| Project/Area Number |
10450317
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| Research Category |
Grant-in-Aid for Scientific Research (B)
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| Allocation Type | Single-year Grants |
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| Section | 一般 |
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| Research Field |
工業分析化学
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| Research Institution | The University of Tokyo |
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Principal Investigator |
NIHEI Yoshimasa Inst. of Industrial Science, The University of Tokyo, Professor, 生産技術研究所, 教授 (10011016)
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| Co-Investigator(Kenkyū-buntansha) |
ISHII Hideshi Inst. of Industrial Science, The University of Tokyo, Research Associate, 生産技術研究所, 助手 (30251466)
OWARI Masanori Environmental Science Center, The University of Tokyo, Professor, 環境研究安全センター, 教授 (70160950)
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| Project Period (FY) |
1998 – 1999
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| Project Status |
Completed (Fiscal Year 1999)
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| Budget Amount *help |
¥12,200,000 (Direct Cost: ¥12,200,000)
Fiscal Year 1999: ¥4,100,000 (Direct Cost: ¥4,100,000)
Fiscal Year 1998: ¥8,100,000 (Direct Cost: ¥8,100,000)
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| Keywords | Photoelectron Diffraction / Real time XPED / Surfactant Epitaxy / Surface alloy / Tensor XPED / Cu / Ge (111) / Photoelectron Holography / Gu |
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| Research Abstract |
1. Instrumentation of real time X-ray Photoelectron Diffraction (XPED) Analysis
For real time measurements of interface structures, reactions and growth by XPED, the improvement of our XPED-MBE chamber was carried out. The new manipulator and transfer rods system enables the XPED measurements at from 77K to about 1300K with the precise rotation.
2. Development of novel theory to investigate interface structures ; Tensor XPED and Photoelectron Holography
To investigate interface structures precisely, novel theory of tensor XPED and Photoelectron Holography were developed. Using these schemes, theoretical XPED patterns of Cu/Ge (111) systems were investigated.
3. Interface structure of Cu/Ge (111) systems (Interface structure and alloy formation of discommensurate system)
The structure of discommensurate domain Cu Layer on Ge (111)-c (2x8) surface was studied by X-ray Photoelectron Diffraction (XPED). It turned out that Cu forms the double layer structure in the discommensurate domain at the initial stage of epitaxy and 0.6Å relaxation of outermost Cu layer occurs. Alloy formation in the interface between Cu an Ge layers was also investigate.
4. Design and Instrumentation of real time XPED detection systems for measurements of interface reaction
To investigate interface reactions precisely and real time, conventional plot-by-plot XPED measurements is not adequate. Thus, theoretical and experimental study on 2 dimensional simultaneous detection of the polar angle and energy distributions was performed. Theoretical design of new type input lens system with a high through put was also carried out.
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