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Development of New Plasma Diagnostics Detectors for the Purpose of the Simultaneous Detection of X-rays, Electrons, Neutral Particles, and Ions with Their Species Resolution Having High Outputs in Wide Energy Ranges

Research Project

Project/Area Number 09558054
Research Category

Grant-in-Aid for Scientific Research (B)

Allocation TypeSingle-year Grants
Section展開研究
Research Field プラズマ理工学
Research InstitutionUniversity of Tsukuba

Principal Investigator

CHO Teruji  Univ.Tsukuba, Institute of Physics, Professor, 物理学系, 教授 (80171958)

Co-Investigator(Kenkyū-buntansha) TANAKA Shigetoshi  Kyoto University, Professor Emeritus, 名誉教授 (20025240)
KOHAGURA Junko  Univ.Tsukuba, Plasma Research Centre/Insti.Physics, Research Associate, プラズマ研究センター・物理学系, 助手 (60302345)
SATO Kenji  SII,Development of Semiconductor Processes, Researcher, 技術本部・開発課, 研究員
NAKASHIMA Yousuke  Univ.Tsukuba, Plasma Research Centre/Insti.Physics, Assistant Prof., プラズマ研究センター・物理学系, 講師 (00188939)
KONDOH Mafumi (HIRATA Maf)  Univ.Tsukuba, Plasma Research Centre/Insti.Physics, Assistant Prof., プラズマ研究センター・物理学系, 講師 (70222247)
坂本 宜照  日本学術振興会, 特別研究員
斎藤 豊  セイコー電子工業(株)技術本部, 開発課, 課長
Project Period (FY) 1997 – 1998
Project Status Completed (Fiscal Year 1998)
Budget Amount *help
¥7,900,000 (Direct Cost: ¥7,900,000)
Fiscal Year 1998: ¥2,300,000 (Direct Cost: ¥2,300,000)
Fiscal Year 1997: ¥5,600,000 (Direct Cost: ¥5,600,000)
KeywordsNeutral Particle Diagnostics / Electron Diagnostics / X-ray Diagnostics / Semiconductor Detectors / Electron Temperatere Diagnostics / Ion Temperature Diagnosdics / Wide Energy Range Detectors / Plasma Diagnostics
Research Abstract

Our newly proposed theory on the x-ray-energy response of semiconductor detectors is applied for the design and fabrication of new semiconductor plasma detectors for simultaneously measurable x rays, electrons, neutral particles, and ions with their species resolution.
This new detector is applied as a new collector using the application and combination with our developed differential-spectrum ion-energy analyzer with electrostatic slanted grids [see Rev. Sci. Instrum. 66 (1995) 4928]. This special detection structure is applied for distinguishing ions with positive charges and electrons with negative charges curved under the detector fields, as well as x rays and neutral particles with straight trajectories in the detector fields because of no charges.
In addition, a semiconductor detector collector is used for distinguishing the x rays and neutral particles on the basis of the difference of the mean free path in the semiconductor detector (i.e., shorter struggling distance for neutral particles and longer penetration length for x rays.
These differences are newly utilized by this research program for constructing new formula and computer simulation. These results for the new calculation method are based on the nuclear and electron interaction with the incident particles ; these details will be published in journals.
Several papers have already been published in journals ; the references are listed in this report sheet (see the rear side of this short summary report). As shown in the papers, these methods have already been verified in plasma experiments and routinely applied in actual plasma diagnostics.

Report

(3 results)
  • 1998 Annual Research Report   Final Research Report Summary
  • 1997 Annual Research Report
  • Research Products

    (24 results)

All Other

All Publications (24 results)

  • [Publications] T.Cho et al.: "Development and Characterization of Semiconductor Ion Detectors for Plasma Diagnostics in the Range over 0.3 keV" Review of Scientific Instruments. 68. 324-327 (1997)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1998 Final Research Report Summary
  • [Publications] T.Cho et al.: "Characterization of New Semiconductor Detectors for X-ray Tomography in the ASDEX Upgrade Tokamak and Its Generalized Physics Interpretations" Review of Scientific Instruments. 68. 774-777 (1997)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1998 Final Research Report Summary
  • [Publications] T.Cho et al.: "Characterization and Interpretation of the Quantum Efficiencies of Multilayer Semiconductor Detectors Using a New Theory" Journal of Synchrotron Radiation. 5. 877-879 (1998)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1998 Final Research Report Summary
  • [Publications] J.Kohagura et al.: "Alternative Principle and Method in X-ray Diagnostics for Plasma Electron Temperatures" Physical Review E. 56. 5884-5893 (1998)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1998 Final Research Report Summary
  • [Publications] J.Kohagura et al.: "International Collaboration Researches on the Effects of a New Theory on the Plasma X-ray Diagnostics Using Semiconductor X-ray Detectors" Plasma Physics Reports (Fizika Plazmy). 24. 218-221 (1998)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1998 Final Research Report Summary
  • [Publications] Y.Sakamoto et al.: "Characterization of a Semiconductor Detector and Its Application for Ion Diagnostics Using a Novel Ion Energy Spectrometer" Review of Scientific Instruments. 70. 857-860 (1999)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1998 Final Research Report Summary
  • [Publications] T.Cho et al.: "Development and Characterization of Semiconductor Ion Detectors for Plasma Diagnostics in the Range over 0.3keV" Review of Scientific Instruments. 68. 324-327 (1997)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1998 Final Research Report Summary
  • [Publications] T.Cho et al.: "Characterization of New Semiconductor Detectors for X-ray Tomography in the ASDEX Upgrade Tokamak and Its Generalized Physics Interpretations" Review of Scientific Instruments. 68. 774-777 (1997)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1998 Final Research Report Summary
  • [Publications] T.Cho et al.: "Characterization and Interpretation of the Quantum Efficiencies of Multilayer Semiconductor Detectors Using a New Theory" Journal of Synchrotron Radiation. 5. 877-879 (1998)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1998 Final Research Report Summary
  • [Publications] J.Kohagura et al.: "Alternative Principle and Method in X-ray Diagnostics for Plasma Electron Temperatures" Physical Review E. 56. 5884-5893 (1998)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1998 Final Research Report Summary
  • [Publications] J.Kohagura et al.: "International Collaboration Researches on the Effects of a New Theory on the Plasma X-ray Diagnostics Using Semiconductor X-ray Detectors" Plasma Physics Reports (Fizika Plazmy). 24. 218-221 (1998)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1998 Final Research Report Summary
  • [Publications] Y.Sakamoto et al.: "Characterization of a Semiconductor Detector and Its Application for Ion Diagnostics Using a Novel Ion Energy Spectrometer" Review of Scientific Instruments. 70. 857-860 (1999)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1998 Final Research Report Summary
  • [Publications] T.Cho et al.: "Characterization and Interpretation of the Quantum Efficiencies of Multilayer Semiconductor Detectors Using a New Theory" Journal of Synchrotron Radiation. 5. 877-879 (1998)

    • Related Report
      1998 Annual Research Report
  • [Publications] T.Cho et al.: "Effects of Neutrons on Semiconductor X-Ray Detectors Including n-Type Joint European Torus and p-Type GAMMA 10 Tomography Detectors" Review of Scientific Instruments. 70. 577-580 (1999)

    • Related Report
      1998 Annual Research Report
  • [Publications] T.Cho et al.: "A New Principle in Plasma Electron-Temperature Diagnostics Using a Semiconductor X-ray Detector" Plasma Devices and Operation. (in press). (1998)

    • Related Report
      1998 Annual Research Report
  • [Publications] J.Kohagura et al.: "International Collaboration Researches on the Effects of a New Theory on the Plasma X-ray Diagnostics Using Semiconductor X-ray Detectors" Plasma Physics Reports(Fizika Plazmy). 24. 218-221 (1998)

    • Related Report
      1998 Annual Research Report
  • [Publications] J.Kohagura et al.: "New Methods for Semiconductor Charge-Diffusion-Length Measurements Using Synchrotron Radiation" Journal of Synchrotron Radiation. 5. 874-876 (1998)

    • Related Report
      1998 Annual Research Report
  • [Publications] Y.Sakamoto et al.: "Characterization of a Semiconductor Detector and Its Application for Ion Diagnostics Using a Novel Ion Energy Spectrometer" Review of Scientific Instruments. 70. 857-860 (1999)

    • Related Report
      1998 Annual Research Report
  • [Publications] T.Cho et al.: "Development and Characterization of Semiconductor Ion Detectors for Plasma Diagnostics in the Range ever 0.3keV" Review of Scientific Instruments. 68,No.1. 324-327 (1997)

    • Related Report
      1997 Annual Research Report
  • [Publications] T.Cho et al.: "Characterization of New Semiconductor Detectors for X-ray Tomography in the ASDEX Upgrade Tokamak and Its Generalized physics Interpretations" Review of Scientific Instruments. 68,No.1. 774-777 (1997)

    • Related Report
      1997 Annual Research Report
  • [Publications] T.Cho et al.: "X-ray Diagnostics for Investigating Electron Distribution Functions and Electron Potential Confinements" Fusion Engineering and Design. 34-35. 179-182 (1997)

    • Related Report
      1997 Annual Research Report
  • [Publications] J.Kohagura et al.: "Alternative Method in X-ray Diagnostics for Plasma Electron-Temperature Measurements" Physical Review E. 56,No.5B. 5884-5893 (1997)

    • Related Report
      1997 Annual Research Report
  • [Publications] J.Kohagura et al.: "Applications of a New Theory on the X-ray Energy Responses of Semiconductor Detector to Plasma X-ray Diagnostics" Fusion Engineering and Design. 34-35. 183-187 (1997)

    • Related Report
      1997 Annual Research Report
  • [Publications] Y.Sakamoto et al.: "Plasma-Ion Diagnostics Using a Newly Designed Differential-Spectrum Ion-Energy Analyzer with Electrostatic Slanted Grids" Fusion Engineering and Design. 34,35. 543-546 (1997)

    • Related Report
      1997 Annual Research Report

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Published: 1997-04-01   Modified: 2016-04-21  

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