1-6 (1998)

    • Related Report
      1997 Annual Research Report
  • [Publications] 藤田政博, 窪野隆能: "弱電流スイッチングアークのプラズマ物性値の観測" 電気情報通信学会技術研究報告[機構デバイス]EMD97-96. Vol.97,No.563. 61-66 (1998)

    • Related Report
      1997 Annual Research Report
  • [Publications] 窪野隆能: "制御継電器の電気接点損傷に関する数値評価研究 その3" 1998年電子情報通信学会総合大会講演論文集(3月30日発表). (1998)

    • Related Report
      1997 Annual Research Report

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Published: 1997-04-01   Modified: 2016-04-21  

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