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ELECTRON SPECTROSCOPIC MICROSCOPY IN MATERIALS SCIENCE

Research Project

Project/Area Number 10044166
Research Category

Grant-in-Aid for Scientific Research (B).

Allocation TypeSingle-year Grants
Section一般
Research Field Physical properties of metals
Research InstitutionKYUSHU UNIVERSITY

Principal Investigator

TOMOKIYO Yoshitsugu  Kyushu University, Materials Science and Engineering, Professor, 工学研究科, 教授 (40037891)

Co-Investigator(Kenkyū-buntansha) YASUDA Kazuhiro  Kyushu University, Nuclear Engineering, Research Associate, 工学研究科, 助手 (80253491)
WATANABE Masashi  Kyushu University, Fac. Eng., Associate Prof., 工学研究科, 助教授 (10304734)
MATSUMURA Syo  Kyushu University, Nuclear Engineering, Professor, 工学研究科, 教授 (60150520)
ZUO JianーMin  アリゾナ州大学, 物理学科, 研究員
MAYER Joachi  マックスプランク研究所, 金属研究所, 主任研究員
Project Period (FY) 1998 – 1999
Project Status Completed (Fiscal Year 1999)
Budget Amount *help
¥4,600,000 (Direct Cost: ¥4,600,000)
Fiscal Year 1999: ¥2,100,000 (Direct Cost: ¥2,100,000)
Fiscal Year 1998: ¥2,500,000 (Direct Cost: ¥2,500,000)
Keywordsimaging filter / electron energym loss spectroscopy / omega filter / electron spectroscopic imaging / electron spectroscopic diffraction / elemental mapping / inelastic scattering / 電子顕微鏡 / 収束電子回折 / 非弾性散乱
Research Abstract

We investigated performance and applicability of the new energy filtering transmission electron microscope which was recently installed in Kyushu University (KU), and compared with those of microscopes in Max-Planck Institute and Arizona State University. The new microscope in KU has a field emission gun of Shottcky type and an imaging filter of omega-type. The imaging energy spectrometer enables us to use the information included in the inelastically scattered electrons and to improve the contrasts of magnified images as well as diffraction patterns.
(1) Electron spectroscopic imaging : By changing a position and a width of energy selecting slit, we can select the energy of electrons to be used for imaging. The contrasts of filtered zero-loss images are improved in the multi-beam resolution images as well as bright-field or dark-field images, although the size and position of an objective apertureare are different in these imaging modes. Images of coherent precipitates, stacking faults and dislocations in metals and alloys are sharp in filtered zero-loss images. The effect of energy filtering is pronounced in thicker spsecimen and lower accelerating voltage. A filtered core-loss (inner-shell ionization) image includes information on composition of a particular element in material (element mapping). Thin oxide layer in Si water is visualized in a two-dimensional scale in the filtered K-loss oxygen image.
(2) Electron spectroscopic diffraction : Energy filtered diffraction patterns are obtained by changing the energy slit in the diffraction mode. Inelastically scattered electrons are responsible for the background in diffraction patterns. The background is well eliminated and contrast is much improved in the zero-loss filtered diffraction patterns. We can observe weak diffraction spots or diffuse maxima in the selected-area diffraction patters, and weak diffraction lines of a higher order Laue zone in convergent electron diffraction patters.

Report

(3 results)
  • 1999 Annual Research Report   Final Research Report Summary
  • 1998 Annual Research Report
  • Research Products

    (22 results)

All Other

All Publications (22 results)

  • [Publications] Joachim Mayer Syo Matsumura and Y. Tomokiyo: "First electron spectroscopic imaging experiments on the new JEOL Z010 FEF"Journal of Electron Microscopy. 47. 283-291 (1998)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1999 Final Research Report Summary
  • [Publications] 友清 芳二: "エネルギーフィルター電子顕微鏡による像観察"電子顕微鏡 基礎技術と応用. 9. 59-63 (1998)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1999 Final Research Report Summary
  • [Publications] 松村 晶: "エネルギーフィルターTEMによる電子回折"電子顕微鏡 基礎技術と応用. 9. 65-69 (1999)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1999 Final Research Report Summary
  • [Publications] Y. Tomokiyo and S. Matsumura: "Energy filtering transmission electron microscopy using the new JEM-201 FEF"Journal of Microscopy. 194. 210-218 (1998)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1999 Final Research Report Summary
  • [Publications] Y. Tomokiyo and S. Matsumura: "Recent Development in Quantitative Electron Diffraction for Crystallography of Materials"Materials Transactions, JIM. 39. 927-937 (1998)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1999 Final Research Report Summary
  • [Publications] Y. Tomokiyo and S. Matsunuma: "Recent Development in Quantitative Electron Diffraction for Crystallography of Materials"Materials Trans. Jap. Inst. Metals. 39-9. 927-937 (1998)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1999 Final Research Report Summary
  • [Publications] J. Mayer, S. Matsunuma and Y. Tomokiyo: "First electron spectroscopic imaging experiments on the new JEOL 2010FEF"J. Electron microscopy. 47-4. 283-291 (1998)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1999 Final Research Report Summary
  • [Publications] Y. Tomokito and S. Matsunuma: "Energy filtering transmission electron microscopy using new JEM-2010FEF"Journal of Microscopy. 194. 210-218 (1998)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1999 Final Research Report Summary
  • [Publications] S. Hata, T. Mitate, S. Matsunuma, N. Kuwano, K. Oki, D. Shindo: "Short range order in Ni4Mo studied by quantitative high resolution transmission electron microscopy Proc."Proc. 3rd Pacific Int'l. Conf. Advanced Materials and Processing. PRICM-3. 1411-1416 (1998)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1999 Final Research Report Summary
  • [Publications] S. Matsunuma, N. Kuwano, K. Oki, S. Shindo: "Short range order in Ni4Mo and its high resolution electron microscopic images"Acta Materials. 46-14. 4955-4961 (1998)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1999 Final Research Report Summary
  • [Publications] S. Hata, D. Shindo, N. Kuwata, S. Matsunuma, K. Oki: "Interpretation of high resolution transmission electron microscope images of short range ordered Ni4Mo"Mater. Trans. JIM. 39-9. (1998)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1999 Final Research Report Summary
  • [Publications] M. Watanabe et al: "Analytical Electron Microscopy Study of Ni/Ni-8mol%Ti Diffusion Couples"Acta Materialia. 46. 9-15 (1998)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1999 Final Research Report Summary
  • [Publications] M. Watanabe and Z. Horita and M. Nemoto: "Application of z-Factor Method to Ti-Al-Cr System in Analytical Electron Microscopy"J. Electron Microscopy. 47. 9-15 (1998)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1999 Final Research Report Summary
  • [Publications] M. Watanabe et al: "Thin Film Analysis and Chemical Mapping in the Analytical Electron Microscope"Acta, Supplement. 15. 49-57 (1998)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1999 Final Research Report Summary
  • [Publications] K. Yasuda, K. Izumi and C. Kinoshita: "Role of irradiation spectrum on the microstructure evolution in magnesium aluminate spinel"Philos. Mag.. A78. 583-598 (1998)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1999 Final Research Report Summary
  • [Publications] K. Yasuda, M. Nastasi, K. E. Sickafus: "C. J. Maggiore and N. Yu, Ion beam channeling study on the damage accumulation in yttria-stabilized cubic zirconia"Nucl. Instr. and Meth. in Phys. R. Res. B.. 136-138. 499-505 (1998)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1999 Final Research Report Summary
  • [Publications] Z. Akase, Y. Tomokiyo and M. Watanabe: "Measurements of charge of Cu and O in YbaィイD22ィエD2CuィイD23ィエD2Oy by energy filtering convergent-beam electron diffraction"Physica C. (in press). (2000)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1999 Final Research Report Summary
  • [Publications] Joachim Mayer Syo Matsumura and Y.Tomokiyo: "First electron spectroscopic imaging experiments on the new JEOL 2010FEF"Jourmal of Electron Microscopy. 47. 283-291 (1998)

    • Related Report
      1999 Annual Research Report
  • [Publications] Y.Tomokiyo and S.Matsumura: "Energy filtering tramsmission electron microscopy using the new JEH-2010 FEF"Jourmal of Microscopy. 194. 210-218 (1998)

    • Related Report
      1999 Annual Research Report
  • [Publications] Y.Tomokiyo and S.Matsumura: "Recent Development in Quantitative Elctron Diffraction for Crystallography of Materials"Materials Transactions,JIM. 39. 927-937 (1998)

    • Related Report
      1999 Annual Research Report
  • [Publications] 友清 芳二: "エネルギーフィルター電子顕微鏡による像観察"電子顕微鏡基礎技術と応用. 9. 59-63 (1998)

    • Related Report
      1999 Annual Research Report
  • [Publications] 松村 晶: "エネルギーフィルターTEMによる電子回折"電子顕微鏡基礎技術と応用. 9. 65-69 (1998)

    • Related Report
      1999 Annual Research Report

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Published: 1998-04-01   Modified: 2016-04-21  

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