Fabrication of Hard magnetic Amorphous Films Prepared by Laser Ablation Method and their properties
| Project/Area Number |
09650753
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| Research Category |
Grant-in-Aid for Scientific Research (C)
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| Allocation Type | Single-year Grants |
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| Section | 一般 |
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| Research Field |
Structural/Functional materials
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| Research Institution | Tohoku University |
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Principal Investigator |
TAKEUCHI Akira Tohoku Univ., Inst.for Mat.Res., Res.Assoc., 金属材料研究所, 助手 (40250815)
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| Project Period (FY) |
1997 – 1998
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| Project Status |
Completed (Fiscal Year 1998)
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| Budget Amount *help |
¥3,100,000 (Direct Cost: ¥3,100,000)
Fiscal Year 1998: ¥1,000,000 (Direct Cost: ¥1,000,000)
Fiscal Year 1997: ¥2,100,000 (Direct Cost: ¥2,100,000)
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| Keywords | Laser Ablation / Amorphous Thin Film / Hard Magnetism / Nano Crystallization / Soft Magnetism / Droplet Particle / 非晶質 / 薄膜 |
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| Research Abstract |
Nd-Fe base thin films with a thickness of up to 50 mum were prepared by laser ablation method. The surface of the thin films consists of a smooth layer and droplet particles abnormally grown. The droplet particles were characteristics of the Nd-based thin films and were not observed on the surface of the Fe-based thin films. The X-ray diffraction patterns exhibits broad halo with sharp peaks, indicating the coexisting of amorphous phase and alpha-Nd crystals. The sharp peaks disappeared when the droplet particles were removed. The saturation magnetization and coercive force of the Nd-based thin film with a thickness of 25 mum are 0.11 T and 13.5 kA/m, respectively. The coercive force is higher than that of the ribbon specimens prepared by melt-spinning. These thin films shows soft magnetism with a maximum coercive force of 2 kA/m. On the other hand, thin films prepared under an annealed state exhibit hard magnetism for both Nd-Fe binary and Nd-rich Nd-Fe-B ternary thin films which consisting of amorphous and crystalline phase while the other Nd-Fe base thin films exhibit amorphous single phase. Nd-richNd-Fe-B thin film prepared at 873 K increases in coercive force, and the magnetization does not saturate in an applied field of 1.256 MAIm. This phenomenon differs from that for button shaped specimens prepared by arc melting method : The coercive force of the button shpaped specimen is 300 kA/m and increase in coercive force when they were annealed. The thin films show soft magnetism due to rapid quenching which restrict structural relaxation in the specimens. It is clarified that thin films prepared by laser ablation method do not exhibit hard magnetism in an amorphous single state while hard magnetism was observed with a mixture of amorphous and nanocrystalline phase.
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Report
(3 results)
Research Products
(1 results)
