| Project/Area Number |
10450034
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| Research Category |
Grant-in-Aid for Scientific Research (B)
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| Allocation Type | Single-year Grants |
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| Section | 一般 |
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| Research Field |
Applied physics, general
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| Research Institution | Tokyo Institute of Technology |
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Principal Investigator |
UEHA Sadayuki Tokyo Inst. of Tech., Precision and Intelligence Lab., Professor, 精密工学研究所, 教授 (90016551)
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| Co-Investigator(Kenkyū-buntansha) |
KOIKE Yoshikazu Tokyo Inst. of Tech., Precision and Intelligence Lab., Research Associate, 精密工学研究所, 助手 (30251672)
NAKAMURA Kentaro Tokyo Inst. of Tech., Precision and Intelligence Lab., Associate Professor, 精密工学研究所, 助教授 (20242315)
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| Project Period (FY) |
1998 – 1999
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| Project Status |
Completed (Fiscal Year 1999)
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| Budget Amount *help |
¥3,900,000 (Direct Cost: ¥3,900,000)
Fiscal Year 1999: ¥3,900,000 (Direct Cost: ¥3,900,000)
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| Keywords | structural intensity / Inverse problem / finite element method / noise control / Laser Doppler vibrometer / noise problem / vibration measurement / noise source identification |
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| Research Abstract |
Many studies about structural intensity (SI) measurement, which is useful to know transmission paths of the vibration energy in a body, have been reported until now. Most of the works, however, have been done only for thin bodies, such as beams or plates because of the difficulty in measuring interior vibration distribution in thick structures. In this research, we propose a new SI measurement method applicable to thick bodies. The entire vibration distribution in the structure is calculated by dynamic analysis of finite element method (FEM) from the partial surface vibration data if the density, the sound velocity, sizes of a body under study and the locations of excitation and absorption are given apriori. The entire SI distribution can be estimated using the results. Based on this method, we have successfully carried several SI measurements for thick vibrating bodies. The merits of this method are as follows: (1) Only surface vibration data of the structure is needed to estimate the entire SI distribution. (2) It is applicable for arbitrary 3-D structures if the conditions mentioned above are satisfied apriori. In the research, the influence of the measurement error and the required number of the measurement data are also investigated.
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