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Development of Scanning Near-field Acoustic Microscopy using Piezoelectric Cantilever

Research Project

Project/Area Number 10355005
Research Category

Grant-in-Aid for Scientific Research (A)

Allocation TypeSingle-year Grants
Section展開研究
Research Field Applied physics, general
Research InstitutionKYOTO UNIVERSITY

Principal Investigator

YAMADA Hirofumi  Kyoto Univ., Dept. of Electrical Engineering, Asistant. Professor, 工学研究科, 助教授 (40283626)

Co-Investigator(Kenkyū-buntansha) WATANABE Syunji  Opto-electronic Material Lab., Nikon Co., Research, 相模原技術開発部, 教授
FUJII Toru  Opto-electronic Material Lab., Nikon Co., Senior Research, 相模原技術開発部, 係長
HORIUCHI Toshihisa  Kyoto Univ., Dept. of Electrical Engineering, Research Associate, 工学研究科, 助手 (10238785)
Project Period (FY) 1998 – 1999
Project Status Completed (Fiscal Year 1999)
Budget Amount *help
¥22,600,000 (Direct Cost: ¥22,600,000)
Fiscal Year 1999: ¥8,200,000 (Direct Cost: ¥8,200,000)
Fiscal Year 1998: ¥14,400,000 (Direct Cost: ¥14,400,000)
KeywordsNear-field Acoustic Microscopy / AFM / Acoustic and Mechanical Properties / Ultrasonic Wave / FM Detection / Phase-Locked Loop / SNAM / 走査型プローブ顕微鏡 / PZTカンチレバー
Research Abstract

The sensitivity of the piezoelectric cantilever was checked by atomic force microscopy (AFM) imaging of atomic step structures of sapphire substrate which was prepared by thermal baking at 1400℃. The step structures with a height of about 2nm were clearly observed so that the sensitivity of the cantilever was high enough for AFM.
Local acoustic and mechanical properties of ferroelectric polymer thin films were investigated by dynamic mode AFM. Since the grain in the films is composed of either amorphous structures or complicated structures made up tangled polymer chains, it is almost impossible to obtain clear images on a nanometer scale with an ordinary AFM. In our research the tip was brought closer to the sample surface to increase the tip-surface interaction. Thus viscoelastic properties were obtained due to some acoustic and mechanical coupling between the tip and the sample. As a result sub-grain structures with the size of some 10nm were found.
We explored another possibility for obtaining acoustic and mechanical properties of a sample by measuring dissipation of the vibration energy of the PZT cantilever in the dynamic mode, which could give higher resolution in connection with non-contact AFM. In this mode the shift of the resonance frequency and the change in the vibration amplitude can be used as topographic and dissipation information, respectively. Frequency detection electronics consisted of a circuit for frequency shift detection and a self-excitation circuit where the dissipation was measured. We successfully developed a new frequency detection electronics which adopted a voltage controlled oscillator using a quartz crystal (VCXO) in order to increase the frequency sensitivity. The sensitivity obtained was 0.01Hz(1kHz bandwidth), which was greatly improved.

Report

(3 results)
  • 1999 Annual Research Report   Final Research Report Summary
  • 1998 Annual Research Report
  • Research Products

    (26 results)

All Other

All Publications (26 results)

  • [Publications] H.Okino, Horiucho,: "Thermally Stimulated Current and Polarization Fatigue in Pb (Zr, Ti) O3 Thin"Jpn. J. Appl Phys.. Vol. 37, Part 1. 5137-5140 (1998)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1999 Final Research Report Summary
  • [Publications] K.Kobayashi, H.Yamada, T.Horiuchi: "Investigations of C60 molecules deposited on Si(III) by noncontact atomic force midroscopy"Applied Surface Science. 140. 281-286 (1998)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1999 Final Research Report Summary
  • [Publications] K.Kobayashi, H.Yamada, T.Horiuchi: "High-Resolution Imaging of Organic Molecules by UHV-AFM"TECHNICAL REPORT OF IENCE. OME98-98. 23-27 (1998)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1999 Final Research Report Summary
  • [Publications] S.Yamamoto, H.Yamada: "Nanoscopic imaging of mechanical properties of metal films with magnetic-force-controlled AFM"Surface Science. 433-435. 567-574 (1999)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1999 Final Research Report Summary
  • [Publications] H.Okino, T.Horiuchi: "Electrical Properties of Highly Strained Epitaxial Pb(Zr, Zi) O3 Thin Films on MgO(100)"Jpn. J. Appl Phys.. Vol. 38, Part 1. 5388-5391 (1999)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1999 Final Research Report Summary
  • [Publications] K.Kobayashi, H.Yamada, T.Horiuchi: "Dynamic Force Microscopy Investigations of C60 Deposited on Si(III)"Jpn. J. Appl Phys.. Vol. 38, Part 2. -1552 (1999)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1999 Final Research Report Summary
  • [Publications] H.Yamada: "Scanning Near-Field Potical Microscopy Using Piezoelectric Cantilevers"SURFACE AND INTERFACE ANALYSIS. 27. 503-506 (1999)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1999 Final Research Report Summary
  • [Publications] Y.Miyahara, T.Fujii, S.Watanabe, H.Yamada: "Lead zirconate titanate cantilever for noncontact atomic force microscopy"Applied Surface Science. 140. 428-431 (1999)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      1999 Final Research Report Summary
  • [Publications] H. Okino, T. Horiuchi: "Thermally Stimulated Current and Polarization Fatigue in Pb (Zr,Ti) O3 Thin Films"Jpn. J. Appl. Phys. Vol.37, Part 1. 5137-5140 (1998)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1999 Final Research Report Summary
  • [Publications] K. Kobayashi, H. Yamada, T. Horiuchi: "Investigations of C60 molecules deposited on Si (111) by noncontact atomic force microscopy"Applied Surface Science. 140. 281-286 (1998)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1999 Final Research Report Summary
  • [Publications] K. Kobayashi, H. Yamada, T. Horiuchi: "High-Resolution Imaging of Organic Molecules by UHV-AFM"TECHNICAL REPORT OF IEICE. OME98-98. 23-27 (1998)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1999 Final Research Report Summary
  • [Publications] S. Yamamoto, H. Yamada: "Nanoscopic imaging of mechanical properties of metal films with magnetic-force-controlled AFM"Surface Science. 433-435. 567-574 (1999)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1999 Final Research Report Summary
  • [Publications] H. Okino, T. Horiuchi: "Electrical Properties of Highly Strained Epitaxial Pb (Zr,Ti) O3 Thin Films on MgO (100)"Jpn. J. Appl. Phys.. Vol.38, Part 1. 5388-5391 (1999)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1999 Final Research Report Summary
  • [Publications] K. Kobayashi, H. Yamada T. Horiuchi: "Dynamic Force Microscopy Investigations of C60 Deposited on Si(111)Surface"Jpn. J. Appl. Phys.. Vol.38, Part 2. L1550-1552 (1999)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1999 Final Research Report Summary
  • [Publications] H. Yamada: "Scanning Near-Field Optical Microscopy Using Piezoelectric Cantilevers"SURFACE AND INTERFACE ANALYSIS. 27. 503-506 (1999)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1999 Final Research Report Summary
  • [Publications] Y. Miyahara, T. Fujii, S. Watanabe, H. Yamada: "Lead zirconate titanate cantilever for noncontact atomic force microscopy"Applied Surface Science. 140. 428-431 (1999)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      1999 Final Research Report Summary
  • [Publications] Kei Kobayashi: "Dynamic Force Microscopy Investigations of C^<60> Deposited on Si(111) Surface"Jpn. J. Appl. Phys.. Vol.38,Part2 No.12B. 1550-1552 (1999)

    • Related Report
      1999 Annual Research Report
  • [Publications] Hirotake Okino: "Electrical Properties of Highly Strained Epitaxial Pb(Zr, Ti)O^3 Thin Films on MgO(100)"Jpn. J. Appl. Phys.. Vol.38,Part1 No.9B. 5388-5391 (1999)

    • Related Report
      1999 Annual Research Report
  • [Publications] Shin-ichi Yamamoto: "Nanoscopic imaging of mechanical properties of metal films with magnetic-force-controlled AFM"Surface Science. 433-435. 567-574 (1999)

    • Related Report
      1999 Annual Research Report
  • [Publications] Hirofumi Yamada: "Scanning Near-Field Optical Microscopy Using Piezoelectric Cantilevers"Surface and Interface Analysis. 27. 503-506 (1999)

    • Related Report
      1999 Annual Research Report
  • [Publications] Y.Miyazaki: "Lead zirconate titanate cantilever for noncontact atomic force microscopy"Applied Surface Science. 140. 428-431 (1999)

    • Related Report
      1999 Annual Research Report
  • [Publications] Hirofumi Yamada: "Scanning hear-field optical microscopy using piezoelectric cantilevers" Surface and Interface Analysis. (印刷中).

    • Related Report
      1998 Annual Research Report
  • [Publications] X.Q.Chen: "Formation of Nanoscale Polarized Domains in Organic Ferroelectic Thin Films by Scanning Probe Microscopy" Mol.Cryst.Lig.Cryst.(印刷中).

    • Related Report
      1998 Annual Research Report
  • [Publications] X.Q.Chen: "Investigation of Surface Potential on Ferroelectric Organic molecules by Scanning Probe Microscopy" Jpn.J.Appl.Phys.(印刷中).

    • Related Report
      1998 Annual Research Report
  • [Publications] Kei Kobayashi: "The Molecules Arrangement of Alkanethiol Self-Assembled Monolayers on Au(III) studied by Scanning Tunneling Microscopy" Jpn.J.Appl.Phys. 37(11A). (1998)

    • Related Report
      1998 Annual Research Report
  • [Publications] S.P.Jarvis: "Feedback stabilized force sensors:a gateway to the direct measurement of interatomic potential" Appl.Phys.A66. 211-213 (1998)

    • Related Report
      1998 Annual Research Report

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Published: 1998-04-01   Modified: 2016-04-21  

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