| Project/Area Number |
10555007
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| Research Category |
Grant-in-Aid for Scientific Research (B)
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| Allocation Type | Single-year Grants |
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| Section | 展開研究 |
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| Research Field |
表面界面物性
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| Research Institution | The University of Tokyo |
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Principal Investigator |
HASEGAWA Shuji Graduate school of Science, The University of Tokyo, Associate Professor, 大学院・理学系研究科, 助教授 (00228446)
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| Co-Investigator(Kenkyū-buntansha) |
NAGAO Tadaaki Graduate school of Science, The University of Tokyo, Research associate, 大学院・理学系研究科, 助手 (40267456)
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| Project Period (FY) |
1998 – 1999
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| Project Status |
Completed (Fiscal Year 1999)
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| Budget Amount *help |
¥13,800,000 (Direct Cost: ¥13,800,000)
Fiscal Year 1999: ¥1,300,000 (Direct Cost: ¥1,300,000)
Fiscal Year 1998: ¥12,500,000 (Direct Cost: ¥12,500,000)
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| Keywords | TRAXS / scanning electron microscopy / surface chemical analysis / RHEED / Energy-dispersive X-ray detector / SREM / electromigration / surfactant epitaxy |
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| Research Abstract |
(1) We have developed a scanning TRAXS combined with UHV-SEM-SREM apparatus, which enables simultaneous analyses of surface chemical compositions and structures of a microscopic region on surfaces.
(2) We have studied electromigration phenomena with this new apparatus. A film patch of Ag was deposited on Au-precovered Si(111) surfaces, and then direct current was stressed through the crystals. The spreading ability and migration velocity of the Ag patch were round to sensitively depend on the Au coverages and corresponding surface superstructures. The results are analyzed in terms if surface alloy phase formation and step-edge barriers in migration potential.
(3) By using an ability of two-dimensional mapping of surface elements, we have investigated a detection sensitivity of the scanning TRAXS with a sample surface of Ag-covered Si(111) surfaces. The results showed a high sensitivity enough for detecting monolayer Ag.
(4) We have studied various surface phases induced by small amounts of Au adsorption on Si(111)-ィイD83ィエD8 X ィイD83ィエD8-Ag surface by using the scanning-TRAXS-SEM-SREM method.
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