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Research on a Structure Analysis of Materials with a Maximum Entropy Restoration of Electron Microscope Images.

Research Project

Project/Area Number 09650063
Research Category

Grant-in-Aid for Scientific Research (C)

Allocation TypeSingle-year Grants
Section一般
Research Field Applied physics, general
Research InstitutionNagoya University

Principal Investigator

HANAI Takaaki  Graduate School of Engineering, Nagoya University Assistant Professor, 工学研究科, 講師 (00156366)

Co-Investigator(Kenkyū-buntansha) MUROOKA Yoshie  Graduate School of Engineering, Research Associate, 工学研究科, 助手 (40273263)
TANAKA Shigeyasu  Graduate School of Engineering, Research Associate, 工学研究科, 助手 (70217032)
Project Period (FY) 1997 – 1998
Project Status Completed (Fiscal Year 1998)
Budget Amount *help
¥3,200,000 (Direct Cost: ¥3,200,000)
Fiscal Year 1998: ¥1,000,000 (Direct Cost: ¥1,000,000)
Fiscal Year 1997: ¥2,200,000 (Direct Cost: ¥2,200,000)
KeywordsMaximum Entropy Method / Image Restoration / Electron Microscopy / Random Noise Constraint / Quantum Noise / Structure Analysis / Contrast Transfer Function / Complex Wave Function / ランダム空間分布制約条件
Research Abstract

1.Implementation of Maximum Entropy (ME) Restoration Programs : Computer programs for the ME image restoration constrained by the spatially random distribution of quantum noise were developed and implemented on PCs. The programs allows visualization of changes in the image during the process of restorations and the difference between the modified ME restoration and conventional kai-squared constrained method. It also enables us to study the effect of the ME restoration in the Fourier space.
2.Restoration of TEM Images of Weak-phase Objects : The modified ME method was applied to deconvolution of largely defocused TEM images of ferritin particles. The cores of ferritin particles, which were blurred with reversed contrast due to the severely oscillating contrast transfer function (CTF) in the defocused image, are recovered to the original size with the correct contrast. The Fourier analysis showed that the frequency regions of reversed contrast in the defocused image is automatically reconstructed by the phase shift of pi as a result of the ME restoration even around zeros in the CTF.
3.Implementation of the Imaging of Crystals : For application of the ME restoration to crystal specimens, simulation of TEM imaging is required to calculate the image intensity from a simulated complex wave function just below the specimen and to compare the image intensity with the observed image. An image simulation program was, therefore, implemented with a C++ language and incorporated into ME restoration programs. The results of the simulation were in good agreement with those calculated with a standard program.
4.Development of ME Restoration of High-resolution Crystal Images : Existing ME methods cannot be applied to crystal images since they are designed. to treat only real number while the electron wave function is complex. To solve this problem, the algorism was extended to deal with complex function.

Report

(3 results)
  • 1998 Annual Research Report   Final Research Report Summary
  • 1997 Annual Research Report
  • Research Products

    (18 results)

All Other

All Publications (18 results)

  • [Publications] 花井孝明: "Maximum Entropy Restoration of Electron Microscope Images with a Random-Spatial-Distribution Constraint (印刷中)" Scanning Electron Microscopy. Suppl.11. (1999)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1998 Final Research Report Summary
  • [Publications] 花井孝明: "Reduction of Spherical Aberration of a Transmisson Electron Microscope by Means of a Foil Lens" Electron Microscopy 1998. 1. 83-84 (1998)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1998 Final Research Report Summary
  • [Publications] 田中成泰: "Characterization of Etch Pits and Correlated Defects in ZnSe/(001)GaAs" Microscopy Research and Technique. 43. 518-519 (1998)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1998 Final Research Report Summary
  • [Publications] 花井孝明: "Characteristics and Effectiveness of a Foil Lens for Correction of Spherical Aberration in Scanning Transmission Electron Microscopy" Journal of Electron Microscopy. 47・3. 185-192 (1998)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1998 Final Research Report Summary
  • [Publications] 田中成泰: "Photochemical Etching Technique Preparing High-quality TEM Samples of n-type Compound Semiconductors" Journal of Electron Microscopy. 46・2. 129-133 (1997)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1998 Final Research Report Summary
  • [Publications] Takaaki Hanai: "Maximum Entropy Restoration of Electron Microscope Images with a Random-Spatial-Distribution Constraint(in print)" Scanning Microscopy. Supplement 11. (1999)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1998 Final Research Report Summary
  • [Publications] Takaaki Hanai: "Reduction of Spherical Aberration of a Transmission Electron Microscope by Means of a Foil Lens" Electron Microscopy 1998. 1. 83-84 (1998)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1998 Final Research Report Summary
  • [Publications] Shigeyasu Tanaka: "Characterization of Etch Pits and Correlated Defects in ZnSe/(001) GaAs" Microscopy Research and Technique. 43. 518-519 (1998)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1998 Final Research Report Summary
  • [Publications] Takaaki Hanai: "Characteristics and Effectiveness of a Foil Lens for Correction of Spherical Aberration in Scanning Transmission Electron Microscopy" Journal of Electron microscopy. 47-3. 185-192 (1998)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1998 Final Research Report Summary
  • [Publications] Shigeyasu Tanaka: "Photochemical Etching Technique Preparing High-quality TEM Samples of n-type Compound Semiconductors" Journal of Electron Microscopy. 46-2. 129-133 (1997)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1998 Final Research Report Summary
  • [Publications] 花井孝明: "Maximum Entropy Restoration of Electron Microscope Images with a Random-Spatial-Distribution Constraint(印刷中)" Scanning Electron Microscopy. Suppl.11. (1999)

    • Related Report
      1998 Annual Research Report
  • [Publications] 花井孝明: "Reduction of Spherical Aberration of a Transmission Electron Microscope by Means of a Foil Lens" Electron Microscopy 1998. 1. 83-84 (1998)

    • Related Report
      1998 Annual Research Report
  • [Publications] 田中成泰: "Characterization of Etch Pits and Correlated Defects in ZnSe/ (001) GaAs" Microscopy Research and Technique. 43. 518-519 (1998)

    • Related Report
      1998 Annual Research Report
  • [Publications] 花井孝明: "Characteristics and Effectiveness of a Foil Lens for Correction of Spherical Aberration in Scanning Transmission Electron Microscopy" Journal of Electron Microscopy. 47・3. 185-192 (1998)

    • Related Report
      1998 Annual Research Report
  • [Publications] 田中成泰: "Photochemical Etching Technique Preparing High-quality TEM Samples of n-type Compound Semiconductors" Journal of Electron Microscopy. 46・2. 129-133 (1997)

    • Related Report
      1998 Annual Research Report
  • [Publications] 花井孝明: "Characteristics and Effectiveness of a FOil Lens for Correction of Spherical Aberration in Scanning Transmission Electron Microscopy(発表予定)" Journal of Electron Microscopy. 47・3. (1998)

    • Related Report
      1997 Annual Research Report
  • [Publications] 花井孝明: "Maximum Entropy Restoration of Electron Microscope Images with a Random-Spatial-Distribution Constraint(発表予定)" Scanning Electron Microscopy. Suppl.11. (1997)

    • Related Report
      1997 Annual Research Report
  • [Publications] 田中成泰: "Photochemical Etching Technique Preparing High-quality TEM Samples of n-type Compound Semiconductors" Journal of Electron Microscopy. 46・2. 129-133 (1997)

    • Related Report
      1997 Annual Research Report

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Published: 1997-04-01   Modified: 2016-04-21  

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