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Development of X-Ray Fluorescence Holography Instrument

Research Project

Project/Area Number 09555264
Research Category

Grant-in-Aid for Scientific Research (B)

Allocation TypeSingle-year Grants
Section展開研究
Research Field 工業分析化学
Research InstitutionKYOTO UNIVERSITY

Principal Investigator

KAWAI Jun  Kyoto Univ., Associate Professor, 工学研究科, 助教授 (60191996)

Co-Investigator(Kenkyū-buntansha) NISHINO Makoto  Shimadzu Co., Chief Scientist, 分析機器事業部, 主任
ASAKI Zenjiro  Kyoto Univ.Professor, 大学院・工学研究科, 教授 (90026005)
GOHSHI Yohichi  Natl.Inst.Envir.Stud.Vice Dir., 副所長 (90111468)
HAYAKAWA Shinjiro  Univ.of Tokyo, Researcher, 大学院・工学系研究科, 助手 (80222222)
HAYASHI Kouichi  Kyoto Univ., Researcher, 大学院・工学研究科, 助手 (20283632)
足立 裕彦  京都大学, 大学院・工学研究科, 教授 (60029105)
Project Period (FY) 1997 – 1998
Project Status Completed (Fiscal Year 1998)
Budget Amount *help
¥12,600,000 (Direct Cost: ¥12,600,000)
Fiscal Year 1998: ¥2,900,000 (Direct Cost: ¥2,900,000)
Fiscal Year 1997: ¥9,700,000 (Direct Cost: ¥9,700,000)
KeywordsAnalytical Chemistry / Crystal Stracture Analysis / Holography / Analytical Informatics / Instrumentation Chemistry / Chemical Informatics
Research Abstract

Holographic methods provide both intensity and phase information, though diffraction methods, which do not give phase information, have long been used to determine crystal structure. X-Ray fluorescence holography employs two types of experimental techniques, which have successfully provided atomic images : one is called "X-ray fluorescence holography" (XFH), the other is called "multiple-energy X-ray holography" (MEXH). MEXH is the result of the optical reciprocity theorem applied to XFH, and is capable of recording holographic intensities at arbitrary energy, which can suppress the twin-image effect.
We succeeded to measure the angle dependence of the X-ray fluorescence intensity at the Photon Factory.
We also succeeded to obtain an atomic image of zinc (Zn ; 0.02 wt%) doped into gallium arsenide (GaAs), and to determine the Zn site using a thirdgeneration synchrotron-radiation facility, SPring-8, Japan Synchrotron Radiation Research Institute, Nishi-Harima, Hyogo, Japan.

Report

(3 results)
  • 1998 Annual Research Report   Final Research Report Summary
  • 1997 Annual Research Report
  • Research Products

    (9 results)

All Other

All Publications (9 results)

  • [Publications] J.Kawai 他: "X-Ray Fluorescence Holography of SrTiO3 compared with X-Ray Photoelectron Holography" Anal.Sci.14. 903-907 (1998)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1998 Final Research Report Summary
  • [Publications] K.Hayashi 他: "Local Atomic Image of 0.02% Zn in GaAs Wafer using X-Ray Holography" Anal.Sci.14. 987-990 (1998)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1998 Final Research Report Summary
  • [Publications] 林好一, 河合潤 他: "蛍光X線ホログラフィー" 放射光. 11. 361-367 (1998)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1998 Final Research Report Summary
  • [Publications] J.Kawai, K.Hayashi, T.Yamamoto, S.Hayakawa, and Y.Gohshi: "X-ray fluorescence holography of SrTiO_3 compared with X-ray photoelectron holography" Anal.Sci.14. 903-907 (1998)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1998 Final Research Report Summary
  • [Publications] K.Hayashi, T.Yamamoto, J.Kawai, M.Suzuki, S.Goto, S.Hayakawa, K.Sakurai, and Y.Gohshi: "Local atomic image of 0.02% Zn in GaAs wafer using X-ray holography" Anal.Sci.14. 987-990 (1998)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1998 Final Research Report Summary
  • [Publications] K.Hayashi, J.Kawai, S.Hayakawa, S.Goto, Y.Nihei, Y.Gohshi: "X-Ray Fluorescence Hologaphy" J.Jpn.Soc.Synchrotron Radiation Res.11. 361-367 (1998)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1998 Final Research Report Summary
  • [Publications] J.Kawai,K.Hayashi: "X-ray fluorescence holography of SrTiO_3 compared with X-ray photoelectron holography" Anal.Sci.14. 903-907 (1998)

    • Related Report
      1998 Annual Research Report
  • [Publications] K.Hayashi: "Local atomic image of 0.02% Zn in GaAs wafer using X-ray holography" Anal.Sci.14. 987-990 (1998)

    • Related Report
      1998 Annual Research Report
  • [Publications] 林 好一,河合 潤 他: "蛍光X線ホログラフィー" 放射光. 11. 361-367 (1998)

    • Related Report
      1998 Annual Research Report

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Published: 1997-04-01   Modified: 2016-04-21  

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