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Formation mechanism of silicon surface nanoholes

Research Project

Project/Area Number 10305006
Research Category

Grant-in-Aid for Scientific Research (A).

Allocation TypeSingle-year Grants
Section一般
Research Field 表面界面物性
Research InstitutionOsaka University

Principal Investigator

TAKEDA Seiji  Graduate School of Science, Osaka Univ.Prof.Research Associate, 大学院・理学研究科, 教授 (70163409)

Co-Investigator(Kenkyū-buntansha) KOHNO Hideo  Graduate School of Science, Osaka Univ.Prof.Research Associate, 大学院・理学研究科, 助手 (00273574)
OHNO Gutaka  Graduate School of Science, Osaka Univ.Prof.Research Associate, 大学院・理学研究科, 助手 (80243129)
Project Period (FY) 1998 – 2000
Project Status Completed (Fiscal Year 2000)
Budget Amount *help
¥40,400,000 (Direct Cost: ¥40,400,000)
Fiscal Year 2000: ¥9,700,000 (Direct Cost: ¥9,700,000)
Fiscal Year 1999: ¥6,400,000 (Direct Cost: ¥6,400,000)
Fiscal Year 1998: ¥24,300,000 (Direct Cost: ¥24,300,000)
Keywordssilicon / surface / nanostructures / electron irradiation / point defects / ナノストラクチュア
Research Abstract

The aim of this research project is to elucidate the formation mechanism of silicon surface nanoholes, which are introduced on silicon surface by high energy electron irradiation. Preliminary studies on the formation of nanoholes were carried out soon after the finding of surface nanoholes by the principal investigator of the research project. Supported by the grant, the systematic studies were made possible by means of transmission electron microscopy and scanning tunneling microscopy. Based on the substantial experimental data along with computer simulation, we have shown that the formation process of surface nanoholes is classified in the three stages. 1) The minimum electron energy needed for the formation of nanoholes has been determined to be 30keV.This shows that, as the primary event of the nanohole formation, single Si atoms on a surface are sputtered out, leaving surface vacancies behind. 2) Under electron irradiation, surface vacancies can migrate athermaly as well as thermally in the wide temperature range from 4 to 500K.3) Nanoholes are gradually excavated along the direction of ongoing electrons with the increase of electron dose. The peculiar phenomenon is accounted for by the anisotropic diffusion of surface vacancies via the momentum transfer from electrons to Si atoms located on the wall of nanohoels. The present study has clarified that the dynamic nature of atoms on surface at the states far from the equilibrium, which has been much less described so far.
During the experiments which were proposed in the project, we have found a new phenomenon that electron irradiation renders crystalline silicon to amorphous silicon. The mechanism of the amorphization is also accounted for by the clustering of point defects under electron irradiation.
The present study will be a basis for fabrication of nanostructures and Si-based microelectronic devices, since an electron beam can be focused on an area smaller than nano-meters and scanned easily.

Report

(4 results)
  • 2000 Annual Research Report   Final Research Report Summary
  • 1999 Annual Research Report
  • 1998 Annual Research Report
  • Research Products

    (19 results)

All Other

All Publications (19 results)

  • [Publications] N.Ozaki 他: "Obseration of silicon surface nanoholes by scanning tunneling microscopy"Surface Science(印刷中).

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] H.Kohno and S,Takoda: "Periodic instability in growth of chains of crystalline-silicon nanospheres"J.Cryst.Growth. 216. 185-191 (2000)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] H.Kohno,T.Iwasaki and S,Takeda: "Metal-mediated growth of alternate semiconductor-insulator nanostructures"Solid State Communications. 116. 591-594 (2000)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] S.Takeda and J.Yamasaki: "Amorphigation in silicon by electron irradiation"Phys.Rev.Lett.. 83. 320-323 (1999)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] S.Takeda et al: "Electron irradiation effects in Si observed at 42-25K by means of in-situ transmission electron microscopy"Physica. B273-274. 476-479 (1999)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] N.Ogaki et al.: "Observation of silicon surface nanoholes by scanning tunneling microscopy"Swiface Science. (in press).

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] H.Kohno and S.Takeda: "Periodic instability in growth of chairs of crystalline-silicon nanospheres"J.Crys.Grocoth. 216. 185-191 (2000)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] H.Kohno, T.Iwasaki and S.Takada: "Metal-mediated growth of alternate Semicon dactor-insulator nanostructures"Solid State Communications. 116. 591-594 (2000)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] S.Takeda and J.Yamasaki: "Amorphigathe in silicon by electron irradiation"Phys.Rov.Lett.. 83. 320-323 (1999)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] S.Takeda, J.Yamasaki and Y.kimura: "Electron irradiation effects in Si observed at 4, 2-25K by means of in-situ transmission electron microscopy"Phys.Sica B. 273-274. 476-479 (1999)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] N.Ozaki,Y.Ohno,M,Tanbara,D.Hamada,J.Yamasaki & S.Takada: "Observation of silicon surface nanoholes by scanning tunneling microscopy"Surface Science. (accepted for publication).

    • Related Report
      2000 Annual Research Report
  • [Publications] H.Kohno,T.Iwasaki & S.Takada: "Metal-mediated growth of alternate semiconductor-insulator nanostructures"Solid State Communications. 116. 591-594 (2000)

    • Related Report
      2000 Annual Research Report
  • [Publications] N.Aki,Y.Ohno,H.Kohno & S.Takada: "Formation of microcracks in cubic boron nitride"PhiBos.Mag.A59. A59. 2694-2699 (2000)

    • Related Report
      2000 Annual Research Report
  • [Publications] H.Kohno,S.Takada & K.Tanaka: "Plasmon-loss imaging of chains of crystalline-silicon nanospheres and silicon nanowires"J.Electron Microscopy. 49. 275-280 (2000)

    • Related Report
      2000 Annual Research Report
  • [Publications] S. Takeda and J. Yamasaki: "Amorphigation in silicon by elctron irradiation"Physical Review Letters. 83-2. 320-323 (1999)

    • Related Report
      1999 Annual Research Report
  • [Publications] 竹田 精治: "新しいシリコン系ナノ構造"応用物理. 69・1. 48-51 (2000)

    • Related Report
      1999 Annual Research Report
  • [Publications] 竹田 精治: "シリコン結晶および表面における点欠陥クラスターの生成とその構造"固体物理. 34・7. 619-629 (1999)

    • Related Report
      1999 Annual Research Report
  • [Publications] H.Kohno and S.Takeda: "Self-organized Chain of crystallino-silicon nanospheres" Appl.Phys.Lett.73. 3144-3146 (1998)

    • Related Report
      1998 Annual Research Report
  • [Publications] N.Ozaki Y.Ohno and S.Takeda: "Silicon nanowhiskers grown on a hydrogen-torminared silicon {III} sarface" Appl.Phys.Lett.73. 3700-3702 (1998)

    • Related Report
      1998 Annual Research Report

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Published: 1998-04-01   Modified: 2016-04-21  

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