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Transmission electron microscope observation of cracks introduced in bulk crystals

Research Project

Project/Area Number 10305045
Research Category

Grant-in-Aid for Scientific Research (A).

Allocation TypeSingle-year Grants
Section一般
Research Field Physical properties of metals
Research InstitutionNagoya University

Principal Investigator

SAKA Hiroyasu  Nagoya University, Graduate School of Engineering, Professor, 工学研究科, 教授 (90023267)

Co-Investigator(Kenkyū-buntansha) SASAKI Katsuhiro  Nagoya University, Graduate School of Engineering, Assistant Professor, 工学研究科, 講師 (00211938)
KURODA Kotaro  Nagoya University, Graduate School of Engineering, Professor., 工学研究科, 教授 (30161798)
Project Period (FY) 1998 – 2000
Project Status Completed (Fiscal Year 2000)
Budget Amount *help
¥37,700,000 (Direct Cost: ¥37,700,000)
Fiscal Year 2000: ¥3,500,000 (Direct Cost: ¥3,500,000)
Fiscal Year 1999: ¥26,900,000 (Direct Cost: ¥26,900,000)
Fiscal Year 1998: ¥7,300,000 (Direct Cost: ¥7,300,000)
KeywordsCrack / Transmission electron microscopy / dislocations / bulk crystals / focused ion beam technique / 破壊 / DBTT / TEM / FIB
Research Abstract

Fracture of materials is one of the most important subjects in materials science. There are two approaches to the study of fracture of materials. One is macroscopic one and the other is atomistic simulation using a computer. However, there is a big gap between these extremes and it is information on mesoscopic scale that bridges this gap. In order to get such information on mesoscopic scale transmission electron microscopy should be the most appropriate technique. However, it is extremely difficult to prepare a foil specimen which contain S the very tip of a crack.
The purpose of the present study is to examine by transmission electron microscopy those cracks which were introduced in bulk crystals applying a focused ion beam technique to preparation of a thin foil specimen from pre-selected area such as a crack tip. This contributes much to bridge the gap between macroscopic approach and atomistic simulation. In this study, Si, GaAs, alumina and quasicrystals were used as specimens and the defect structures at and near the tips of the cracks were observed comprehensively.

Report

(4 results)
  • 2000 Annual Research Report   Final Research Report Summary
  • 1999 Annual Research Report
  • 1998 Annual Research Report
  • Research Products

    (25 results)

All Other

All Publications (25 results)

  • [Publications] Suprijadi and H.Saka: "On the nature of a dislocation wake along a crack introduced in Si at the DBTT"Phil.Mag.Lett.. 78. 435-443 (1998)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] H.Saka,J.Shimatani,Suprijadi and T.Nango: "FIB/TEM observation of defect structure underneath an indentation in silicon"Mat.Res.Soc.Symp.Proc.. 522. 71-76 (1998)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] H.Saka,G.Nagaya: "Plan-view observation of crack tips in bulk materials by FIB/HVEM"Radiation Effects & Defects in Solids. 148. 319-332 (1999)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] M.Wollgarten,H.Saka: "Microstructural investigation of the brittle-ductile transition in Al-Pd-Mn quasicrsytals"Phil.Mag.A. 79. 2195-2208 (1999)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] Suprijadi and H.Saka: "Cross-sectional and plan-view observation of cracks introduced in Si at the DBTT"Mat.Res.Soc.Symp.Proc.. 538. 169-174 (1999)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] Suprijadi and H.Saka: "TEM observation of dislocation emission from a crack at DBTT in Si"Materi.Trans. 42. 28-32 (2001)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] Suprijadi and H.Saka: "On the nature of a dislocation wake along a crack introduced in Si at the ductile-brittle transition temperature"Phil.Mag.Lett.. 78. 435-443 (1998)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] H.Saka, J.Shimatani, Suprijadi and T.Nango: "FIB/TEM observation of defect structure underneath an indentation in silicon"Mat.Res.Soc.Symp.Proc.. 522. 71-76 (1998)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] H.Saka, G.Nagaya, T.Sakuishi and S.Abe: "Plan-view observation of crack tips in bulk materials by FIB/HVEM"Radiation Effects & Defects in Solids. 148. 319-332 (1999)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] M.Wollgarten, H.Saka and A.Inoue: "Microstructural investigation of the brittle-ductile transition in Al-Pd-Mn quasicrsytals"Phil.Mag., A. 79. 2195-2208 (1999)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] Suprijadi and H.Saka: "Cross-sectional and plan-view observation of cracks introduced in Si at the ductile-brittle transition temperature"Mat.Res.Soc.Symp.Proc.. 538. 169-174 (1999)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] Suprijadi, and H.Saka: "TEM observation of dislocation emission from a crack at DBTT in Si"Materi.Trans.. 42. 28-32 (2001)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] Suprijadi and H.Saka: "On the nature of a dislocation wake along a crack introduced in Si at the DBTT"Phil.Mag.Lett.. 78. 435-443 (1998)

    • Related Report
      2000 Annual Research Report
  • [Publications] H.Saka,J.Shimatani,Suprijadi and T.Nango: "FIB/TEM observation of defect structure underneath an indentation in silicon "Mat,Res,Soc.Symp.Proc.. 522. 71-76 (1998)

    • Related Report
      2000 Annual Research Report
  • [Publications] H.Saka,G.Nagaya : "Plan-View observation of crack tips in bulk materials by FIB/HVEM"Radiation Effects & Defects in Solids....... 148. 319-332 (1999)

    • Related Report
      2000 Annual Research Report
  • [Publications] M.Wollgarten,H.Saka: "Microstructural investigation of the brittle-ductile transition in Al-Pd-Mn quasicrsytals"Phil.Mag.A. 79. 2195-2208 (1999)

    • Related Report
      2000 Annual Research Report
  • [Publications] Suprijadi and H.Saka: "Cross-sectional and plan-view observation of cracks introduced in Si at the DBTT"Mat.Res.Soc.Symp.Proc.. 538. 169-174 (1999)

    • Related Report
      2000 Annual Research Report
  • [Publications] Suprijadi and H.Saka: "TEM observation of dislocation emission from a crack at DBTT in Si"Materi.Trans. 42. 28-32 (2001)

    • Related Report
      2000 Annual Research Report
  • [Publications] H.Saka,G.Nagoya,T.Sakuishi and S.Abe: "Plan-view observation of crack tips in bulk Materials by F1B/ HVEM"Radiation Effects & Defects in Solids. 148. 319-332 (1999)

    • Related Report
      1999 Annual Research Report
  • [Publications] M.Wollgarten,H.Saka and A.Inoue: "Microstructural investigotion of the brittle-to-ductile transition in Si-Pd-Mn quasi crystals"Phil.Mag.A. 79.9. 2195-2208 (1999)

    • Related Report
      1999 Annual Research Report
  • [Publications] Suprijadi and H.Saka: "Cross-sectional and plan-view observation of cracks introduced in Si at PBTT"Mat. Res.Soc.Symp.Proc.. 539. 169-174 (1999)

    • Related Report
      1999 Annual Research Report
  • [Publications] H.SAKA: "Transmission electron microscopy observation of thin foil specimeus prepared by means of a focused ion beam" J.Vac.Sci.Technol.B. 16(4). 2522-2527 (1998)

    • Related Report
      1998 Annual Research Report
  • [Publications] A.Shimatani: "FIB/TEM observation of defect structure underrieath an inallufation in Si" Mat.Res.Soc.Symp.Proc. 522. 71-76 (1998)

    • Related Report
      1998 Annual Research Report
  • [Publications] Suprijadi: "On the nature of a dislocation wake along a crack introduced in Si at the DBTT temperature" Phil.Mag.Lett.78. 435-443 (1998)

    • Related Report
      1998 Annual Research Report
  • [Publications] Suprijadi: "Siの亀裂先端観察" まてりあ. 37. 990-990 (1998)

    • Related Report
      1998 Annual Research Report

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Published: 1998-04-01   Modified: 2016-04-21  

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