• Search Research Projects
  • Search Researchers
  • How to Use
  1. Back to previous page

Development of a field electron emission-scanning probe microscope with a build-up tip

Research Project

Project/Area Number 10555008
Research Category

Grant-in-Aid for Scientific Research (B).

Allocation TypeSingle-year Grants
Section展開研究
Research Field 表面界面物性
Research InstitutionJapan Advanced Institute of Science and Technology

Principal Investigator

TOMITORI Masahiko  School of Materials Science, Japan Advanced Institute of Science and Technology Associate Professor, 材料科学研究科, 助教授 (10188790)

Co-Investigator(Kenkyū-buntansha) ARAI Toyoko  School of Materials Science, Japan Advanced Institute of Science and Technology Associate, 材料科学研究科, 助手 (20250235)
OOTSUKA Nobuo  School of Materials Science, Japan Advanced Institute of Science and Technology Professor, 材料科学研究科, 教授 (80111649)
Project Period (FY) 1998 – 2000
Project Status Completed (Fiscal Year 2000)
Budget Amount *help
¥13,000,000 (Direct Cost: ¥13,000,000)
Fiscal Year 2000: ¥2,100,000 (Direct Cost: ¥2,100,000)
Fiscal Year 1999: ¥3,500,000 (Direct Cost: ¥3,500,000)
Fiscal Year 1998: ¥7,400,000 (Direct Cost: ¥7,400,000)
Keywordsfield electron emission scanning probe microscope / scanning tunneling microscope / build-up tip / field emission / electron spectroscopy
Research Abstract

We have developed a new instrument combined with a field electron emission-scanning probe microscope (FEE-SPM) and an electron energy analyzer to acquire energy spectra of electrons backscattered from a sample surface. The sample was irradiated with electrons field-emitted from a build-up [111]-oriented W tip. The area irradiated with the electrons can be imaged by STM with the same tip.
In this instrument, the tip fabrication is crucial to draw a stable electron beam. We applied a build-up technique to fabricate it, which is called a thermal-field (T-F) treatment : we apply a positive high voltage to the tip while heating it. The surface atoms on the tip are polarized and pulled toward its apex with a higher electric field, resulting in expansion of some facets with specific plane indices. Consequently, the tip apex is surrounded by a set of facets with vertices and ridges. By choosing the tip axis to a vertex direction, the tip is sharpened : it is the [111] direction for W.
An elastic peak with plasmon losses and Auger electron peaks were found for a Si (111) and a Si (111) covered with Ge, and other samples. The Ge islands with 5x5 and 7x7 reconstructions grown on the step and the domain boundaries of the substrate are imaged with the STM.After STM imaging, the tip is retracted slightly and the electron beam is field-emitted from the tip. Several energy peaks are found, which are attributed to plasmons and to Auger electrons of Si LVV and Ge MVV.The Auger peaks shifted toward lower energies as the separation between tip and sample decreases. The electron trajectoriey are possibly deflected in the electric field between tip and sample. A metal plate with a small hole to reduce the electric field was inserted between tip and sample : the peaks became prominent.

Report

(4 results)
  • 2000 Annual Research Report   Final Research Report Summary
  • 1999 Annual Research Report
  • 1998 Annual Research Report
  • Research Products

    (21 results)

All Other

All Publications (21 results)

  • [Publications] M.Tomitori: "An applicability of scanning tunneling microscopy for surface electron spectroscopy"Surface Science. (in print).

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] Y.Suganuma: "Evaluation of an electric field over sample surfaces by electron standing waves in a vacuum gap of scanning tunneling microscopy"Jpn.J.Appl.Phys.. 39(6B). 3758-3760 (2000)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] T.Arai : "AFM tip sharpening and evaluation by electric field confinement using a metal grid approached to the tip"J.Vac.Sci.Technol.B. 18. 648-652 (2000)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] Y.Suganuma: "Analysis of electron standing waves in a vacuum gap of scanning tunneling microscopy: measurement of band bending through energy shifts of electron standing wave"J.Vac.Sci.Technol.B. 18. 48-54 (2000)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] Y.Suganuma : "Tunneling condition dependence of electron standing waves in vacuum gaps on gold (111) and silicon (001) observed by scanning tunneling microscopy "Surface Science. 438. 311-318 (1999)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] M.Tomitori: "Energy spectrum of backscattered electrons excited by a field emission STM with a build-up [111]-oriented W tip "Applied Surface Science. 144-145. 123-127 (1999)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] 森田清三: "走査型プローブ顕微鏡 基礎と未来予想"森田清三 編著、丸善. 1-181 (2000)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] 西川治: "走査型プローブ顕微鏡 STMからSPMへ"西川治 編著、丸善. 1-245 (1998)

    • Description
      「研究成果報告書概要(和文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] M.Tomitori et al.: "An applicability of scanning tunneling microscopy for surface electron spectroscopy"Surf.Sci.. (in print).

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] Y.Suganuma et al.: "Evaluation of an electric field over sample surfaces by electron standing waves in a vacuum gap of scanning tunneling microscopy""Jpn.J.Appl.Phys.. 39 Pt.1.(6B). 3758-3760 (2000)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] T.Arai et al.: "AFM tip sharpening and evaluation by electric field confinement using a metal grid approached to the tip"J.Vac.Sci.Technol.. B 18. 648-652 (2000)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] Y.Suganuma et al.: "Analysis of electron standing waves in a vacuum gap of scanning tunneling microscopy : measurement of band bending through energy shifts of electron standing wave"J.Vac.Sci.Technol.. B 18. 48-54 (2000)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] Y.Suganuma et al.: "Tunneling condition dependence of electron standing waves in vacuum gaps on gold (111) and silicon (001) observed by scanning tunneling microscopy"Surf.Sci.. 438. 311-318 (1999)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] M.Tomitori et al.: "Energy spectrum of backscattered electrons excited by a field emission STM with a build-up [111]-oriented W tip"Appl.Surf.Sci.. 144-145. 123-127 (1999)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] Y.Suganuma et al.: "Differential conductance imaging of Si and Ge Islands deposited on Si(001) by scanning tunneling microscopy"Jpn.J.Appl.Phys.. 37. 3789-3792 (1998)

    • Description
      「研究成果報告書概要(欧文)」より
    • Related Report
      2000 Final Research Report Summary
  • [Publications] Y.Suganuma: "Analysis of electron standing waves in a vacuum gap of scanning tunneling microscopy : measurement of band bending through energy shifts of electron standing wave"J.Vac.Sci.Technol.. B18. 48-54 (2000)

    • Related Report
      2000 Annual Research Report
  • [Publications] M.Tomitori: "An applicability of scanning tunneling microscopy for surface electron spectroscopy"Surf.Sci.. (in print.).

    • Related Report
      2000 Annual Research Report
  • [Publications] M.Tomitori: "Energy spectrum of backscattered electrons excited by a field emission STM with a build-up [111]-oriented W tip"Appl.Surf.Sci.. 144-145. 123-127 (1999)

    • Related Report
      1999 Annual Research Report
  • [Publications] Y.Suganuma: "Tunneling condition dependence of electron standing waves in vacuum gaps on gold (111) and silicon (001) observed by scanning tunneling microscopy"Surf.Sci.. 438. 311-318 (1999)

    • Related Report
      1999 Annual Research Report
  • [Publications] Y.Suganuma: "Analysis of electron standing waves in a vacuum gap of scanning tunneling microscopy: measurement of band bending through energy shifts of electron standing wave"J.Vac.Sci.Technol.A. (in print.).

    • Related Report
      1999 Annual Research Report
  • [Publications] M.Tomitori: "Energy spectrum of backscattered electrons excited by a field emission STM with a build-up[111]-oriented W tip" Appl.Surf.Sci.(in print.).

    • Related Report
      1998 Annual Research Report

URL: 

Published: 1998-04-01   Modified: 2016-04-21  

Information User Guide FAQ News Terms of Use Attribution of KAKENHI

Powered by NII kakenhi