| Project/Area Number |
10650417
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| Research Category |
Grant-in-Aid for Scientific Research (C)
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| Allocation Type | Single-year Grants |
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| Section | 一般 |
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| Research Field |
Measurement engineering
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| Research Institution | Hosei University |
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Principal Investigator |
HASEGAWA Kenichi Hosei University, Faculty of Engineering, Professor, 工学部, 教授 (40010798)
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| Co-Investigator(Kenkyū-buntansha) |
MAEDA Kuniko The Institute of Physical and Chemical Research (Riken), Senior Research Scientist, 無機化学物理研究室, 先任研究員 (60087476)
HAMANAKA Hiromi Hosei University, Faculty of Engineering, Professor, 工学部, 教授 (10061235)
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| Project Period (FY) |
1998 – 1999
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| Project Status |
Completed (Fiscal Year 1999)
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| Budget Amount *help |
¥3,300,000 (Direct Cost: ¥3,300,000)
Fiscal Year 1999: ¥1,100,000 (Direct Cost: ¥1,100,000)
Fiscal Year 1998: ¥2,200,000 (Direct Cost: ¥2,200,000)
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| Keywords | PIXE / spectrometer / PSPC / X-ray / position-sensitive detector |
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| Research Abstract |
A wavelength-dispersive crystal spectrometer system with a position-sensitive detector has been developed for high-resolution PIXE (Particle Induced X-ray Emission) experiments in atmospheric air. We have designed and constructed two detectors to improve its counting efficiency : one is a multianode PSPC (Position-Sensitive Proportional Counter) and the other is a stacked PSPC assembly. The multianode PSPC has seven carbon fiber filaments used as resistive anodes. Pulses from the anodes are converted into digital signals with a 512 x 7 channel charge-division analyzer. A Visual Basic program converts this 2D data set into a 1D spectrum after adjusting the offset channels and conversion factors.
The stacked PSPC assembly is improved one and consists of five single PSPCs. Each PSPC has also a carbon fiber anode, and is placed so as to obtain the maximum counting efficiency and the best spatial resolution according to a curved distribution of the incident X-rays on the detector surface. The spectral resolution of this detector is 0.5mm which is somewhat larger than that of our single PSPC system previously developed, while its counting efficiency is five times higher than that of the single one.
We have also tried to use Kr gas for analyzing the characteristic X-rays of P and S as the counter gas instead of Ar generally used, because the counting efficiency of Kr gas is about two times as large as that of Ar for the range of 2keV.
The chemical bonding states of various compounds of Al, Si, P, and S can be analyzed within several seconds to several minutes by using this system.
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