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"OBSERVATION OF ULTRA FAST DYNAMICS OF SEMICONDUCTOR SURFACE ATOMS AND MOLECULES"

Research Project

Project/Area Number 09650032
Research Category

Grant-in-Aid for Scientific Research (C)

Allocation TypeSingle-year Grants
Section一般
Research Field 表面界面物性
Research InstitutionKYUSHU UNIVERSITY

Principal Investigator

WATANABE Fumiya  KYUSHU UNIVERSITY,DEPT.OF MATERIALS SCIENCE AND ENGINEERING,ASSISTANT PROFESSOR, 工学研究科, 講師 (30264063)

Co-Investigator(Kenkyū-buntansha) MOTOOKA Teruaki  KYUSHU UNIVERSITY,DEPT.OF MATERIALS SCIENCE AND ENGINEERING,PROFESSOR, 工学研究科, 教授 (50219979)
Project Period (FY) 1997 – 1998
Project Status Completed (Fiscal Year 1998)
Budget Amount *help
¥3,900,000 (Direct Cost: ¥3,900,000)
Fiscal Year 1998: ¥600,000 (Direct Cost: ¥600,000)
Fiscal Year 1997: ¥3,300,000 (Direct Cost: ¥3,300,000)
KeywordsFIELD EMISSION / SURFACE DIFFUSION / SILICON / MICROMACHINE / アトムダイナミックス / アトミックダイナミックス / シリコン超薄膜
Research Abstract

A device called femtosecond field emission camera (FFEC) which is capable of directly observing the dynamics of single surface atoms has been built. We have investigated several forms of semiconductor samples suitable for FFEC operation. The best sample has been determined to be sharp tungsten tips covered with thin silicon films, approximately 50-200_ thick. This type of tip is strong enough to survive high electric field needed for field emission. They remain amorphous while being heated to relatively high temperatures (>1300K) confirmed by high resolution transmission electron microscopy. We have measured silicon surface diffusivities within a 80_chi80 _ square at relatively high temperatures (950K -1100K) utilizing field emission current fluctuation method. The diffusion in this range is described by an activation energy of 2.08 eV and a prefactor of 0.022 cm^2/sec. If a pulse laser is used to heat the tip, the time limit of our device is the duration of laser pulses to heat the tip.
In the course of the tip material investigation, we have invented a device which enable the scanning probe microscopy tip based lithography in parallel. The device also may be utilized in down sizing of data storage devices.

Report

(3 results)
  • 1998 Annual Research Report   Final Research Report Summary
  • 1997 Annual Research Report
  • Research Products

    (9 results)

All Other

All Publications (9 results)

  • [Publications] F. Watanabe and T. Motooka: "Atomic scale dynamics of silicon at high temperatures,,1998" Proc.of the 2nd Symp.on Atomic-scale Surface and Interface Dynamics. 2. 97-102 (1998)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1998 Final Research Report Summary
  • [Publications] F.Watanabe,M.Arita,T.Motooka,K.Okano,and T.Yamada: "Diamond Tip Arrays for Parallel Lithography and Data Storage" Jpn.J.Appl.Phys.37. L562-L564 (1999)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1998 Final Research Report Summary
  • [Publications] F.Watanabe and T.Motooka: "Silicon surface diffusion studied by field emission current fluctuation method" Proc. of the 3rd Symp. on Atomic-scale Surface and Interface Dynamics. to be published. (1999)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1998 Final Research Report Summary
  • [Publications] Fumiya Watanabe and Teruaki Motooka: ""Atomic scale dynamics of silicon at high temperatures"" Proc.of the 2nd Symp.on Atomic-scale Surface and Interface Dynamics. 97-102 (1998)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1998 Final Research Report Summary
  • [Publications] Fumiya Watanabe, Makoto Arita, Teruaki Motooka, K.Okano, and T.Yamada: ""Diamond tip arrays for parallel lithography and data storage"" Jpn.J.Appl.Phys.37. L562-564 (1998)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1998 Final Research Report Summary
  • [Publications] Fumiya Watanabe, Satoshi Hirayama, Ken Nishihira, and Teruaki Motooka: ""Silicon surface diffusion studied by field emission current fluctuation method"" 3rd Symp.on Atomic-scale Surface and Interface Dynamics. (to be published.).

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1998 Final Research Report Summary
  • [Publications] F. Watanabe, M. Arita, T. Motooka, K. Okano, and T. Yamada: "Diamond Tip Arrays for Parallel Lithography and Data Storage" Jpn. J. Appl. Phys.37. L562-L564 (1999)

    • Related Report
      1998 Annual Research Report
  • [Publications] F. Watanabe and T. Motooka: "Silicon surface diffusion studied by field emission current fluctuation method" Proc. of the 3rd Symp. on Atomic-scale Surface and Interface Dynamics. (to be published). (1999)

    • Related Report
      1998 Annual Research Report
  • [Publications] F.Watanabe and T.Motooka: "Atomic scale dynamics of silicon at high temperatures" Proc.3rd Symp.of Atomic-Scale Surface and Inetrface Dynamics. 4(in press). (1998)

    • Related Report
      1997 Annual Research Report

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Published: 1997-04-01   Modified: 2016-04-21  

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